Determination of mode I and II adhesion toughness of monolayer thin films by circular blister tests Article Swipe

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Christopher M. Harvey , Simon Wang , Bo Yuan , R.C. Thomson , Gary W. Critchlow ·

YOU? · · 2018 · Open Access · · DOI: https://doi.org/10.1016/j.tafmec.2018.01.006

Related Topics

Materials Science

Composite Material

Transition Metal Dichalcogenide Monolayers

Concepts

Materials science Composite material Monolayer Deflection (physics) Toughness Fracture toughness Thin film Blisters Adhesion Bending Optics Nanotechnology Physics

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Type: article
Language: en
Landing Page: https://doi.org/10.1016/j.tafmec.2018.01.006
OA Status: green
Cited By: 13
References: 32
Related Works: 10
OpenAlex ID: https://openalex.org/W2782006436

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OpenAlex ID: https://openalex.org/W2782006436

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DOI: https://doi.org/10.1016/j.tafmec.2018.01.006

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Title: Determination of mode I and II adhesion toughness of monolayer thin films by circular blister tests

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Type: article

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Language: en

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Publication year: 2018

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Publication date: 2018-01-06

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Authors: Christopher M. Harvey, Simon Wang, Bo Yuan, R.C. Thomson, Gary W. Critchlow

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Landing page: https://doi.org/10.1016/j.tafmec.2018.01.006

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OA status: green

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OA URL: https://dspace.lboro.ac.uk/2134/28040

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Concepts: Materials science, Composite material, Monolayer, Deflection (physics), Toughness, Fracture toughness, Thin film, Blisters, Adhesion, Bending, Optics, Nanotechnology, Physics

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Cited by: 13

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Citations by year (recent): 2025: 1, 2024: 5, 2023: 1, 2022: 1, 2021: 1

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References (count): 32

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Related works (count): 10

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