A Holistic Approach to Defect Detection in Solar Modules: Leveraging Lifecycle Data for Improved Performance Article Swipe
A.G. Phadke
,
N. Bhagwat
,
S. Mohaadkar
,
Vikram L. Dalal
,
Pranav Joshi
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.38124/ijisrt/25apr988
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.38124/ijisrt/25apr988
The efficient maintenance and optimization of solar modules are critical for sustaining high energy yields over their operational lifetimes. This research introduces a comprehensive system designed to enhance lifecycle traceability and defect detection in solar modules using a combination of advanced image analysis and machine learning techniques. By leveraging Convolutional Neural Networks (CNN), You Only Look Once (YOLO) object detection, and deep learning, the system analyzes thermal and normal imaging data as well as current-voltage (IV) characteristics and curves. The proposed framework enables the detection of common faults, such as hotspots, cell cracks, and degradation patterns, which can impact performance and safety. Integrated data management and tracking capabilities facilitate end-to-end lifecycle monitoring, providing accessible, organized insights for stakeholders involved in solar module maintenance and diagnostics. The model shows an accuracy of 90%. The results show that the system not only improves accuracy in fault identification but also allows efficient storage and retrieval of diagnostic data, presenting a robust solution for advancing photovoltaic asset management
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https://openalex.org/W4410014602Canonical identifier for this work in OpenAlex
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https://doi.org/10.38124/ijisrt/25apr988Digital Object Identifier
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A Holistic Approach to Defect Detection in Solar Modules: Leveraging Lifecycle Data for Improved PerformanceWork title
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articleOpenAlex work type
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enPrimary language
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2025Year of publication
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2025-04-30Full publication date if available
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A.G. Phadke, N. Bhagwat, S. Mohaadkar, Vikram L. Dalal, Pranav JoshiList of authors in order
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https://doi.org/10.38124/ijisrt/25apr988Publisher landing page
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YesWhether a free full text is available
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goldOpen access status per OpenAlex
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https://doi.org/10.38124/ijisrt/25apr988Direct OA link when available
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System lifecycle, Computer science, Application lifecycle management, Systems engineering, Process management, Business, Engineering, Operating system, SoftwareTop concepts (fields/topics) attached by OpenAlex
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0Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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