Enhanced switching ratio and subthreshold swing analysis of different gate dielectric materials effect on OFET performance Article Swipe
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· 2025
· Open Access
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· DOI: https://doi.org/10.56053/9.s.303
Organic field-effect transistors (OFET) have gained significant interest for their potential in low-cost, large-scale, flexible, and printable electronic devices. However, they face numerous significant challenges, such as high operating voltage and leakage current. This study investigates the impact of using high-dielectric constant materials as gate dielectrics on the performance of OFETs. The goal is to improve OFETs by lowering the operating voltages using high gate dielectric organic and inorganic materials. Aluminum dioxide (Al2O3) and polyvinyl alcohol (PVA) were selected as the gate dielectrics due to their favorable properties. MATLAB was used to model and study the electrical characteristics of the device. The device demonstrated typical p-type channel behavior with increasing negative gate bias voltage values. The device shows a clear enhancement using a bilayer of PVA/Al2O3 against the monolayer. The results show that the device saturation regime has a high value of on/off ratio (Ion/Ioff), transconductance (gm), and lower subthreshold swing (SS) of 8.05 x10 2 -3 , 4.19x10 A/V, 1.52. These values indicate that organic materials can potentially produce organic electronic device applications.
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.56053/9.s.303
- https://etnano.com/index.php/journal/article/download/159/165
- OA Status
- diamond
- Cited By
- 1
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4408519511
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4408519511Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.56053/9.s.303Digital Object Identifier
- Title
-
Enhanced switching ratio and subthreshold swing analysis of different gate dielectric materials effect on OFET performanceWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2025Year of publication
- Publication date
-
2025-03-15Full publication date if available
- Authors
-
Zainab Naseer Hasheem, Estabraq T. AbdullahList of authors in order
- Landing page
-
https://doi.org/10.56053/9.s.303Publisher landing page
- PDF URL
-
https://etnano.com/index.php/journal/article/download/159/165Direct link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
diamondOpen access status per OpenAlex
- OA URL
-
https://etnano.com/index.php/journal/article/download/159/165Direct OA link when available
- Concepts
-
Organic field-effect transistor, Subthreshold swing, Swing, Materials science, Gate dielectric, Optoelectronics, Subthreshold conduction, Dielectric, Transistor, Electrical engineering, Threshold voltage, Field-effect transistor, Physics, Acoustics, Engineering, VoltageTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
1Total citation count in OpenAlex
- Citations by year (recent)
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2025: 1Per-year citation counts (last 5 years)
- Related works (count)
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10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4408519511 |
|---|---|
| doi | https://doi.org/10.56053/9.s.303 |
| ids.doi | https://doi.org/10.56053/9.s.303 |
| ids.openalex | https://openalex.org/W4408519511 |
| fwci | 2.02156574 |
| type | article |
| title | Enhanced switching ratio and subthreshold swing analysis of different gate dielectric materials effect on OFET performance |
| biblio.issue | S |
| biblio.volume | 9 |
| biblio.last_page | 310 |
| biblio.first_page | 303 |
| topics[0].id | https://openalex.org/T10502 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9997000098228455 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Advanced Memory and Neural Computing |
| topics[1].id | https://openalex.org/T12808 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9997000098228455 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Ferroelectric and Negative Capacitance Devices |
| topics[2].id | https://openalex.org/T10472 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9991000294685364 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Semiconductor materials and devices |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C99903730 |
| concepts[0].level | 5 |
| concepts[0].score | 0.7175361514091492 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q1066726 |
| concepts[0].display_name | Organic field-effect transistor |
| concepts[1].id | https://openalex.org/C2982823382 |
| concepts[1].level | 5 |
| concepts[1].score | 0.6979836225509644 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q7632226 |
| concepts[1].display_name | Subthreshold swing |
| concepts[2].id | https://openalex.org/C65655974 |
| concepts[2].level | 2 |
| concepts[2].score | 0.6420266628265381 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q14867674 |
| concepts[2].display_name | Swing |
| concepts[3].id | https://openalex.org/C192562407 |
| concepts[3].level | 0 |
| concepts[3].score | 0.6236542463302612 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[3].display_name | Materials science |
| concepts[4].id | https://openalex.org/C166972891 |
| concepts[4].level | 4 |
| concepts[4].score | 0.594283401966095 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q5527011 |
| concepts[4].display_name | Gate dielectric |
| concepts[5].id | https://openalex.org/C49040817 |
| concepts[5].level | 1 |
| concepts[5].score | 0.47607749700546265 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[5].display_name | Optoelectronics |
| concepts[6].id | https://openalex.org/C156465305 |
| concepts[6].level | 4 |
| concepts[6].score | 0.4329163432121277 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q1658601 |
| concepts[6].display_name | Subthreshold conduction |
| concepts[7].id | https://openalex.org/C133386390 |
| concepts[7].level | 2 |
| concepts[7].score | 0.4193669557571411 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q184996 |
| concepts[7].display_name | Dielectric |
| concepts[8].id | https://openalex.org/C172385210 |
| concepts[8].level | 3 |
| concepts[8].score | 0.31955277919769287 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q5339 |
| concepts[8].display_name | Transistor |
| concepts[9].id | https://openalex.org/C119599485 |
| concepts[9].level | 1 |
| concepts[9].score | 0.2554304003715515 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[9].display_name | Electrical engineering |
| concepts[10].id | https://openalex.org/C195370968 |
| concepts[10].level | 4 |
| concepts[10].score | 0.14627674221992493 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q1754002 |
| concepts[10].display_name | Threshold voltage |
| concepts[11].id | https://openalex.org/C145598152 |
| concepts[11].level | 4 |
| concepts[11].score | 0.1357935667037964 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q176097 |
| concepts[11].display_name | Field-effect transistor |
| concepts[12].id | https://openalex.org/C121332964 |
| concepts[12].level | 0 |
| concepts[12].score | 0.08671548962593079 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[12].display_name | Physics |
| concepts[13].id | https://openalex.org/C24890656 |
| concepts[13].level | 1 |
| concepts[13].score | 0.078240305185318 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q82811 |
| concepts[13].display_name | Acoustics |
| concepts[14].id | https://openalex.org/C127413603 |
| concepts[14].level | 0 |
| concepts[14].score | 0.07307019829750061 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[14].display_name | Engineering |
| concepts[15].id | https://openalex.org/C165801399 |
| concepts[15].level | 2 |
| concepts[15].score | 0.048977285623550415 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q25428 |
| concepts[15].display_name | Voltage |
| keywords[0].id | https://openalex.org/keywords/organic-field-effect-transistor |
| keywords[0].score | 0.7175361514091492 |
| keywords[0].display_name | Organic field-effect transistor |
| keywords[1].id | https://openalex.org/keywords/subthreshold-swing |
| keywords[1].score | 0.6979836225509644 |
| keywords[1].display_name | Subthreshold swing |
| keywords[2].id | https://openalex.org/keywords/swing |
| keywords[2].score | 0.6420266628265381 |
| keywords[2].display_name | Swing |
| keywords[3].id | https://openalex.org/keywords/materials-science |
| keywords[3].score | 0.6236542463302612 |
| keywords[3].display_name | Materials science |
| keywords[4].id | https://openalex.org/keywords/gate-dielectric |
| keywords[4].score | 0.594283401966095 |
| keywords[4].display_name | Gate dielectric |
| keywords[5].id | https://openalex.org/keywords/optoelectronics |
| keywords[5].score | 0.47607749700546265 |
| keywords[5].display_name | Optoelectronics |
| keywords[6].id | https://openalex.org/keywords/subthreshold-conduction |
| keywords[6].score | 0.4329163432121277 |
| keywords[6].display_name | Subthreshold conduction |
| keywords[7].id | https://openalex.org/keywords/dielectric |
| keywords[7].score | 0.4193669557571411 |
| keywords[7].display_name | Dielectric |
| keywords[8].id | https://openalex.org/keywords/transistor |
| keywords[8].score | 0.31955277919769287 |
| keywords[8].display_name | Transistor |
| keywords[9].id | https://openalex.org/keywords/electrical-engineering |
| keywords[9].score | 0.2554304003715515 |
| keywords[9].display_name | Electrical engineering |
| keywords[10].id | https://openalex.org/keywords/threshold-voltage |
| keywords[10].score | 0.14627674221992493 |
| keywords[10].display_name | Threshold voltage |
| keywords[11].id | https://openalex.org/keywords/field-effect-transistor |
| keywords[11].score | 0.1357935667037964 |
| keywords[11].display_name | Field-effect transistor |
| keywords[12].id | https://openalex.org/keywords/physics |
| keywords[12].score | 0.08671548962593079 |
| keywords[12].display_name | Physics |
| keywords[13].id | https://openalex.org/keywords/acoustics |
| keywords[13].score | 0.078240305185318 |
| keywords[13].display_name | Acoustics |
| keywords[14].id | https://openalex.org/keywords/engineering |
| keywords[14].score | 0.07307019829750061 |
| keywords[14].display_name | Engineering |
| keywords[15].id | https://openalex.org/keywords/voltage |
| keywords[15].score | 0.048977285623550415 |
| keywords[15].display_name | Voltage |
| language | en |
| locations[0].id | doi:10.56053/9.s.303 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S4387282083 |
| locations[0].source.issn | 2590-4132 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 2590-4132 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | Experimental and Theoretical NANOTECHNOLOGY |
| locations[0].source.host_organization | |
| locations[0].source.host_organization_name | |
| locations[0].license | |
| locations[0].pdf_url | https://etnano.com/index.php/journal/article/download/159/165 |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Experimental and Theoretical NANOTECHNOLOGY |
| locations[0].landing_page_url | https://doi.org/10.56053/9.s.303 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5116657591 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | Zainab Naseer Hasheem |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Zainab Naseer Hasheem |
| authorships[0].is_corresponding | False |
| authorships[1].author.id | https://openalex.org/A5035848576 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-2893-3529 |
| authorships[1].author.display_name | Estabraq T. Abdullah |
| authorships[1].author_position | last |
| authorships[1].raw_author_name | Estabraq Talib Abdullah |
| authorships[1].is_corresponding | False |
| has_content.pdf | True |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://etnano.com/index.php/journal/article/download/159/165 |
| open_access.oa_status | diamond |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Enhanced switching ratio and subthreshold swing analysis of different gate dielectric materials effect on OFET performance |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T06:51:31.235846 |
| primary_topic.id | https://openalex.org/T10502 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9997000098228455 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Advanced Memory and Neural Computing |
| related_works | https://openalex.org/W2286143580, https://openalex.org/W2120470805, https://openalex.org/W1994870051, https://openalex.org/W2588746516, https://openalex.org/W4379057581, https://openalex.org/W2030922901, https://openalex.org/W4200529533, https://openalex.org/W2181436197, https://openalex.org/W2532553827, https://openalex.org/W2378659741 |
| cited_by_count | 1 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 1 |
| locations_count | 1 |
| best_oa_location.id | doi:10.56053/9.s.303 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S4387282083 |
| best_oa_location.source.issn | 2590-4132 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 2590-4132 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | Experimental and Theoretical NANOTECHNOLOGY |
| best_oa_location.source.host_organization | |
| best_oa_location.source.host_organization_name | |
| best_oa_location.license | |
| best_oa_location.pdf_url | https://etnano.com/index.php/journal/article/download/159/165 |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Experimental and Theoretical NANOTECHNOLOGY |
| best_oa_location.landing_page_url | https://doi.org/10.56053/9.s.303 |
| primary_location.id | doi:10.56053/9.s.303 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S4387282083 |
| primary_location.source.issn | 2590-4132 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 2590-4132 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | Experimental and Theoretical NANOTECHNOLOGY |
| primary_location.source.host_organization | |
| primary_location.source.host_organization_name | |
| primary_location.license | |
| primary_location.pdf_url | https://etnano.com/index.php/journal/article/download/159/165 |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Experimental and Theoretical NANOTECHNOLOGY |
| primary_location.landing_page_url | https://doi.org/10.56053/9.s.303 |
| publication_date | 2025-03-15 |
| publication_year | 2025 |
| referenced_works_count | 0 |
| abstract_inverted_index., | 157 |
| abstract_inverted_index.2 | 155 |
| abstract_inverted_index.a | 118, 122, 138 |
| abstract_inverted_index.-3 | 156 |
| abstract_inverted_index.as | 26, 43, 79 |
| abstract_inverted_index.by | 57 |
| abstract_inverted_index.in | 11 |
| abstract_inverted_index.is | 53 |
| abstract_inverted_index.of | 38, 49, 98, 124, 141, 152 |
| abstract_inverted_index.on | 46 |
| abstract_inverted_index.to | 54, 84, 91 |
| abstract_inverted_index.The | 51, 101, 115, 129 |
| abstract_inverted_index.and | 15, 30, 67, 73, 93, 147 |
| abstract_inverted_index.can | 167 |
| abstract_inverted_index.due | 83 |
| abstract_inverted_index.for | 8 |
| abstract_inverted_index.has | 137 |
| abstract_inverted_index.the | 36, 47, 59, 80, 95, 99, 127, 133 |
| abstract_inverted_index.was | 89 |
| abstract_inverted_index.x10 | 154 |
| abstract_inverted_index.(SS) | 151 |
| abstract_inverted_index.8.05 | 153 |
| abstract_inverted_index.A/V, | 159 |
| abstract_inverted_index.This | 33 |
| abstract_inverted_index.bias | 112 |
| abstract_inverted_index.face | 21 |
| abstract_inverted_index.gate | 44, 64, 81, 111 |
| abstract_inverted_index.goal | 52 |
| abstract_inverted_index.have | 4 |
| abstract_inverted_index.high | 27, 63, 139 |
| abstract_inverted_index.show | 131 |
| abstract_inverted_index.such | 25 |
| abstract_inverted_index.that | 132, 164 |
| abstract_inverted_index.they | 20 |
| abstract_inverted_index.used | 90 |
| abstract_inverted_index.were | 77 |
| abstract_inverted_index.with | 108 |
| abstract_inverted_index.(PVA) | 76 |
| abstract_inverted_index.(gm), | 146 |
| abstract_inverted_index.1.52. | 160 |
| abstract_inverted_index.OFETs | 56 |
| abstract_inverted_index.These | 161 |
| abstract_inverted_index.clear | 119 |
| abstract_inverted_index.lower | 148 |
| abstract_inverted_index.model | 92 |
| abstract_inverted_index.ratio | 143 |
| abstract_inverted_index.shows | 117 |
| abstract_inverted_index.study | 34, 94 |
| abstract_inverted_index.swing | 150 |
| abstract_inverted_index.their | 9, 85 |
| abstract_inverted_index.using | 39, 62, 121 |
| abstract_inverted_index.value | 140 |
| abstract_inverted_index.(OFET) | 3 |
| abstract_inverted_index.MATLAB | 88 |
| abstract_inverted_index.OFETs. | 50 |
| abstract_inverted_index.device | 102, 116, 134, 172 |
| abstract_inverted_index.gained | 5 |
| abstract_inverted_index.impact | 37 |
| abstract_inverted_index.on/off | 142 |
| abstract_inverted_index.p-type | 105 |
| abstract_inverted_index.regime | 136 |
| abstract_inverted_index.values | 162 |
| abstract_inverted_index.(Al2O3) | 72 |
| abstract_inverted_index.4.19x10 | 158 |
| abstract_inverted_index.Organic | 0 |
| abstract_inverted_index.against | 126 |
| abstract_inverted_index.alcohol | 75 |
| abstract_inverted_index.bilayer | 123 |
| abstract_inverted_index.channel | 106 |
| abstract_inverted_index.device. | 100 |
| abstract_inverted_index.dioxide | 71 |
| abstract_inverted_index.improve | 55 |
| abstract_inverted_index.leakage | 31 |
| abstract_inverted_index.organic | 66, 165, 170 |
| abstract_inverted_index.produce | 169 |
| abstract_inverted_index.results | 130 |
| abstract_inverted_index.typical | 104 |
| abstract_inverted_index.values. | 114 |
| abstract_inverted_index.voltage | 29, 113 |
| abstract_inverted_index.Aluminum | 70 |
| abstract_inverted_index.However, | 19 |
| abstract_inverted_index.behavior | 107 |
| abstract_inverted_index.constant | 41 |
| abstract_inverted_index.current. | 32 |
| abstract_inverted_index.devices. | 18 |
| abstract_inverted_index.indicate | 163 |
| abstract_inverted_index.interest | 7 |
| abstract_inverted_index.lowering | 58 |
| abstract_inverted_index.negative | 110 |
| abstract_inverted_index.numerous | 22 |
| abstract_inverted_index.selected | 78 |
| abstract_inverted_index.voltages | 61 |
| abstract_inverted_index.PVA/Al2O3 | 125 |
| abstract_inverted_index.favorable | 86 |
| abstract_inverted_index.flexible, | 14 |
| abstract_inverted_index.inorganic | 68 |
| abstract_inverted_index.low-cost, | 12 |
| abstract_inverted_index.materials | 42, 166 |
| abstract_inverted_index.operating | 28, 60 |
| abstract_inverted_index.polyvinyl | 74 |
| abstract_inverted_index.potential | 10 |
| abstract_inverted_index.printable | 16 |
| abstract_inverted_index.dielectric | 65 |
| abstract_inverted_index.electrical | 96 |
| abstract_inverted_index.electronic | 17, 171 |
| abstract_inverted_index.increasing | 109 |
| abstract_inverted_index.materials. | 69 |
| abstract_inverted_index.monolayer. | 128 |
| abstract_inverted_index.saturation | 135 |
| abstract_inverted_index.(Ion/Ioff), | 144 |
| abstract_inverted_index.challenges, | 24 |
| abstract_inverted_index.dielectrics | 45, 82 |
| abstract_inverted_index.enhancement | 120 |
| abstract_inverted_index.performance | 48 |
| abstract_inverted_index.potentially | 168 |
| abstract_inverted_index.properties. | 87 |
| abstract_inverted_index.significant | 6, 23 |
| abstract_inverted_index.transistors | 2 |
| abstract_inverted_index.demonstrated | 103 |
| abstract_inverted_index.field-effect | 1 |
| abstract_inverted_index.investigates | 35 |
| abstract_inverted_index.large-scale, | 13 |
| abstract_inverted_index.subthreshold | 149 |
| abstract_inverted_index.applications. | 173 |
| abstract_inverted_index.characteristics | 97 |
| abstract_inverted_index.high-dielectric | 40 |
| abstract_inverted_index.transconductance | 145 |
| cited_by_percentile_year.max | 95 |
| cited_by_percentile_year.min | 91 |
| countries_distinct_count | 0 |
| institutions_distinct_count | 2 |
| citation_normalized_percentile.value | 0.76933153 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | True |