A single event transient detector in SRAM-based FPGAs Article Swipe
Xiumin Xu
,
Huaguo Liang
,
Zhengfeng Huang
,
Cuiyun Jiang
,
Minghao Yin
,
Aibin Yan
,
Tianming Ni
,
Maoxiang Yi
·
YOU?
·
· 2017
· Open Access
·
· DOI: https://doi.org/10.1587/elex.14.20170210
YOU?
·
· 2017
· Open Access
·
· DOI: https://doi.org/10.1587/elex.14.20170210
This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs).Experimental results demonstrate that the new pulse detector is able to onchip measure bipolar pulses with a detection limit of near 150 ps, compared with existing pulse detectors, detection capability and detection precision are effectively improved.
Related Topics
Concepts
Static random-access memory
Transient (computer programming)
Field-programmable gate array
Detector
Computer science
Event (particle physics)
Embedded system
Single event upset
Computer hardware
Electronic engineering
Parallel computing
Engineering
Physics
Telecommunications
Operating system
Quantum mechanics
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1587/elex.14.20170210
- https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdf
- OA Status
- diamond
- Cited By
- 5
- References
- 11
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2616035479
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W2616035479Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1587/elex.14.20170210Digital Object Identifier
- Title
-
A single event transient detector in SRAM-based FPGAsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2017Year of publication
- Publication date
-
2017-01-01Full publication date if available
- Authors
-
Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Minghao Yin, Aibin Yan, Tianming Ni, Maoxiang YiList of authors in order
- Landing page
-
https://doi.org/10.1587/elex.14.20170210Publisher landing page
- PDF URL
-
https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
diamondOpen access status per OpenAlex
- OA URL
-
https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdfDirect OA link when available
- Concepts
-
Static random-access memory, Transient (computer programming), Field-programmable gate array, Detector, Computer science, Event (particle physics), Embedded system, Single event upset, Computer hardware, Electronic engineering, Parallel computing, Engineering, Physics, Telecommunications, Operating system, Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
5Total citation count in OpenAlex
- Citations by year (recent)
-
2020: 2, 2019: 1, 2018: 2Per-year citation counts (last 5 years)
- References (count)
-
11Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W2616035479 |
|---|---|
| doi | https://doi.org/10.1587/elex.14.20170210 |
| ids.doi | https://doi.org/10.1587/elex.14.20170210 |
| ids.mag | 2616035479 |
| ids.openalex | https://openalex.org/W2616035479 |
| fwci | 0.66069452 |
| type | article |
| title | A single event transient detector in SRAM-based FPGAs |
| biblio.issue | 12 |
| biblio.volume | 14 |
| biblio.last_page | 20170210 |
| biblio.first_page | 20170210 |
| topics[0].id | https://openalex.org/T11005 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 1.0 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Radiation Effects in Electronics |
| topics[1].id | https://openalex.org/T11032 |
| topics[1].field.id | https://openalex.org/fields/17 |
| topics[1].field.display_name | Computer Science |
| topics[1].score | 0.9983999729156494 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/1708 |
| topics[1].subfield.display_name | Hardware and Architecture |
| topics[1].display_name | VLSI and Analog Circuit Testing |
| topics[2].id | https://openalex.org/T12122 |
| topics[2].field.id | https://openalex.org/fields/17 |
| topics[2].field.display_name | Computer Science |
| topics[2].score | 0.9972000122070312 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/1708 |
| topics[2].subfield.display_name | Hardware and Architecture |
| topics[2].display_name | Physical Unclonable Functions (PUFs) and Hardware Security |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C68043766 |
| concepts[0].level | 2 |
| concepts[0].score | 0.8022320866584778 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q267416 |
| concepts[0].display_name | Static random-access memory |
| concepts[1].id | https://openalex.org/C2780799671 |
| concepts[1].level | 2 |
| concepts[1].score | 0.7469937205314636 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q17087362 |
| concepts[1].display_name | Transient (computer programming) |
| concepts[2].id | https://openalex.org/C42935608 |
| concepts[2].level | 2 |
| concepts[2].score | 0.7319576740264893 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q190411 |
| concepts[2].display_name | Field-programmable gate array |
| concepts[3].id | https://openalex.org/C94915269 |
| concepts[3].level | 2 |
| concepts[3].score | 0.5860224962234497 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q1834857 |
| concepts[3].display_name | Detector |
| concepts[4].id | https://openalex.org/C41008148 |
| concepts[4].level | 0 |
| concepts[4].score | 0.5490877032279968 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[4].display_name | Computer science |
| concepts[5].id | https://openalex.org/C2779662365 |
| concepts[5].level | 2 |
| concepts[5].score | 0.5323947668075562 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q5416694 |
| concepts[5].display_name | Event (particle physics) |
| concepts[6].id | https://openalex.org/C149635348 |
| concepts[6].level | 1 |
| concepts[6].score | 0.5118781328201294 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q193040 |
| concepts[6].display_name | Embedded system |
| concepts[7].id | https://openalex.org/C2780073065 |
| concepts[7].level | 3 |
| concepts[7].score | 0.501861572265625 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q1476733 |
| concepts[7].display_name | Single event upset |
| concepts[8].id | https://openalex.org/C9390403 |
| concepts[8].level | 1 |
| concepts[8].score | 0.4019058048725128 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q3966 |
| concepts[8].display_name | Computer hardware |
| concepts[9].id | https://openalex.org/C24326235 |
| concepts[9].level | 1 |
| concepts[9].score | 0.3675305247306824 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[9].display_name | Electronic engineering |
| concepts[10].id | https://openalex.org/C173608175 |
| concepts[10].level | 1 |
| concepts[10].score | 0.3472065329551697 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q232661 |
| concepts[10].display_name | Parallel computing |
| concepts[11].id | https://openalex.org/C127413603 |
| concepts[11].level | 0 |
| concepts[11].score | 0.22836080193519592 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[11].display_name | Engineering |
| concepts[12].id | https://openalex.org/C121332964 |
| concepts[12].level | 0 |
| concepts[12].score | 0.19405171275138855 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[12].display_name | Physics |
| concepts[13].id | https://openalex.org/C76155785 |
| concepts[13].level | 1 |
| concepts[13].score | 0.10032564401626587 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q418 |
| concepts[13].display_name | Telecommunications |
| concepts[14].id | https://openalex.org/C111919701 |
| concepts[14].level | 1 |
| concepts[14].score | 0.07284599542617798 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q9135 |
| concepts[14].display_name | Operating system |
| concepts[15].id | https://openalex.org/C62520636 |
| concepts[15].level | 1 |
| concepts[15].score | 0.0 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[15].display_name | Quantum mechanics |
| keywords[0].id | https://openalex.org/keywords/static-random-access-memory |
| keywords[0].score | 0.8022320866584778 |
| keywords[0].display_name | Static random-access memory |
| keywords[1].id | https://openalex.org/keywords/transient |
| keywords[1].score | 0.7469937205314636 |
| keywords[1].display_name | Transient (computer programming) |
| keywords[2].id | https://openalex.org/keywords/field-programmable-gate-array |
| keywords[2].score | 0.7319576740264893 |
| keywords[2].display_name | Field-programmable gate array |
| keywords[3].id | https://openalex.org/keywords/detector |
| keywords[3].score | 0.5860224962234497 |
| keywords[3].display_name | Detector |
| keywords[4].id | https://openalex.org/keywords/computer-science |
| keywords[4].score | 0.5490877032279968 |
| keywords[4].display_name | Computer science |
| keywords[5].id | https://openalex.org/keywords/event |
| keywords[5].score | 0.5323947668075562 |
| keywords[5].display_name | Event (particle physics) |
| keywords[6].id | https://openalex.org/keywords/embedded-system |
| keywords[6].score | 0.5118781328201294 |
| keywords[6].display_name | Embedded system |
| keywords[7].id | https://openalex.org/keywords/single-event-upset |
| keywords[7].score | 0.501861572265625 |
| keywords[7].display_name | Single event upset |
| keywords[8].id | https://openalex.org/keywords/computer-hardware |
| keywords[8].score | 0.4019058048725128 |
| keywords[8].display_name | Computer hardware |
| keywords[9].id | https://openalex.org/keywords/electronic-engineering |
| keywords[9].score | 0.3675305247306824 |
| keywords[9].display_name | Electronic engineering |
| keywords[10].id | https://openalex.org/keywords/parallel-computing |
