Development of a Technique For Quantitative and Localized Charge Deposition on Dielectric Surfaces Article Swipe
YOU?
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· 2023
· Open Access
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· DOI: https://doi.org/10.1109/ceidp51414.2023.10410493
Surface charging of solid dielectrics poses challenges in industry. To investigate the dynamics of these charges, a tool for quantitative and spatially controlled surface charge deposition is desired. However, existing charge deposition techniques lack the possibility of controlled local charge deposition. This paper presents a surface charging technique at atmospheric pressure using an X-ray ionizer. A mask is introduced to enable local charging. The surface charge accumulation is studied with an electrostatic voltmeter. This X-ray based technique proves to be highly repetitive: only 1 % variation in the potential induced by the surface charges is observed. Furthermore, it allows for quantitative charging for both polarities up to at least -600V and +300V of induced potential. Local charging is achieved for charge spots of 1x2mm2 or larger with an accuracy of at least 2 mm over a surface of several hundred square millimeters. In principle, this technique works for all solid dielectrics, but is tested for quartz, silicon dioxide and commercial display glass. Finally, the charging process happens in the order of seconds. This technique enables future research into surface charge migration.
Related Topics
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/ceidp51414.2023.10410493
- OA Status
- gold
- Cited By
- 1
- References
- 7
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4391424392
Raw OpenAlex JSON
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https://openalex.org/W4391424392Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1109/ceidp51414.2023.10410493Digital Object Identifier
- Title
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Development of a Technique For Quantitative and Localized Charge Deposition on Dielectric SurfacesWork title
- Type
-
articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2023Year of publication
- Publication date
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2023-10-15Full publication date if available
- Authors
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Anne Limburg, L.C. Van De Rakt, R. L. Bell, G.G. van Eden, Sander NijdamList of authors in order
- Landing page
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https://doi.org/10.1109/ceidp51414.2023.10410493Publisher landing page
- Open access
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YesWhether a free full text is available
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goldOpen access status per OpenAlex
- OA URL
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https://research.tue.nl/en/publications/c0d8b626-725b-454c-9030-bbbf29023b80Direct OA link when available
- Concepts
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Deposition (geology), Charge (physics), Dielectric, Surface charge, Surface (topology), Materials science, Analytical Chemistry (journal), Optoelectronics, Chemistry, Physics, Physical chemistry, Geometry, Mathematics, Sediment, Chromatography, Paleontology, Quantum mechanics, BiologyTop concepts (fields/topics) attached by OpenAlex
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1Total citation count in OpenAlex
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2024: 1Per-year citation counts (last 5 years)
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7Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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