Development of a Diagnostic Method for Open/Short Circuit Faults in a Vienna Rectifier Based on the THD Method Using SOGI FLL Article Swipe
Keval Prakash Desai
,
José Matas
,
Josep M. Guerrero
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/app152312836
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/app152312836
The increasing demand for reliable DC fast-charging stations in electric vehicle (EV) infrastructure necessitates efficient fault detection mechanisms to ensure operational stability and user safety. This paper will present the development of a diagnostic method for identifying open-circuit faults and short-circuit faults in DC charging stations by leveraging Total Harmonic Distortion (THD) analysis combined with a Second-Order Generalized Integrator (SOGI). The proposed approach uses the THD method to detect anomalies in the current and voltage waveforms, while the Frequency Locked Loop (FLL) serves to track the frequency of the grid and keep the SOGI tuned to it, and SOGI-FLL provides the rectifier with the capability of tracking the frequency, amplitude, voltage, and phase of the grid and monitoring these parameters of the grid. The ability to measure the THD is the kernel of the detection of faults. Detailed simulation confirms the method’s high sensitivity and robustness in detecting open/short circuit faults with minimal false positives. This technique offers a cost-effective, non-invasive diagnostic solution suitable for modern DC charging systems, contributing to improved reliability and efficiency of EV charging infrastructure.
Related Topics
Concepts
Total harmonic distortion
Computer science
Robustness (evolution)
Integrator
Control theory (sociology)
Fault detection and isolation
Voltage
Rectifier (neural networks)
Electronic engineering
Grid
Reliability (semiconductor)
Distortion (music)
Three-phase
Kernel density estimation
Sensitivity (control systems)
Fault (geology)
Single phase
Waveform
Stability (learning theory)
Distribution grid
Harmonic
Fault current limiter
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.3390/app152312836
- OA Status
- gold
- References
- 24
- OpenAlex ID
- https://openalex.org/W7108455399
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W7108455399Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.3390/app152312836Digital Object Identifier
- Title
-
Development of a Diagnostic Method for Open/Short Circuit Faults in a Vienna Rectifier Based on the THD Method Using SOGI FLLWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2025Year of publication
- Publication date
-
2025-12-04Full publication date if available
- Authors
-
Keval Prakash Desai, José Matas, Josep M. GuerreroList of authors in order
- Landing page
-
https://doi.org/10.3390/app152312836Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.3390/app152312836Direct OA link when available
- Concepts
-
Total harmonic distortion, Computer science, Robustness (evolution), Integrator, Control theory (sociology), Fault detection and isolation, Voltage, Rectifier (neural networks), Electronic engineering, Grid, Reliability (semiconductor), Distortion (music), Three-phase, Kernel density estimation, Sensitivity (control systems), Fault (geology), Single phase, Waveform, Stability (learning theory), Distribution grid, Harmonic, Fault current limiterTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
0Total citation count in OpenAlex
- References (count)
-
24Number of works referenced by this work
Full payload
| id | https://openalex.org/W7108455399 |
|---|---|
| doi | https://doi.org/10.3390/app152312836 |
| ids.doi | https://doi.org/10.3390/app152312836 |
| ids.openalex | https://openalex.org/W7108455399 |
| fwci | 0.0 |
| type | article |
| title | Development of a Diagnostic Method for Open/Short Circuit Faults in a Vienna Rectifier Based on the THD Method Using SOGI FLL |
| biblio.issue | 23 |
| biblio.volume | 15 |
| biblio.last_page | 12836 |
| biblio.first_page | 12836 |
