Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope Article Swipe
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2412.20356
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-Ångström probe is a complex and time-costly procedure, largely due to the difficulty of precisely measuring the optical state of the system. When measurements are both costly and noisy, Bayesian methods provide rapid and efficient optimization. To this end, we develop a Bayesian approach to fully automate the process by minimizing a new quality metric, beam emittance, which is shown to be equivalent to performing aberration correction. In part I, we derived several important properties of the beam emittance metric and trained a deep neural network to predict beam emittance growth from a single Ronchigram. Here we use this as the black box function for Bayesian Optimization and demonstrate automated tuning of simulated and real electron microscopes. We explore different surrogate functions for the Bayesian optimizer and implement a deep neural network kernel to effectively learn the interactions between different control channels without the need to explicitly measure a full set of aberration coefficients. Both simulation and experimental results show the proposed method outperforms conventional approaches by achieving a better optical state with a higher convergence rate.
Related Topics
- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2412.20356
- https://arxiv.org/pdf/2412.20356
- OA Status
- green
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4405956399
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4405956399Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2412.20356Digital Object Identifier
- Title
-
Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron MicroscopeWork title
- Type
-
preprintOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2024Year of publication
- Publication date
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2024-12-29Full publication date if available
- Authors
-
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov, Yu‐Tsun Shao, Cameron Duncan, Jared Maxson, Auralee Edelen, David A. MullerList of authors in order
- Landing page
-
https://arxiv.org/abs/2412.20356Publisher landing page
- PDF URL
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https://arxiv.org/pdf/2412.20356Direct link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
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https://arxiv.org/pdf/2412.20356Direct OA link when available
- Concepts
-
Bayesian optimization, Thermal emittance, Bayesian probability, Electron, Physics, Microscope, Minification, Electron microscope, Computer science, Bayesian inference, Optics, Algorithm, Artificial intelligence, Nuclear physics, Beam (structure), World Wide WebTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
- Related works (count)
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10Other works algorithmically related by OpenAlex
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| abstract_inverted_index.higher | 200 |
| abstract_inverted_index.kernel | 158 |
| abstract_inverted_index.method | 188 |
| abstract_inverted_index.metric | 105 |
| abstract_inverted_index.neural | 110, 156 |
| abstract_inverted_index.noisy, | 54 |
| abstract_inverted_index.scale. | 17 |
| abstract_inverted_index.single | 119 |
| abstract_inverted_index.tuning | 19, 136 |
| abstract_inverted_index.between | 164 |
| abstract_inverted_index.complex | 30 |
| abstract_inverted_index.control | 166 |
| abstract_inverted_index.derived | 97 |
| abstract_inverted_index.develop | 66 |
| abstract_inverted_index.explore | 144 |
| abstract_inverted_index.largely | 34 |
| abstract_inverted_index.measure | 173 |
| abstract_inverted_index.methods | 56 |
| abstract_inverted_index.metric, | 80 |
| abstract_inverted_index.network | 111, 157 |
| abstract_inverted_index.optical | 43, 196 |
| abstract_inverted_index.predict | 113 |
| abstract_inverted_index.process | 74 |
| abstract_inverted_index.produce | 24 |
| abstract_inverted_index.provide | 57 |
| abstract_inverted_index.quality | 79 |
| abstract_inverted_index.results | 184 |
| abstract_inverted_index.several | 98 |
| abstract_inverted_index.system. | 47 |
| abstract_inverted_index.trained | 107 |
| abstract_inverted_index.without | 168 |
| abstract_inverted_index.Bayesian | 55, 68, 131, 150 |
| abstract_inverted_index.Electron | 3 |
| abstract_inverted_index.However, | 18 |
| abstract_inverted_index.Scanning | 1 |
| abstract_inverted_index.approach | 69 |
| abstract_inverted_index.automate | 72 |
| abstract_inverted_index.channels | 167 |
| abstract_inverted_index.electron | 141 |
| abstract_inverted_index.function | 129 |
| abstract_inverted_index.proposed | 187 |
| abstract_inverted_index.achieving | 193 |
| abstract_inverted_index.automated | 135 |
| abstract_inverted_index.corrector | 22 |
| abstract_inverted_index.different | 145, 165 |
| abstract_inverted_index.efficient | 60 |
| abstract_inverted_index.emittance | 104, 115 |
| abstract_inverted_index.essential | 9 |
| abstract_inverted_index.functions | 147 |
| abstract_inverted_index.implement | 153 |
| abstract_inverted_index.important | 99 |
| abstract_inverted_index.materials | 13 |
| abstract_inverted_index.measuring | 41 |
| abstract_inverted_index.optimizer | 151 |
| abstract_inverted_index.precisely | 40 |
| abstract_inverted_index.simulated | 138 |
| abstract_inverted_index.surrogate | 146 |
| abstract_inverted_index.Microscopy | 4 |
| abstract_inverted_index.aberration | 21, 91, 178 |
| abstract_inverted_index.approaches | 191 |
| abstract_inverted_index.difficulty | 38 |
| abstract_inverted_index.emittance, | 82 |
| abstract_inverted_index.equivalent | 88 |
| abstract_inverted_index.explicitly | 172 |
| abstract_inverted_index.minimizing | 76 |
| abstract_inverted_index.performing | 90 |
| abstract_inverted_index.procedure, | 33 |
| abstract_inverted_index.properties | 100 |
| abstract_inverted_index.simulation | 181 |
| abstract_inverted_index.Ronchigram. | 120 |
| abstract_inverted_index.convergence | 201 |
| abstract_inverted_index.correction. | 92 |
| abstract_inverted_index.demonstrate | 134 |
| abstract_inverted_index.effectively | 160 |
| abstract_inverted_index.outperforms | 189 |
| abstract_inverted_index.time-costly | 32 |
| abstract_inverted_index.Optimization | 132 |
| abstract_inverted_index.Transmission | 2 |
| abstract_inverted_index.conventional | 190 |
| abstract_inverted_index.experimental | 183 |
| abstract_inverted_index.interactions | 163 |
| abstract_inverted_index.measurements | 49 |
| abstract_inverted_index.microscopes. | 142 |
| abstract_inverted_index.coefficients. | 179 |
| abstract_inverted_index.optimization. | 61 |
| abstract_inverted_index.understanding | 12 |
| abstract_inverted_index.sub-Ångström | 26 |
| abstract_inverted_index.Aberration-corrected | 0 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 9 |
| citation_normalized_percentile |