Accurate SPICE Modeling of Poly-silicon Resistor in 40nm CMOS Technology Process for Analog Circuit Simulation Article Swipe
YOU?
·
· 2015
· Open Access
·
· DOI: https://doi.org/10.1051/matecconf/20152202023
\nIn this paper, the SPICE model of poly resistor is accurately developed based on silicon data. To describe the non-linear R-V trend, the new correlation in temperature and voltage is found in non-silicide poly-silicon resistor. A scalable model is developed on the temperature-dependent characteristics (TDC) and the temperature-dependent voltage characteristics (TDVC) from the R-V data. Besides, the parasitic capacitance between poly and substrate are extracted from real silicon structure in replacing conventional simulation data. The capacitance data are tested through using on-wafer charge-induced-injection error-free charge-based capacitance measurement (CIEF-CBCM) technique which is driven by non-overlapping clock generation circuit. All modeling test structures are designed and fabricated through using 40nm CMOS technology process. The new SPICE model of poly-silicon resistor is more accurate to silicon for analog circuit simulation.\n
Related Topics
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1051/matecconf/20152202023
- https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdf
- OA Status
- diamond
- Cited By
- 2
- References
- 11
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W1786387870
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W1786387870Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1051/matecconf/20152202023Digital Object Identifier
- Title
-
Accurate SPICE Modeling of Poly-silicon Resistor in 40nm CMOS Technology Process for Analog Circuit SimulationWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2015Year of publication
- Publication date
-
2015-01-01Full publication date if available
- Authors
-
Lijie Sun, Xiaojin Li, Yanling Shi, Ao Guo, Linlin Liu, Shaojian Hu, Shoumian Chen, Yuhang Zhao, Ganbing Shang, Jia Cheng, Lin DingList of authors in order
- Landing page
-
https://doi.org/10.1051/matecconf/20152202023Publisher landing page
- PDF URL
-
https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
diamondOpen access status per OpenAlex
- OA URL
-
https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdfDirect OA link when available
- Concepts
-
Spice, Resistor, CMOS, Materials science, Capacitance, Silicon, Electronic engineering, Wafer, Voltage, Electrical engineering, Optoelectronics, Engineering, Physics, Electrode, Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
2Total citation count in OpenAlex
- Citations by year (recent)
-
2019: 1, 2018: 1Per-year citation counts (last 5 years)
- References (count)
-
11Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W1786387870 |
|---|---|
| doi | https://doi.org/10.1051/matecconf/20152202023 |
| ids.doi | https://doi.org/10.1051/matecconf/20152202023 |
| ids.mag | 1786387870 |
| ids.openalex | https://openalex.org/W1786387870 |
| fwci | 0.16707889 |
| type | article |
| title | Accurate SPICE Modeling of Poly-silicon Resistor in 40nm CMOS Technology Process for Analog Circuit Simulation |
| biblio.issue | |
| biblio.volume | 22 |
| biblio.last_page | 02023 |
| biblio.first_page | 02023 |
| topics[0].id | https://openalex.org/T10623 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9998000264167786 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Thin-Film Transistor Technologies |
| topics[1].id | https://openalex.org/T10558 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9994999766349792 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Advancements in Semiconductor Devices and Circuit Design |
| topics[2].id | https://openalex.org/T10624 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9990000128746033 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Silicon and Solar Cell Technologies |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C2780077345 |
| concepts[0].level | 2 |
| concepts[0].score | 0.8641831874847412 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q16891888 |
| concepts[0].display_name | Spice |
| concepts[1].id | https://openalex.org/C137488568 |
| concepts[1].level | 3 |
| concepts[1].score | 0.8089079856872559 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q5321 |
| concepts[1].display_name | Resistor |
| concepts[2].id | https://openalex.org/C46362747 |
| concepts[2].level | 2 |
| concepts[2].score | 0.6769699454307556 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q173431 |
| concepts[2].display_name | CMOS |
| concepts[3].id | https://openalex.org/C192562407 |
| concepts[3].level | 0 |
| concepts[3].score | 0.6236918568611145 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[3].display_name | Materials science |
| concepts[4].id | https://openalex.org/C30066665 |
| concepts[4].level | 3 |
| concepts[4].score | 0.5517638325691223 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q164399 |
| concepts[4].display_name | Capacitance |
| concepts[5].id | https://openalex.org/C544956773 |
| concepts[5].level | 2 |
| concepts[5].score | 0.5152974128723145 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q670 |
| concepts[5].display_name | Silicon |
| concepts[6].id | https://openalex.org/C24326235 |
| concepts[6].level | 1 |
| concepts[6].score | 0.5065149068832397 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[6].display_name | Electronic engineering |
| concepts[7].id | https://openalex.org/C160671074 |
| concepts[7].level | 2 |
| concepts[7].score | 0.4874286949634552 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q267131 |
| concepts[7].display_name | Wafer |
| concepts[8].id | https://openalex.org/C165801399 |
| concepts[8].level | 2 |
| concepts[8].score | 0.4155041575431824 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q25428 |
| concepts[8].display_name | Voltage |
| concepts[9].id | https://openalex.org/C119599485 |
| concepts[9].level | 1 |
| concepts[9].score | 0.40435218811035156 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[9].display_name | Electrical engineering |
| concepts[10].id | https://openalex.org/C49040817 |
| concepts[10].level | 1 |
| concepts[10].score | 0.3989101052284241 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[10].display_name | Optoelectronics |
| concepts[11].id | https://openalex.org/C127413603 |
| concepts[11].level | 0 |
| concepts[11].score | 0.25996047258377075 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[11].display_name | Engineering |
| concepts[12].id | https://openalex.org/C121332964 |
| concepts[12].level | 0 |
| concepts[12].score | 0.10682964324951172 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[12].display_name | Physics |
| concepts[13].id | https://openalex.org/C17525397 |
| concepts[13].level | 2 |
| concepts[13].score | 0.06508806347846985 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q176140 |
| concepts[13].display_name | Electrode |
| concepts[14].id | https://openalex.org/C62520636 |
| concepts[14].level | 1 |
| concepts[14].score | 0.0 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[14].display_name | Quantum mechanics |
| keywords[0].id | https://openalex.org/keywords/spice |
| keywords[0].score | 0.8641831874847412 |
| keywords[0].display_name | Spice |
| keywords[1].id | https://openalex.org/keywords/resistor |
| keywords[1].score | 0.8089079856872559 |
| keywords[1].display_name | Resistor |
| keywords[2].id | https://openalex.org/keywords/cmos |
| keywords[2].score | 0.6769699454307556 |
| keywords[2].display_name | CMOS |
| keywords[3].id | https://openalex.org/keywords/materials-science |
| keywords[3].score | 0.6236918568611145 |
| keywords[3].display_name | Materials science |
| keywords[4].id | https://openalex.org/keywords/capacitance |
| keywords[4].score | 0.5517638325691223 |
| keywords[4].display_name | Capacitance |
| keywords[5].id | https://openalex.org/keywords/silicon |
| keywords[5].score | 0.5152974128723145 |
| keywords[5].display_name | Silicon |
| keywords[6].id | https://openalex.org/keywords/electronic-engineering |
| keywords[6].score | 0.5065149068832397 |
| keywords[6].display_name | Electronic engineering |
| keywords[7].id | https://openalex.org/keywords/wafer |
| keywords[7].score | 0.4874286949634552 |
| keywords[7].display_name | Wafer |
| keywords[8].id | https://openalex.org/keywords/voltage |
| keywords[8].score | 0.4155041575431824 |
| keywords[8].display_name | Voltage |
| keywords[9].id | https://openalex.org/keywords/electrical-engineering |
| keywords[9].score | 0.40435218811035156 |
| keywords[9].display_name | Electrical engineering |
| keywords[10].id | https://openalex.org/keywords/optoelectronics |
| keywords[10].score | 0.3989101052284241 |
| keywords[10].display_name | Optoelectronics |
| keywords[11].id | https://openalex.org/keywords/engineering |
| keywords[11].score | 0.25996047258377075 |
| keywords[11].display_name | Engineering |
| keywords[12].id | https://openalex.org/keywords/physics |
| keywords[12].score | 0.10682964324951172 |
| keywords[12].display_name | Physics |
| keywords[13].id | https://openalex.org/keywords/electrode |
| keywords[13].score | 0.06508806347846985 |
| keywords[13].display_name | Electrode |
| language | en |
| locations[0].id | doi:10.1051/matecconf/20152202023 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S4210175061 |
| locations[0].source.issn | 2261-236X, 2274-7214 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 2261-236X |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | True |
| locations[0].source.display_name | MATEC Web of Conferences |
| locations[0].source.host_organization | https://openalex.org/P4310319748 |
| locations[0].source.host_organization_name | EDP Sciences |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310319748 |
| locations[0].source.host_organization_lineage_names | EDP Sciences |
| locations[0].license | cc-by |
| locations[0].pdf_url | https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | MATEC Web of Conferences |
| locations[0].landing_page_url | https://doi.org/10.1051/matecconf/20152202023 |
| locations[1].id | pmh:oai:edpsciences.org:dkey/10.1051/matecconf/20152202023 |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4306400744 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | Springer Link (Chiba Institute of Technology) |
| locations[1].source.host_organization | https://openalex.org/I8488066 |
| locations[1].source.host_organization_name | Chiba Institute of Technology |
| locations[1].source.host_organization_lineage | https://openalex.org/I8488066 |
| locations[1].license | |
| locations[1].pdf_url | https://www.matec-conferences.org/10.1051/matecconf/20152202023/pdf |
| locations[1].version | submittedVersion |
| locations[1].raw_type | Text |
| locations[1].license_id | |
| locations[1].is_accepted | False |
| locations[1].is_published | False |
| locations[1].raw_source_name | https://doi.org/10.1051/matecconf/20152202023 |
| locations[1].landing_page_url | |
| locations[2].id | pmh:oai:doaj.org/article:607b281c3488422192ef19f3e0b8314a |
| locations[2].is_oa | True |
| locations[2].source.id | https://openalex.org/S4306401280 |
| locations[2].source.issn | |
| locations[2].source.type | repository |
| locations[2].source.is_oa | False |
| locations[2].source.issn_l | |
| locations[2].source.is_core | False |
| locations[2].source.is_in_doaj | False |
| locations[2].source.display_name | DOAJ (DOAJ: Directory of Open Access Journals) |
| locations[2].source.host_organization | |
| locations[2].source.host_organization_name | |
| locations[2].license | cc-by-sa |
| locations[2].pdf_url | |
| locations[2].version | submittedVersion |
| locations[2].raw_type | article |
| locations[2].license_id | https://openalex.org/licenses/cc-by-sa |
| locations[2].is_accepted | False |
| locations[2].is_published | False |
| locations[2].raw_source_name | MATEC Web of Conferences, Vol 22, p 02023 (2015) |
| locations[2].landing_page_url | https://doaj.org/article/607b281c3488422192ef19f3e0b8314a |
| indexed_in | crossref, doaj |
| authorships[0].author.id | https://openalex.org/A5110589546 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | Lijie Sun |
| authorships[0].countries | CN |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I66867065 |
| authorships[0].affiliations[0].raw_affiliation_string | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[0].institutions[0].id | https://openalex.org/I66867065 |
| authorships[0].institutions[0].ror | https://ror.org/02n96ep67 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I66867065 |
| authorships[0].institutions[0].country_code | CN |
| authorships[0].institutions[0].display_name | East China Normal University |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Lijie Sun |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[1].author.id | https://openalex.org/A5100633213 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-9603-8489 |
| authorships[1].author.display_name | Xiaojin Li |
| authorships[1].countries | CN |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I66867065 |
| authorships[1].affiliations[0].raw_affiliation_string | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[1].institutions[0].id | https://openalex.org/I66867065 |
| authorships[1].institutions[0].ror | https://ror.org/02n96ep67 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I66867065 |
| authorships[1].institutions[0].country_code | CN |
| authorships[1].institutions[0].display_name | East China Normal University |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Xiaojin Li |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[2].author.id | https://openalex.org/A5100983851 |
| authorships[2].author.orcid | |
| authorships[2].author.display_name | Yanling Shi |
| authorships[2].countries | CN |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I66867065 |
| authorships[2].affiliations[0].raw_affiliation_string | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[2].institutions[0].id | https://openalex.org/I66867065 |
| authorships[2].institutions[0].ror | https://ror.org/02n96ep67 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I66867065 |
| authorships[2].institutions[0].country_code | CN |
| authorships[2].institutions[0].display_name | East China Normal University |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Yanling Shi |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | School of Information Science and Technology, East China Normal University, Shanghai, China#TAB# |
| authorships[3].author.id | https://openalex.org/A5101943490 |
| authorships[3].author.orcid | https://orcid.org/0000-0002-9698-8425 |
| authorships[3].author.display_name | Ao Guo |
| authorships[3].countries | CN |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I4210089783 |
| authorships[3].affiliations[0].raw_affiliation_string | Shanghai IC R&D Center, Shanghai, China |
| authorships[3].institutions[0].id | https://openalex.org/I4210089783 |
| authorships[3].institutions[0].ror | https://ror.org/007wz9933 |
| authorships[3].institutions[0].type | other |
| authorships[3].institutions[0].lineage | https://openalex.org/I4210089783 |
| authorships[3].institutions[0].country_code | CN |
| authorships[3].institutions[0].display_name | Shanghai Medical Information Center |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Ao Guo |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | Shanghai IC R&D Center, Shanghai, China |
| authorships[4].author.id | https://openalex.org/A5100409387 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-1058-4551 |
| authorships[4].author.display_name | Linlin Liu |
| authorships[4].countries | CN |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I4210089783 |
| authorships[4].affiliations[0].raw_affiliation_string | Shanghai IC R&D Center, Shanghai, China |
| authorships[4].institutions[0].id | https://openalex.org/I4210089783 |
| authorships[4].institutions[0].ror | https://ror.org/007wz9933 |
| authorships[4].institutions[0].type | other |
| authorships[4].institutions[0].lineage | https://openalex.org/I4210089783 |
| authorships[4].institutions[0].country_code | CN |
| authorships[4].institutions[0].display_name | Shanghai Medical Information Center |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Linlin Liu |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | Shanghai IC R&D Center, Shanghai, China |
| authorships[5].author.id | https://openalex.org/A5108824213 |
| authorships[5].author.orcid | |
| authorships[5].author.display_name | Shaojian Hu |
| authorships[5].countries | CN |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I4210089783 |
| authorships[5].affiliations[0].raw_affiliation_string | Shanghai IC R&D Center, Shanghai, China |
| authorships[5].institutions[0].id | https://openalex.org/I4210089783 |
| authorships[5].institutions[0].ror | https://ror.org/007wz9933 |
| authorships[5].institutions[0].type | other |
| authorships[5].institutions[0].lineage | https://openalex.org/I4210089783 |
| authorships[5].institutions[0].country_code | CN |
| authorships[5].institutions[0].display_name | Shanghai Medical Information Center |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Shaojian Hu |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | Shanghai IC R&D Center, Shanghai, China |
| authorships[6].author.id | https://openalex.org/A5073992621 |
| authorships[6].author.orcid | |
| authorships[6].author.display_name | Shoumian Chen |
| authorships[6].countries | CN |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I4210089783 |
| authorships[6].affiliations[0].raw_affiliation_string | Shanghai IC R&D Center, Shanghai, China |
| authorships[6].institutions[0].id | https://openalex.org/I4210089783 |
| authorships[6].institutions[0].ror | https://ror.org/007wz9933 |
| authorships[6].institutions[0].type | other |
| authorships[6].institutions[0].lineage | https://openalex.org/I4210089783 |
| authorships[6].institutions[0].country_code | CN |
| authorships[6].institutions[0].display_name | Shanghai Medical Information Center |
| authorships[6].author_position | middle |
| authorships[6].raw_author_name | Shoumian Chen |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | Shanghai IC R&D Center, Shanghai, China |
| authorships[7].author.id | https://openalex.org/A5101756802 |
| authorships[7].author.orcid | https://orcid.org/0009-0000-9976-3478 |
| authorships[7].author.display_name | Yuhang Zhao |
| authorships[7].countries | CN |
| authorships[7].affiliations[0].institution_ids | https://openalex.org/I4210089783 |
| authorships[7].affiliations[0].raw_affiliation_string | Shanghai IC R&D Center, Shanghai, China |
| authorships[7].institutions[0].id | https://openalex.org/I4210089783 |
| authorships[7].institutions[0].ror | https://ror.org/007wz9933 |
| authorships[7].institutions[0].type | other |
| authorships[7].institutions[0].lineage | https://openalex.org/I4210089783 |
| authorships[7].institutions[0].country_code | CN |
| authorships[7].institutions[0].display_name | Shanghai Medical Information Center |
| authorships[7].author_position | middle |
| authorships[7].raw_author_name | Yuhang Zhao |
| authorships[7].is_corresponding | False |
| authorships[7].raw_affiliation_strings | Shanghai IC R&D Center, Shanghai, China |
| authorships[8].author.id | https://openalex.org/A5035951660 |
| authorships[8].author.orcid | |
| authorships[8].author.display_name | Ganbing Shang |
| authorships[8].countries | CN |
| authorships[8].affiliations[0].institution_ids | https://openalex.org/I4210147014 |
| authorships[8].affiliations[0].raw_affiliation_string | Huali Microelectronics Corporation, Shanghai, China |
| authorships[8].institutions[0].id | https://openalex.org/I4210147014 |
| authorships[8].institutions[0].ror | https://ror.org/054deg252 |
| authorships[8].institutions[0].type | company |
| authorships[8].institutions[0].lineage | https://openalex.org/I4210147014 |
| authorships[8].institutions[0].country_code | CN |
| authorships[8].institutions[0].display_name | Shanghai Huali Microelectronics (China) |
| authorships[8].author_position | middle |
| authorships[8].raw_author_name | Ganbing Shang |
| authorships[8].is_corresponding | False |
| authorships[8].raw_affiliation_strings | Huali Microelectronics Corporation, Shanghai, China |
| authorships[9].author.id | https://openalex.org/A5037173390 |
| authorships[9].author.orcid | https://orcid.org/0000-0002-2557-0072 |
| authorships[9].author.display_name | Jia Cheng |
| authorships[9].countries | CN |
| authorships[9].affiliations[0].institution_ids | https://openalex.org/I4210147014 |
| authorships[9].affiliations[0].raw_affiliation_string | Huali Microelectronics Corporation, Shanghai, China |
| authorships[9].institutions[0].id | https://openalex.org/I4210147014 |
| authorships[9].institutions[0].ror | https://ror.org/054deg252 |
| authorships[9].institutions[0].type | company |
| authorships[9].institutions[0].lineage | https://openalex.org/I4210147014 |
| authorships[9].institutions[0].country_code | CN |
| authorships[9].institutions[0].display_name | Shanghai Huali Microelectronics (China) |
| authorships[9].author_position | middle |
| authorships[9].raw_author_name | Jia Cheng |
| authorships[9].is_corresponding | False |
| authorships[9].raw_affiliation_strings | Huali Microelectronics Corporation, Shanghai, China |
| authorships[10].author.id | https://openalex.org/A5003317656 |
| authorships[10].author.orcid | https://orcid.org/0000-0001-5381-3484 |
| authorships[10].author.display_name | Lin Ding |
| authorships[10].countries | CN |
| authorships[10].affiliations[0].institution_ids | https://openalex.org/I4210147014 |
| authorships[10].affiliations[0].raw_affiliation_string | Huali Microelectronics Corporation, Shanghai, China |
| authorships[10].institutions[0].id | https://openalex.org/I4210147014 |
| authorships[10].institutions[0].ror | https://ror.org/054deg252 |
| authorships[10].institutions[0].type | company |
| authorships[10].institutions[0].lineage | https://openalex.org/I4210147014 |
| authorships[10].institutions[0].country_code | CN |
| authorships[10].institutions[0].display_name | Shanghai Huali Microelectronics (China) |
| authorships[10].author_position | last |
| authorships[10].raw_author_name | Lin Ding |
| authorships[10].is_corresponding | False |
| authorships[10].raw_affiliation_strings | Huali Microelectronics Corporation, Shanghai, China |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdf |
| open_access.oa_status | diamond |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Accurate SPICE Modeling of Poly-silicon Resistor in 40nm CMOS Technology Process for Analog Circuit Simulation |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T10623 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9998000264167786 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Thin-Film Transistor Technologies |
| related_works | https://openalex.org/W2204879205, https://openalex.org/W2096437374, https://openalex.org/W1943174035, https://openalex.org/W1928481607, https://openalex.org/W3135165657, https://openalex.org/W1485582195, https://openalex.org/W57337972, https://openalex.org/W2313216219, https://openalex.org/W1561306903, https://openalex.org/W2368486130 |
| cited_by_count | 2 |
| counts_by_year[0].year | 2019 |
| counts_by_year[0].cited_by_count | 1 |
| counts_by_year[1].year | 2018 |
| counts_by_year[1].cited_by_count | 1 |
| locations_count | 3 |
| best_oa_location.id | doi:10.1051/matecconf/20152202023 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S4210175061 |
| best_oa_location.source.issn | 2261-236X, 2274-7214 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 2261-236X |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | True |
| best_oa_location.source.display_name | MATEC Web of Conferences |
| best_oa_location.source.host_organization | https://openalex.org/P4310319748 |
| best_oa_location.source.host_organization_name | EDP Sciences |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310319748 |
| best_oa_location.source.host_organization_lineage_names | EDP Sciences |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | MATEC Web of Conferences |
| best_oa_location.landing_page_url | https://doi.org/10.1051/matecconf/20152202023 |
| primary_location.id | doi:10.1051/matecconf/20152202023 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S4210175061 |
| primary_location.source.issn | 2261-236X, 2274-7214 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 2261-236X |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | True |
| primary_location.source.display_name | MATEC Web of Conferences |
| primary_location.source.host_organization | https://openalex.org/P4310319748 |
| primary_location.source.host_organization_name | EDP Sciences |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310319748 |
| primary_location.source.host_organization_lineage_names | EDP Sciences |
| primary_location.license | cc-by |
| primary_location.pdf_url | https://www.matec-conferences.org/articles/matecconf/pdf/2015/03/matecconf_iceta2015_02023.pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | MATEC Web of Conferences |
| primary_location.landing_page_url | https://doi.org/10.1051/matecconf/20152202023 |
| publication_date | 2015-01-01 |
| publication_year | 2015 |
| referenced_works | https://openalex.org/W2099874867, https://openalex.org/W2134344835, https://openalex.org/W2114685908, https://openalex.org/W1991239799, https://openalex.org/W2161615290, https://openalex.org/W1999237447, https://openalex.org/W2316195353, https://openalex.org/W2127662855, https://openalex.org/W2102397945, https://openalex.org/W1494995054, https://openalex.org/W1934709003 |
| referenced_works_count | 11 |
| abstract_inverted_index.A | 35 |
| abstract_inverted_index.To | 16 |
| abstract_inverted_index.by | 92 |
| abstract_inverted_index.in | 25, 31, 69 |
| abstract_inverted_index.is | 9, 29, 38, 90, 118 |
| abstract_inverted_index.of | 6, 115 |
| abstract_inverted_index.on | 13, 40 |
| abstract_inverted_index.to | 121 |
| abstract_inverted_index.All | 97 |
| abstract_inverted_index.R-V | 20, 53 |
| abstract_inverted_index.The | 74, 111 |
| abstract_inverted_index.and | 27, 45, 61, 103 |
| abstract_inverted_index.are | 63, 77, 101 |
| abstract_inverted_index.for | 123 |
| abstract_inverted_index.new | 23, 112 |
| abstract_inverted_index.the | 3, 18, 22, 41, 46, 52, 56 |
| abstract_inverted_index.40nm | 107 |
| abstract_inverted_index.CMOS | 108 |
| abstract_inverted_index.\nIn | 0 |
| abstract_inverted_index.data | 76 |
| abstract_inverted_index.from | 51, 65 |
| abstract_inverted_index.more | 119 |
| abstract_inverted_index.poly | 7, 60 |
| abstract_inverted_index.real | 66 |
| abstract_inverted_index.test | 99 |
| abstract_inverted_index.this | 1 |
| abstract_inverted_index.(TDC) | 44 |
| abstract_inverted_index.SPICE | 4, 113 |
| abstract_inverted_index.based | 12 |
| abstract_inverted_index.clock | 94 |
| abstract_inverted_index.data. | 15, 54, 73 |
| abstract_inverted_index.found | 30 |
| abstract_inverted_index.model | 5, 37, 114 |
| abstract_inverted_index.using | 80, 106 |
| abstract_inverted_index.which | 89 |
| abstract_inverted_index.(TDVC) | 50 |
| abstract_inverted_index.analog | 124 |
| abstract_inverted_index.driven | 91 |
| abstract_inverted_index.paper, | 2 |
| abstract_inverted_index.tested | 78 |
| abstract_inverted_index.trend, | 21 |
| abstract_inverted_index.between | 59 |
| abstract_inverted_index.circuit | 125 |
| abstract_inverted_index.silicon | 14, 67, 122 |
| abstract_inverted_index.through | 79, 105 |
| abstract_inverted_index.voltage | 28, 48 |
| abstract_inverted_index.Besides, | 55 |
| abstract_inverted_index.accurate | 120 |
| abstract_inverted_index.circuit. | 96 |
| abstract_inverted_index.describe | 17 |
| abstract_inverted_index.designed | 102 |
| abstract_inverted_index.modeling | 98 |
| abstract_inverted_index.on-wafer | 81 |
| abstract_inverted_index.process. | 110 |
| abstract_inverted_index.resistor | 8, 117 |
| abstract_inverted_index.scalable | 36 |
| abstract_inverted_index.developed | 11, 39 |
| abstract_inverted_index.extracted | 64 |
| abstract_inverted_index.parasitic | 57 |
| abstract_inverted_index.replacing | 70 |
| abstract_inverted_index.resistor. | 34 |
| abstract_inverted_index.structure | 68 |
| abstract_inverted_index.substrate | 62 |
| abstract_inverted_index.technique | 88 |
| abstract_inverted_index.accurately | 10 |
| abstract_inverted_index.error-free | 83 |
| abstract_inverted_index.fabricated | 104 |
| abstract_inverted_index.generation | 95 |
| abstract_inverted_index.non-linear | 19 |
| abstract_inverted_index.simulation | 72 |
| abstract_inverted_index.structures | 100 |
| abstract_inverted_index.technology | 109 |
| abstract_inverted_index.(CIEF-CBCM) | 87 |
| abstract_inverted_index.capacitance | 58, 75, 85 |
| abstract_inverted_index.correlation | 24 |
| abstract_inverted_index.measurement | 86 |
| abstract_inverted_index.temperature | 26 |
| abstract_inverted_index.charge-based | 84 |
| abstract_inverted_index.conventional | 71 |
| abstract_inverted_index.non-silicide | 32 |
| abstract_inverted_index.poly-silicon | 33, 116 |
| abstract_inverted_index.simulation.\n | 126 |
| abstract_inverted_index.characteristics | 43, 49 |
| abstract_inverted_index.non-overlapping | 93 |
| abstract_inverted_index.temperature-dependent | 42, 47 |
| abstract_inverted_index.charge-induced-injection | 82 |
| cited_by_percentile_year.max | 94 |
| cited_by_percentile_year.min | 90 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 11 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/7 |
| sustainable_development_goals[0].score | 0.7200000286102295 |
| sustainable_development_goals[0].display_name | Affordable and clean energy |
| citation_normalized_percentile.value | 0.57930004 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |