Discovery of a metastable van der Waals semiconductor via polymorphic crystallization of an amorphous film Article Swipe
Yuta Saito
,
Shogo Hatayama
,
Wen-Hsin Chang
,
Naoya Okada
,
Toshifumi Irisawa
,
Fumihiko Uesugi
,
Masaki Takeguchi
,
Yuji Sutou
,
Paul Fons
·
YOU?
·
· 2023
· Open Access
·
· DOI: https://doi.org/10.1039/d2mh01449a
YOU?
·
· 2023
· Open Access
·
· DOI: https://doi.org/10.1039/d2mh01449a
Here, we report on the growth of GeTe 2 thin films, a metastable phase. The GeTe 2 film was found to be a semiconductor with a layered structure.
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Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1039/d2mh01449a
- https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449a
- OA Status
- hybrid
- Cited By
- 3
- References
- 32
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4362656992
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4362656992Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1039/d2mh01449aDigital Object Identifier
- Title
-
Discovery of a metastable van der Waals semiconductor via polymorphic crystallization of an amorphous filmWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2023Year of publication
- Publication date
-
2023-01-01Full publication date if available
- Authors
-
Yuta Saito, Shogo Hatayama, Wen-Hsin Chang, Naoya Okada, Toshifumi Irisawa, Fumihiko Uesugi, Masaki Takeguchi, Yuji Sutou, Paul FonsList of authors in order
- Landing page
-
https://doi.org/10.1039/d2mh01449aPublisher landing page
- PDF URL
-
https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449aDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449aDirect OA link when available
- Concepts
-
Metastability, Crystallization, van der Waals force, Materials science, Semiconductor, Amorphous semiconductors, Amorphous solid, Thin film, Crystallography, Condensed matter physics, Optoelectronics, Chemical physics, Nanotechnology, Chemical engineering, Chemistry, Physics, Molecule, Organic chemistry, EngineeringTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
3Total citation count in OpenAlex
- Citations by year (recent)
-
2024: 2, 2023: 1Per-year citation counts (last 5 years)
- References (count)
-
32Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4362656992 |
|---|---|
| doi | https://doi.org/10.1039/d2mh01449a |
| ids.doi | https://doi.org/10.1039/d2mh01449a |
| ids.pmid | https://pubmed.ncbi.nlm.nih.gov/37021482 |
| ids.openalex | https://openalex.org/W4362656992 |
| fwci | 0.40204528 |
| type | article |
| title | Discovery of a metastable van der Waals semiconductor via polymorphic crystallization of an amorphous film |
| awards[0].id | https://openalex.org/G7421269294 |
| awards[0].funder_id | https://openalex.org/F4320335839 |
| awards[0].display_name | |
| awards[0].funder_award_id | 03701 |
| awards[0].funder_display_name | National Institute of Information and Communications Technology |
| awards[1].id | https://openalex.org/G1852942049 |
| awards[1].funder_id | https://openalex.org/F4320334764 |
| awards[1].display_name | |
| awards[1].funder_award_id | 21H05009 |
| awards[1].funder_display_name | Japan Society for the Promotion of Science |
| awards[2].id | https://openalex.org/G4005717735 |
| awards[2].funder_id | https://openalex.org/F4320334764 |
| awards[2].display_name | |
| awards[2].funder_award_id | 18K14306 |
| awards[2].funder_display_name | Japan Society for the Promotion of Science |
| awards[3].id | https://openalex.org/G6765267675 |
| awards[3].funder_id | https://openalex.org/F4320334764 |
| awards[3].display_name | |
| awards[3].funder_award_id | 19H02619 |
| awards[3].funder_display_name | Japan Society for the Promotion of Science |
| biblio.issue | 6 |
| biblio.volume | 10 |
| biblio.last_page | 2261 |
| biblio.first_page | 2254 |
| topics[0].id | https://openalex.org/T11315 |
| topics[0].field.id | https://openalex.org/fields/25 |
| topics[0].field.display_name | Materials Science |
| topics[0].score | 1.0 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2505 |
| topics[0].subfield.display_name | Materials Chemistry |
| topics[0].display_name | Phase-change materials and chalcogenides |
| topics[1].id | https://openalex.org/T10590 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9987999796867371 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Chalcogenide Semiconductor Thin Films |
| topics[2].id | https://openalex.org/T10440 |
| topics[2].field.id | https://openalex.org/fields/25 |
| topics[2].field.display_name | Materials Science |
| topics[2].score | 0.9980999827384949 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2505 |
| topics[2].subfield.display_name | Materials Chemistry |
| topics[2].display_name | Advanced Thermoelectric Materials and Devices |
| funders[0].id | https://openalex.org/F4320334764 |
| funders[0].ror | https://ror.org/00hhkn466 |
| funders[0].display_name | Japan Society for the Promotion of Science |
| funders[1].id | https://openalex.org/F4320335839 |
| funders[1].ror | https://ror.org/016bgq349 |
| funders[1].display_name | National Institute of Information and Communications Technology |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C89464430 |
| concepts[0].level | 2 |
| concepts[0].score | 0.8926525712013245 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q849516 |
| concepts[0].display_name | Metastability |
| concepts[1].id | https://openalex.org/C203036418 |
| concepts[1].level | 2 |
| concepts[1].score | 0.8334606885910034 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q284256 |
| concepts[1].display_name | Crystallization |
| concepts[2].id | https://openalex.org/C126061179 |
| concepts[2].level | 3 |
| concepts[2].score | 0.7359060049057007 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q189627 |
| concepts[2].display_name | van der Waals force |
| concepts[3].id | https://openalex.org/C192562407 |
| concepts[3].level | 0 |
| concepts[3].score | 0.7279744744300842 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[3].display_name | Materials science |
| concepts[4].id | https://openalex.org/C108225325 |
| concepts[4].level | 2 |
| concepts[4].score | 0.715943455696106 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q11456 |
| concepts[4].display_name | Semiconductor |
| concepts[5].id | https://openalex.org/C2986957394 |
| concepts[5].level | 3 |
| concepts[5].score | 0.7053150534629822 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q474163 |
| concepts[5].display_name | Amorphous semiconductors |
| concepts[6].id | https://openalex.org/C56052488 |
| concepts[6].level | 2 |
| concepts[6].score | 0.6106557250022888 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q103382 |
| concepts[6].display_name | Amorphous solid |
| concepts[7].id | https://openalex.org/C19067145 |
| concepts[7].level | 2 |
| concepts[7].score | 0.49749520421028137 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q1137203 |
| concepts[7].display_name | Thin film |
| concepts[8].id | https://openalex.org/C8010536 |
| concepts[8].level | 1 |
| concepts[8].score | 0.41802743077278137 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q160398 |
| concepts[8].display_name | Crystallography |
| concepts[9].id | https://openalex.org/C26873012 |
| concepts[9].level | 1 |
| concepts[9].score | 0.34481197595596313 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q214781 |
| concepts[9].display_name | Condensed matter physics |
| concepts[10].id | https://openalex.org/C49040817 |
| concepts[10].level | 1 |
| concepts[10].score | 0.3337199091911316 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[10].display_name | Optoelectronics |
| concepts[11].id | https://openalex.org/C159467904 |
| concepts[11].level | 1 |
| concepts[11].score | 0.3292769193649292 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q2001702 |
| concepts[11].display_name | Chemical physics |
| concepts[12].id | https://openalex.org/C171250308 |
| concepts[12].level | 1 |
| concepts[12].score | 0.31554603576660156 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q11468 |
| concepts[12].display_name | Nanotechnology |
| concepts[13].id | https://openalex.org/C42360764 |
| concepts[13].level | 1 |
| concepts[13].score | 0.20640969276428223 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q83588 |
| concepts[13].display_name | Chemical engineering |
| concepts[14].id | https://openalex.org/C185592680 |
| concepts[14].level | 0 |
| concepts[14].score | 0.1353350579738617 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q2329 |
| concepts[14].display_name | Chemistry |
| concepts[15].id | https://openalex.org/C121332964 |
| concepts[15].level | 0 |
| concepts[15].score | 0.11890241503715515 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[15].display_name | Physics |
| concepts[16].id | https://openalex.org/C32909587 |
| concepts[16].level | 2 |
| concepts[16].score | 0.11692214012145996 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q11369 |
| concepts[16].display_name | Molecule |
| concepts[17].id | https://openalex.org/C178790620 |
| concepts[17].level | 1 |
| concepts[17].score | 0.04994857311248779 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q11351 |
| concepts[17].display_name | Organic chemistry |
| concepts[18].id | https://openalex.org/C127413603 |
| concepts[18].level | 0 |
| concepts[18].score | 0.0 |
| concepts[18].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[18].display_name | Engineering |
| keywords[0].id | https://openalex.org/keywords/metastability |
| keywords[0].score | 0.8926525712013245 |
| keywords[0].display_name | Metastability |
| keywords[1].id | https://openalex.org/keywords/crystallization |
| keywords[1].score | 0.8334606885910034 |
| keywords[1].display_name | Crystallization |
| keywords[2].id | https://openalex.org/keywords/van-der-waals-force |
| keywords[2].score | 0.7359060049057007 |
| keywords[2].display_name | van der Waals force |
| keywords[3].id | https://openalex.org/keywords/materials-science |
| keywords[3].score | 0.7279744744300842 |
| keywords[3].display_name | Materials science |
| keywords[4].id | https://openalex.org/keywords/semiconductor |
| keywords[4].score | 0.715943455696106 |
| keywords[4].display_name | Semiconductor |
| keywords[5].id | https://openalex.org/keywords/amorphous-semiconductors |
| keywords[5].score | 0.7053150534629822 |
| keywords[5].display_name | Amorphous semiconductors |
| keywords[6].id | https://openalex.org/keywords/amorphous-solid |
| keywords[6].score | 0.6106557250022888 |
| keywords[6].display_name | Amorphous solid |
| keywords[7].id | https://openalex.org/keywords/thin-film |
| keywords[7].score | 0.49749520421028137 |
| keywords[7].display_name | Thin film |
| keywords[8].id | https://openalex.org/keywords/crystallography |
| keywords[8].score | 0.41802743077278137 |
| keywords[8].display_name | Crystallography |
| keywords[9].id | https://openalex.org/keywords/condensed-matter-physics |
| keywords[9].score | 0.34481197595596313 |
| keywords[9].display_name | Condensed matter physics |
| keywords[10].id | https://openalex.org/keywords/optoelectronics |
| keywords[10].score | 0.3337199091911316 |
| keywords[10].display_name | Optoelectronics |
| keywords[11].id | https://openalex.org/keywords/chemical-physics |
| keywords[11].score | 0.3292769193649292 |
| keywords[11].display_name | Chemical physics |
| keywords[12].id | https://openalex.org/keywords/nanotechnology |
| keywords[12].score | 0.31554603576660156 |
| keywords[12].display_name | Nanotechnology |
| keywords[13].id | https://openalex.org/keywords/chemical-engineering |
| keywords[13].score | 0.20640969276428223 |
| keywords[13].display_name | Chemical engineering |
| keywords[14].id | https://openalex.org/keywords/chemistry |
| keywords[14].score | 0.1353350579738617 |
| keywords[14].display_name | Chemistry |
| keywords[15].id | https://openalex.org/keywords/physics |
| keywords[15].score | 0.11890241503715515 |
| keywords[15].display_name | Physics |
| keywords[16].id | https://openalex.org/keywords/molecule |
| keywords[16].score | 0.11692214012145996 |
| keywords[16].display_name | Molecule |
| keywords[17].id | https://openalex.org/keywords/organic-chemistry |
| keywords[17].score | 0.04994857311248779 |
| keywords[17].display_name | Organic chemistry |
| language | en |
| locations[0].id | doi:10.1039/d2mh01449a |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S2764386229 |
| locations[0].source.issn | 2051-6347, 2051-6355 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 2051-6347 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | Materials Horizons |
| locations[0].source.host_organization | https://openalex.org/P4310320556 |
| locations[0].source.host_organization_name | Royal Society of Chemistry |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310320556 |
| locations[0].source.host_organization_lineage_names | Royal Society of Chemistry |
| locations[0].license | cc-by |
| locations[0].pdf_url | https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449a |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Materials Horizons |
| locations[0].landing_page_url | https://doi.org/10.1039/d2mh01449a |
| locations[1].id | pmid:37021482 |
| locations[1].is_oa | False |
| locations[1].source.id | https://openalex.org/S4306525036 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | PubMed |
| locations[1].source.host_organization | https://openalex.org/I1299303238 |
| locations[1].source.host_organization_name | National Institutes of Health |
| locations[1].source.host_organization_lineage | https://openalex.org/I1299303238 |
| locations[1].license | |
| locations[1].pdf_url | |
| locations[1].version | publishedVersion |
| locations[1].raw_type | |
| locations[1].license_id | |
| locations[1].is_accepted | True |
| locations[1].is_published | True |
| locations[1].raw_source_name | Materials horizons |
| locations[1].landing_page_url | https://pubmed.ncbi.nlm.nih.gov/37021482 |
| indexed_in | crossref, pubmed |
| authorships[0].author.id | https://openalex.org/A5086656623 |
| authorships[0].author.orcid | https://orcid.org/0000-0002-9576-1560 |
| authorships[0].author.display_name | Yuta Saito |
| authorships[0].countries | JP |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[0].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[0].institutions[0].id | https://openalex.org/I73613424 |
| authorships[0].institutions[0].ror | https://ror.org/01703db54 |
| authorships[0].institutions[0].type | government |
| authorships[0].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[0].institutions[0].country_code | JP |
| authorships[0].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Yuta Saito |
| authorships[0].is_corresponding | True |
| authorships[0].raw_affiliation_strings | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[1].author.id | https://openalex.org/A5068118585 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-2914-1072 |
| authorships[1].author.display_name | Shogo Hatayama |
| authorships[1].countries | JP |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[1].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[1].institutions[0].id | https://openalex.org/I73613424 |
| authorships[1].institutions[0].ror | https://ror.org/01703db54 |
| authorships[1].institutions[0].type | government |
| authorships[1].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[1].institutions[0].country_code | JP |
| authorships[1].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Shogo Hatayama |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[2].author.id | https://openalex.org/A5054400789 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-8501-6276 |
| authorships[2].author.display_name | Wen-Hsin Chang |
| authorships[2].countries | JP |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[2].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[2].institutions[0].id | https://openalex.org/I73613424 |
| authorships[2].institutions[0].ror | https://ror.org/01703db54 |
| authorships[2].institutions[0].type | government |
| authorships[2].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[2].institutions[0].country_code | JP |
| authorships[2].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Wen Hsin Chang |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[3].author.id | https://openalex.org/A5088113142 |
| authorships[3].author.orcid | https://orcid.org/0000-0002-0512-8324 |
| authorships[3].author.display_name | Naoya Okada |
| authorships[3].countries | JP |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[3].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[3].institutions[0].id | https://openalex.org/I73613424 |
| authorships[3].institutions[0].ror | https://ror.org/01703db54 |
| authorships[3].institutions[0].type | government |
| authorships[3].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[3].institutions[0].country_code | JP |
| authorships[3].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Naoya Okada |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[4].author.id | https://openalex.org/A5080097517 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-8801-7688 |
| authorships[4].author.display_name | Toshifumi Irisawa |
| authorships[4].countries | JP |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[4].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[4].institutions[0].id | https://openalex.org/I73613424 |
| authorships[4].institutions[0].ror | https://ror.org/01703db54 |
| authorships[4].institutions[0].type | government |
| authorships[4].institutions[0].lineage | https://openalex.org/I73613424 |
| authorships[4].institutions[0].country_code | JP |
| authorships[4].institutions[0].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Toshifumi Irisawa |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[5].author.id | https://openalex.org/A5077004883 |
| authorships[5].author.orcid | https://orcid.org/0000-0003-3346-4218 |
| authorships[5].author.display_name | Fumihiko Uesugi |
| authorships[5].countries | JP |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I205401836 |
| authorships[5].affiliations[0].raw_affiliation_string | Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, 305-0047, Japan |
| authorships[5].institutions[0].id | https://openalex.org/I205401836 |
| authorships[5].institutions[0].ror | https://ror.org/026v1ze26 |
| authorships[5].institutions[0].type | facility |
| authorships[5].institutions[0].lineage | https://openalex.org/I205401836 |
| authorships[5].institutions[0].country_code | JP |
| authorships[5].institutions[0].display_name | National Institute for Materials Science |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Fumihiko Uesugi |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, 305-0047, Japan |
| authorships[6].author.id | https://openalex.org/A5025881433 |
| authorships[6].author.orcid | https://orcid.org/0000-0002-0282-6020 |
| authorships[6].author.display_name | Masaki Takeguchi |
| authorships[6].countries | JP |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I205401836 |
| authorships[6].affiliations[0].raw_affiliation_string | Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, 305-0047, Japan |
| authorships[6].institutions[0].id | https://openalex.org/I205401836 |
| authorships[6].institutions[0].ror | https://ror.org/026v1ze26 |
| authorships[6].institutions[0].type | facility |
| authorships[6].institutions[0].lineage | https://openalex.org/I205401836 |
| authorships[6].institutions[0].country_code | JP |
| authorships[6].institutions[0].display_name | National Institute for Materials Science |
| authorships[6].author_position | middle |
| authorships[6].raw_author_name | Masaki Takeguchi |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | Electron Microscopy Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, 305-0047, Japan |
| authorships[7].author.id | https://openalex.org/A5057239783 |
| authorships[7].author.orcid | https://orcid.org/0000-0002-3067-2727 |
| authorships[7].author.display_name | Yuji Sutou |
| authorships[7].countries | JP |
| authorships[7].affiliations[0].institution_ids | https://openalex.org/I201537933 |
| authorships[7].affiliations[0].raw_affiliation_string | Department of Materials Science, Graduate School of Engineering, Tohoku University, 6-6-11 Aoba-yama, Sendai, 980-8579, Japan |
| authorships[7].affiliations[1].institution_ids | https://openalex.org/I201537933 |
| authorships[7].affiliations[1].raw_affiliation_string | Advanced Institute for Materials Research (AIMR), Tohoku University, 2-1-1 Katahira, Sendai, 980-8577, Japan |
| authorships[7].institutions[0].id | https://openalex.org/I201537933 |
| authorships[7].institutions[0].ror | https://ror.org/01dq60k83 |
| authorships[7].institutions[0].type | education |
| authorships[7].institutions[0].lineage | https://openalex.org/I201537933 |
| authorships[7].institutions[0].country_code | JP |
| authorships[7].institutions[0].display_name | Tohoku University |
| authorships[7].author_position | middle |
| authorships[7].raw_author_name | Yuji Sutou |
| authorships[7].is_corresponding | False |
| authorships[7].raw_affiliation_strings | Advanced Institute for Materials Research (AIMR), Tohoku University, 2-1-1 Katahira, Sendai, 980-8577, Japan, Department of Materials Science, Graduate School of Engineering, Tohoku University, 6-6-11 Aoba-yama, Sendai, 980-8579, Japan |
| authorships[8].author.id | https://openalex.org/A5007804089 |
| authorships[8].author.orcid | https://orcid.org/0000-0002-7820-1924 |
| authorships[8].author.display_name | Paul Fons |
| authorships[8].countries | JP |
| authorships[8].affiliations[0].institution_ids | https://openalex.org/I73613424 |
| authorships[8].affiliations[0].raw_affiliation_string | Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| authorships[8].affiliations[1].institution_ids | https://openalex.org/I203951103 |
| authorships[8].affiliations[1].raw_affiliation_string | Department of Electronics and Electrical Engineering, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, 223-8522, Japan |
| authorships[8].institutions[0].id | https://openalex.org/I203951103 |
| authorships[8].institutions[0].ror | https://ror.org/02kn6nx58 |
| authorships[8].institutions[0].type | education |
| authorships[8].institutions[0].lineage | https://openalex.org/I203951103 |
| authorships[8].institutions[0].country_code | JP |
| authorships[8].institutions[0].display_name | Keio University |
| authorships[8].institutions[1].id | https://openalex.org/I73613424 |
| authorships[8].institutions[1].ror | https://ror.org/01703db54 |
| authorships[8].institutions[1].type | government |
| authorships[8].institutions[1].lineage | https://openalex.org/I73613424 |
| authorships[8].institutions[1].country_code | JP |
| authorships[8].institutions[1].display_name | National Institute of Advanced Industrial Science and Technology |
| authorships[8].author_position | last |
| authorships[8].raw_author_name | Paul Fons |
| authorships[8].is_corresponding | False |
| authorships[8].raw_affiliation_strings | Department of Electronics and Electrical Engineering, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, 223-8522, Japan, Device Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, 305-8568, Japan |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449a |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Discovery of a metastable van der Waals semiconductor via polymorphic crystallization of an amorphous film |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11315 |
| primary_topic.field.id | https://openalex.org/fields/25 |
| primary_topic.field.display_name | Materials Science |
| primary_topic.score | 1.0 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2505 |
| primary_topic.subfield.display_name | Materials Chemistry |
| primary_topic.display_name | Phase-change materials and chalcogenides |
| related_works | https://openalex.org/W4307107610, https://openalex.org/W3213627526, https://openalex.org/W4226159838, https://openalex.org/W2016023420, https://openalex.org/W1975066220, https://openalex.org/W2361648762, https://openalex.org/W252847268, https://openalex.org/W1984784043, https://openalex.org/W1981396204, https://openalex.org/W1980585287 |
| cited_by_count | 3 |
| counts_by_year[0].year | 2024 |
| counts_by_year[0].cited_by_count | 2 |
| counts_by_year[1].year | 2023 |
| counts_by_year[1].cited_by_count | 1 |
| locations_count | 2 |
| best_oa_location.id | doi:10.1039/d2mh01449a |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S2764386229 |
| best_oa_location.source.issn | 2051-6347, 2051-6355 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 2051-6347 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | Materials Horizons |
| best_oa_location.source.host_organization | https://openalex.org/P4310320556 |
| best_oa_location.source.host_organization_name | Royal Society of Chemistry |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310320556 |
| best_oa_location.source.host_organization_lineage_names | Royal Society of Chemistry |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449a |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Materials Horizons |
| best_oa_location.landing_page_url | https://doi.org/10.1039/d2mh01449a |
| primary_location.id | doi:10.1039/d2mh01449a |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S2764386229 |
| primary_location.source.issn | 2051-6347, 2051-6355 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 2051-6347 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | Materials Horizons |
| primary_location.source.host_organization | https://openalex.org/P4310320556 |
| primary_location.source.host_organization_name | Royal Society of Chemistry |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310320556 |
| primary_location.source.host_organization_lineage_names | Royal Society of Chemistry |
| primary_location.license | cc-by |
| primary_location.pdf_url | https://pubs.rsc.org/en/content/articlepdf/2023/mh/d2mh01449a |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Materials Horizons |
| primary_location.landing_page_url | https://doi.org/10.1039/d2mh01449a |
| publication_date | 2023-01-01 |
| publication_year | 2023 |
| referenced_works | https://openalex.org/W2058122340, https://openalex.org/W3214807145, https://openalex.org/W3008685795, https://openalex.org/W2495679764, https://openalex.org/W2606210333, https://openalex.org/W3155592228, https://openalex.org/W2903343625, https://openalex.org/W2042862454, https://openalex.org/W2728558515, https://openalex.org/W2132836196, https://openalex.org/W2763444008, https://openalex.org/W2996956434, https://openalex.org/W2793946739, https://openalex.org/W2002715597, https://openalex.org/W2051247581, https://openalex.org/W2042515670, https://openalex.org/W1979051690, https://openalex.org/W3183251163, https://openalex.org/W2501986700, https://openalex.org/W4285203992, https://openalex.org/W3123165572, https://openalex.org/W2040875144, https://openalex.org/W2017871657, https://openalex.org/W2249694920, https://openalex.org/W2138630324, https://openalex.org/W2971886410, https://openalex.org/W1980333083, https://openalex.org/W1981368803, https://openalex.org/W2007395042, https://openalex.org/W2083222334, https://openalex.org/W2036113194, https://openalex.org/W2015197254 |
| referenced_works_count | 32 |
| abstract_inverted_index.2 | 8, 16 |
| abstract_inverted_index.a | 11, 22, 25 |
| abstract_inverted_index.be | 21 |
| abstract_inverted_index.of | 6 |
| abstract_inverted_index.on | 3 |
| abstract_inverted_index.to | 20 |
| abstract_inverted_index.we | 1 |
| abstract_inverted_index.The | 14 |
| abstract_inverted_index.the | 4 |
| abstract_inverted_index.was | 18 |
| abstract_inverted_index.GeTe | 7, 15 |
| abstract_inverted_index.film | 17 |
| abstract_inverted_index.thin | 9 |
| abstract_inverted_index.with | 24 |
| abstract_inverted_index.Here, | 0 |
| abstract_inverted_index.found | 19 |
| abstract_inverted_index.films, | 10 |
| abstract_inverted_index.growth | 5 |
| abstract_inverted_index.phase. | 13 |
| abstract_inverted_index.report | 2 |
| abstract_inverted_index.layered | 26 |
| abstract_inverted_index.metastable | 12 |
| abstract_inverted_index.structure. | 27 |
| abstract_inverted_index.semiconductor | 23 |
| cited_by_percentile_year.max | 96 |
| cited_by_percentile_year.min | 89 |
| corresponding_author_ids | https://openalex.org/A5086656623 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 9 |
| corresponding_institution_ids | https://openalex.org/I73613424 |
| citation_normalized_percentile.value | 0.49656012 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |