Crystal orientation measurements using SEM–EBSD under unconventional conditions Article Swipe

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Electron backscatter diffraction Materials science Scanning electron microscope Crystallite Kikuchi line Planar Diffraction Crystal (programming language) Energy-dispersive X-ray spectroscopy Resolution (logic) Optics Crystallography Electron diffraction Composite material Metallurgy Microstructure Reflection high-energy electron diffraction Chemistry Physics Computer science Artificial intelligence Computer graphics (images) Programming language

Karsten Kunze ·

YOU? · · 2015 · Open Access · · DOI: https://doi.org/10.1017/s0885715615000263 · OA: W2606100236

Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scanning electron microscope (SEM). The vast majority of EBSD measurements is applied to planar and polished surfaces of polycrystalline bulk specimen. In this paper, we present examples of using EBSD and energy-dispersive X-ray spectroscopy (EDX) to analyze specimens that are not flat, not planar, or not bulk – but pillars, needles, and rods. The benefits of low vacuum SEM operation to reduced drift problems are displayed. It is further demonstrated that small and thin specimens enhance the attainable spatial resolution for orientation mapping (by EBSD or transmission Kikuchi diffraction) as well as for element mapping (by EDX).