An integrated method for full-field stress measurement via coupled in situ digital image correlation and electron backscatter diffraction Article Swipe
Xinru Ma
,
Yu Jian Cheng
,
Xiaojun Yan
,
Weifeng Wan
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.1088/1361-6501/ae05bb
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.1088/1361-6501/ae05bb
A novel method is proposed to measure the stress field on the surface of polycrystalline samples by combining in situ digital image correlation (DIC) and electron backscatter diffraction (EBSD). DIC provides full-field strain measurements in two dimensions, both at peak load (total strain, ϵ t ) and in the unloaded state (plastic strain, ϵ p ), during a fatigue test with a stress ratio of zero. The elastic strain field, obtained from the difference between ϵ t and ϵ p , can be used to estimate the stress field by applying a rotated stiffness matrix, in which the rotation matrices are derived from the crystallographic orientations identified by EBSD. The method is validated using a crystal plasticity finite element model subjected to representative loading and boundary conditions at both the edge notch and the fatigue crack tip in three-point bend tests. This approach enables accurate, full-field, and orientation-resolved stress analysis, offering a powerful tool for meso-scale mechanical characterisation.
Related Topics
Concepts
No concepts available.
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1088/1361-6501/ae05bb
- OA Status
- hybrid
- References
- 21
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4414106257
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4414106257Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1088/1361-6501/ae05bbDigital Object Identifier
- Title
-
An integrated method for full-field stress measurement via coupled in situ digital image correlation and electron backscatter diffractionWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2025Year of publication
- Publication date
-
2025-09-10Full publication date if available
- Authors
-
Xinru Ma, Yu Jian Cheng, Xiaojun Yan, Weifeng WanList of authors in order
- Landing page
-
https://doi.org/10.1088/1361-6501/ae05bbPublisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.1088/1361-6501/ae05bbDirect OA link when available
- Cited by
-
0Total citation count in OpenAlex
- References (count)
-
21Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4414106257 |
|---|---|
| doi | https://doi.org/10.1088/1361-6501/ae05bb |
| ids.doi | https://doi.org/10.1088/1361-6501/ae05bb |
| ids.openalex | https://openalex.org/W4414106257 |
| fwci | 0.0 |
| type | article |
| title | An integrated method for full-field stress measurement via coupled in situ digital image correlation and electron backscatter diffraction |
| biblio.issue | 11 |
| biblio.volume | 36 |
| biblio.last_page | 116012 |
| biblio.first_page | 116012 |
| topics[0].id | https://openalex.org/T12169 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9997000098228455 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2210 |
| topics[0].subfield.display_name | Mechanical Engineering |
| topics[0].display_name | Non-Destructive Testing Techniques |
| topics[1].id | https://openalex.org/T10638 |
| topics[1].field.id | https://openalex.org/fields/17 |
| topics[1].field.display_name | Computer Science |
| topics[1].score | 0.9991000294685364 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/1707 |
| topics[1].subfield.display_name | Computer Vision and Pattern Recognition |
| topics[1].display_name | Optical measurement and interference techniques |
| topics[2].id | https://openalex.org/T10534 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9969000220298767 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2205 |
| topics[2].subfield.display_name | Civil and Structural Engineering |
| topics[2].display_name | Structural Health Monitoring Techniques |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| language | en |
| locations[0].id | doi:10.1088/1361-6501/ae05bb |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S109302362 |
| locations[0].source.issn | 0957-0233, 1361-6501 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 0957-0233 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | Measurement Science and Technology |
| locations[0].source.host_organization | https://openalex.org/P4310320083 |
