Energy dispersive X-ray spectroscopy of atomically thin semiconductors Article Swipe
Anna Rupp
,
Jonas Göser
,
Zhijie Li
,
Philipp Altpeter
,
Ismail Bilgin
,
Alexander Högele
·
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2201.12545
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2201.12545
We report the implementation of energy dispersive X-ray spectroscopy for layered semiconductors in the form of atomically thin transition metal dichalcogenides. The technique is based on a scanning electron microscope equipped with a silicon drift detector for energy dispersive X-ray analysis. By optimizing operational parameters in numerical simulations and experiments, we achieve layer-resolving sensitivity for few-layer crystals down to the monolayer limit and demonstrate elemental composition profiling in vertical and lateral heterobilayers of transition metal dichalcogenides. The technique can be straight-forwardly applied to other layered two-dimensional materials and van der Waals heterostructures, thus expanding the experimental toolbox for quantitative characterization of layer number, atomic composition, or alloy gradients for atomically thin materials and devices.
Related Topics
Concepts
Heterojunction
Materials science
Semiconductor
Monolayer
Spectroscopy
Thin film
X-ray photoelectron spectroscopy
Energy-dispersive X-ray spectroscopy
Silicon
Thin layers
Characterization (materials science)
Optoelectronics
Scanning electron microscope
van der Waals force
Alloy
Nanotechnology
Chemistry
Physics
Molecule
Composite material
Nuclear magnetic resonance
Quantum mechanics
Organic chemistry
Metadata
- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2201.12545
- https://arxiv.org/pdf/2201.12545
- OA Status
- green
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4221147556
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4221147556Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.48550/arxiv.2201.12545Digital Object Identifier
- Title
-
Energy dispersive X-ray spectroscopy of atomically thin semiconductorsWork title
- Type
-
preprintOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2022Year of publication
- Publication date
-
2022-01-29Full publication date if available
- Authors
-
Anna Rupp, Jonas Göser, Zhijie Li, Philipp Altpeter, Ismail Bilgin, Alexander HögeleList of authors in order
- Landing page
-
https://arxiv.org/abs/2201.12545Publisher landing page
- PDF URL
-
https://arxiv.org/pdf/2201.12545Direct link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
-
https://arxiv.org/pdf/2201.12545Direct OA link when available
- Concepts
-
Heterojunction, Materials science, Semiconductor, Monolayer, Spectroscopy, Thin film, X-ray photoelectron spectroscopy, Energy-dispersive X-ray spectroscopy, Silicon, Thin layers, Characterization (materials science), Optoelectronics, Scanning electron microscope, van der Waals force, Alloy, Nanotechnology, Chemistry, Physics, Molecule, Composite material, Nuclear magnetic resonance, Quantum mechanics, Organic chemistryTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
0Total citation count in OpenAlex
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4221147556 |
|---|---|
| doi | https://doi.org/10.48550/arxiv.2201.12545 |
| ids.doi | https://doi.org/10.48550/arxiv.2201.12545 |
| ids.openalex | https://openalex.org/W4221147556 |
| fwci | |
| type | preprint |
| title | Energy dispersive X-ray spectroscopy of atomically thin semiconductors |
| biblio.issue | |
| biblio.volume | |
| biblio.last_page | |
| biblio.first_page | |
| topics[0].id | https://openalex.org/T11948 |
| topics[0].field.id | https://openalex.org/fields/25 |
| topics[0].field.display_name | Materials Science |
| topics[0].score | 0.9983000159263611 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2505 |
| topics[0].subfield.display_name | Materials Chemistry |
| topics[0].display_name | Machine Learning in Materials Science |
| topics[1].id | https://openalex.org/T12039 |
