Bi 2 O 2 Se-Based Monolithic Floating-Gate Nonvolatile Memory with Enhanced Charge Retention and Switching Performance Article Swipe
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· 2025
· Open Access
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· DOI: https://doi.org/10.1021/acsnano.5c14437
The continuous scaling of conventional floating-gate memories faces major challenges due to charge leakage and complex multilayer architectures. Here, we report a monolithic nonvolatile memory (NVM) device constructed using a single 2D material, Bi2O2Se, that integrates channel, charge storage, and tunneling functions within the same material system. Upon UV-ozone treatment, semiconducting Bi2O2Se (s-BOS) forms a conformal and crystalline β-Bi2SeO5 shell. Subsequent thermal annealing introduces selenium vacancies into the core, converting it to metallic Bi2O2Se (m-BOS), which serves as a floating-gate capable of efficient charge trapping, while the crystalline BOS oxide shell provides robust tunneling insulation and suppresses leakage. This monolithic structure integrates channel (s-BOS), storage (m-BOS), and tunneling functions (BOS oxide) within a single material system. The devices exhibit a large memory window, a high charge storage density (∼5 × 1013 cm-2), and a current ON/OFF ratio exceeding 108. They also show fast programming/erasing with ±12 V, 100 ms pulses, robust endurance over 2000 cycles, and charge retention exceeding 104 seconds. Compared with other 2D NVMs employing separate materials for each functional layer, this single-material platform enables simplified fabrication and improved scalability in the 2D memory device design.
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1021/acsnano.5c14437
- OA Status
- hybrid
- References
- 45
- OpenAlex ID
- https://openalex.org/W4416295571
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4416295571Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1021/acsnano.5c14437Digital Object Identifier
- Title
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Bi 2 O 2 Se-Based Monolithic Floating-Gate Nonvolatile Memory with Enhanced Charge Retention and Switching PerformanceWork title
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2025Year of publication
- Publication date
-
2025-11-17Full publication date if available
- Authors
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Chi-Chun Cheng, H.C. Chien, Tai‐Ting Lee, Huynh-Uyen-Phuong Nguyen, Yung‐Chang Lin, Chang-Hong Shen, Yu‐Lun Chueh, M. Y. ChouList of authors in order
- Landing page
-
https://doi.org/10.1021/acsnano.5c14437Publisher landing page
- Open access
-
YesWhether a free full text is available
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-
hybridOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.1021/acsnano.5c14437Direct OA link when available
- Cited by
-
0Total citation count in OpenAlex
- References (count)
-
45Number of works referenced by this work
Full payload
| id | https://openalex.org/W4416295571 |
|---|---|
| doi | https://doi.org/10.1021/acsnano.5c14437 |
| ids.doi | https://doi.org/10.1021/acsnano.5c14437 |
| ids.pmid | https://pubmed.ncbi.nlm.nih.gov/41247341 |
| ids.openalex | https://openalex.org/W4416295571 |
| fwci | |
| type | article |
| title | Bi 2 O 2 Se-Based Monolithic Floating-Gate Nonvolatile Memory with Enhanced Charge Retention and Switching Performance |
| biblio.issue | 47 |
| biblio.volume | 19 |
| biblio.last_page | 40505 |
| biblio.first_page | 40497 |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| language | en |
| locations[0].id | doi:10.1021/acsnano.5c14437 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S145476921 |
| locations[0].source.issn | 1936-0851, 1936-086X |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 1936-0851 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | ACS Nano |
| locations[0].source.host_organization | https://openalex.org/P4310320006 |
| locations[0].source.host_organization_name | American Chemical Society |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310320006 |
| locations[0].source.host_organization_lineage_names | American Chemical Society |
| locations[0].license | cc-by |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | ACS Nano |
| locations[0].landing_page_url | https://doi.org/10.1021/acsnano.5c14437 |
| locations[1].id | pmid:41247341 |
| locations[1].is_oa | False |
| locations[1].source.id | https://openalex.org/S4306525036 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | PubMed |
| locations[1].source.host_organization | https://openalex.org/I1299303238 |
| locations[1].source.host_organization_name | National Institutes of Health |
| locations[1].source.host_organization_lineage | https://openalex.org/I1299303238 |