| locations[0].source.host_organization_name | IOP Publishing |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310320083 |
| locations[0].license | cc-by-nc-nd |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by-nc-nd |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Measurement Science and Technology |
| locations[0].landing_page_url | https://doi.org/10.1088/1361-6501/ae05bb |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5100573552 |
| authorships[0].author.orcid | https://orcid.org/0009-0000-9628-9600 |
| authorships[0].author.display_name | Xinru Ma |
| authorships[0].countries | CN |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I82880672 |
| authorships[0].affiliations[0].raw_affiliation_string | Beihang University, Beihang University, Beijing, 100091, CHINA |
| authorships[0].institutions[0].id | https://openalex.org/I82880672 |
| authorships[0].institutions[0].ror | https://ror.org/00wk2mp56 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I82880672 |
| authorships[0].institutions[0].country_code | CN |
| authorships[0].institutions[0].display_name | Beihang University |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Xinru Ma |
| authorships[0].is_corresponding | True |
| authorships[0].raw_affiliation_strings | Beihang University, Beihang University, Beijing, 100091, CHINA |
| authorships[1].author.id | https://openalex.org/A5056880874 |
| authorships[1].author.orcid | https://orcid.org/0000-0003-1075-4167 |
| authorships[1].author.display_name | Yu Jian Cheng |
| authorships[1].countries | CN |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I82880672 |
| authorships[1].affiliations[0].raw_affiliation_string | Beihang University, Beihang University, Beijing, 100091, CHINA |
| authorships[1].institutions[0].id | https://openalex.org/I82880672 |
| authorships[1].institutions[0].ror | https://ror.org/00wk2mp56 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I82880672 |
| authorships[1].institutions[0].country_code | CN |
| authorships[1].institutions[0].display_name | Beihang University |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Yu Cheng |
| authorships[1].is_corresponding | True |
| authorships[1].raw_affiliation_strings | Beihang University, Beihang University, Beijing, 100091, CHINA |
| authorships[2].author.id | https://openalex.org/A5022586564 |
| authorships[2].author.orcid | https://orcid.org/0000-0003-0257-0157 |
| authorships[2].author.display_name | Xiaojun Yan |
| authorships[2].countries | CN |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I82880672 |
| authorships[2].affiliations[0].raw_affiliation_string | School of Energy and Power Engineering, Beihang University, Beijing 100191, Beijing, Beijing, 100083, CHINA |
| authorships[2].institutions[0].id | https://openalex.org/I82880672 |
| authorships[2].institutions[0].ror | https://ror.org/00wk2mp56 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I82880672 |
| authorships[2].institutions[0].country_code | CN |
| authorships[2].institutions[0].display_name | Beihang University |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Xiaojun Yan |
| authorships[2].is_corresponding | True |
| authorships[2].raw_affiliation_strings | School of Energy and Power Engineering, Beihang University, Beijing 100191, Beijing, Beijing, 100083, CHINA |
| authorships[3].author.id | https://openalex.org/A5063689847 |
| authorships[3].author.orcid | https://orcid.org/0000-0001-6119-1961 |
| authorships[3].author.display_name | Weifeng Wan |
| authorships[3].countries | CN |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I82880672 |
| authorships[3].affiliations[0].raw_affiliation_string | Beihang University, Beihang University, Beijing, 100091, CHINA |
| authorships[3].institutions[0].id | https://openalex.org/I82880672 |
| authorships[3].institutions[0].ror | https://ror.org/00wk2mp56 |
| authorships[3].institutions[0].type | education |
| authorships[3].institutions[0].lineage | https://openalex.org/I82880672 |
| authorships[3].institutions[0].country_code | CN |
| authorships[3].institutions[0].display_name | Beihang University |
| authorships[3].author_position | last |
| authorships[3].raw_author_name | Weifeng Wan |
| authorships[3].is_corresponding | True |
