Characterization of irradiated RD53A pixel modules with passive CMOS sensors Article Swipe
A. Jofrehei
,
M. Backhaus
,
P. Baertschi
,
F. Canelli
,
F. Glessgen
,
Wenzui Jin
,
B. Kilminster
,
A. Macchiolo
,
A. Reimers
,
B. Ristic
,
R. Wallny
·
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2203.11376
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2203.11376
We are investigating the feasibility of using CMOS foundries to fabricate silicon detectors, both for pixels and for large-area strip sensors. The availability of multi-layer routing will provide the freedom to optimize the sensor geometry and the performance, with biasing structures in poly-silicon layers and MIM-capacitors allowing for AC coupling. A prototyping production of strip test-structures and RD53A compatible pixel sensors was recently completed at LFoundry in a 150$\,$nm CMOS process. This paper will focus on the characterization of irradiated and non-irradiated pixel modules, composed by a CMOS passive sensor interconnected to a RD53A chip. The sensors are designed with a pixel cell of $25\times100\,μ\mathrm{m}^2$ in case of DC coupled devices and $50\times50\,μ\mathrm{m}^2$ for the AC coupled ones. Their performance in terms of charge collection, position resolution, and hit efficiency was studied with measurements performed in the laboratory and with beam tests. The RD53A modules with LFoundry silicon sensors were irradiated to fluences up to $1.0\times10^{16}\,\frac{\mathrm{n}_\mathrm{eq}}{\mathrm{cm}^2}$.
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Metadata
- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2203.11376
- https://arxiv.org/pdf/2203.11376
- OA Status
- green
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4225722271
All OpenAlex metadata
Raw OpenAlex JSON
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https://openalex.org/W4225722271Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2203.11376Digital Object Identifier
- Title
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Characterization of irradiated RD53A pixel modules with passive CMOS sensorsWork title
- Type
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preprintOpenAlex work type
- Language
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enPrimary language
- Publication year
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2022Year of publication
- Publication date
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2022-03-21Full publication date if available
- Authors
-
A. Jofrehei, M. Backhaus, P. Baertschi, F. Canelli, F. Glessgen, Wenzui Jin, B. Kilminster, A. Macchiolo, A. Reimers, B. Ristic, R. WallnyList of authors in order
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https://arxiv.org/abs/2203.11376Publisher landing page
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https://arxiv.org/pdf/2203.11376Direct link to full text PDF
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YesWhether a free full text is available
- OA status
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greenOpen access status per OpenAlex
- OA URL
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https://arxiv.org/pdf/2203.11376Direct OA link when available
- Concepts
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CMOS, Pixel, Silicon, Materials science, Optoelectronics, Irradiation, Characterization (materials science), Detector, Sensitivity (control systems), Focus (optics), CMOS sensor, Capacitor, Electrical engineering, Physics, Voltage, Electronic engineering, Optics, Nanotechnology, Engineering, Nuclear physicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
- Related works (count)
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10Other works algorithmically related by OpenAlex
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| best_oa_location.license_id | |
| best_oa_location.is_accepted | False |
| best_oa_location.is_published | False |
| best_oa_location.raw_source_name | |
| best_oa_location.landing_page_url | http://arxiv.org/abs/2203.11376 |
| primary_location.id | pmh:oai:arXiv.org:2203.11376 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S4306400194 |
| primary_location.source.issn | |
| primary_location.source.type | repository |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | |
| primary_location.source.is_core | False |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | arXiv (Cornell University) |
| primary_location.source.host_organization | https://openalex.org/I205783295 |
| primary_location.source.host_organization_name | Cornell University |
| primary_location.source.host_organization_lineage | https://openalex.org/I205783295 |
| primary_location.license | |
| primary_location.pdf_url | https://arxiv.org/pdf/2203.11376 |
| primary_location.version | submittedVersion |
| primary_location.raw_type | text |
| primary_location.license_id | |
| primary_location.is_accepted | False |
| primary_location.is_published | False |
| primary_location.raw_source_name | |
| primary_location.landing_page_url | http://arxiv.org/abs/2203.11376 |
| publication_date | 2022-03-21 |
| publication_year | 2022 |
| referenced_works_count | 0 |
| abstract_inverted_index.A | 50 |
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| abstract_inverted_index.at | 64 |
| abstract_inverted_index.by | 85 |
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| abstract_inverted_index.of | 5, 23, 53, 78, 103, 107, 122 |
| abstract_inverted_index.on | 75 |
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| abstract_inverted_index.The | 21, 95, 142 |
| abstract_inverted_index.and | 16, 35, 44, 56, 80, 111, 127, 138 |
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| abstract_inverted_index.$50\times50\,μ\mathrm{m}^2$ | 112 |
| abstract_inverted_index.$25\times100\,μ\mathrm{m}^2$ | 104 |
| abstract_inverted_index.$1.0\times10^{16}\,\frac{\mathrm{n}_\mathrm{eq}}{\mathrm{cm}^2}$. | 155 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 11 |
| citation_normalized_percentile.value | 0.01556393 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | True |