Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications Article Swipe

View

Aibin Yan , Jing Xiang , Zhengfeng Huang , Tianming Ni , Jie Cui , Patrick Girard , Xiaoqing Wen ·

YOU? · · 2023 · Open Access · · DOI: https://doi.org/10.1109/itc-asia58802.2023.10301170

International audience

Related Topics

Upset (Competition)

Static Random-Access Memory

Computer Science

Transistor

Embedded System

Electrical Engineering

Structural Engineering

Mechanical Engineering

Quantum Mechanics

Concepts

Upset Node (physics) Static random-access memory Reliability (semiconductor) Computer science Transistor Power (physics) Power consumption Embedded system Circuit reliability Single event upset Low-power electronics Reliability engineering Electrical engineering Computer hardware Engineering Voltage Physics Structural engineering Mechanical engineering Quantum mechanics

Metadata

Type: article
Language: en
Landing Page: https://doi.org/10.1109/itc-asia58802.2023.10301170
OA Status: green
Cited By: 1
References: 14
Related Works: 10
OpenAlex ID: https://openalex.org/W4388117365

All OpenAlex metadata

Raw OpenAlex JSON

OpenAlex ID: https://openalex.org/W4388117365

Canonical identifier for this work in OpenAlex
DOI: https://doi.org/10.1109/itc-asia58802.2023.10301170

Digital Object Identifier
Title: Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications

Work title
Type: article

OpenAlex work type
Language: en

Primary language
Publication year: 2023

Year of publication
Publication date: 2023-09-12

Full publication date if available
Authors: Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen

List of authors in order
Landing page: https://doi.org/10.1109/itc-asia58802.2023.10301170

Publisher landing page
Open access: Yes

Whether a free full text is available
OA status: green

Open access status per OpenAlex
OA URL: https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173

Direct OA link when available
Concepts: Upset, Node (physics), Static random-access memory, Reliability (semiconductor), Computer science, Transistor, Power (physics), Power consumption, Embedded system, Circuit reliability, Single event upset, Low-power electronics, Reliability engineering, Electrical engineering, Computer hardware, Engineering, Voltage, Physics, Structural engineering, Mechanical engineering, Quantum mechanics

Top concepts (fields/topics) attached by OpenAlex
Cited by: 1

Total citation count in OpenAlex
Citations by year (recent): 2024: 1

Per-year citation counts (last 5 years)
References (count): 14

Number of works referenced by this work
Related works (count): 10

Other works algorithmically related by OpenAlex

Full payload

id	https://openalex.org/W4388117365
doi	https://doi.org/10.1109/itc-asia58802.2023.10301170
ids.doi	https://doi.org/10.1109/itc-asia58802.2023.10301170
ids.openalex	https://openalex.org/W4388117365
fwci	0.1658839
type	article
title	Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications
biblio.issue
biblio.volume
biblio.last_page	6
biblio.first_page	1
topics[0].id	https://openalex.org/T11005
topics[0].field.id	https://openalex.org/fields/22
topics[0].field.display_name	Engineering
topics[0].score	0.9998999834060669
topics[0].domain.id	https://openalex.org/domains/3
topics[0].domain.display_name	Physical Sciences
topics[0].subfield.id	https://openalex.org/subfields/2208
topics[0].subfield.display_name	Electrical and Electronic Engineering
topics[0].display_name	Radiation Effects in Electronics
topics[1].id	https://openalex.org/T10472
topics[1].field.id	https://openalex.org/fields/22
topics[1].field.display_name	Engineering
topics[1].score	0.9997000098228455
topics[1].domain.id	https://openalex.org/domains/3
topics[1].domain.display_name	Physical Sciences
topics[1].subfield.id	https://openalex.org/subfields/2208
topics[1].subfield.display_name	Electrical and Electronic Engineering
topics[1].display_name	Semiconductor materials and devices
topics[2].id	https://openalex.org/T10558
topics[2].field.id	https://openalex.org/fields/22
topics[2].field.display_name	Engineering
topics[2].score	0.9991000294685364
topics[2].domain.id	https://openalex.org/domains/3
topics[2].domain.display_name	Physical Sciences
topics[2].subfield.id	https://openalex.org/subfields/2208
topics[2].subfield.display_name	Electrical and Electronic Engineering
topics[2].display_name	Advancements in Semiconductor Devices and Circuit Design
is_xpac	False
apc_list
apc_paid
concepts[0].id	https://openalex.org/C2778002589
concepts[0].level	2
concepts[0].score	0.884035587310791
concepts[0].wikidata	https://www.wikidata.org/wiki/Q2406791
concepts[0].display_name	Upset
concepts[1].id	https://openalex.org/C62611344
concepts[1].level	2
concepts[1].score	0.7831299304962158
concepts[1].wikidata	https://www.wikidata.org/wiki/Q1062658
concepts[1].display_name	Node (physics)
concepts[2].id	https://openalex.org/C68043766
concepts[2].level	2
concepts[2].score	0.7619141340255737
concepts[2].wikidata	https://www.wikidata.org/wiki/Q267416
concepts[2].display_name	Static random-access memory
concepts[3].id	https://openalex.org/C43214815
concepts[3].level	3
concepts[3].score	0.6683580875396729
concepts[3].wikidata	https://www.wikidata.org/wiki/Q7310987
concepts[3].display_name	Reliability (semiconductor)
concepts[4].id	https://openalex.org/C41008148
concepts[4].level	0
concepts[4].score	0.5826039910316467
concepts[4].wikidata	https://www.wikidata.org/wiki/Q21198
concepts[4].display_name	Computer science
concepts[5].id	https://openalex.org/C172385210
concepts[5].level	3
concepts[5].score	0.5532457828521729
concepts[5].wikidata	https://www.wikidata.org/wiki/Q5339
concepts[5].display_name	Transistor
concepts[6].id	https://openalex.org/C163258240
concepts[6].level	2
concepts[6].score	0.5367530584335327
concepts[6].wikidata	https://www.wikidata.org/wiki/Q25342
concepts[6].display_name	Power (physics)
concepts[7].id	https://openalex.org/C2984118289
concepts[7].level	3
concepts[7].score	0.5257088541984558
concepts[7].wikidata	https://www.wikidata.org/wiki/Q29954
concepts[7].display_name	Power consumption
concepts[8].id	https://openalex.org/C149635348
concepts[8].level	1
concepts[8].score	0.4907890260219574
concepts[8].wikidata	https://www.wikidata.org/wiki/Q193040
concepts[8].display_name	Embedded system
concepts[9].id	https://openalex.org/C2778309119
concepts[9].level	4
concepts[9].score	0.4370056390762329
concepts[9].wikidata	https://www.wikidata.org/wiki/Q5121614
concepts[9].display_name	Circuit reliability
concepts[10].id	https://openalex.org/C2780073065
concepts[10].level	3
concepts[10].score	0.42207375168800354
concepts[10].wikidata	https://www.wikidata.org/wiki/Q1476733
concepts[10].display_name	Single event upset
concepts[11].id	https://openalex.org/C117551214
concepts[11].level	4
concepts[11].score	0.41134363412857056
concepts[11].wikidata	https://www.wikidata.org/wiki/Q6692774
concepts[11].display_name	Low-power electronics
concepts[12].id	https://openalex.org/C200601418
concepts[12].level	1
concepts[12].score	0.32332587242126465
concepts[12].wikidata	https://www.wikidata.org/wiki/Q2193887
concepts[12].display_name	Reliability engineering
concepts[13].id	https://openalex.org/C119599485
concepts[13].level	1
concepts[13].score	0.2831456661224365
concepts[13].wikidata	https://www.wikidata.org/wiki/Q43035
concepts[13].display_name	Electrical engineering
concepts[14].id	https://openalex.org/C9390403
concepts[14].level	1
concepts[14].score	0.20115670561790466
concepts[14].wikidata	https://www.wikidata.org/wiki/Q3966
concepts[14].display_name	Computer hardware
concepts[15].id	https://openalex.org/C127413603
concepts[15].level	0
concepts[15].score	0.17035537958145142
concepts[15].wikidata	https://www.wikidata.org/wiki/Q11023
concepts[15].display_name	Engineering
concepts[16].id	https://openalex.org/C165801399
concepts[16].level	2
concepts[16].score	0.08289352059364319
concepts[16].wikidata	https://www.wikidata.org/wiki/Q25428
concepts[16].display_name	Voltage
concepts[17].id	https://openalex.org/C121332964
concepts[17].level	0
concepts[17].score	0.06582081317901611
concepts[17].wikidata	https://www.wikidata.org/wiki/Q413
concepts[17].display_name	Physics
concepts[18].id	https://openalex.org/C66938386
concepts[18].level	1
concepts[18].score	0.0
concepts[18].wikidata	https://www.wikidata.org/wiki/Q633538
concepts[18].display_name	Structural engineering
concepts[19].id	https://openalex.org/C78519656
concepts[19].level	1
concepts[19].score	0.0
concepts[19].wikidata	https://www.wikidata.org/wiki/Q101333
concepts[19].display_name	Mechanical engineering
concepts[20].id	https://openalex.org/C62520636
concepts[20].level	1
concepts[20].score	0.0
concepts[20].wikidata	https://www.wikidata.org/wiki/Q944
concepts[20].display_name	Quantum mechanics
keywords[0].id	https://openalex.org/keywords/upset
keywords[0].score	0.884035587310791
keywords[0].display_name	Upset
keywords[1].id	https://openalex.org/keywords/node
keywords[1].score	0.7831299304962158
keywords[1].display_name	Node (physics)
keywords[2].id	https://openalex.org/keywords/static-random-access-memory
keywords[2].score	0.7619141340255737
keywords[2].display_name	Static random-access memory
keywords[3].id	https://openalex.org/keywords/reliability
keywords[3].score	0.6683580875396729
keywords[3].display_name	Reliability (semiconductor)
keywords[4].id	https://openalex.org/keywords/computer-science
keywords[4].score	0.5826039910316467
keywords[4].display_name	Computer science
keywords[5].id	https://openalex.org/keywords/transistor
keywords[5].score	0.5532457828521729
keywords[5].display_name	Transistor
keywords[6].id	https://openalex.org/keywords/power
keywords[6].score	0.5367530584335327
keywords[6].display_name	Power (physics)
keywords[7].id	https://openalex.org/keywords/power-consumption
keywords[7].score	0.5257088541984558
keywords[7].display_name	Power consumption
keywords[8].id	https://openalex.org/keywords/embedded-system
keywords[8].score	0.4907890260219574
keywords[8].display_name	Embedded system
keywords[9].id	https://openalex.org/keywords/circuit-reliability
keywords[9].score	0.4370056390762329
keywords[9].display_name	Circuit reliability
keywords[10].id	https://openalex.org/keywords/single-event-upset
keywords[10].score	0.42207375168800354
keywords[10].display_name	Single event upset
keywords[11].id	https://openalex.org/keywords/low-power-electronics
keywords[11].score	0.41134363412857056
keywords[11].display_name	Low-power electronics
keywords[12].id	https://openalex.org/keywords/reliability-engineering
keywords[12].score	0.32332587242126465
keywords[12].display_name	Reliability engineering
keywords[13].id	https://openalex.org/keywords/electrical-engineering
keywords[13].score	0.2831456661224365
keywords[13].display_name	Electrical engineering
keywords[14].id	https://openalex.org/keywords/computer-hardware
keywords[14].score	0.20115670561790466
keywords[14].display_name	Computer hardware
keywords[15].id	https://openalex.org/keywords/engineering
keywords[15].score	0.17035537958145142
keywords[15].display_name	Engineering
keywords[16].id	https://openalex.org/keywords/voltage
keywords[16].score	0.08289352059364319
keywords[16].display_name	Voltage
keywords[17].id	https://openalex.org/keywords/physics
keywords[17].score	0.06582081317901611
keywords[17].display_name	Physics
language	en
locations[0].id	doi:10.1109/itc-asia58802.2023.10301170
locations[0].is_oa	False
locations[0].source
locations[0].license
locations[0].pdf_url
locations[0].version	publishedVersion
locations[0].raw_type	proceedings-article
locations[0].license_id
locations[0].is_accepted	True
locations[0].is_published	True
locations[0].raw_source_name	2023 IEEE International Test Conference in Asia (ITC-Asia)
locations[0].landing_page_url	https://doi.org/10.1109/itc-asia58802.2023.10301170
locations[1].id	pmh:oai:HAL:lirmm-04241173v1
locations[1].is_oa	True
locations[1].source.id	https://openalex.org/S4306402512
locations[1].source.issn
locations[1].source.type	repository
locations[1].source.is_oa	False
locations[1].source.issn_l
locations[1].source.is_core	False
locations[1].source.is_in_doaj	False
locations[1].source.display_name	HAL (Le Centre pour la Communication Scientifique Directe)
locations[1].source.host_organization	https://openalex.org/I1294671590
locations[1].source.host_organization_name	Centre National de la Recherche Scientifique
locations[1].source.host_organization_lineage	https://openalex.org/I1294671590
locations[1].license	other-oa
locations[1].pdf_url
locations[1].version	submittedVersion
locations[1].raw_type	Conference papers
locations[1].license_id	https://openalex.org/licenses/other-oa
locations[1].is_accepted	False
locations[1].is_published	False
locations[1].raw_source_name	ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-6, ⟨10.1109/ITC-Asia58802.2023.10301170⟩
locations[1].landing_page_url	https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173
indexed_in	crossref
authorships[0].author.id	https://openalex.org/A5072439444
authorships[0].author.orcid	https://orcid.org/0000-0003-0024-987X
authorships[0].author.display_name	Aibin Yan
authorships[0].countries	CN
authorships[0].affiliations[0].institution_ids	https://openalex.org/I143868143
authorships[0].affiliations[0].raw_affiliation_string	School of Computer Science and Technology, Anhui University, Hefei, China
authorships[0].affiliations[1].institution_ids	https://openalex.org/I16365422
authorships[0].affiliations[1].raw_affiliation_string	School of Microelectronics, Hefei University of Technology, Hefei, China
authorships[0].institutions[0].id	https://openalex.org/I143868143
authorships[0].institutions[0].ror	https://ror.org/05th6yx34
authorships[0].institutions[0].type	education
authorships[0].institutions[0].lineage	https://openalex.org/I143868143
authorships[0].institutions[0].country_code	CN
authorships[0].institutions[0].display_name	Anhui University
authorships[0].institutions[1].id	https://openalex.org/I16365422
authorships[0].institutions[1].ror	https://ror.org/02czkny70
authorships[0].institutions[1].type	education
authorships[0].institutions[1].lineage	https://openalex.org/I16365422
authorships[0].institutions[1].country_code	CN
authorships[0].institutions[1].display_name	Hefei University of Technology
authorships[0].author_position	first
authorships[0].raw_author_name	Aibin Yan
authorships[0].is_corresponding	False
authorships[0].raw_affiliation_strings	School of Computer Science and Technology, Anhui University, Hefei, China, School of Microelectronics, Hefei University of Technology, Hefei, China
authorships[1].author.id	https://openalex.org/A5047431544
authorships[1].author.orcid
authorships[1].author.display_name	Jing Xiang
authorships[1].countries	CN
authorships[1].affiliations[0].institution_ids	https://openalex.org/I143868143
authorships[1].affiliations[0].raw_affiliation_string	School of Computer Science and Technology, Anhui University, Hefei, China
authorships[1].institutions[0].id	https://openalex.org/I143868143
authorships[1].institutions[0].ror	https://ror.org/05th6yx34
authorships[1].institutions[0].type	education
authorships[1].institutions[0].lineage	https://openalex.org/I143868143
authorships[1].institutions[0].country_code	CN
authorships[1].institutions[0].display_name	Anhui University
authorships[1].author_position	middle
authorships[1].raw_author_name	Jing Xiang
authorships[1].is_corresponding	False
authorships[1].raw_affiliation_strings	School of Computer Science and Technology, Anhui University, Hefei, China
authorships[2].author.id	https://openalex.org/A5073810494
authorships[2].author.orcid	https://orcid.org/0000-0001-8695-4478
authorships[2].author.display_name	Zhengfeng Huang
authorships[2].countries	CN
authorships[2].affiliations[0].institution_ids	https://openalex.org/I16365422
authorships[2].affiliations[0].raw_affiliation_string	School of Microelectronics, Hefei University of Technology, Hefei, China
authorships[2].institutions[0].id	https://openalex.org/I16365422
authorships[2].institutions[0].ror	https://ror.org/02czkny70
authorships[2].institutions[0].type	education
authorships[2].institutions[0].lineage	https://openalex.org/I16365422
authorships[2].institutions[0].country_code	CN
authorships[2].institutions[0].display_name	Hefei University of Technology
authorships[2].author_position	middle
authorships[2].raw_author_name	Zhengfeng Huang
authorships[2].is_corresponding	False
authorships[2].raw_affiliation_strings	School of Microelectronics, Hefei University of Technology, Hefei, China
authorships[3].author.id	https://openalex.org/A5085987622
authorships[3].author.orcid	https://orcid.org/0000-0001-6272-8660
authorships[3].author.display_name	Tianming Ni
authorships[3].countries	CN
authorships[3].affiliations[0].institution_ids	https://openalex.org/I70908550
authorships[3].affiliations[0].raw_affiliation_string	School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China
authorships[3].institutions[0].id	https://openalex.org/I70908550
authorships[3].institutions[0].ror	https://ror.org/041sj0284
authorships[3].institutions[0].type	education
authorships[3].institutions[0].lineage	https://openalex.org/I70908550
authorships[3].institutions[0].country_code	CN
authorships[3].institutions[0].display_name	Anhui Polytechnic University
authorships[3].author_position	middle
authorships[3].raw_author_name	Tianming Ni
authorships[3].is_corresponding	False
authorships[3].raw_affiliation_strings	School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China
authorships[4].author.id	https://openalex.org/A5081525426
authorships[4].author.orcid	https://orcid.org/0000-0001-7258-3418
authorships[4].author.display_name	Jie Cui
authorships[4].countries	CN
authorships[4].affiliations[0].institution_ids	https://openalex.org/I143868143
authorships[4].affiliations[0].raw_affiliation_string	School of Computer Science and Technology, Anhui University, Hefei, China
authorships[4].institutions[0].id	https://openalex.org/I143868143
authorships[4].institutions[0].ror	https://ror.org/05th6yx34
authorships[4].institutions[0].type	education
authorships[4].institutions[0].lineage	https://openalex.org/I143868143
authorships[4].institutions[0].country_code	CN
authorships[4].institutions[0].display_name	Anhui University
authorships[4].author_position	middle
authorships[4].raw_author_name	Jie Cui
authorships[4].is_corresponding	False
authorships[4].raw_affiliation_strings	School of Computer Science and Technology, Anhui University, Hefei, China
authorships[5].author.id	https://openalex.org/A5005116115
authorships[5].author.orcid	https://orcid.org/0000-0003-0722-8772
authorships[5].author.display_name	Patrick Girard
authorships[5].countries	FR
authorships[5].affiliations[0].institution_ids	https://openalex.org/I1294671590, https://openalex.org/I19894307, https://openalex.org/I4210101743
authorships[5].affiliations[0].raw_affiliation_string	Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France
authorships[5].institutions[0].id	https://openalex.org/I1294671590
authorships[5].institutions[0].ror	https://ror.org/02feahw73
authorships[5].institutions[0].type	government
authorships[5].institutions[0].lineage	https://openalex.org/I1294671590
authorships[5].institutions[0].country_code	FR
authorships[5].institutions[0].display_name	Centre National de la Recherche Scientifique
authorships[5].institutions[1].id	https://openalex.org/I4210101743
authorships[5].institutions[1].ror	https://ror.org/013yean28
authorships[5].institutions[1].type	facility
authorships[5].institutions[1].lineage	https://openalex.org/I1294671590, https://openalex.org/I1294671590, https://openalex.org/I1326498283, https://openalex.org/I151295451, https://openalex.org/I19894307, https://openalex.org/I4210101743, https://openalex.org/I4210159245, https://openalex.org/I4412460525
authorships[5].institutions[1].country_code	FR
authorships[5].institutions[1].display_name	Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
authorships[5].institutions[2].id	https://openalex.org/I19894307
authorships[5].institutions[2].ror	https://ror.org/051escj72
authorships[5].institutions[2].type	education
authorships[5].institutions[2].lineage	https://openalex.org/I19894307
authorships[5].institutions[2].country_code	FR
authorships[5].institutions[2].display_name	Université de Montpellier
authorships[5].author_position	middle
authorships[5].raw_author_name	Patrick Girard
authorships[5].is_corresponding	False
authorships[5].raw_affiliation_strings	Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France
authorships[6].author.id	https://openalex.org/A5084697545
authorships[6].author.orcid	https://orcid.org/0000-0001-8305-604X
authorships[6].author.display_name	Xiaoqing Wen
authorships[6].countries	JP
authorships[6].affiliations[0].institution_ids	https://openalex.org/I207014233
authorships[6].affiliations[0].raw_affiliation_string	Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan
authorships[6].institutions[0].id	https://openalex.org/I207014233
authorships[6].institutions[0].ror	https://ror.org/02278tr80
authorships[6].institutions[0].type	education
authorships[6].institutions[0].lineage	https://openalex.org/I207014233
authorships[6].institutions[0].country_code	JP
authorships[6].institutions[0].display_name	Kyushu Institute of Technology
authorships[6].author_position	last
authorships[6].raw_author_name	Xiaoqing Wen
authorships[6].is_corresponding	False
authorships[6].raw_affiliation_strings	Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan
has_content.pdf	False
has_content.grobid_xml	False
is_paratext	False
open_access.is_oa	True
open_access.oa_url	https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173
open_access.oa_status	green
open_access.any_repository_has_fulltext	False
created_date	2025-10-10T00:00:00
display_name	Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications
has_fulltext	False
is_retracted	False
updated_date	2025-11-06T03:46:38.306776
primary_topic.id	https://openalex.org/T11005
primary_topic.field.id	https://openalex.org/fields/22
primary_topic.field.display_name	Engineering
primary_topic.score	0.9998999834060669
primary_topic.domain.id	https://openalex.org/domains/3
primary_topic.domain.display_name	Physical Sciences
primary_topic.subfield.id	https://openalex.org/subfields/2208
primary_topic.subfield.display_name	Electrical and Electronic Engineering
primary_topic.display_name	Radiation Effects in Electronics
related_works	https://openalex.org/W2102538861, https://openalex.org/W2765704306, https://openalex.org/W2123934961, https://openalex.org/W1540420234, https://openalex.org/W2161646799, https://openalex.org/W2359969304, https://openalex.org/W764628369, https://openalex.org/W3208260600, https://openalex.org/W2065552285, https://openalex.org/W2051386096
cited_by_count	1
counts_by_year[0].year	2024
counts_by_year[0].cited_by_count	1
locations_count	2
best_oa_location.id	pmh:oai:HAL:lirmm-04241173v1
best_oa_location.is_oa	True
best_oa_location.source.id	https://openalex.org/S4306402512
best_oa_location.source.issn
best_oa_location.source.type	repository
best_oa_location.source.is_oa	False
best_oa_location.source.issn_l
best_oa_location.source.is_core	False
best_oa_location.source.is_in_doaj	False
best_oa_location.source.display_name	HAL (Le Centre pour la Communication Scientifique Directe)
best_oa_location.source.host_organization	https://openalex.org/I1294671590
best_oa_location.source.host_organization_name	Centre National de la Recherche Scientifique
best_oa_location.source.host_organization_lineage	https://openalex.org/I1294671590
best_oa_location.license	other-oa
best_oa_location.pdf_url
best_oa_location.version	submittedVersion
best_oa_location.raw_type	Conference papers
best_oa_location.license_id	https://openalex.org/licenses/other-oa
best_oa_location.is_accepted	False
best_oa_location.is_published	False
best_oa_location.raw_source_name	ITC-Asia 2023 - 7th IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. pp.1-6, ⟨10.1109/ITC-Asia58802.2023.10301170⟩
best_oa_location.landing_page_url	https://hal-lirmm.ccsd.cnrs.fr/lirmm-04241173
primary_location.id	doi:10.1109/itc-asia58802.2023.10301170
primary_location.is_oa	False
primary_location.source
primary_location.license
primary_location.pdf_url
primary_location.version	publishedVersion
primary_location.raw_type	proceedings-article
primary_location.license_id
primary_location.is_accepted	True
primary_location.is_published	True
primary_location.raw_source_name	2023 IEEE International Test Conference in Asia (ITC-Asia)
primary_location.landing_page_url	https://doi.org/10.1109/itc-asia58802.2023.10301170
publication_date	2023-09-12
publication_year	2023
referenced_works	https://openalex.org/W4313897315, https://openalex.org/W2009506926, https://openalex.org/W2784101586, https://openalex.org/W2033453286, https://openalex.org/W3081672332, https://openalex.org/W3112339708, https://openalex.org/W3155037334, https://openalex.org/W3162523375, https://openalex.org/W2784261945, https://openalex.org/W3137664271, https://openalex.org/W4319456276, https://openalex.org/W4320168170, https://openalex.org/W4285163035, https://openalex.org/W3094567060
referenced_works_count	14
abstract_inverted_index.audience	1
abstract_inverted_index.International	0
cited_by_percentile_year.max	94
cited_by_percentile_year.min	90
countries_distinct_count	3
institutions_distinct_count	7
sustainable_development_goals[0].id	https://metadata.un.org/sdg/7
sustainable_development_goals[0].score	0.8999999761581421
sustainable_development_goals[0].display_name	Affordable and clean energy
citation_normalized_percentile.value	0.49150919
citation_normalized_percentile.is_in_top_1_percent	False
citation_normalized_percentile.is_in_top_10_percent	False