| authorships[3].raw_affiliation_strings | Beihang University, Beihang University, Beijing, 100091, CHINA |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.1088/1361-6501/ae05bb |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | An integrated method for full-field stress measurement via coupled in situ digital image correlation and electron backscatter diffraction |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-28T23:10:37.245301 |
| primary_topic.id | https://openalex.org/T12169 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9997000098228455 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2210 |
| primary_topic.subfield.display_name | Mechanical Engineering |
| primary_topic.display_name | Non-Destructive Testing Techniques |
| related_works | https://openalex.org/W3109474150, https://openalex.org/W3037703115, https://openalex.org/W2072405901, https://openalex.org/W2372440534, https://openalex.org/W2518029989, https://openalex.org/W4411198777, https://openalex.org/W2153077083, https://openalex.org/W2349230009, https://openalex.org/W3135117605, https://openalex.org/W1973828396 |
| cited_by_count | 0 |
| locations_count | 1 |
| best_oa_location.id | doi:10.1088/1361-6501/ae05bb |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S109302362 |
| best_oa_location.source.issn | 0957-0233, 1361-6501 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 0957-0233 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | Measurement Science and Technology |
| best_oa_location.source.host_organization | https://openalex.org/P4310320083 |
| best_oa_location.source.host_organization_name | IOP Publishing |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310320083 |
| best_oa_location.license | cc-by-nc-nd |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Measurement Science and Technology |
| best_oa_location.landing_page_url | https://doi.org/10.1088/1361-6501/ae05bb |
| primary_location.id | doi:10.1088/1361-6501/ae05bb |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S109302362 |
| primary_location.source.issn | 0957-0233, 1361-6501 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 0957-0233 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | Measurement Science and Technology |
| primary_location.source.host_organization | https://openalex.org/P4310320083 |
| primary_location.source.host_organization_name | IOP Publishing |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310320083 |
| primary_location.license | cc-by-nc-nd |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Measurement Science and Technology |
| primary_location.landing_page_url | https://doi.org/10.1088/1361-6501/ae05bb |
| publication_date | 2025-09-10 |
| publication_year | 2025 |
| referenced_works | https://openalex.org/W2081887802, https://openalex.org/W2021745452, https://openalex.org/W2050756523, https://openalex.org/W2051688863, https://openalex.org/W1896929487, https://openalex.org/W2626423327, https://openalex.org/W2884349737, https://openalex.org/W4403607271, https://openalex.org/W1996075847, https://openalex.org/W1772740084, https://openalex.org/W3194835479, https://openalex.org/W2897137984, https://openalex.org/W3097662930, https://openalex.org/W2063509315, https://openalex.org/W4220946567, https://openalex.org/W4405318492, https://openalex.org/W2023701915, https://openalex.org/W2062465444, https://openalex.org/W1997094317, https://openalex.org/W2064208416, https://openalex.org/W2027082851 |
| referenced_works_count | 21 |
| abstract_inverted_index.) | 46 |
| abstract_inverted_index., | 81 |
| abstract_inverted_index.A | 1 |
| abstract_inverted_index.a | 58, 62, 92, 115, 152 |
| abstract_inverted_index.p | 55, 80 |
| abstract_inverted_index.t | 45, 77 |
| abstract_inverted_index.), | 56 |
| abstract_inverted_index.at | 39, 128 |
| abstract_inverted_index.be | 83 |
| abstract_inverted_index.by | 17, 90, 108 |
| abstract_inverted_index.in | 19, 35, 48, 96, 138 |
| abstract_inverted_index.is | 4, 112 |
| abstract_inverted_index.of | 14, 65 |
| abstract_inverted_index.on | 11 |
| abstract_inverted_index.to | 6, 85, 122 |
| abstract_inverted_index.ϵ | 44, 54, 76, 79 |
| abstract_inverted_index.DIC | 30 |
| abstract_inverted_index.The | 67, 110 |
| abstract_inverted_index.and | 25, 47, 78, 125, 133, 147 |
| abstract_inverted_index.are | 101 |
| abstract_inverted_index.can | 82 |
| abstract_inverted_index.for | 155 |
| abstract_inverted_index.the | 8, 12, 49, 73, 87, 98, 104, 130, 134 |
| abstract_inverted_index.tip | 137 |
| abstract_inverted_index.two | 36 |
| abstract_inverted_index.This | 142 |
| abstract_inverted_index.bend | 140 |
| abstract_inverted_index.both | 38, 129 |
| abstract_inverted_index.edge | 131 |
| abstract_inverted_index.from | 72, 103 |
| abstract_inverted_index.load | 41 |
| abstract_inverted_index.peak | 40 |
| abstract_inverted_index.situ | 20 |
| abstract_inverted_index.test | 60 |
| abstract_inverted_index.tool | 154 |
| abstract_inverted_index.used | 84 |
| abstract_inverted_index.with | 61 |
| abstract_inverted_index.(DIC) | 24 |
| abstract_inverted_index.EBSD. | 109 |
| abstract_inverted_index.crack | 136 |
| abstract_inverted_index.field | 10, 89 |
| abstract_inverted_index.image | 22 |
| abstract_inverted_index.model | 120 |
| abstract_inverted_index.notch | 132 |
| abstract_inverted_index.novel | 2 |
| abstract_inverted_index.ratio | 64 |
| abstract_inverted_index.state | 51 |
| abstract_inverted_index.using | 114 |
| abstract_inverted_index.which | 97 |
| abstract_inverted_index.zero. | 66 |
| abstract_inverted_index.(total | 42 |
| abstract_inverted_index.during | 57 |
| abstract_inverted_index.field, | 70 |
| abstract_inverted_index.finite | 118 |
| abstract_inverted_index.method | 3, 111 |
| abstract_inverted_index.strain | 33, 69 |
| abstract_inverted_index.stress | 9, 63, 88, 149 |
| abstract_inverted_index.tests. | 141 |
| abstract_inverted_index.(EBSD). | 29 |
| abstract_inverted_index.between | 75 |
| abstract_inverted_index.crystal | 116 |
| abstract_inverted_index.derived | 102 |
| abstract_inverted_index.digital | 21 |
| abstract_inverted_index.elastic | 68 |
| abstract_inverted_index.element | 119 |
| abstract_inverted_index.enables | 144 |
| abstract_inverted_index.fatigue | 59, 135 |
| abstract_inverted_index.loading | 124 |
| abstract_inverted_index.matrix, | 95 |
| abstract_inverted_index.measure | 7 |
| abstract_inverted_index.rotated | 93 |
| abstract_inverted_index.samples | 16 |
| abstract_inverted_index.strain, | 43, 53 |
| abstract_inverted_index.surface | 13 |
| abstract_inverted_index.(plastic | 52 |
| abstract_inverted_index.Abstract | 0 |
| abstract_inverted_index.applying | 91 |
| abstract_inverted_index.approach | 143 |
| abstract_inverted_index.boundary | 126 |
| abstract_inverted_index.electron | 26 |
| abstract_inverted_index.estimate | 86 |
| abstract_inverted_index.matrices | 100 |
| abstract_inverted_index.obtained | 71 |
| abstract_inverted_index.offering | 151 |
| abstract_inverted_index.powerful | 153 |
| abstract_inverted_index.proposed | 5 |
| abstract_inverted_index.provides | 31 |
| abstract_inverted_index.rotation | 99 |
| abstract_inverted_index.unloaded | 50 |
| abstract_inverted_index.accurate, | 145 |
| abstract_inverted_index.analysis, | 150 |
| abstract_inverted_index.combining | 18 |
| abstract_inverted_index.stiffness | 94 |
| abstract_inverted_index.subjected | 121 |
| abstract_inverted_index.validated | 113 |
| abstract_inverted_index.conditions | 127 |
| abstract_inverted_index.difference | 74 |
| abstract_inverted_index.full-field | 32 |
| abstract_inverted_index.identified | 107 |
| abstract_inverted_index.mechanical | 157 |
| abstract_inverted_index.meso-scale | 156 |
| abstract_inverted_index.plasticity | 117 |
| abstract_inverted_index.backscatter | 27 |
| abstract_inverted_index.correlation | 23 |
| abstract_inverted_index.diffraction | 28 |
| abstract_inverted_index.dimensions, | 37 |
| abstract_inverted_index.full-field, | 146 |
| abstract_inverted_index.three-point | 139 |
| abstract_inverted_index.measurements | 34 |
| abstract_inverted_index.orientations | 106 |
| abstract_inverted_index.representative | 123 |
| abstract_inverted_index.polycrystalline | 15 |
| abstract_inverted_index.crystallographic | 105 |
| abstract_inverted_index.characterisation. | 158 |
| abstract_inverted_index.orientation-resolved | 148 |
| cited_by_percentile_year | |
| corresponding_author_ids | https://openalex.org/A5100573552, https://openalex.org/A5063689847, https://openalex.org/A5022586564, https://openalex.org/A5056880874 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 4 |
| corresponding_institution_ids | https://openalex.org/I82880672 |
| citation_normalized_percentile.value | 0.4719404 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |