Collection of charge in NMOS from single event effect Article Swipe
Jingqiu Wang
,
Fujiang Lin
,
Donglin Wang
,
Wenna Song
,
Li Liu
,
Qiwei Song
,
Liang Chen
·
YOU?
·
· 2016
· Open Access
·
· DOI: https://doi.org/10.1587/elex.13.20160014
YOU?
·
· 2016
· Open Access
·
· DOI: https://doi.org/10.1587/elex.13.20160014
In aerospace environment, single event effect (SEE) will occur and single event transient (SET) current pulse will be induced in drain/source region of Metal Oxide Semiconductor Field Effect Transistor (MOSFET) when high energy ion strikes semiconductor devices. The typical double exponential transient current model proposed for traditional technology is not suitable for ultra deep sub-micron technology devices. In this paper, a novel multi-dimensional double exponential transient current model is proposed based on our new understanding of ultra deep sub-micron radiation mechanism, which has been validated using Technology Computer Aided Design (TCAD) simulation. This model can be important basis for the searching of SEE at circuit level and can be transparently applied to evaluate the effectiveness and performance of hardening technique, thus shortening the developing cycle of integrated circuit intended to operate within aerospace environment.
Related Topics
Concepts
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1587/elex.13.20160014
- https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdf
- OA Status
- diamond
- Cited By
- 2
- References
- 9
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2312714035
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W2312714035Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1587/elex.13.20160014Digital Object Identifier
- Title
-
Collection of charge in NMOS from single event effectWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2016Year of publication
- Publication date
-
2016-01-01Full publication date if available
- Authors
-
Jingqiu Wang, Fujiang Lin, Donglin Wang, Wenna Song, Li Liu, Qiwei Song, Liang ChenList of authors in order
- Landing page
-
https://doi.org/10.1587/elex.13.20160014Publisher landing page
- PDF URL
-
https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
diamondOpen access status per OpenAlex
- OA URL
-
https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdfDirect OA link when available
- Concepts
-
NMOS logic, MOSFET, Transient (computer programming), Electronic engineering, Transistor, Computer science, Overcurrent, Electrical engineering, Aerospace, Technology CAD, Current (fluid), Voltage, Engineering, Aerospace engineering, CAD, Operating system, Engineering drawingTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
2Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 1, 2022: 1Per-year citation counts (last 5 years)
- References (count)
-
9Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W2312714035 |
|---|---|
| doi | https://doi.org/10.1587/elex.13.20160014 |
| ids.doi | https://doi.org/10.1587/elex.13.20160014 |
| ids.mag | 2312714035 |
| ids.openalex | https://openalex.org/W2312714035 |
| fwci | 0.0 |
| type | article |
| title | Collection of charge in NMOS from single event effect |
| biblio.issue | 8 |
| biblio.volume | 13 |
| biblio.last_page | 20160014 |
| biblio.first_page | 20160014 |
| topics[0].id | https://openalex.org/T11005 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 1.0 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Radiation Effects in Electronics |
| topics[1].id | https://openalex.org/T11032 |
| topics[1].field.id | https://openalex.org/fields/17 |
| topics[1].field.display_name | Computer Science |
| topics[1].score | 0.9923999905586243 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/1708 |
| topics[1].subfield.display_name | Hardware and Architecture |
| topics[1].display_name | VLSI and Analog Circuit Testing |
| topics[2].id | https://openalex.org/T10558 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9919000267982483 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Advancements in Semiconductor Devices and Circuit Design |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C197162436 |
| concepts[0].level | 4 |
| concepts[0].score | 0.7853963375091553 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q83908 |
| concepts[0].display_name | NMOS logic |
| concepts[1].id | https://openalex.org/C2778413303 |
| concepts[1].level | 4 |
| concepts[1].score | 0.5956032276153564 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q210793 |
| concepts[1].display_name | MOSFET |
| concepts[2].id | https://openalex.org/C2780799671 |
| concepts[2].level | 2 |
| concepts[2].score | 0.5929529666900635 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q17087362 |
| concepts[2].display_name | Transient (computer programming) |
| concepts[3].id | https://openalex.org/C24326235 |
| concepts[3].level | 1 |
| concepts[3].score | 0.48108598589897156 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[3].display_name | Electronic engineering |
| concepts[4].id | https://openalex.org/C172385210 |
| concepts[4].level | 3 |
| concepts[4].score | 0.4750494956970215 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q5339 |
| concepts[4].display_name | Transistor |
| concepts[5].id | https://openalex.org/C41008148 |
| concepts[5].level | 0 |
| concepts[5].score | 0.45802411437034607 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[5].display_name | Computer science |
| concepts[6].id | https://openalex.org/C47949032 |
| concepts[6].level | 3 |
| concepts[6].score | 0.4512374699115753 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q663542 |
| concepts[6].display_name | Overcurrent |
| concepts[7].id | https://openalex.org/C119599485 |
| concepts[7].level | 1 |
| concepts[7].score | 0.4371562898159027 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[7].display_name | Electrical engineering |
| concepts[8].id | https://openalex.org/C167740415 |
| concepts[8].level | 2 |
| concepts[8].score | 0.4364601969718933 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q2876213 |
| concepts[8].display_name | Aerospace |
| concepts[9].id | https://openalex.org/C34929307 |
| concepts[9].level | 3 |
| concepts[9].score | 0.41475093364715576 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q845636 |
| concepts[9].display_name | Technology CAD |
| concepts[10].id | https://openalex.org/C148043351 |
| concepts[10].level | 2 |
| concepts[10].score | 0.28975701332092285 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q4456944 |
| concepts[10].display_name | Current (fluid) |
| concepts[11].id | https://openalex.org/C165801399 |
| concepts[11].level | 2 |
| concepts[11].score | 0.28035157918930054 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q25428 |
| concepts[11].display_name | Voltage |
| concepts[12].id | https://openalex.org/C127413603 |
| concepts[12].level | 0 |
| concepts[12].score | 0.26424098014831543 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[12].display_name | Engineering |
| concepts[13].id | https://openalex.org/C146978453 |
| concepts[13].level | 1 |
| concepts[13].score | 0.11701858043670654 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q3798668 |
| concepts[13].display_name | Aerospace engineering |
| concepts[14].id | https://openalex.org/C194789388 |
| concepts[14].level | 2 |
| concepts[14].score | 0.0 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q17855283 |
| concepts[14].display_name | CAD |
| concepts[15].id | https://openalex.org/C111919701 |
| concepts[15].level | 1 |
| concepts[15].score | 0.0 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q9135 |
| concepts[15].display_name | Operating system |
| concepts[16].id | https://openalex.org/C199639397 |
| concepts[16].level | 1 |
| concepts[16].score | 0.0 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q1788588 |
| concepts[16].display_name | Engineering drawing |
| keywords[0].id | https://openalex.org/keywords/nmos-logic |
| keywords[0].score | 0.7853963375091553 |
| keywords[0].display_name | NMOS logic |
| keywords[1].id | https://openalex.org/keywords/mosfet |
| keywords[1].score | 0.5956032276153564 |
| keywords[1].display_name | MOSFET |
| keywords[2].id | https://openalex.org/keywords/transient |
| keywords[2].score | 0.5929529666900635 |
| keywords[2].display_name | Transient (computer programming) |
| keywords[3].id | https://openalex.org/keywords/electronic-engineering |
| keywords[3].score | 0.48108598589897156 |
| keywords[3].display_name | Electronic engineering |
| keywords[4].id | https://openalex.org/keywords/transistor |
| keywords[4].score | 0.4750494956970215 |
| keywords[4].display_name | Transistor |
| keywords[5].id | https://openalex.org/keywords/computer-science |
| keywords[5].score | 0.45802411437034607 |
| keywords[5].display_name | Computer science |
| keywords[6].id | https://openalex.org/keywords/overcurrent |
| keywords[6].score | 0.4512374699115753 |
| keywords[6].display_name | Overcurrent |
| keywords[7].id | https://openalex.org/keywords/electrical-engineering |
| keywords[7].score | 0.4371562898159027 |
| keywords[7].display_name | Electrical engineering |
| keywords[8].id | https://openalex.org/keywords/aerospace |