| keywords[10].score | 0.3472065329551697 |
| keywords[10].display_name | Parallel computing |
| keywords[11].id | https://openalex.org/keywords/engineering |
| keywords[11].score | 0.22836080193519592 |
| keywords[11].display_name | Engineering |
| keywords[12].id | https://openalex.org/keywords/physics |
| keywords[12].score | 0.19405171275138855 |
| keywords[12].display_name | Physics |
| keywords[13].id | https://openalex.org/keywords/telecommunications |
| keywords[13].score | 0.10032564401626587 |
| keywords[13].display_name | Telecommunications |
| keywords[14].id | https://openalex.org/keywords/operating-system |
| keywords[14].score | 0.07284599542617798 |
| keywords[14].display_name | Operating system |
| language | en |
| locations[0].id | doi:10.1587/elex.14.20170210 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S207433681 |
| locations[0].source.issn | 1349-2543, 1349-9467 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 1349-2543 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | IEICE Electronics Express |
| locations[0].source.host_organization | https://openalex.org/P4320800604 |
| locations[0].source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| locations[0].source.host_organization_lineage | https://openalex.org/P4320800604 |
| locations[0].source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| locations[0].license | |
| locations[0].pdf_url | https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | IEICE Electronics Express |
| locations[0].landing_page_url | https://doi.org/10.1587/elex.14.20170210 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5101325537 |
| authorships[0].author.orcid | https://orcid.org/0000-0001-7902-3050 |
| authorships[0].author.display_name | Xiumin Xu |
| authorships[0].countries | CN |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[0].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[0].institutions[0].id | https://openalex.org/I16365422 |
| authorships[0].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[0].institutions[0].country_code | CN |
| authorships[0].institutions[0].display_name | Hefei University of Technology |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Xiumin Xu |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[1].author.id | https://openalex.org/A5100736309 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-0307-7236 |
| authorships[1].author.display_name | Huaguo Liang |
| authorships[1].countries | CN |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[1].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[1].institutions[0].id | https://openalex.org/I16365422 |
| authorships[1].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[1].institutions[0].country_code | CN |
| authorships[1].institutions[0].display_name | Hefei University of Technology |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Huaguo Liang |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[2].author.id | https://openalex.org/A5073810494 |
| authorships[2].author.orcid | https://orcid.org/0000-0001-8695-4478 |
| authorships[2].author.display_name | Zhengfeng Huang |
| authorships[2].countries | CN |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[2].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[2].institutions[0].id | https://openalex.org/I16365422 |
| authorships[2].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[2].institutions[0].country_code | CN |
| authorships[2].institutions[0].display_name | Hefei University of Technology |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Zhengfeng Huang |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[3].author.id | https://openalex.org/A5081415353 |
| authorships[3].author.orcid | |
| authorships[3].author.display_name | Cuiyun Jiang |
| authorships[3].countries | CN |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[3].affiliations[0].raw_affiliation_string | School of Mathematics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[3].institutions[0].id | https://openalex.org/I16365422 |
| authorships[3].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[3].institutions[0].type | education |
| authorships[3].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[3].institutions[0].country_code | CN |
| authorships[3].institutions[0].display_name | Hefei University of Technology |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Cuiyun Jiang |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | School of Mathematics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[4].author.id | https://openalex.org/A5023555343 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-6226-2394 |
| authorships[4].author.display_name | Minghao Yin |
| authorships[4].countries | CN |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[4].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[4].institutions[0].id | https://openalex.org/I16365422 |
| authorships[4].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[4].institutions[0].type | education |
| authorships[4].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[4].institutions[0].country_code | CN |
| authorships[4].institutions[0].display_name | Hefei University of Technology |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Yingchun Lu |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[5].author.id | https://openalex.org/A5072439444 |
| authorships[5].author.orcid | https://orcid.org/0000-0003-0024-987X |
| authorships[5].author.display_name | Aibin Yan |
| authorships[5].countries | CN |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I143868143 |
| authorships[5].affiliations[0].raw_affiliation_string | School of Computer Science and Technology, Anhui University, 111 Jiulong Rd., Jingkai District, Hefei 230601, P. R. China |
| authorships[5].institutions[0].id | https://openalex.org/I143868143 |
| authorships[5].institutions[0].ror | https://ror.org/05th6yx34 |
| authorships[5].institutions[0].type | education |
| authorships[5].institutions[0].lineage | https://openalex.org/I143868143 |
| authorships[5].institutions[0].country_code | CN |
| authorships[5].institutions[0].display_name | Anhui University |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Aibin Yan |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | School of Computer Science and Technology, Anhui University, 111 Jiulong Rd., Jingkai District, Hefei 230601, P. R. China |
| authorships[6].author.id | https://openalex.org/A5085987622 |
| authorships[6].author.orcid | https://orcid.org/0000-0001-6272-8660 |
| authorships[6].author.display_name | Tianming Ni |
| authorships[6].countries | CN |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[6].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[6].institutions[0].id | https://openalex.org/I16365422 |
| authorships[6].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[6].institutions[0].type | education |
| authorships[6].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[6].institutions[0].country_code | CN |
| authorships[6].institutions[0].display_name | Hefei University of Technology |
| authorships[6].author_position | middle |
| authorships[6].raw_author_name | Tianming Ni |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[7].author.id | https://openalex.org/A5029018913 |
| authorships[7].author.orcid | https://orcid.org/0000-0002-5160-0933 |
| authorships[7].author.display_name | Maoxiang Yi |
| authorships[7].countries | CN |
| authorships[7].affiliations[0].institution_ids | https://openalex.org/I16365422 |
| authorships[7].affiliations[0].raw_affiliation_string | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| authorships[7].institutions[0].id | https://openalex.org/I16365422 |
| authorships[7].institutions[0].ror | https://ror.org/02czkny70 |
| authorships[7].institutions[0].type | education |
| authorships[7].institutions[0].lineage | https://openalex.org/I16365422 |
| authorships[7].institutions[0].country_code | CN |
| authorships[7].institutions[0].display_name | Hefei University of Technology |
| authorships[7].author_position | last |
| authorships[7].raw_author_name | Maoxiang Yi |
| authorships[7].is_corresponding | False |
| authorships[7].raw_affiliation_strings | School of Electronic Science and Applied Physics, Hefei University of Technology, 193 Tunxi Rd., Baohe District, Hefei 230009, P. R. China |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdf |
| open_access.oa_status | diamond |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | A single event transient detector in SRAM-based FPGAs |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11005 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 1.0 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Radiation Effects in Electronics |
| related_works | https://openalex.org/W1491404489, https://openalex.org/W2135181769, https://openalex.org/W2093752973, https://openalex.org/W4327500719, https://openalex.org/W2146311933, https://openalex.org/W2164363068, https://openalex.org/W1991204622, https://openalex.org/W2032741866, https://openalex.org/W3016958173, https://openalex.org/W2381342229 |
| cited_by_count | 5 |
| counts_by_year[0].year | 2020 |
| counts_by_year[0].cited_by_count | 2 |
| counts_by_year[1].year | 2019 |
| counts_by_year[1].cited_by_count | 1 |
| counts_by_year[2].year | 2018 |
| counts_by_year[2].cited_by_count | 2 |
| locations_count | 1 |
| best_oa_location.id | doi:10.1587/elex.14.20170210 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S207433681 |
| best_oa_location.source.issn | 1349-2543, 1349-9467 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 1349-2543 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | IEICE Electronics Express |
| best_oa_location.source.host_organization | https://openalex.org/P4320800604 |
| best_oa_location.source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4320800604 |
| best_oa_location.source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| best_oa_location.license | |
| best_oa_location.pdf_url | https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | IEICE Electronics Express |
| best_oa_location.landing_page_url | https://doi.org/10.1587/elex.14.20170210 |
| primary_location.id | doi:10.1587/elex.14.20170210 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S207433681 |
| primary_location.source.issn | 1349-2543, 1349-9467 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 1349-2543 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | IEICE Electronics Express |
| primary_location.source.host_organization | https://openalex.org/P4320800604 |
| primary_location.source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| primary_location.source.host_organization_lineage | https://openalex.org/P4320800604 |
| primary_location.source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| primary_location.license | |
| primary_location.pdf_url | https://www.jstage.jst.go.jp/article/elex/14/12/14_14.20170210/_pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | IEICE Electronics Express |
| primary_location.landing_page_url | https://doi.org/10.1587/elex.14.20170210 |
| publication_date | 2017-01-01 |
| publication_year | 2017 |
| referenced_works | https://openalex.org/W2114709079, https://openalex.org/W2141519113, https://openalex.org/W2019132277, https://openalex.org/W2165738869, https://openalex.org/W2123905096, https://openalex.org/W2562808351, https://openalex.org/W2088494064, https://openalex.org/W2123000916, https://openalex.org/W2533291033, https://openalex.org/W2294420364, https://openalex.org/W3101108820 |
| referenced_works_count | 11 |
| abstract_inverted_index.a | 3, 33 |
| abstract_inverted_index.in | 11 |
| abstract_inverted_index.is | 25 |
| abstract_inverted_index.of | 36 |
| abstract_inverted_index.to | 27 |
| abstract_inverted_index.150 | 38 |
| abstract_inverted_index.and | 47 |
| abstract_inverted_index.are | 50 |
| abstract_inverted_index.new | 22 |
| abstract_inverted_index.ps, | 39 |
| abstract_inverted_index.the | 21 |
| abstract_inverted_index.This | 0 |
| abstract_inverted_index.able | 26 |
| abstract_inverted_index.gate | 15 |
| abstract_inverted_index.near | 37 |
| abstract_inverted_index.that | 20 |
| abstract_inverted_index.with | 32, 41 |
| abstract_inverted_index.(SET) | 8 |
| abstract_inverted_index.event | 6 |
| abstract_inverted_index.field | 13 |
| abstract_inverted_index.limit | 35 |
| abstract_inverted_index.novel | 4 |
| abstract_inverted_index.paper | 1 |
| abstract_inverted_index.pulse | 23, 43 |
| abstract_inverted_index.arrays | 16 |
| abstract_inverted_index.onchip | 28 |
| abstract_inverted_index.pulses | 31 |
| abstract_inverted_index.single | 5 |
| abstract_inverted_index.bipolar | 30 |
| abstract_inverted_index.circuit | 10 |
| abstract_inverted_index.measure | 29 |
| abstract_inverted_index.results | 18 |
| abstract_inverted_index.compared | 40 |
| abstract_inverted_index.detector | 24 |
| abstract_inverted_index.existing | 42 |
| abstract_inverted_index.presents | 2 |
| abstract_inverted_index.detection | 34, 45, 48 |
| abstract_inverted_index.improved. | 52 |
| abstract_inverted_index.precision | 49 |
| abstract_inverted_index.transient | 7 |
| abstract_inverted_index.SRAM-based | 12 |
| abstract_inverted_index.capability | 46 |
| abstract_inverted_index.detectors, | 44 |
| abstract_inverted_index.demonstrate | 19 |
| abstract_inverted_index.effectively | 51 |
| abstract_inverted_index.measurement | 9 |
| abstract_inverted_index.programmable | 14 |
| abstract_inverted_index.(FPGAs).Experimental | 17 |
| cited_by_percentile_year.max | 96 |
| cited_by_percentile_year.min | 90 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 8 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/7 |
| sustainable_development_goals[0].score | 0.6200000047683716 |
| sustainable_development_goals[0].display_name | Affordable and clean energy |
| citation_normalized_percentile.value | 0.72532699 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |