IEEE Transactions on Very Large Scale Integration (VLSI) Systems • Vol 33 • No 6
Cost-Optimized Double-Node-Upset-Recovery Latch Designs With Aging Mitigation and Algorithm-Based Verification for Long-Term Robustness Enhancement
April 2025 • Aibin Yan, Changli Hu, Jing Li, Na Bai, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
International audience