Characterization of Soft Error Rate Against Memory Elements Spacing and Clock Skew in a Logic with Triple Modular Redundancy in a 65nm Process Article Swipe
Sandeep Miryala
,
T. Hemperek
,
M. Menouni
·
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.22323/1.343.0029
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.22323/1.343.0029
Single Event Effects introduce soft errors in ASICs. Design methodologies like Triple ModularRedundancy (TMR) with clock skew insertion, a system level redundancy technique is a commonpractice by designers to mitigate soft errors. However, the optimal spacing between memoryelements in a TMR in 65nm process hasn't been addressed so far. RD53SEU is a mini ASICdevelopment under the framework of the CERN RD53 collaboration to characterize the soft errorrates against the separation spacing and clock skew between memory elements in a TMR. Thisarticle describes the architecture and design aspects of the various test structures on the RD53SEUtest chip.
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- Type
- preprint
- Language
- en
- Landing Page
- https://doi.org/10.22323/1.343.0029
- https://pos.sissa.it/343/029/pdf
- OA Status
- gold
- Cited By
- 1
- References
- 3
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2963207218
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- OpenAlex ID
-
https://openalex.org/W2963207218Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.22323/1.343.0029Digital Object Identifier
- Title
-
Characterization of Soft Error Rate Against Memory Elements Spacing and Clock Skew in a Logic with Triple Modular Redundancy in a 65nm ProcessWork title
- Type
-
preprintOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2019Year of publication
- Publication date
-
2019-05-20Full publication date if available
- Authors
-
Sandeep Miryala, T. Hemperek, M. MenouniList of authors in order
- Landing page
-
https://doi.org/10.22323/1.343.0029Publisher landing page
- PDF URL
-
https://pos.sissa.it/343/029/pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://pos.sissa.it/343/029/pdfDirect OA link when available
- Concepts
-
Triple modular redundancy, Redundancy (engineering), Soft error, Skew, Modular design, Computer science, Embedded system, Application-specific integrated circuit, Error detection and correction, Computer hardware, Electronic engineering, Engineering, Algorithm, Operating system, TelecommunicationsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
1Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 1Per-year citation counts (last 5 years)
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-
3Number of works referenced by this work
- Related works (count)
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10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W2963207218 |
|---|---|
| doi | https://doi.org/10.22323/1.343.0029 |
| ids.doi | https://doi.org/10.22323/1.343.0029 |
| ids.mag | 2963207218 |
| ids.openalex | https://openalex.org/W2963207218 |
| fwci | 0.0 |
| type | preprint |
| title | Characterization of Soft Error Rate Against Memory Elements Spacing and Clock Skew in a Logic with Triple Modular Redundancy in a 65nm Process |
| biblio.issue | |
| biblio.volume | |
| biblio.last_page | 029 |
| biblio.first_page | 029 |
| topics[0].id | https://openalex.org/T11005 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9998000264167786 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Radiation Effects in Electronics |
| topics[1].id | https://openalex.org/T11032 |
| topics[1].field.id | https://openalex.org/fields/17 |
| topics[1].field.display_name | Computer Science |
| topics[1].score | 0.9962999820709229 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/1708 |
| topics[1].subfield.display_name | Hardware and Architecture |
| topics[1].display_name | VLSI and Analog Circuit Testing |
| topics[2].id | https://openalex.org/T10363 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9933000206947327 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Low-power high-performance VLSI design |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C196371267 |
| concepts[0].level | 3 |
| concepts[0].score | 0.7414698600769043 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q3998979 |
| concepts[0].display_name | Triple modular redundancy |
| concepts[1].id | https://openalex.org/C152124472 |
| concepts[1].level | 2 |
| concepts[1].score | 0.7379971146583557 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q1204361 |
| concepts[1].display_name | Redundancy (engineering) |
| concepts[2].id | https://openalex.org/C154474529 |
| concepts[2].level | 2 |
| concepts[2].score | 0.7356421947479248 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q1658917 |
| concepts[2].display_name | Soft error |
| concepts[3].id | https://openalex.org/C43711488 |
| concepts[3].level | 2 |
| concepts[3].score | 0.6925839185714722 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q7534783 |
| concepts[3].display_name | Skew |
| concepts[4].id | https://openalex.org/C101468663 |
| concepts[4].level | 2 |
| concepts[4].score | 0.5905156135559082 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q1620158 |
| concepts[4].display_name | Modular design |
| concepts[5].id | https://openalex.org/C41008148 |
| concepts[5].level | 0 |
| concepts[5].score | 0.5569891333580017 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[5].display_name | Computer science |
| concepts[6].id | https://openalex.org/C149635348 |
| concepts[6].level | 1 |
| concepts[6].score | 0.46811264753341675 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q193040 |
| concepts[6].display_name | Embedded system |
| concepts[7].id | https://openalex.org/C77390884 |
| concepts[7].level | 2 |
| concepts[7].score | 0.45501887798309326 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q217302 |
| concepts[7].display_name | Application-specific integrated circuit |
| concepts[8].id | https://openalex.org/C103088060 |
| concepts[8].level | 2 |
| concepts[8].score | 0.42624324560165405 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q1062839 |
| concepts[8].display_name | Error detection and correction |
| concepts[9].id | https://openalex.org/C9390403 |
| concepts[9].level | 1 |
| concepts[9].score | 0.3563805818557739 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q3966 |
| concepts[9].display_name | Computer hardware |
| concepts[10].id | https://openalex.org/C24326235 |
| concepts[10].level | 1 |
| concepts[10].score | 0.2661113739013672 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[10].display_name | Electronic engineering |
| concepts[11].id | https://openalex.org/C127413603 |
| concepts[11].level | 0 |
| concepts[11].score | 0.2582154870033264 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[11].display_name | Engineering |
| concepts[12].id | https://openalex.org/C11413529 |
| concepts[12].level | 1 |
| concepts[12].score | 0.12188476324081421 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q8366 |
| concepts[12].display_name | Algorithm |
| concepts[13].id | https://openalex.org/C111919701 |
| concepts[13].level | 1 |
| concepts[13].score | 0.07746905088424683 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q9135 |
| concepts[13].display_name | Operating system |
| concepts[14].id | https://openalex.org/C76155785 |
| concepts[14].level | 1 |
| concepts[14].score | 0.0 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q418 |
| concepts[14].display_name | Telecommunications |
| keywords[0].id | https://openalex.org/keywords/triple-modular-redundancy |
| keywords[0].score | 0.7414698600769043 |
| keywords[0].display_name | Triple modular redundancy |
| keywords[1].id | https://openalex.org/keywords/redundancy |
| keywords[1].score | 0.7379971146583557 |
| keywords[1].display_name | Redundancy (engineering) |
| keywords[2].id | https://openalex.org/keywords/soft-error |
| keywords[2].score | 0.7356421947479248 |
| keywords[2].display_name | Soft error |
| keywords[3].id | https://openalex.org/keywords/skew |
| keywords[3].score | 0.6925839185714722 |
| keywords[3].display_name | Skew |
| keywords[4].id | https://openalex.org/keywords/modular-design |
| keywords[4].score | 0.5905156135559082 |
| keywords[4].display_name | Modular design |
| keywords[5].id | https://openalex.org/keywords/computer-science |
| keywords[5].score | 0.5569891333580017 |
| keywords[5].display_name | Computer science |
| keywords[6].id | https://openalex.org/keywords/embedded-system |
| keywords[6].score | 0.46811264753341675 |
| keywords[6].display_name | Embedded system |
| keywords[7].id | https://openalex.org/keywords/application-specific-integrated-circuit |
| keywords[7].score | 0.45501887798309326 |
| keywords[7].display_name | Application-specific integrated circuit |
| keywords[8].id | https://openalex.org/keywords/error-detection-and-correction |
| keywords[8].score | 0.42624324560165405 |
| keywords[8].display_name | Error detection and correction |
| keywords[9].id | https://openalex.org/keywords/computer-hardware |
| keywords[9].score | 0.3563805818557739 |
| keywords[9].display_name | Computer hardware |
| keywords[10].id | https://openalex.org/keywords/electronic-engineering |
| keywords[10].score | 0.2661113739013672 |
| keywords[10].display_name | Electronic engineering |
| keywords[11].id | https://openalex.org/keywords/engineering |
| keywords[11].score | 0.2582154870033264 |
| keywords[11].display_name | Engineering |
| keywords[12].id | https://openalex.org/keywords/algorithm |
| keywords[12].score | 0.12188476324081421 |
| keywords[12].display_name | Algorithm |
| keywords[13].id | https://openalex.org/keywords/operating-system |
| keywords[13].score | 0.07746905088424683 |
| keywords[13].display_name | Operating system |
| language | en |
| locations[0].id | doi:10.22323/1.343.0029 |
| locations[0].is_oa | True |
| locations[0].source | |
| locations[0].license | cc-by-nc-nd |
| locations[0].pdf_url | https://pos.sissa.it/343/029/pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | proceedings-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by-nc-nd |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) |
| locations[0].landing_page_url | https://doi.org/10.22323/1.343.0029 |
| locations[1].id | pmh:oai:osti.gov:1843258 |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4306402487 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) |
| locations[1].source.host_organization | https://openalex.org/I139351228 |
| locations[1].source.host_organization_name | Office of Scientific and Technical Information |
| locations[1].source.host_organization_lineage | https://openalex.org/I139351228 |
| locations[1].license | |
| locations[1].pdf_url | https://www.osti.gov/biblio/1843258 |
| locations[1].version | submittedVersion |
| locations[1].raw_type | |
| locations[1].license_id | |
| locations[1].is_accepted | False |
| locations[1].is_published | False |
| locations[1].raw_source_name | |
| locations[1].landing_page_url | https://www.osti.gov/biblio/1843258 |
| locations[2].id | pmh:oai:HAL:hal-02283614v1 |
| locations[2].is_oa | False |
| locations[2].source.id | https://openalex.org/S4306402512 |
| locations[2].source.issn | |
| locations[2].source.type | repository |
| locations[2].source.is_oa | False |
| locations[2].source.issn_l | |
| locations[2].source.is_core | False |
| locations[2].source.is_in_doaj | False |
| locations[2].source.display_name | HAL (Le Centre pour la Communication Scientifique Directe) |
| locations[2].source.host_organization | https://openalex.org/I1294671590 |
| locations[2].source.host_organization_name | Centre National de la Recherche Scientifique |
| locations[2].source.host_organization_lineage | https://openalex.org/I1294671590 |
| locations[2].license | |
| locations[2].pdf_url | |
| locations[2].version | submittedVersion |
| locations[2].raw_type | info:eu-repo/semantics/conferenceObject |
| locations[2].license_id | |
| locations[2].is_accepted | False |
| locations[2].is_published | False |
| locations[2].raw_source_name | PoS |
| locations[2].landing_page_url | https://hal.science/hal-02283614 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5026474122 |
| authorships[0].author.orcid | https://orcid.org/0000-0003-1277-1745 |
| authorships[0].author.display_name | Sandeep Miryala |
| authorships[0].countries | DE, FR, US |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I1294671590 |
| authorships[0].affiliations[0].raw_affiliation_string | Aix Marseille, CNRS/IN2P3, CPPM 163, avenue de Luminy 13288 Marseille, France |
| authorships[0].affiliations[1].institution_ids | https://openalex.org/I1314696892 |
| authorships[0].affiliations[1].raw_affiliation_string | Fermi National Accelerator Labotraory Pine Street, Batavia, IL-60510, U.S. |
| authorships[0].affiliations[2].institution_ids | https://openalex.org/I135140700 |
| authorships[0].affiliations[2].raw_affiliation_string | University of Bonn Nussalle 12, Bonn, Germany |
| authorships[0].institutions[0].id | https://openalex.org/I135140700 |
| authorships[0].institutions[0].ror | https://ror.org/041nas322 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I135140700 |
| authorships[0].institutions[0].country_code | DE |
| authorships[0].institutions[0].display_name | University of Bonn |
| authorships[0].institutions[1].id | https://openalex.org/I1294671590 |
| authorships[0].institutions[1].ror | https://ror.org/02feahw73 |
| authorships[0].institutions[1].type | government |
| authorships[0].institutions[1].lineage | https://openalex.org/I1294671590 |
| authorships[0].institutions[1].country_code | FR |
| authorships[0].institutions[1].display_name | Centre National de la Recherche Scientifique |
| authorships[0].institutions[2].id | https://openalex.org/I1314696892 |
| authorships[0].institutions[2].ror | https://ror.org/020hgte69 |
| authorships[0].institutions[2].type | facility |
| authorships[0].institutions[2].lineage | https://openalex.org/I1314696892, https://openalex.org/I1330989302, https://openalex.org/I39565521, https://openalex.org/I4210114836 |
| authorships[0].institutions[2].country_code | US |
| authorships[0].institutions[2].display_name | Fermi National Accelerator Laboratory |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Sandeep Miryala |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | Aix Marseille, CNRS/IN2P3, CPPM 163, avenue de Luminy 13288 Marseille, France, Fermi National Accelerator Labotraory Pine Street, Batavia, IL-60510, U.S., University of Bonn Nussalle 12, Bonn, Germany |
| authorships[1].author.id | https://openalex.org/A5000938185 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-0833-7762 |
| authorships[1].author.display_name | T. Hemperek |
| authorships[1].countries | DE, FR, US |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I1314696892 |
| authorships[1].affiliations[0].raw_affiliation_string | Fermi National Accelerator Labotraory Pine Street, Batavia, IL-60510, U.S. |
| authorships[1].affiliations[1].institution_ids | https://openalex.org/I1294671590 |
| authorships[1].affiliations[1].raw_affiliation_string | Aix Marseille, CNRS/IN2P3, CPPM 163, avenue de Luminy 13288 Marseille, France |
| authorships[1].affiliations[2].institution_ids | https://openalex.org/I135140700 |
| authorships[1].affiliations[2].raw_affiliation_string | University of Bonn Nussalle 12, Bonn, Germany |
| authorships[1].institutions[0].id | https://openalex.org/I135140700 |
| authorships[1].institutions[0].ror | https://ror.org/041nas322 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I135140700 |
| authorships[1].institutions[0].country_code | DE |
| authorships[1].institutions[0].display_name | University of Bonn |
| authorships[1].institutions[1].id | https://openalex.org/I1294671590 |
| authorships[1].institutions[1].ror | https://ror.org/02feahw73 |
| authorships[1].institutions[1].type | government |
| authorships[1].institutions[1].lineage | https://openalex.org/I1294671590 |
| authorships[1].institutions[1].country_code | FR |
| authorships[1].institutions[1].display_name | Centre National de la Recherche Scientifique |
| authorships[1].institutions[2].id | https://openalex.org/I1314696892 |
| authorships[1].institutions[2].ror | https://ror.org/020hgte69 |
| authorships[1].institutions[2].type | facility |
| authorships[1].institutions[2].lineage | https://openalex.org/I1314696892, https://openalex.org/I1330989302, https://openalex.org/I39565521, https://openalex.org/I4210114836 |
| authorships[1].institutions[2].country_code | US |
| authorships[1].institutions[2].display_name | Fermi National Accelerator Laboratory |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Tomasz Hemperek |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Aix Marseille, CNRS/IN2P3, CPPM 163, avenue de Luminy 13288 Marseille, France, Fermi National Accelerator Labotraory Pine Street, Batavia, IL-60510, U.S., University of Bonn Nussalle 12, Bonn, Germany |
| authorships[2].author.id | https://openalex.org/A5044344538 |
| authorships[2].author.orcid | |
| authorships[2].author.display_name | M. Menouni |
| authorships[2].countries | FR |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I4210093936 |
| authorships[2].affiliations[0].raw_affiliation_string | CPPM - Centre de Physique des Particules de Marseille (163, avenue de Luminy - Case 902 - 13288 Marseille cedex 09 - France) |
| authorships[2].institutions[0].id | https://openalex.org/I4210093936 |
| authorships[2].institutions[0].ror | https://ror.org/00fw8bp86 |
| authorships[2].institutions[0].type | facility |
| authorships[2].institutions[0].lineage | https://openalex.org/I1294671590, https://openalex.org/I1294671590, https://openalex.org/I21491767, https://openalex.org/I4210093936, https://openalex.org/I4210133362 |
| authorships[2].institutions[0].country_code | FR |
| authorships[2].institutions[0].display_name | Centre de physique des particules de Marseille |
| authorships[2].author_position | last |
| authorships[2].raw_author_name | Mohsine Menouni |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | CPPM - Centre de Physique des Particules de Marseille (163, avenue de Luminy - Case 902 - 13288 Marseille cedex 09 - France) |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://pos.sissa.it/343/029/pdf |
| open_access.oa_status | gold |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Characterization of Soft Error Rate Against Memory Elements Spacing and Clock Skew in a Logic with Triple Modular Redundancy in a 65nm Process |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11005 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9998000264167786 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Radiation Effects in Electronics |
| related_works | https://openalex.org/W1749592617, https://openalex.org/W2537369590, https://openalex.org/W2116473596, https://openalex.org/W2991163706, https://openalex.org/W2007710086, https://openalex.org/W2110991008, https://openalex.org/W2126481660, https://openalex.org/W2068711101, https://openalex.org/W2000201823, https://openalex.org/W3182233882 |
| cited_by_count | 1 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 1 |
| locations_count | 3 |
| best_oa_location.id | doi:10.22323/1.343.0029 |
| best_oa_location.is_oa | True |
| best_oa_location.source | |
| best_oa_location.license | cc-by-nc-nd |
| best_oa_location.pdf_url | https://pos.sissa.it/343/029/pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | proceedings-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) |
| best_oa_location.landing_page_url | https://doi.org/10.22323/1.343.0029 |
| primary_location.id | doi:10.22323/1.343.0029 |
| primary_location.is_oa | True |
| primary_location.source | |
| primary_location.license | cc-by-nc-nd |
| primary_location.pdf_url | https://pos.sissa.it/343/029/pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | proceedings-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018) |
| primary_location.landing_page_url | https://doi.org/10.22323/1.343.0029 |
| publication_date | 2019-05-20 |
| publication_year | 2019 |
| referenced_works | https://openalex.org/W2169370034, https://openalex.org/W2278566897, https://openalex.org/W2218265448 |
| referenced_works_count | 3 |
| abstract_inverted_index.a | 18, 24, 39, 51, 78 |
| abstract_inverted_index.by | 26 |
| abstract_inverted_index.in | 6, 38, 41, 77 |
| abstract_inverted_index.is | 23, 50 |
| abstract_inverted_index.of | 57, 87 |
| abstract_inverted_index.on | 92 |
| abstract_inverted_index.so | 47 |
| abstract_inverted_index.to | 28, 62 |
| abstract_inverted_index.TMR | 40 |
| abstract_inverted_index.and | 71, 84 |
| abstract_inverted_index.the | 33, 55, 58, 64, 68, 82, 88, 93 |
| abstract_inverted_index.65nm | 42 |
| abstract_inverted_index.CERN | 59 |
| abstract_inverted_index.RD53 | 60 |
| abstract_inverted_index.TMR. | 79 |
| abstract_inverted_index.been | 45 |
| abstract_inverted_index.far. | 48 |
| abstract_inverted_index.like | 10 |
| abstract_inverted_index.mini | 52 |
| abstract_inverted_index.skew | 16, 73 |
| abstract_inverted_index.soft | 4, 30, 65 |
| abstract_inverted_index.test | 90 |
| abstract_inverted_index.with | 14 |
| abstract_inverted_index.(TMR) | 13 |
| abstract_inverted_index.Event | 1 |
| abstract_inverted_index.chip. | 95 |
| abstract_inverted_index.clock | 15, 72 |
| abstract_inverted_index.level | 20 |
| abstract_inverted_index.under | 54 |
| abstract_inverted_index.ASICs. | 7 |
| abstract_inverted_index.Design | 8 |
| abstract_inverted_index.Single | 0 |
| abstract_inverted_index.Triple | 11 |
| abstract_inverted_index.design | 85 |
| abstract_inverted_index.errors | 5 |
| abstract_inverted_index.hasn't | 44 |
| abstract_inverted_index.memory | 75 |
| abstract_inverted_index.system | 19 |
| abstract_inverted_index.Effects | 2 |
| abstract_inverted_index.RD53SEU | 49 |
| abstract_inverted_index.against | 67 |
| abstract_inverted_index.aspects | 86 |
| abstract_inverted_index.between | 36, 74 |
| abstract_inverted_index.errors. | 31 |
| abstract_inverted_index.optimal | 34 |
| abstract_inverted_index.process | 43 |
| abstract_inverted_index.spacing | 35, 70 |
| abstract_inverted_index.various | 89 |
| abstract_inverted_index.However, | 32 |
| abstract_inverted_index.elements | 76 |
| abstract_inverted_index.mitigate | 29 |
| abstract_inverted_index.addressed | 46 |
| abstract_inverted_index.describes | 81 |
| abstract_inverted_index.designers | 27 |
| abstract_inverted_index.framework | 56 |
| abstract_inverted_index.introduce | 3 |
| abstract_inverted_index.technique | 22 |
| abstract_inverted_index.errorrates | 66 |
| abstract_inverted_index.insertion, | 17 |
| abstract_inverted_index.redundancy | 21 |
| abstract_inverted_index.separation | 69 |
| abstract_inverted_index.structures | 91 |
| abstract_inverted_index.RD53SEUtest | 94 |
| abstract_inverted_index.Thisarticle | 80 |
| abstract_inverted_index.architecture | 83 |
| abstract_inverted_index.characterize | 63 |
| abstract_inverted_index.collaboration | 61 |
| abstract_inverted_index.methodologies | 9 |
| abstract_inverted_index.commonpractice | 25 |
| abstract_inverted_index.memoryelements | 37 |
| abstract_inverted_index.ASICdevelopment | 53 |
| abstract_inverted_index.ModularRedundancy | 12 |
| cited_by_percentile_year.max | 95 |
| cited_by_percentile_year.min | 91 |
| countries_distinct_count | 3 |
| institutions_distinct_count | 3 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/9 |
| sustainable_development_goals[0].score | 0.44999998807907104 |
| sustainable_development_goals[0].display_name | Industry, innovation and infrastructure |
| citation_normalized_percentile.value | 0.06065953 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |