A Study of Structural and Photoluminescence for Al-Doped CdO Thin Films Article Swipe
Al-doped CdO thin films were prepared by radio frequency magnetron sputtering at different deposition time and substrate temperature. X-ray diffraction showed that the changes in the intensities of the (200), (220), and (311) planes followed a similar trend with increase in deposition time. The surface of the thin film was examined by scanning electron microscopy. Grain sizes of Al-doped CdO thin films increased significantly with increasing deposition time. The film thicknesses were 0.09, 0.12, 0.20, and 0.225 μ m for the deposition times of 1, 2, 3, and 4 h, respectively. The photoluminescence spectra of the Al-doped CdO thin films were measured at room temperature. The photoluminescence wavelength changed in the sequence, green, blue, green, and blue, with increasing deposition time, which indicates that blue light emitting films can be fabricated by adjusting the processing parameters.
Related Topics
Concepts
Photoluminescence
Thin film
Materials science
Doping
Scanning electron microscope
Sputter deposition
Deposition (geology)
Substrate (aquarium)
Analytical Chemistry (journal)
Blueshift
Optoelectronics
Sputtering
Optics
Nanotechnology
Composite material
Chemistry
Geology
Paleontology
Sediment
Chromatography
Oceanography
Physics
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1155/2016/5127348
- http://downloads.hindawi.com/journals/jspec/2016/5127348.pdf
- OA Status
- gold
- Cited By
- 7
- References
- 13
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2390615864
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W2390615864Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1155/2016/5127348Digital Object Identifier
- Title
-
A Study of Structural and Photoluminescence for Al-Doped CdO Thin FilmsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2016Year of publication
- Publication date
-
2016-01-01Full publication date if available
- Authors
-
Bong Ju Lee, Jin JeongList of authors in order
- Landing page
-
https://doi.org/10.1155/2016/5127348Publisher landing page
- PDF URL
-
https://downloads.hindawi.com/journals/jspec/2016/5127348.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
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https://downloads.hindawi.com/journals/jspec/2016/5127348.pdfDirect OA link when available
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Photoluminescence, Thin film, Materials science, Doping, Scanning electron microscope, Sputter deposition, Deposition (geology), Substrate (aquarium), Analytical Chemistry (journal), Blueshift, Optoelectronics, Sputtering, Optics, Nanotechnology, Composite material, Chemistry, Geology, Paleontology, Sediment, Chromatography, Oceanography, PhysicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
7Total citation count in OpenAlex
- Citations by year (recent)
-
2023: 1, 2022: 1, 2021: 2, 2020: 3Per-year citation counts (last 5 years)
- References (count)
-
13Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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| referenced_works | https://openalex.org/W2074327513, https://openalex.org/W2025800270, https://openalex.org/W2006743481, https://openalex.org/W2094983906, https://openalex.org/W2050663711, https://openalex.org/W2066345290, https://openalex.org/W2072825418, https://openalex.org/W2083781164, https://openalex.org/W1996775875, https://openalex.org/W2032284877, https://openalex.org/W2070784012, https://openalex.org/W2073971086, https://openalex.org/W1975848659 |
| referenced_works_count | 13 |
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| abstract_inverted_index.3, | 86 |
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| abstract_inverted_index.(200), | 29 |
| abstract_inverted_index.(220), | 30 |
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| cited_by_percentile_year.min | 89 |
| corresponding_author_ids | https://openalex.org/A5047236467 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 2 |
| corresponding_institution_ids | https://openalex.org/I152238500 |
| citation_normalized_percentile.value | 0.02664902 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |