Effect of Segmented Thermal Aging on Defect Location Accuracy in XLPE Distribution Cables Article Swipe
Bingliang Shan
,
Shuning Li
,
Liying Yu
,
Wei Wang
,
Chengrong Li
,
Xiaokai Meng
·
YOU?
·
· 2021
· Open Access
·
· DOI: https://doi.org/10.1109/access.2021.3116107
YOU?
·
· 2021
· Open Access
·
· DOI: https://doi.org/10.1109/access.2021.3116107
Frequency domain reflectometry (FDR) technologies could be applied to locate defects in cables effectively. Owing to the large space span and complex operating environment of the actual XLPE distribution cables, segmented thermal aging phenomenon occurs easily, causing the nonuniform distribution of electrical parameters along cables, which might affect the defect location accuracy ultimately. In this paper, the segmented thermal aging cable models were established and the effect of segmented-aging in XLPE distribution cables on defect location accuracy was explored based on simulation. It was found the floating range of defect location deviation in segmented thermal aging cable models could reach 10% of the whole cable length, which could not be ignored. Further research and analysis revealed that the defect location deviation in the segmented-aging cable mainly attributes to the differences of distributed wave velocities in the cable. On this basis, a correction coefficient of defect location was put forward for the segmented-aging cable models established, which has achieved remarkable results. Finally, a segmented-aging cable model with a length of 119 m was built in the laboratory, and the validity for improving defect location accuracy by considering the differences of wave velocities was verified through experiments. Results show the defect location deviation can be reduced from 2.19% to 0.39% by introducing .
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/access.2021.3116107
- https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551967.pdf
- OA Status
- gold
- Cited By
- 16
- References
- 20
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W3202433153
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- OpenAlex ID
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https://openalex.org/W3202433153Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1109/access.2021.3116107Digital Object Identifier
- Title
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Effect of Segmented Thermal Aging on Defect Location Accuracy in XLPE Distribution CablesWork title
- Type
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articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2021Year of publication
- Publication date
-
2021-01-01Full publication date if available
- Authors
-
Bingliang Shan, Shuning Li, Liying Yu, Wei Wang, Chengrong Li, Xiaokai MengList of authors in order
- Landing page
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https://doi.org/10.1109/access.2021.3116107Publisher landing page
- PDF URL
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https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551967.pdfDirect link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
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goldOpen access status per OpenAlex
- OA URL
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https://ieeexplore.ieee.org/ielx7/6287639/6514899/09551967.pdfDirect OA link when available
- Concepts
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Reflectometry, Standard deviation, Thermal, Materials science, Acoustics, Span (engineering), Structural engineering, Computer science, Time domain, Engineering, Physics, Mathematics, Statistics, Meteorology, Computer visionTop concepts (fields/topics) attached by OpenAlex
- Cited by
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16Total citation count in OpenAlex
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2025: 5, 2024: 5, 2023: 5, 2022: 1Per-year citation counts (last 5 years)
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10Other works algorithmically related by OpenAlex
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