| locations[1].license | |
| locations[1].pdf_url | |
| locations[1].version | publishedVersion |
| locations[1].raw_type | |
| locations[1].license_id | |
| locations[1].is_accepted | True |
| locations[1].is_published | True |
| locations[1].raw_source_name | ACS nano |
| locations[1].landing_page_url | https://pubmed.ncbi.nlm.nih.gov/41247341 |
| indexed_in | crossref, pubmed |
| authorships[0].author.id | https://openalex.org/A5017017635 |
| authorships[0].author.orcid | https://orcid.org/0009-0002-9570-9858 |
| authorships[0].author.display_name | Chi-Chun Cheng |
| authorships[0].countries | TW |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I25846049 |
| authorships[0].affiliations[0].raw_affiliation_string | Department of Electrical Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[0].institutions[0].id | https://openalex.org/I25846049 |
| authorships[0].institutions[0].ror | https://ror.org/00zdnkx70 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I25846049 |
| authorships[0].institutions[0].country_code | TW |
| authorships[0].institutions[0].display_name | National Tsing Hua University |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Chi-Chun Cheng |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | Department of Electrical Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[1].author.id | https://openalex.org/A5103506613 |
| authorships[1].author.orcid | |
| authorships[1].author.display_name | H.C. Chien |
| authorships[1].countries | TW |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I25846049 |
| authorships[1].affiliations[0].raw_affiliation_string | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[1].institutions[0].id | https://openalex.org/I25846049 |
| authorships[1].institutions[0].ror | https://ror.org/00zdnkx70 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I25846049 |
| authorships[1].institutions[0].country_code | TW |
| authorships[1].institutions[0].display_name | National Tsing Hua University |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Hsing-Chien Chien |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[2].author.id | https://openalex.org/A5087875610 |
| authorships[2].author.orcid | |
| authorships[2].author.display_name | Tai‐Ting Lee |
| authorships[2].countries | TW |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I16733864 |
| authorships[2].affiliations[0].raw_affiliation_string | Department of Physics, National Taiwan University, Taipei 10617, Taiwan |
| authorships[2].affiliations[1].institution_ids | https://openalex.org/I4210135784 |
| authorships[2].affiliations[1].raw_affiliation_string | Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan |
| authorships[2].institutions[0].id | https://openalex.org/I4210135784 |
| authorships[2].institutions[0].ror | https://ror.org/03haqsp75 |
| authorships[2].institutions[0].type | facility |
| authorships[2].institutions[0].lineage | https://openalex.org/I4210135784, https://openalex.org/I84653119 |
| authorships[2].institutions[0].country_code | TW |
| authorships[2].institutions[0].display_name | Institute of Atomic and Molecular Sciences, Academia Sinica |
| authorships[2].institutions[1].id | https://openalex.org/I16733864 |
| authorships[2].institutions[1].ror | https://ror.org/05bqach95 |
| authorships[2].institutions[1].type | education |
| authorships[2].institutions[1].lineage | https://openalex.org/I16733864 |
| authorships[2].institutions[1].country_code | TW |
| authorships[2].institutions[1].display_name | National Taiwan University |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Tai-Ting Lee |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan |
| authorships[3].author.id | https://openalex.org/A5102626190 |
| authorships[3].author.orcid | |
| authorships[3].author.display_name | Huynh-Uyen-Phuong Nguyen |
| authorships[3].countries | TW |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I25846049 |
| authorships[3].affiliations[0].raw_affiliation_string | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[3].institutions[0].id | https://openalex.org/I25846049 |
| authorships[3].institutions[0].ror | https://ror.org/00zdnkx70 |
| authorships[3].institutions[0].type | education |
| authorships[3].institutions[0].lineage | https://openalex.org/I25846049 |
| authorships[3].institutions[0].country_code | TW |
| authorships[3].institutions[0].display_name | National Tsing Hua University |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Huynh-Uyen-Phuong Nguyen |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[4].author.id | https://openalex.org/A5069441314 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-3968-7239 |
| authorships[4].author.display_name | Yung‐Chang Lin |
| authorships[4].countries | JP |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[4].affiliations[0].raw_affiliation_string | Research Institute of Core Technology for Materials Innovation, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan |
| authorships[4].institutions[0].id | https://openalex.org/I73613424 |
| authorships[4].institutions[0].ror | https://ror.org/01703db54 |
| authorships[4].institutions[0].type | government |
| authorships[4].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[4].institutions[0].country_code | JP |
| authorships[4].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Yung-Chang Lin |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | Research Institute of Core Technology for Materials Innovation, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan |
| authorships[5].author.id | https://openalex.org/A5112379951 |
| authorships[5].author.orcid | |
| authorships[5].author.display_name | Chang-Hong Shen |
| authorships[5].countries | TW |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I25846049 |
| authorships[5].affiliations[0].raw_affiliation_string | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[5].institutions[0].id | https://openalex.org/I25846049 |
| authorships[5].institutions[0].ror | https://ror.org/00zdnkx70 |
| authorships[5].institutions[0].type | education |
| authorships[5].institutions[0].lineage | https://openalex.org/I25846049 |
| authorships[5].institutions[0].country_code | TW |
| authorships[5].institutions[0].display_name | National Tsing Hua University |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Chang-Hong Shen |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | College of Semiconductor Research, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[6].author.id | https://openalex.org/A5012327097 |
| authorships[6].author.orcid | https://orcid.org/0000-0002-0155-9987 |
| authorships[6].author.display_name | Yu‐Lun Chueh |
| authorships[6].countries | TW |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I25846049 |
| authorships[6].affiliations[0].raw_affiliation_string | Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[6].institutions[0].id | https://openalex.org/I25846049 |
| authorships[6].institutions[0].ror | https://ror.org/00zdnkx70 |
| authorships[6].institutions[0].type | education |
| authorships[6].institutions[0].lineage | https://openalex.org/I25846049 |
| authorships[6].institutions[0].country_code | TW |
| authorships[6].institutions[0].display_name | National Tsing Hua University |
| authorships[6].author_position | middle |
| authorships[6].raw_author_name | Yu-Lun Chueh |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan |
| authorships[7].author.id | https://openalex.org/A5038675324 |
| authorships[7].author.orcid | https://orcid.org/0000-0003-0113-7191 |
| authorships[7].author.display_name | M. Y. Chou |
| authorships[7].countries | TW |
| authorships[7].affiliations[0].institution_ids | https://openalex.org/I16733864 |
| authorships[7].affiliations[0].raw_affiliation_string | Department of Physics, National Taiwan University, Taipei 10617, Taiwan |
| authorships[7].affiliations[1].institution_ids | https://openalex.org/I4210135784 |
| authorships[7].affiliations[1].raw_affiliation_string | Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan |
| authorships[7].institutions[0].id | https://openalex.org/I4210135784 |
| authorships[7].institutions[0].ror | https://ror.org/03haqsp75 |
| authorships[7].institutions[0].type | facility |
| authorships[7].institutions[0].lineage | https://openalex.org/I4210135784, https://openalex.org/I84653119 |
| authorships[7].institutions[0].country_code | TW |
| authorships[7].institutions[0].display_name | Institute of Atomic and Molecular Sciences, Academia Sinica |
| authorships[7].institutions[1].id | https://openalex.org/I16733864 |
| authorships[7].institutions[1].ror | https://ror.org/05bqach95 |
| authorships[7].institutions[1].type | education |
| authorships[7].institutions[1].lineage | https://openalex.org/I16733864 |
| authorships[7].institutions[1].country_code | TW |
| authorships[7].institutions[1].display_name | National Taiwan University |
| authorships[7].author_position | middle |
| authorships[7].raw_author_name | Mei-Yin Chou |
| authorships[7].is_corresponding | False |
| authorships[7].raw_affiliation_strings | Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.1021/acsnano.5c14437 |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-11-17T00:00:00 |
| display_name | Bi 2 O 2 Se-Based Monolithic Floating-Gate Nonvolatile Memory with Enhanced Charge Retention and Switching Performance |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-12-03T23:09:05.601824 |
| primary_topic | |
| cited_by_count | 0 |
| locations_count | 2 |
| best_oa_location.id | doi:10.1021/acsnano.5c14437 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S145476921 |
| best_oa_location.source.issn | 1936-0851, 1936-086X |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 1936-0851 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | ACS Nano |
| best_oa_location.source.host_organization | https://openalex.org/P4310320006 |
| best_oa_location.source.host_organization_name | American Chemical Society |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310320006 |
| best_oa_location.source.host_organization_lineage_names | American Chemical Society |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | ACS Nano |
| best_oa_location.landing_page_url | https://doi.org/10.1021/acsnano.5c14437 |
| primary_location.id | doi:10.1021/acsnano.5c14437 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S145476921 |
| primary_location.source.issn | 1936-0851, 1936-086X |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 1936-0851 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | ACS Nano |
| primary_location.source.host_organization | https://openalex.org/P4310320006 |
| primary_location.source.host_organization_name | American Chemical Society |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310320006 |
| primary_location.source.host_organization_lineage_names | American Chemical Society |
| primary_location.license | cc-by |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | ACS Nano |
| primary_location.landing_page_url | https://doi.org/10.1021/acsnano.5c14437 |
| publication_date | 2025-11-17 |
| publication_year | 2025 |
| referenced_works | https://openalex.org/W2745718324, https://openalex.org/W3196883839, https://openalex.org/W4404137413, https://openalex.org/W3164957849, https://openalex.org/W4410615582, https://openalex.org/W2487018225, https://openalex.org/W2970608956, https://openalex.org/W2115262483, https://openalex.org/W2327630289, https://openalex.org/W4399394788, https://openalex.org/W1969562914, https://openalex.org/W4388207376, https://openalex.org/W4410358964, https://openalex.org/W2141635000, https://openalex.org/W2105152280, https://openalex.org/W2082788345, https://openalex.org/W4382140063, https://openalex.org/W2069234752, https://openalex.org/W2171888576, https://openalex.org/W1508018340, https://openalex.org/W2338228311, https://openalex.org/W2075278406, https://openalex.org/W1987850127, https://openalex.org/W2543638529, https://openalex.org/W2051736202, https://openalex.org/W2065482379, https://openalex.org/W2290682369, https://openalex.org/W2908747511, https://openalex.org/W3043827851, https://openalex.org/W3041029313, https://openalex.org/W4392940410, https://openalex.org/W4206701386, https://openalex.org/W2471433031, https://openalex.org/W3080865650, https://openalex.org/W2144088175, https://openalex.org/W3082776506, https://openalex.org/W4407585168, https://openalex.org/W3045242314, https://openalex.org/W2797604670, https://openalex.org/W4212801669, https://openalex.org/W2317318782, https://openalex.org/W2083222334, https://openalex.org/W1970127494, https://openalex.org/W1981368803, https://openalex.org/W2085093563 |
| referenced_works_count | 45 |
| abstract_inverted_index.a | 21, 29, 54, 78, 112, 119, 123, 133 |
| abstract_inverted_index.2D | 31, 164, 184 |
| abstract_inverted_index.V, | 146 |
| abstract_inverted_index.as | 77 |
| abstract_inverted_index.in | 182 |
| abstract_inverted_index.it | 70 |
| abstract_inverted_index.ms | 148 |
| abstract_inverted_index.of | 3, 81 |
| abstract_inverted_index.to | 11, 71 |
| abstract_inverted_index.we | 19 |
| abstract_inverted_index.× | 129 |
| abstract_inverted_index.100 | 147 |
| abstract_inverted_index.BOS | 88 |
| abstract_inverted_index.The | 0, 116 |
| abstract_inverted_index.and | 14, 39, 56, 95, 106, 132, 155, 179 |
| abstract_inverted_index.due | 10 |
| abstract_inverted_index.for | 169 |
| abstract_inverted_index.the | 43, 67, 86, 183 |
| abstract_inverted_index.(BOS | 109 |
| abstract_inverted_index.2000 | 153 |
| abstract_inverted_index.NVMs | 165 |
| abstract_inverted_index.They | 139 |
| abstract_inverted_index.This | 98 |
| abstract_inverted_index.Upon | 47 |
| abstract_inverted_index.also | 140 |
| abstract_inverted_index.each | 170 |
| abstract_inverted_index.fast | 142 |
| abstract_inverted_index.high | 124 |
| abstract_inverted_index.into | 66 |
| abstract_inverted_index.over | 152 |
| abstract_inverted_index.same | 44 |
| abstract_inverted_index.show | 141 |
| abstract_inverted_index.that | 34 |
| abstract_inverted_index.this | 173 |
| abstract_inverted_index.with | 144, 162 |
| abstract_inverted_index.±12 | 145 |
| abstract_inverted_index.(NVM) | 25 |
| abstract_inverted_index.(∼5 | 128 |
| abstract_inverted_index.Here, | 18 |
| abstract_inverted_index.core, | 68 |
| abstract_inverted_index.faces | 7 |
| abstract_inverted_index.forms | 53 |
| abstract_inverted_index.large | 120 |
| abstract_inverted_index.major | 8 |
| abstract_inverted_index.other | 163 |
| abstract_inverted_index.oxide | 89 |
| abstract_inverted_index.ratio | 136 |
| abstract_inverted_index.shell | 90 |
| abstract_inverted_index.using | 28 |
| abstract_inverted_index.which | 75 |
| abstract_inverted_index.while | 85 |
| abstract_inverted_index.ON/OFF | 135 |
| abstract_inverted_index.charge | 12, 37, 83, 125, 156 |
| abstract_inverted_index.device | 26, 186 |
| abstract_inverted_index.layer, | 172 |
| abstract_inverted_index.memory | 24, 121, 185 |
| abstract_inverted_index.oxide) | 110 |
| abstract_inverted_index.report | 20 |
| abstract_inverted_index.robust | 92, 150 |
| abstract_inverted_index.serves | 76 |
| abstract_inverted_index.shell. | 59 |
| abstract_inverted_index.single | 30, 113 |
| abstract_inverted_index.within | 42, 111 |
| abstract_inverted_index.(s-BOS) | 52 |
| abstract_inverted_index.capable | 80 |
| abstract_inverted_index.channel | 102 |
| abstract_inverted_index.complex | 15 |
| abstract_inverted_index.current | 134 |
| abstract_inverted_index.cycles, | 154 |
| abstract_inverted_index.density | 127 |
| abstract_inverted_index.design. | 187 |
| abstract_inverted_index.devices | 117 |
| abstract_inverted_index.enables | 176 |
| abstract_inverted_index.exhibit | 118 |
| abstract_inverted_index.leakage | 13 |
| abstract_inverted_index.pulses, | 149 |
| abstract_inverted_index.scaling | 2 |
| abstract_inverted_index.storage | 104, 126 |
| abstract_inverted_index.system. | 46, 115 |
| abstract_inverted_index.thermal | 61 |
| abstract_inverted_index.window, | 122 |
| abstract_inverted_index.(m-BOS), | 74, 105 |
| abstract_inverted_index.(s-BOS), | 103 |
| abstract_inverted_index.Compared | 161 |
| abstract_inverted_index.UV-ozone | 48 |
| abstract_inverted_index.channel, | 36 |
| abstract_inverted_index.improved | 180 |
| abstract_inverted_index.leakage. | 97 |
| abstract_inverted_index.material | 45, 114 |
| abstract_inverted_index.memories | 6 |
| abstract_inverted_index.metallic | 72 |
| abstract_inverted_index.platform | 175 |
| abstract_inverted_index.provides | 91 |
| abstract_inverted_index.seconds. | 160 |
| abstract_inverted_index.selenium | 64 |
| abstract_inverted_index.separate | 167 |
| abstract_inverted_index.storage, | 38 |
| abstract_inverted_index.annealing | 62 |
| abstract_inverted_index.conformal | 55 |
| abstract_inverted_index.efficient | 82 |
| abstract_inverted_index.employing | 166 |
| abstract_inverted_index.endurance | 151 |
| abstract_inverted_index.exceeding | 137, 158 |
| abstract_inverted_index.functions | 41, 108 |
| abstract_inverted_index.material, | 32 |
| abstract_inverted_index.materials | 168 |
| abstract_inverted_index.retention | 157 |
| abstract_inverted_index.structure | 100 |
| abstract_inverted_index.trapping, | 84 |
| abstract_inverted_index.tunneling | 40, 93, 107 |
| abstract_inverted_index.vacancies | 65 |
| abstract_inverted_index.Subsequent | 60 |
| abstract_inverted_index.challenges | 9 |
| abstract_inverted_index.continuous | 1 |
| abstract_inverted_index.converting | 69 |
| abstract_inverted_index.functional | 171 |
| abstract_inverted_index.insulation | 94 |
| abstract_inverted_index.integrates | 35, 101 |
| abstract_inverted_index.introduces | 63 |
| abstract_inverted_index.monolithic | 22, 99 |
| abstract_inverted_index.multilayer | 16 |
| abstract_inverted_index.simplified | 177 |
| abstract_inverted_index.suppresses | 96 |
| abstract_inverted_index.treatment, | 49 |
| abstract_inverted_index.constructed | 27 |
| abstract_inverted_index.crystalline | 57, 87 |
| abstract_inverted_index.fabrication | 178 |
| abstract_inverted_index.nonvolatile | 23 |
| abstract_inverted_index.scalability | 181 |
| abstract_inverted_index.conventional | 4 |
| abstract_inverted_index.floating-gate | 5, 79 |
| abstract_inverted_index.10<sup>4</sup> | 159 |
| abstract_inverted_index.architectures. | 17 |
| abstract_inverted_index.semiconducting | 50 |
| abstract_inverted_index.10<sup>13</sup> | 130 |
| abstract_inverted_index.10<sup>8</sup>. | 138 |
| abstract_inverted_index.single-material | 174 |
| abstract_inverted_index.cm<sup>-2</sup>), | 131 |
| abstract_inverted_index.programming/erasing | 143 |
| abstract_inverted_index.Bi<sub>2</sub>O<sub>2</sub>Se | 51, 73 |
| abstract_inverted_index.Bi<sub>2</sub>O<sub>2</sub>Se, | 33 |
| abstract_inverted_index.β-Bi<sub>2</sub>SeO<sub>5</sub> | 58 |
| cited_by_percentile_year | |
| countries_distinct_count | 2 |
| institutions_distinct_count | 8 |
| citation_normalized_percentile |