| topics[1].field.id | https://openalex.org/fields/25 |
| topics[1].field.display_name | Materials Science |
| topics[1].score | 0.996999979019165 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2508 |
| topics[1].subfield.display_name | Surfaces, Coatings and Films |
| topics[1].display_name | Electron and X-Ray Spectroscopy Techniques |
| topics[2].id | https://openalex.org/T10275 |
| topics[2].field.id | https://openalex.org/fields/25 |
| topics[2].field.display_name | Materials Science |
| topics[2].score | 0.9944999814033508 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2505 |
| topics[2].subfield.display_name | Materials Chemistry |
| topics[2].display_name | 2D Materials and Applications |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C79794668 |
| concepts[0].level | 2 |
| concepts[0].score | 0.7160464525222778 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q1616270 |
| concepts[0].display_name | Heterojunction |
| concepts[1].id | https://openalex.org/C192562407 |
| concepts[1].level | 0 |
| concepts[1].score | 0.7019966244697571 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[1].display_name | Materials science |
| concepts[2].id | https://openalex.org/C108225325 |
| concepts[2].level | 2 |
| concepts[2].score | 0.6666523218154907 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q11456 |
| concepts[2].display_name | Semiconductor |
| concepts[3].id | https://openalex.org/C7070889 |
| concepts[3].level | 2 |
| concepts[3].score | 0.6285403370857239 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q902488 |
| concepts[3].display_name | Monolayer |
| concepts[4].id | https://openalex.org/C32891209 |
| concepts[4].level | 2 |
| concepts[4].score | 0.5827595591545105 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q483666 |
| concepts[4].display_name | Spectroscopy |
| concepts[5].id | https://openalex.org/C19067145 |
| concepts[5].level | 2 |
| concepts[5].score | 0.5735890865325928 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q1137203 |
| concepts[5].display_name | Thin film |
| concepts[6].id | https://openalex.org/C175708663 |
| concepts[6].level | 2 |
| concepts[6].score | 0.5285483598709106 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q899559 |
| concepts[6].display_name | X-ray photoelectron spectroscopy |
| concepts[7].id | https://openalex.org/C147438087 |
| concepts[7].level | 3 |
| concepts[7].score | 0.5164942741394043 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q386334 |
| concepts[7].display_name | Energy-dispersive X-ray spectroscopy |
| concepts[8].id | https://openalex.org/C544956773 |
| concepts[8].level | 2 |
| concepts[8].score | 0.5040380358695984 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q670 |
| concepts[8].display_name | Silicon |
| concepts[9].id | https://openalex.org/C2778182573 |
| concepts[9].level | 2 |
| concepts[9].score | 0.4758279621601105 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q7784286 |
| concepts[9].display_name | Thin layers |
| concepts[10].id | https://openalex.org/C2780841128 |
| concepts[10].level | 2 |
| concepts[10].score | 0.4558514356613159 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q5073781 |
| concepts[10].display_name | Characterization (materials science) |
| concepts[11].id | https://openalex.org/C49040817 |
| concepts[11].level | 1 |
| concepts[11].score | 0.4227210581302643 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[11].display_name | Optoelectronics |
| concepts[12].id | https://openalex.org/C26771246 |
| concepts[12].level | 2 |
| concepts[12].score | 0.4205261468887329 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q321095 |
| concepts[12].display_name | Scanning electron microscope |
| concepts[13].id | https://openalex.org/C126061179 |
| concepts[13].level | 3 |
| concepts[13].score | 0.42028170824050903 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q189627 |
| concepts[13].display_name | van der Waals force |
| concepts[14].id | https://openalex.org/C2780026712 |
| concepts[14].level | 2 |
| concepts[14].score | 0.41164201498031616 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q37756 |
| concepts[14].display_name | Alloy |
| concepts[15].id | https://openalex.org/C171250308 |
| concepts[15].level | 1 |
| concepts[15].score | 0.25923842191696167 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q11468 |
| concepts[15].display_name | Nanotechnology |
| concepts[16].id | https://openalex.org/C185592680 |
| concepts[16].level | 0 |
| concepts[16].score | 0.1271321177482605 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q2329 |
| concepts[16].display_name | Chemistry |
| concepts[17].id | https://openalex.org/C121332964 |
| concepts[17].level | 0 |
| concepts[17].score | 0.10678672790527344 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[17].display_name | Physics |
| concepts[18].id | https://openalex.org/C32909587 |
| concepts[18].level | 2 |
| concepts[18].score | 0.07331779599189758 |
| concepts[18].wikidata | https://www.wikidata.org/wiki/Q11369 |
| concepts[18].display_name | Molecule |
| concepts[19].id | https://openalex.org/C159985019 |
| concepts[19].level | 1 |
| concepts[19].score | 0.0 |
| concepts[19].wikidata | https://www.wikidata.org/wiki/Q181790 |
| concepts[19].display_name | Composite material |
| concepts[20].id | https://openalex.org/C46141821 |
| concepts[20].level | 1 |
| concepts[20].score | 0.0 |
| concepts[20].wikidata | https://www.wikidata.org/wiki/Q209402 |
| concepts[20].display_name | Nuclear magnetic resonance |
| concepts[21].id | https://openalex.org/C62520636 |
| concepts[21].level | 1 |
| concepts[21].score | 0.0 |
| concepts[21].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[21].display_name | Quantum mechanics |
| concepts[22].id | https://openalex.org/C178790620 |
| concepts[22].level | 1 |
| concepts[22].score | 0.0 |
| concepts[22].wikidata | https://www.wikidata.org/wiki/Q11351 |
| concepts[22].display_name | Organic chemistry |
| keywords[0].id | https://openalex.org/keywords/heterojunction |
| keywords[0].score | 0.7160464525222778 |
| keywords[0].display_name | Heterojunction |
| keywords[1].id | https://openalex.org/keywords/materials-science |
| keywords[1].score | 0.7019966244697571 |
| keywords[1].display_name | Materials science |
| keywords[2].id | https://openalex.org/keywords/semiconductor |
| keywords[2].score | 0.6666523218154907 |
| keywords[2].display_name | Semiconductor |
| keywords[3].id | https://openalex.org/keywords/monolayer |
| keywords[3].score | 0.6285403370857239 |
| keywords[3].display_name | Monolayer |
| keywords[4].id | https://openalex.org/keywords/spectroscopy |
| keywords[4].score | 0.5827595591545105 |
| keywords[4].display_name | Spectroscopy |
| keywords[5].id | https://openalex.org/keywords/thin-film |
| keywords[5].score | 0.5735890865325928 |
| keywords[5].display_name | Thin film |
| keywords[6].id | https://openalex.org/keywords/x-ray-photoelectron-spectroscopy |
| keywords[6].score | 0.5285483598709106 |
| keywords[6].display_name | X-ray photoelectron spectroscopy |
| keywords[7].id | https://openalex.org/keywords/energy-dispersive-x-ray-spectroscopy |
| keywords[7].score | 0.5164942741394043 |
| keywords[7].display_name | Energy-dispersive X-ray spectroscopy |
| keywords[8].id | https://openalex.org/keywords/silicon |
| keywords[8].score | 0.5040380358695984 |
| keywords[8].display_name | Silicon |
| keywords[9].id | https://openalex.org/keywords/thin-layers |
| keywords[9].score | 0.4758279621601105 |
| keywords[9].display_name | Thin layers |
| keywords[10].id | https://openalex.org/keywords/characterization |
| keywords[10].score | 0.4558514356613159 |
| keywords[10].display_name | Characterization (materials science) |
| keywords[11].id | https://openalex.org/keywords/optoelectronics |
| keywords[11].score | 0.4227210581302643 |
| keywords[11].display_name | Optoelectronics |
| keywords[12].id | https://openalex.org/keywords/scanning-electron-microscope |
| keywords[12].score | 0.4205261468887329 |
| keywords[12].display_name | Scanning electron microscope |
| keywords[13].id | https://openalex.org/keywords/van-der-waals-force |
| keywords[13].score | 0.42028170824050903 |
| keywords[13].display_name | van der Waals force |
| keywords[14].id | https://openalex.org/keywords/alloy |
| keywords[14].score | 0.41164201498031616 |
| keywords[14].display_name | Alloy |
| keywords[15].id | https://openalex.org/keywords/nanotechnology |
| keywords[15].score | 0.25923842191696167 |
| keywords[15].display_name | Nanotechnology |
| keywords[16].id | https://openalex.org/keywords/chemistry |
| keywords[16].score | 0.1271321177482605 |
| keywords[16].display_name | Chemistry |
| keywords[17].id | https://openalex.org/keywords/physics |
| keywords[17].score | 0.10678672790527344 |
| keywords[17].display_name | Physics |
| keywords[18].id | https://openalex.org/keywords/molecule |
| keywords[18].score | 0.07331779599189758 |
| keywords[18].display_name | Molecule |
| language | en |
| locations[0].id | pmh:oai:arXiv.org:2201.12545 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S4306400194 |
| locations[0].source.issn | |
| locations[0].source.type | repository |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | |
| locations[0].source.is_core | False |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | arXiv (Cornell University) |
| locations[0].source.host_organization | https://openalex.org/I205783295 |
| locations[0].source.host_organization_name | Cornell University |
| locations[0].source.host_organization_lineage | https://openalex.org/I205783295 |
| locations[0].license | |
| locations[0].pdf_url | https://arxiv.org/pdf/2201.12545 |
| locations[0].version | submittedVersion |
| locations[0].raw_type | text |
| locations[0].license_id | |
| locations[0].is_accepted | False |
| locations[0].is_published | False |
| locations[0].raw_source_name | |
| locations[0].landing_page_url | http://arxiv.org/abs/2201.12545 |
| locations[1].id | doi:10.48550/arxiv.2201.12545 |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4306400194 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | True |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | arXiv (Cornell University) |
| locations[1].source.host_organization | https://openalex.org/I205783295 |
| locations[1].source.host_organization_name | Cornell University |
| locations[1].source.host_organization_lineage | https://openalex.org/I205783295 |
| locations[1].license | cc-by |
| locations[1].pdf_url | |
| locations[1].version | |
| locations[1].raw_type | article |
| locations[1].license_id | https://openalex.org/licenses/cc-by |
| locations[1].is_accepted | False |
| locations[1].is_published | |
| locations[1].raw_source_name | |
| locations[1].landing_page_url | https://doi.org/10.48550/arxiv.2201.12545 |
| indexed_in | arxiv, datacite |
| authorships[0].author.id | https://openalex.org/A5023374911 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | Anna Rupp |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Rupp, Anna |
| authorships[0].is_corresponding | False |
| authorships[1].author.id | https://openalex.org/A5087550567 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-1307-0361 |
| authorships[1].author.display_name | Jonas Göser |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Göser, Jonas |
| authorships[1].is_corresponding | False |
| authorships[2].author.id | https://openalex.org/A5100341904 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-1367-3031 |
| authorships[2].author.display_name | Zhijie Li |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Li, Zhijie |
| authorships[2].is_corresponding | False |
| authorships[3].author.id | https://openalex.org/A5079219767 |
| authorships[3].author.orcid | |
| authorships[3].author.display_name | Philipp Altpeter |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Altpeter, Philipp |
| authorships[3].is_corresponding | False |
| authorships[4].author.id | https://openalex.org/A5038682893 |
| authorships[4].author.orcid | https://orcid.org/0000-0002-7614-1972 |
| authorships[4].author.display_name | Ismail Bilgin |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Bilgin, Ismail |
| authorships[4].is_corresponding | False |
| authorships[5].author.id | https://openalex.org/A5013851830 |
| authorships[5].author.orcid | https://orcid.org/0000-0002-0178-9117 |
| authorships[5].author.display_name | Alexander Högele |
| authorships[5].author_position | last |
| authorships[5].raw_author_name | Högele, Alexander |
| authorships[5].is_corresponding | False |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://arxiv.org/pdf/2201.12545 |
| open_access.oa_status | green |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Energy dispersive X-ray spectroscopy of atomically thin semiconductors |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T06:51:31.235846 |
| primary_topic.id | https://openalex.org/T11948 |
| primary_topic.field.id | https://openalex.org/fields/25 |
| primary_topic.field.display_name | Materials Science |
| primary_topic.score | 0.9983000159263611 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2505 |
| primary_topic.subfield.display_name | Materials Chemistry |
| primary_topic.display_name | Machine Learning in Materials Science |
| related_works | https://openalex.org/W2072594297, https://openalex.org/W2050317300, https://openalex.org/W2037348326, https://openalex.org/W2376711334, https://openalex.org/W1974457739, https://openalex.org/W2051355712, https://openalex.org/W2981194423, https://openalex.org/W2921614548, https://openalex.org/W2318741150, https://openalex.org/W2990347040 |
| cited_by_count | 0 |
| locations_count | 2 |
| best_oa_location.id | pmh:oai:arXiv.org:2201.12545 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S4306400194 |
| best_oa_location.source.issn | |
| best_oa_location.source.type | repository |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | |
| best_oa_location.source.is_core | False |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | arXiv (Cornell University) |
| best_oa_location.source.host_organization | https://openalex.org/I205783295 |
| best_oa_location.source.host_organization_name | Cornell University |
| best_oa_location.source.host_organization_lineage | https://openalex.org/I205783295 |
| best_oa_location.license | |
| best_oa_location.pdf_url | https://arxiv.org/pdf/2201.12545 |
| best_oa_location.version | submittedVersion |
| best_oa_location.raw_type | text |
| best_oa_location.license_id | |
| best_oa_location.is_accepted | False |
| best_oa_location.is_published | False |
| best_oa_location.raw_source_name | |
| best_oa_location.landing_page_url | http://arxiv.org/abs/2201.12545 |
| primary_location.id | pmh:oai:arXiv.org:2201.12545 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S4306400194 |
| primary_location.source.issn | |
| primary_location.source.type | repository |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | |
| primary_location.source.is_core | False |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | arXiv (Cornell University) |
| primary_location.source.host_organization | https://openalex.org/I205783295 |
| primary_location.source.host_organization_name | Cornell University |
| primary_location.source.host_organization_lineage | https://openalex.org/I205783295 |
| primary_location.license | |
| primary_location.pdf_url | https://arxiv.org/pdf/2201.12545 |
| primary_location.version | submittedVersion |
| primary_location.raw_type | text |
| primary_location.license_id | |
| primary_location.is_accepted | False |
| primary_location.is_published | False |
| primary_location.raw_source_name | |
| primary_location.landing_page_url | http://arxiv.org/abs/2201.12545 |
| publication_date | 2022-01-29 |
| publication_year | 2022 |
| referenced_works_count | 0 |
| abstract_inverted_index.a | 26, 32 |
| abstract_inverted_index.By | 41 |
| abstract_inverted_index.We | 0 |
| abstract_inverted_index.be | 79 |
| abstract_inverted_index.in | 12, 45, 67 |
| abstract_inverted_index.is | 23 |
| abstract_inverted_index.of | 4, 15, 72, 100 |
| abstract_inverted_index.on | 25 |
| abstract_inverted_index.or | 105 |
| abstract_inverted_index.to | 58, 82 |
| abstract_inverted_index.we | 50 |
| abstract_inverted_index.The | 21, 76 |
| abstract_inverted_index.and | 48, 62, 69, 87, 112 |
| abstract_inverted_index.can | 78 |
| abstract_inverted_index.der | 89 |
| abstract_inverted_index.for | 9, 36, 54, 97, 108 |
| abstract_inverted_index.the | 2, 13, 59, 94 |
| abstract_inverted_index.van | 88 |
| abstract_inverted_index.down | 57 |
| abstract_inverted_index.form | 14 |
| abstract_inverted_index.thin | 17, 110 |
| abstract_inverted_index.thus | 92 |
| abstract_inverted_index.with | 31 |
| abstract_inverted_index.Waals | 90 |
| abstract_inverted_index.X-ray | 7, 39 |
| abstract_inverted_index.alloy | 106 |
| abstract_inverted_index.based | 24 |
| abstract_inverted_index.drift | 34 |
| abstract_inverted_index.layer | 101 |
| abstract_inverted_index.limit | 61 |
| abstract_inverted_index.metal | 19, 74 |
| abstract_inverted_index.other | 83 |
| abstract_inverted_index.atomic | 103 |
| abstract_inverted_index.energy | 5, 37 |
| abstract_inverted_index.report | 1 |
| abstract_inverted_index.achieve | 51 |
| abstract_inverted_index.applied | 81 |
| abstract_inverted_index.lateral | 70 |
| abstract_inverted_index.layered | 10, 84 |
| abstract_inverted_index.number, | 102 |
| abstract_inverted_index.silicon | 33 |
| abstract_inverted_index.toolbox | 96 |
| abstract_inverted_index.crystals | 56 |
| abstract_inverted_index.detector | 35 |
| abstract_inverted_index.devices. | 113 |
| abstract_inverted_index.electron | 28 |
| abstract_inverted_index.equipped | 30 |
| abstract_inverted_index.scanning | 27 |
| abstract_inverted_index.vertical | 68 |
| abstract_inverted_index.analysis. | 40 |
| abstract_inverted_index.elemental | 64 |
| abstract_inverted_index.expanding | 93 |
| abstract_inverted_index.few-layer | 55 |
| abstract_inverted_index.gradients | 107 |
| abstract_inverted_index.materials | 86, 111 |
| abstract_inverted_index.monolayer | 60 |
| abstract_inverted_index.numerical | 46 |
| abstract_inverted_index.profiling | 66 |
| abstract_inverted_index.technique | 22, 77 |
| abstract_inverted_index.atomically | 16, 109 |
| abstract_inverted_index.dispersive | 6, 38 |
| abstract_inverted_index.microscope | 29 |
| abstract_inverted_index.optimizing | 42 |
| abstract_inverted_index.parameters | 44 |
| abstract_inverted_index.transition | 18, 73 |
| abstract_inverted_index.composition | 65 |
| abstract_inverted_index.demonstrate | 63 |
| abstract_inverted_index.operational | 43 |
| abstract_inverted_index.sensitivity | 53 |
| abstract_inverted_index.simulations | 47 |
| abstract_inverted_index.composition, | 104 |
| abstract_inverted_index.experimental | 95 |
| abstract_inverted_index.experiments, | 49 |
| abstract_inverted_index.quantitative | 98 |
| abstract_inverted_index.spectroscopy | 8 |
| abstract_inverted_index.heterobilayers | 71 |
| abstract_inverted_index.implementation | 3 |
| abstract_inverted_index.semiconductors | 11 |
| abstract_inverted_index.layer-resolving | 52 |
| abstract_inverted_index.two-dimensional | 85 |
| abstract_inverted_index.characterization | 99 |
| abstract_inverted_index.dichalcogenides. | 20, 75 |
| abstract_inverted_index.heterostructures, | 91 |
| abstract_inverted_index.straight-forwardly | 80 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 6 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/7 |
| sustainable_development_goals[0].score | 0.7799999713897705 |
| sustainable_development_goals[0].display_name | Affordable and clean energy |
| citation_normalized_percentile |