EFT Immunity Test and Damage Localization of C-band Limiters Article Swipe
Jiacheng Ma
,
Bin Liu
,
Deren Feng
,
Weiheng Shao
,
Shan Xue
,
Liuxing He
,
Zongqi Cai
,
Caixu Yu
,
Jinxin Zhang
,
Zhenli Zhu
,
Hui Li
,
Wenrui Ding
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.56028/aetr.10.1.37.2024
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.56028/aetr.10.1.37.2024
In this paper, the EFT immunity experimental platform of C-band RF limiter is designed, and then electromagnetic immunity test and device damage analysis are carried out.When the voltage of the EFT interference source exceeds 900V, the device experiences increased insertion loss. When the interference continues to increase to 1000V, the device is damaged.Failure localization was carried out for the failed sample.Failure Location Using Electromagnetic Emission Measurement Techniques.By analyzing the emitted electromagnetic field map (EMF), it was concluded that PIN diodes are more susceptible to damage.The device was then disassembled and the failed component replaced, proving the accuracy of the location of the failure point.
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Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.56028/aetr.10.1.37.2024
- https://madison-proceedings.com/index.php/aetr/article/download/2254/2274
- OA Status
- diamond
- References
- 2
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4394928821
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4394928821Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.56028/aetr.10.1.37.2024Digital Object Identifier
- Title
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EFT Immunity Test and Damage Localization of C-band LimitersWork title
- Type
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2024Year of publication
- Publication date
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2024-03-07Full publication date if available
- Authors
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Jiacheng Ma, Bin Liu, Deren Feng, Weiheng Shao, Shan Xue, Liuxing He, Zongqi Cai, Caixu Yu, Jinxin Zhang, Zhenli Zhu, Hui Li, Wenrui DingList of authors in order
- Landing page
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https://doi.org/10.56028/aetr.10.1.37.2024Publisher landing page
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https://madison-proceedings.com/index.php/aetr/article/download/2254/2274Direct link to full text PDF
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YesWhether a free full text is available
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diamondOpen access status per OpenAlex
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https://madison-proceedings.com/index.php/aetr/article/download/2254/2274Direct OA link when available
- Concepts
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Electromagnetic interference, Interference (communication), Limiter, Diode, Materials science, Voltage, Electromagnetic field, Electrical engineering, Optoelectronics, Physics, Engineering, Channel (broadcasting), Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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