| topics[0].id | https://openalex.org/T10228 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.14076219499111176 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Multilevel Inverters and Converters |
| topics[1].id | https://openalex.org/T10663 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.13196450471878052 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2203 |
| topics[1].subfield.display_name | Automotive Engineering |
| topics[1].display_name | Advanced Battery Technologies Research |
| topics[2].id | https://openalex.org/T12737 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.08153250068426132 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Electrical Fault Detection and Protection |
| is_xpac | False |
| apc_list.value | 2300 |
| apc_list.currency | CHF |
| apc_list.value_usd | 2490 |
| apc_paid.value | 2300 |
| apc_paid.currency | CHF |
| apc_paid.value_usd | 2490 |
| concepts[0].id | https://openalex.org/C42156128 |
| concepts[0].level | 3 |
| concepts[0].score | 0.8394403457641602 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q162641 |
| concepts[0].display_name | Total harmonic distortion |
| concepts[1].id | https://openalex.org/C41008148 |
| concepts[1].level | 0 |
| concepts[1].score | 0.6277281641960144 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[1].display_name | Computer science |
| concepts[2].id | https://openalex.org/C63479239 |
| concepts[2].level | 3 |
| concepts[2].score | 0.5400325059890747 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q7353546 |
| concepts[2].display_name | Robustness (evolution) |
| concepts[3].id | https://openalex.org/C79518650 |
| concepts[3].level | 3 |
| concepts[3].score | 0.5359720587730408 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q2081431 |
| concepts[3].display_name | Integrator |
| concepts[4].id | https://openalex.org/C47446073 |
| concepts[4].level | 3 |
| concepts[4].score | 0.5191461443901062 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q5165890 |
| concepts[4].display_name | Control theory (sociology) |
| concepts[5].id | https://openalex.org/C152745839 |
| concepts[5].level | 3 |
| concepts[5].score | 0.4464699327945709 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q5438153 |
| concepts[5].display_name | Fault detection and isolation |
| concepts[6].id | https://openalex.org/C165801399 |
| concepts[6].level | 2 |
| concepts[6].score | 0.43549466133117676 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q25428 |
| concepts[6].display_name | Voltage |
| concepts[7].id | https://openalex.org/C50100734 |
| concepts[7].level | 5 |
| concepts[7].score | 0.4192703068256378 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q7303176 |
| concepts[7].display_name | Rectifier (neural networks) |
| concepts[8].id | https://openalex.org/C24326235 |
| concepts[8].level | 1 |
| concepts[8].score | 0.40871500968933105 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[8].display_name | Electronic engineering |
| concepts[9].id | https://openalex.org/C187691185 |
| concepts[9].level | 2 |
| concepts[9].score | 0.39319226145744324 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q2020720 |
| concepts[9].display_name | Grid |
| concepts[10].id | https://openalex.org/C43214815 |
| concepts[10].level | 3 |
| concepts[10].score | 0.3600866496562958 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q7310987 |
| concepts[10].display_name | Reliability (semiconductor) |
| concepts[11].id | https://openalex.org/C126780896 |
| concepts[11].level | 4 |
| concepts[11].score | 0.3582879602909088 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q899871 |
| concepts[11].display_name | Distortion (music) |
| concepts[12].id | https://openalex.org/C173871940 |
| concepts[12].level | 3 |
| concepts[12].score | 0.35679134726524353 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q471846 |
| concepts[12].display_name | Three-phase |
| concepts[13].id | https://openalex.org/C71134354 |
| concepts[13].level | 3 |
| concepts[13].score | 0.3227773606777191 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q458825 |
| concepts[13].display_name | Kernel density estimation |
| concepts[14].id | https://openalex.org/C21200559 |
| concepts[14].level | 2 |
| concepts[14].score | 0.31323617696762085 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q7451068 |
| concepts[14].display_name | Sensitivity (control systems) |
| concepts[15].id | https://openalex.org/C175551986 |
| concepts[15].level | 2 |
| concepts[15].score | 0.3067590594291687 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q47089 |
| concepts[15].display_name | Fault (geology) |
| concepts[16].id | https://openalex.org/C2989427145 |
| concepts[16].level | 2 |
| concepts[16].score | 0.2926725149154663 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q260295 |
| concepts[16].display_name | Single phase |
| concepts[17].id | https://openalex.org/C197424946 |
| concepts[17].level | 3 |
| concepts[17].score | 0.29199323058128357 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q1165717 |
| concepts[17].display_name | Waveform |
| concepts[18].id | https://openalex.org/C112972136 |
| concepts[18].level | 2 |
| concepts[18].score | 0.27375638484954834 |
| concepts[18].wikidata | https://www.wikidata.org/wiki/Q7595718 |
| concepts[18].display_name | Stability (learning theory) |
| concepts[19].id | https://openalex.org/C2986219281 |
| concepts[19].level | 3 |
| concepts[19].score | 0.2626628279685974 |
| concepts[19].wikidata | https://www.wikidata.org/wiki/Q844861 |
| concepts[19].display_name | Distribution grid |
| concepts[20].id | https://openalex.org/C127934551 |
| concepts[20].level | 2 |
| concepts[20].score | 0.25583139061927795 |
| concepts[20].wikidata | https://www.wikidata.org/wiki/Q1148098 |
| concepts[20].display_name | Harmonic |
| concepts[21].id | https://openalex.org/C129187525 |
| concepts[21].level | 4 |
| concepts[21].score | 0.2504842281341553 |
| concepts[21].wikidata | https://www.wikidata.org/wiki/Q10858078 |
| concepts[21].display_name | Fault current limiter |
| keywords[0].id | https://openalex.org/keywords/total-harmonic-distortion |
| keywords[0].score | 0.8394403457641602 |
| keywords[0].display_name | Total harmonic distortion |
| keywords[1].id | https://openalex.org/keywords/robustness |
| keywords[1].score | 0.5400325059890747 |
| keywords[1].display_name | Robustness (evolution) |
| keywords[2].id | https://openalex.org/keywords/integrator |
| keywords[2].score | 0.5359720587730408 |
| keywords[2].display_name | Integrator |
| keywords[3].id | https://openalex.org/keywords/control-theory |
| keywords[3].score | 0.5191461443901062 |
| keywords[3].display_name | Control theory (sociology) |
| keywords[4].id | https://openalex.org/keywords/fault-detection-and-isolation |
| keywords[4].score | 0.4464699327945709 |
| keywords[4].display_name | Fault detection and isolation |
| keywords[5].id | https://openalex.org/keywords/voltage |
| keywords[5].score | 0.43549466133117676 |
| keywords[5].display_name | Voltage |
| keywords[6].id | https://openalex.org/keywords/rectifier |
| keywords[6].score | 0.4192703068256378 |
| keywords[6].display_name | Rectifier (neural networks) |
| keywords[7].id | https://openalex.org/keywords/grid |
| keywords[7].score | 0.39319226145744324 |
| keywords[7].display_name | Grid |
| language | en |
| locations[0].id | doi:10.3390/app152312836 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S4210205812 |
| locations[0].source.issn | 2076-3417 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 2076-3417 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | True |
| locations[0].source.display_name | Applied Sciences |
| locations[0].source.host_organization | https://openalex.org/P4310310987 |
| locations[0].source.host_organization_name | Multidisciplinary Digital Publishing Institute |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310310987 |
| locations[0].source.host_organization_lineage_names | Multidisciplinary Digital Publishing Institute |
| locations[0].license | cc-by |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Applied Sciences |
| locations[0].landing_page_url | https://doi.org/10.3390/app152312836 |
| indexed_in | crossref, doaj |
| authorships[0].author.id | https://openalex.org/A5119318281 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | Keval Prakash Desai |
| authorships[0].countries | ES |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I9617848 |
| authorships[0].affiliations[0].raw_affiliation_string | Barcelona East School of Engineering (EEBE), Polytechnic University of Catalonia—BarcelonaTech (UPC), 08034 Barcelona, Spain |
| authorships[0].institutions[0].id | https://openalex.org/I9617848 |
| authorships[0].institutions[0].ror | https://ror.org/03mb6wj31 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I9617848 |
| authorships[0].institutions[0].country_code | ES |
| authorships[0].institutions[0].display_name | Universitat Politècnica de Catalunya |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Keval Prakash Desai |
| authorships[0].is_corresponding | True |
| authorships[0].raw_affiliation_strings | Barcelona East School of Engineering (EEBE), Polytechnic University of Catalonia—BarcelonaTech (UPC), 08034 Barcelona, Spain |
| authorships[1].author.id | https://openalex.org/A2109681410 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-7624-6897 |
| authorships[1].author.display_name | José Matas |
| authorships[1].countries | ES |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I9617848 |
| authorships[1].affiliations[0].raw_affiliation_string | Barcelona East School of Engineering (EEBE), Polytechnic University of Catalonia—BarcelonaTech (UPC), 08034 Barcelona, Spain |
| authorships[1].institutions[0].id | https://openalex.org/I9617848 |
| authorships[1].institutions[0].ror | https://ror.org/03mb6wj31 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I9617848 |
| authorships[1].institutions[0].country_code | ES |
| authorships[1].institutions[0].display_name | Universitat Politècnica de Catalunya |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | José Matas |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Barcelona East School of Engineering (EEBE), Polytechnic University of Catalonia—BarcelonaTech (UPC), 08034 Barcelona, Spain |
| authorships[2].author.id | https://openalex.org/A2463309245 |
| authorships[2].author.orcid | https://orcid.org/0000-0001-5236-4592 |
| authorships[2].author.display_name | Josep M. Guerrero |
| authorships[2].countries | CN |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I76130692 |
| authorships[2].affiliations[0].raw_affiliation_string | Center for Research on Microgrids (CROM), Zhejiang University, Hangzhou 310027, China |
| authorships[2].institutions[0].id | https://openalex.org/I76130692 |
| authorships[2].institutions[0].ror | https://ror.org/00a2xv884 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I76130692 |
| authorships[2].institutions[0].country_code | CN |
| authorships[2].institutions[0].display_name | Zhejiang University |
| authorships[2].author_position | last |
| authorships[2].raw_author_name | Josep M. Guerrero |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Center for Research on Microgrids (CROM), Zhejiang University, Hangzhou 310027, China |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.3390/app152312836 |
| open_access.oa_status | gold |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-12-04T00:00:00 |
| display_name | Development of a Diagnostic Method for Open/Short Circuit Faults in a Vienna Rectifier Based on the THD Method Using SOGI FLL |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-12-05T23:21:25.405358 |
| primary_topic.id | https://openalex.org/T10228 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.14076219499111176 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Multilevel Inverters and Converters |
| cited_by_count | 0 |
| locations_count | 1 |
| best_oa_location.id | doi:10.3390/app152312836 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S4210205812 |
| best_oa_location.source.issn | 2076-3417 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 2076-3417 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | True |
| best_oa_location.source.display_name | Applied Sciences |
| best_oa_location.source.host_organization | https://openalex.org/P4310310987 |
| best_oa_location.source.host_organization_name | Multidisciplinary Digital Publishing Institute |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310310987 |
| best_oa_location.source.host_organization_lineage_names | Multidisciplinary Digital Publishing Institute |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Applied Sciences |
| best_oa_location.landing_page_url | https://doi.org/10.3390/app152312836 |
| primary_location.id | doi:10.3390/app152312836 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S4210205812 |
| primary_location.source.issn | 2076-3417 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 2076-3417 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | True |
| primary_location.source.display_name | Applied Sciences |
| primary_location.source.host_organization | https://openalex.org/P4310310987 |
| primary_location.source.host_organization_name | Multidisciplinary Digital Publishing Institute |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310310987 |
| primary_location.source.host_organization_lineage_names | Multidisciplinary Digital Publishing Institute |
| primary_location.license | cc-by |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Applied Sciences |
| primary_location.landing_page_url | https://doi.org/10.3390/app152312836 |
| publication_date | 2025-12-04 |
| publication_year | 2025 |
| referenced_works | https://openalex.org/W4281477741, https://openalex.org/W4391576677, https://openalex.org/W4309323100, https://openalex.org/W2596910270, https://openalex.org/W4387686236, https://openalex.org/W1597576211, https://openalex.org/W2996237764, https://openalex.org/W2946486426, https://openalex.org/W2125239084, https://openalex.org/W3024005278, https://openalex.org/W4390879122, https://openalex.org/W2952852625, https://openalex.org/W2085944755, https://openalex.org/W2910440949, https://openalex.org/W2072572638, https://openalex.org/W4285066555, https://openalex.org/W2342385499, https://openalex.org/W4226307050, https://openalex.org/W2945088910, https://openalex.org/W4316468882, https://openalex.org/W4385954752, https://openalex.org/W4415849979, https://openalex.org/W2990379155, https://openalex.org/W3048695608 |
| referenced_works_count | 24 |
| abstract_inverted_index.a | 32, 55, 158 |
| abstract_inverted_index.DC | 5, 43, 166 |
| abstract_inverted_index.EV | 176 |
| abstract_inverted_index.by | 46 |
| abstract_inverted_index.in | 8, 42, 70, 146 |
| abstract_inverted_index.is | 129 |
| abstract_inverted_index.of | 31, 87, 105, 113, 120, 132, 135, 175 |
| abstract_inverted_index.to | 18, 67, 83, 95, 125, 170 |
| abstract_inverted_index.THD | 65, 128 |
| abstract_inverted_index.The | 0, 60, 123 |
| abstract_inverted_index.and | 22, 39, 73, 90, 97, 111, 116, 144, 173 |
| abstract_inverted_index.for | 3, 35, 164 |
| abstract_inverted_index.it, | 96 |
| abstract_inverted_index.the | 29, 64, 71, 77, 85, 88, 92, 100, 103, 107, 114, 121, 127, 130, 133, 140 |
| abstract_inverted_index.(EV) | 11 |
| abstract_inverted_index.Loop | 80 |
| abstract_inverted_index.SOGI | 93 |
| abstract_inverted_index.This | 25, 155 |
| abstract_inverted_index.grid | 89, 115 |
| abstract_inverted_index.high | 142 |
| abstract_inverted_index.keep | 91 |
| abstract_inverted_index.user | 23 |
| abstract_inverted_index.uses | 63 |
| abstract_inverted_index.will | 27 |
| abstract_inverted_index.with | 54, 102, 151 |
| abstract_inverted_index.(FLL) | 81 |
| abstract_inverted_index.(THD) | 51 |
| abstract_inverted_index.Total | 48 |
| abstract_inverted_index.false | 153 |
| abstract_inverted_index.fault | 15 |
| abstract_inverted_index.grid. | 122 |
| abstract_inverted_index.paper | 26 |
| abstract_inverted_index.phase | 112 |
| abstract_inverted_index.these | 118 |
| abstract_inverted_index.track | 84 |
| abstract_inverted_index.tuned | 94 |
| abstract_inverted_index.while | 76 |
| abstract_inverted_index.Locked | 79 |
| abstract_inverted_index.demand | 2 |
| abstract_inverted_index.detect | 68 |
| abstract_inverted_index.ensure | 19 |
| abstract_inverted_index.faults | 38, 41, 150 |
| abstract_inverted_index.kernel | 131 |
| abstract_inverted_index.method | 34, 66 |
| abstract_inverted_index.modern | 165 |
| abstract_inverted_index.offers | 157 |
| abstract_inverted_index.serves | 82 |
| abstract_inverted_index.(SOGI). | 59 |
| abstract_inverted_index.ability | 124 |
| abstract_inverted_index.circuit | 149 |
| abstract_inverted_index.current | 72 |
| abstract_inverted_index.faults. | 136 |
| abstract_inverted_index.measure | 126 |
| abstract_inverted_index.minimal | 152 |
| abstract_inverted_index.present | 28 |
| abstract_inverted_index.safety. | 24 |
| abstract_inverted_index.vehicle | 10 |
| abstract_inverted_index.voltage | 74 |
| abstract_inverted_index.Detailed | 137 |
| abstract_inverted_index.Harmonic | 49 |
| abstract_inverted_index.SOGI-FLL | 98 |
| abstract_inverted_index.analysis | 52 |
| abstract_inverted_index.approach | 62 |
| abstract_inverted_index.charging | 44, 167, 177 |
| abstract_inverted_index.combined | 53 |
| abstract_inverted_index.confirms | 139 |
| abstract_inverted_index.electric | 9 |
| abstract_inverted_index.improved | 171 |
| abstract_inverted_index.proposed | 61 |
| abstract_inverted_index.provides | 99 |
| abstract_inverted_index.reliable | 4 |
| abstract_inverted_index.solution | 162 |
| abstract_inverted_index.stations | 7, 45 |
| abstract_inverted_index.suitable | 163 |
| abstract_inverted_index.systems, | 168 |
| abstract_inverted_index.tracking | 106 |
| abstract_inverted_index.voltage, | 110 |
| abstract_inverted_index.Frequency | 78 |
| abstract_inverted_index.anomalies | 69 |
| abstract_inverted_index.detecting | 147 |
| abstract_inverted_index.detection | 16, 134 |
| abstract_inverted_index.efficient | 14 |
| abstract_inverted_index.frequency | 86 |
| abstract_inverted_index.rectifier | 101 |
| abstract_inverted_index.stability | 21 |
| abstract_inverted_index.technique | 156 |
| abstract_inverted_index.Distortion | 50 |
| abstract_inverted_index.Integrator | 58 |
| abstract_inverted_index.amplitude, | 109 |
| abstract_inverted_index.capability | 104 |
| abstract_inverted_index.diagnostic | 33, 161 |
| abstract_inverted_index.efficiency | 174 |
| abstract_inverted_index.frequency, | 108 |
| abstract_inverted_index.increasing | 1 |
| abstract_inverted_index.leveraging | 47 |
| abstract_inverted_index.mechanisms | 17 |
| abstract_inverted_index.method’s | 141 |
| abstract_inverted_index.monitoring | 117 |
| abstract_inverted_index.open/short | 148 |
| abstract_inverted_index.parameters | 119 |
| abstract_inverted_index.positives. | 154 |
| abstract_inverted_index.robustness | 145 |
| abstract_inverted_index.simulation | 138 |
| abstract_inverted_index.waveforms, | 75 |
| abstract_inverted_index.Generalized | 57 |
| abstract_inverted_index.development | 30 |
| abstract_inverted_index.identifying | 36 |
| abstract_inverted_index.operational | 20 |
| abstract_inverted_index.reliability | 172 |
| abstract_inverted_index.sensitivity | 143 |
| abstract_inverted_index.Second-Order | 56 |
| abstract_inverted_index.contributing | 169 |
| abstract_inverted_index.necessitates | 13 |
| abstract_inverted_index.non-invasive | 160 |
| abstract_inverted_index.open-circuit | 37 |
| abstract_inverted_index.fast-charging | 6 |
| abstract_inverted_index.short-circuit | 40 |
| abstract_inverted_index.infrastructure | 12 |
| abstract_inverted_index.cost-effective, | 159 |
| abstract_inverted_index.infrastructure. | 178 |
| cited_by_percentile_year | |
| countries_distinct_count | 2 |
| institutions_distinct_count | 3 |
| citation_normalized_percentile.value | 0.73387359 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |