Detection and Classification of Low-Voltage Series Arc Faults Based on RF-Adaboost-SHAP Article Swipe

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Li Qi , Takahiro Kawaguchi , Seiji Hashimoto ·

YOU? · · 2025 · Open Access · · DOI: https://doi.org/10.3390/electronics14193761

Low-voltage series arc faults pose a significant threat to power system safety due to their random, nonlinear, and non-stationary characteristics. Traditional detection methods often suffer from low sensitivity and poor robustness under complex load conditions. To address these challenges, this paper proposes a novel detection framework based on Random Forest (RF) feature selection, Adaptive Boosting (Adaboost) classification, and SHapley Additive exPlanations (SHAP) interpretability. First, RF is employed to rank and select the most discriminative features from arc fault current signals. Then, the selected features are input into an Adaboost classifier to enhance the detection accuracy and generalization capability. Finally, SHAP values are introduced to quantify the contribution of each feature, improving the transparency and interpretability of the model. Experimental results on a self-built arc fault dataset demonstrate that the proposed method achieves an accuracy of 97.1%, outperforming five widely used traditional classifiers. The integration of SHAP further reveals the physical relevance of key features, providing valuable insights for practical applications. This study confirms that the proposed RF-Adaboost-SHAP framework offers both high accuracy and interpretability, making it suitable for real-time arc fault detection in complex load scenarios.

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Type: article
Language: en
Landing Page: https://doi.org/10.3390/electronics14193761
PDF: https://www.mdpi.com/2079-9292/14/19/3761/pdf?version=1758634164
OA Status: gold
OpenAlex ID: https://openalex.org/W4414426734

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OpenAlex ID: https://openalex.org/W4414426734

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DOI: https://doi.org/10.3390/electronics14193761

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Title: Detection and Classification of Low-Voltage Series Arc Faults Based on RF-Adaboost-SHAP

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Type: article

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Language: en

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Publication year: 2025

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Publication date: 2025-09-23

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Authors: Li Qi, Takahiro Kawaguchi, Seiji Hashimoto

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Landing page: https://doi.org/10.3390/electronics14193761

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