| keywords[8].score | 0.4364601969718933 |
| keywords[8].display_name | Aerospace |
| keywords[9].id | https://openalex.org/keywords/technology-cad |
| keywords[9].score | 0.41475093364715576 |
| keywords[9].display_name | Technology CAD |
| keywords[10].id | https://openalex.org/keywords/current |
| keywords[10].score | 0.28975701332092285 |
| keywords[10].display_name | Current (fluid) |
| keywords[11].id | https://openalex.org/keywords/voltage |
| keywords[11].score | 0.28035157918930054 |
| keywords[11].display_name | Voltage |
| keywords[12].id | https://openalex.org/keywords/engineering |
| keywords[12].score | 0.26424098014831543 |
| keywords[12].display_name | Engineering |
| keywords[13].id | https://openalex.org/keywords/aerospace-engineering |
| keywords[13].score | 0.11701858043670654 |
| keywords[13].display_name | Aerospace engineering |
| language | en |
| locations[0].id | doi:10.1587/elex.13.20160014 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S207433681 |
| locations[0].source.issn | 1349-2543, 1349-9467 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 1349-2543 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | IEICE Electronics Express |
| locations[0].source.host_organization | https://openalex.org/P4320800604 |
| locations[0].source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| locations[0].source.host_organization_lineage | https://openalex.org/P4320800604 |
| locations[0].source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| locations[0].license | |
| locations[0].pdf_url | https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | IEICE Electronics Express |
| locations[0].landing_page_url | https://doi.org/10.1587/elex.13.20160014 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5087653391 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | Jingqiu Wang |
| authorships[0].countries | CN |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[0].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[0].affiliations[1].institution_ids | https://openalex.org/I126520041 |
| authorships[0].affiliations[1].raw_affiliation_string | School of Information Science and Technology, University of Science and Technology of China |
| authorships[0].institutions[0].id | https://openalex.org/I19820366 |
| authorships[0].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[0].institutions[0].type | government |
| authorships[0].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[0].institutions[0].country_code | CN |
| authorships[0].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[0].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[0].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[0].institutions[1].type | facility |
| authorships[0].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[0].institutions[1].country_code | CN |
| authorships[0].institutions[1].display_name | Shandong Institute of Automation |
| authorships[0].institutions[2].id | https://openalex.org/I126520041 |
| authorships[0].institutions[2].ror | https://ror.org/04c4dkn09 |
| authorships[0].institutions[2].type | education |
| authorships[0].institutions[2].lineage | https://openalex.org/I126520041, https://openalex.org/I19820366 |
| authorships[0].institutions[2].country_code | CN |
| authorships[0].institutions[2].display_name | University of Science and Technology of China |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Jingqiu Wang |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences, School of Information Science and Technology, University of Science and Technology of China |
| authorships[1].author.id | https://openalex.org/A5078740447 |
| authorships[1].author.orcid | https://orcid.org/0000-0001-9238-6737 |
| authorships[1].author.display_name | Fujiang Lin |
| authorships[1].countries | CN |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I126520041 |
| authorships[1].affiliations[0].raw_affiliation_string | School of Information Science and Technology, University of Science and Technology of China |
| authorships[1].institutions[0].id | https://openalex.org/I126520041 |
| authorships[1].institutions[0].ror | https://ror.org/04c4dkn09 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I126520041, https://openalex.org/I19820366 |
| authorships[1].institutions[0].country_code | CN |
| authorships[1].institutions[0].display_name | University of Science and Technology of China |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Fujiang Lin |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | School of Information Science and Technology, University of Science and Technology of China |
| authorships[2].author.id | https://openalex.org/A5100665178 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-5428-5596 |
| authorships[2].author.display_name | Donglin Wang |
| authorships[2].countries | CN |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[2].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[2].institutions[0].id | https://openalex.org/I19820366 |
| authorships[2].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[2].institutions[0].type | government |
| authorships[2].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[2].institutions[0].country_code | CN |
| authorships[2].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[2].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[2].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[2].institutions[1].type | facility |
| authorships[2].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[2].institutions[1].country_code | CN |
| authorships[2].institutions[1].display_name | Shandong Institute of Automation |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Donglin Wang |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[3].author.id | https://openalex.org/A5015385339 |
| authorships[3].author.orcid | |
| authorships[3].author.display_name | Wenna Song |
| authorships[3].countries | CN |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[3].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[3].institutions[0].id | https://openalex.org/I19820366 |
| authorships[3].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[3].institutions[0].type | government |
| authorships[3].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[3].institutions[0].country_code | CN |
| authorships[3].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[3].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[3].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[3].institutions[1].type | facility |
| authorships[3].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[3].institutions[1].country_code | CN |
| authorships[3].institutions[1].display_name | Shandong Institute of Automation |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Wenna Song |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[4].author.id | https://openalex.org/A5100418870 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-9436-7035 |
| authorships[4].author.display_name | Li Liu |
| authorships[4].countries | CN |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[4].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[4].institutions[0].id | https://openalex.org/I19820366 |
| authorships[4].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[4].institutions[0].type | government |
| authorships[4].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[4].institutions[0].country_code | CN |
| authorships[4].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[4].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[4].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[4].institutions[1].type | facility |
| authorships[4].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[4].institutions[1].country_code | CN |
| authorships[4].institutions[1].display_name | Shandong Institute of Automation |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Li Liu |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[5].author.id | https://openalex.org/A5046062078 |
| authorships[5].author.orcid | https://orcid.org/0000-0002-3223-3269 |
| authorships[5].author.display_name | Qiwei Song |
| authorships[5].countries | CN |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[5].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[5].institutions[0].id | https://openalex.org/I19820366 |
| authorships[5].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[5].institutions[0].type | government |
| authorships[5].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[5].institutions[0].country_code | CN |
| authorships[5].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[5].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[5].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[5].institutions[1].type | facility |
| authorships[5].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[5].institutions[1].country_code | CN |
| authorships[5].institutions[1].display_name | Shandong Institute of Automation |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Qiwei Song |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[6].author.id | https://openalex.org/A5112386842 |
| authorships[6].author.orcid | https://orcid.org/0000-0002-0667-540X |
| authorships[6].author.display_name | Liang Chen |
| authorships[6].countries | CN |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I19820366, https://openalex.org/I4210094879 |
| authorships[6].affiliations[0].raw_affiliation_string | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| authorships[6].institutions[0].id | https://openalex.org/I19820366 |
| authorships[6].institutions[0].ror | https://ror.org/034t30j35 |
| authorships[6].institutions[0].type | government |
| authorships[6].institutions[0].lineage | https://openalex.org/I19820366 |
| authorships[6].institutions[0].country_code | CN |
| authorships[6].institutions[0].display_name | Chinese Academy of Sciences |
| authorships[6].institutions[1].id | https://openalex.org/I4210094879 |
| authorships[6].institutions[1].ror | https://ror.org/00qdtba35 |
| authorships[6].institutions[1].type | facility |
| authorships[6].institutions[1].lineage | https://openalex.org/I4210094879, https://openalex.org/I4210142748 |
| authorships[6].institutions[1].country_code | CN |
| authorships[6].institutions[1].display_name | Shandong Institute of Automation |
| authorships[6].author_position | last |
| authorships[6].raw_author_name | Liang Chen |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | National ASIC Design Engineering Center, Institute of Automation, Chinese Academy of Sciences |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdf |
| open_access.oa_status | diamond |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Collection of charge in NMOS from single event effect |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11005 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 1.0 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Radiation Effects in Electronics |
| related_works | https://openalex.org/W2217098757, https://openalex.org/W3208688275, https://openalex.org/W2088771128, https://openalex.org/W2263373136, https://openalex.org/W2796085262, https://openalex.org/W1742453416, https://openalex.org/W2999656532, https://openalex.org/W3185914787, https://openalex.org/W2922843507, https://openalex.org/W2767286817 |
| cited_by_count | 2 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 1 |
| counts_by_year[1].year | 2022 |
| counts_by_year[1].cited_by_count | 1 |
| locations_count | 1 |
| best_oa_location.id | doi:10.1587/elex.13.20160014 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S207433681 |
| best_oa_location.source.issn | 1349-2543, 1349-9467 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 1349-2543 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | IEICE Electronics Express |
| best_oa_location.source.host_organization | https://openalex.org/P4320800604 |
| best_oa_location.source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4320800604 |
| best_oa_location.source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| best_oa_location.license | |
| best_oa_location.pdf_url | https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | IEICE Electronics Express |
| best_oa_location.landing_page_url | https://doi.org/10.1587/elex.13.20160014 |
| primary_location.id | doi:10.1587/elex.13.20160014 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S207433681 |
| primary_location.source.issn | 1349-2543, 1349-9467 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 1349-2543 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | IEICE Electronics Express |
| primary_location.source.host_organization | https://openalex.org/P4320800604 |
| primary_location.source.host_organization_name | Institute of Electronics, Information and Communication Engineers |
| primary_location.source.host_organization_lineage | https://openalex.org/P4320800604 |
| primary_location.source.host_organization_lineage_names | Institute of Electronics, Information and Communication Engineers |
| primary_location.license | |
| primary_location.pdf_url | https://www.jstage.jst.go.jp/article/elex/13/8/13_13.20160014/_pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | IEICE Electronics Express |
| primary_location.landing_page_url | https://doi.org/10.1587/elex.13.20160014 |
| publication_date | 2016-01-01 |
| publication_year | 2016 |
| referenced_works | https://openalex.org/W586566244, https://openalex.org/W2115516668, https://openalex.org/W1996659322, https://openalex.org/W2037576944, https://openalex.org/W2056634481, https://openalex.org/W1600162194, https://openalex.org/W2100855482, https://openalex.org/W2030501553, https://openalex.org/W4285719527 |
| referenced_works_count | 9 |
| abstract_inverted_index.a | 60 |
| abstract_inverted_index.In | 0, 57 |
| abstract_inverted_index.at | 103 |
| abstract_inverted_index.be | 17, 95, 108 |
| abstract_inverted_index.in | 19 |
| abstract_inverted_index.is | 48, 68 |
| abstract_inverted_index.of | 22, 75, 101, 117, 125 |
| abstract_inverted_index.on | 71 |
| abstract_inverted_index.to | 111, 129 |
| abstract_inverted_index.SEE | 102 |
| abstract_inverted_index.The | 37 |
| abstract_inverted_index.and | 9, 106, 115 |
| abstract_inverted_index.can | 94, 107 |
| abstract_inverted_index.for | 45, 51, 98 |
| abstract_inverted_index.has | 82 |
| abstract_inverted_index.ion | 33 |
| abstract_inverted_index.new | 73 |
| abstract_inverted_index.not | 49 |
| abstract_inverted_index.our | 72 |
| abstract_inverted_index.the | 99, 113, 122 |
| abstract_inverted_index.This | 92 |
| abstract_inverted_index.been | 83 |
| abstract_inverted_index.deep | 53, 77 |
| abstract_inverted_index.high | 31 |
| abstract_inverted_index.this | 58 |
| abstract_inverted_index.thus | 120 |
| abstract_inverted_index.when | 30 |
| abstract_inverted_index.will | 7, 16 |
| abstract_inverted_index.(SEE) | 6 |
| abstract_inverted_index.(SET) | 13 |
| abstract_inverted_index.Aided | 88 |
| abstract_inverted_index.Field | 26 |
| abstract_inverted_index.Metal | 23 |
| abstract_inverted_index.Oxide | 24 |
| abstract_inverted_index.based | 70 |
| abstract_inverted_index.basis | 97 |
| abstract_inverted_index.cycle | 124 |
| abstract_inverted_index.event | 4, 11 |
| abstract_inverted_index.level | 105 |
| abstract_inverted_index.model | 43, 67, 93 |
| abstract_inverted_index.novel | 61 |
| abstract_inverted_index.occur | 8 |
| abstract_inverted_index.pulse | 15 |
| abstract_inverted_index.ultra | 52, 76 |
| abstract_inverted_index.using | 85 |
| abstract_inverted_index.which | 81 |
| abstract_inverted_index.(TCAD) | 90 |
| abstract_inverted_index.Design | 89 |
| abstract_inverted_index.Effect | 27 |
| abstract_inverted_index.double | 39, 63 |
| abstract_inverted_index.effect | 5 |
| abstract_inverted_index.energy | 32 |
| abstract_inverted_index.paper, | 59 |
| abstract_inverted_index.region | 21 |
| abstract_inverted_index.single | 3, 10 |
| abstract_inverted_index.within | 131 |
| abstract_inverted_index.applied | 110 |
| abstract_inverted_index.circuit | 104, 127 |
| abstract_inverted_index.current | 14, 42, 66 |
| abstract_inverted_index.induced | 18 |
| abstract_inverted_index.operate | 130 |
| abstract_inverted_index.strikes | 34 |
| abstract_inverted_index.typical | 38 |
| abstract_inverted_index.(MOSFET) | 29 |
| abstract_inverted_index.Computer | 87 |
| abstract_inverted_index.devices. | 36, 56 |
| abstract_inverted_index.evaluate | 112 |
| abstract_inverted_index.intended | 128 |
| abstract_inverted_index.proposed | 44, 69 |
| abstract_inverted_index.suitable | 50 |
| abstract_inverted_index.aerospace | 1, 132 |
| abstract_inverted_index.hardening | 118 |
| abstract_inverted_index.important | 96 |
| abstract_inverted_index.radiation | 79 |
| abstract_inverted_index.searching | 100 |
| abstract_inverted_index.transient | 12, 41, 65 |
| abstract_inverted_index.validated | 84 |
| abstract_inverted_index.Technology | 86 |
| abstract_inverted_index.Transistor | 28 |
| abstract_inverted_index.developing | 123 |
| abstract_inverted_index.integrated | 126 |
| abstract_inverted_index.mechanism, | 80 |
| abstract_inverted_index.shortening | 121 |
| abstract_inverted_index.sub-micron | 54, 78 |
| abstract_inverted_index.technique, | 119 |
| abstract_inverted_index.technology | 47, 55 |
| abstract_inverted_index.exponential | 40, 64 |
| abstract_inverted_index.performance | 116 |
| abstract_inverted_index.simulation. | 91 |
| abstract_inverted_index.traditional | 46 |
| abstract_inverted_index.drain/source | 20 |
| abstract_inverted_index.environment, | 2 |
| abstract_inverted_index.environment. | 133 |
| abstract_inverted_index.Semiconductor | 25 |
| abstract_inverted_index.effectiveness | 114 |
| abstract_inverted_index.semiconductor | 35 |
| abstract_inverted_index.transparently | 109 |
| abstract_inverted_index.understanding | 74 |
| abstract_inverted_index.multi-dimensional | 62 |
| cited_by_percentile_year.max | 95 |
| cited_by_percentile_year.min | 89 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 7 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/9 |
| sustainable_development_goals[0].score | 0.5799999833106995 |
| sustainable_development_goals[0].display_name | Industry, innovation and infrastructure |
| citation_normalized_percentile.value | 0.01215242 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |