ESfix: An Embedded Program Repair Tool for Effective Removal of Concurrency Defects Article Swipe
J. Leon Zhao
,
Yanxia Wu
,
Yan Fu
,
Shuyong Liu
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/e27030294
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/e27030294
Embedded programs are not only inseparable from our daily lives but are also widely used in aerospace, medical devices, and other fields that require very high security and stability. The uncertainty and randomness of the large amount of data generated by these systems during operation can be quantified by entropy. Traditional repair methods for concurrency defects may introduce new issues such as deadlocks, original semantic destruction, and high performance overhead. To overcome the limitations of the existing methods and help developers reduce the time and effort spent on fixing software defects, this paper proposes ESfix, a defect fixing technique applied to embedded software. ESfix first utilizes the bug information reported by the defect detection tool to locate the repair region and extracts the node information corresponding to the defective code. Then, ESfix optimizes the interrupt disable/enable strategies and lock strategies to repair data race and reduce bugs in information transmission, thereby reducing system entropy and improving data certainty and reliability. Finally, ESfix repairs atomicity violation defects using the reordering repair strategy, reducing information entropy by adjusting the order of information to ensure its integrity and consistency. ESfix conducts semantic analysis by analyzing the dependency graph in the control flow graph (CFG) to ensure that no new defects are introduced during the repair process, and to maintain the efficiency and accuracy of information transmission between different parts of the code. We evaluate the effectiveness of repair strategies through information entropy, and the experimental results show that ESfix not only improves performance but also reduces potential risks and losses.
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Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.3390/e27030294
- https://www.mdpi.com/1099-4300/27/3/294/pdf?version=1741763856
- OA Status
- gold
- References
- 50
- Related Works
- 10
- OpenAlex ID
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All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4408376798Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.3390/e27030294Digital Object Identifier
- Title
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ESfix: An Embedded Program Repair Tool for Effective Removal of Concurrency DefectsWork title
- Type
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2025Year of publication
- Publication date
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2025-03-12Full publication date if available
- Authors
-
J. Leon Zhao, Yanxia Wu, Yan Fu, Shuyong LiuList of authors in order
- Landing page
-
https://doi.org/10.3390/e27030294Publisher landing page
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https://www.mdpi.com/1099-4300/27/3/294/pdf?version=1741763856Direct link to full text PDF
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YesWhether a free full text is available
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goldOpen access status per OpenAlex
- OA URL
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https://www.mdpi.com/1099-4300/27/3/294/pdf?version=1741763856Direct OA link when available
- Concepts
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Computer science, Concurrency, Atomicity, Reliability engineering, Thread (computing), Distributed computing, Database, Database transaction, Operating system, EngineeringTop concepts (fields/topics) attached by OpenAlex
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0Total citation count in OpenAlex
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50Number of works referenced by this work
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10Other works algorithmically related by OpenAlex
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| publication_year | 2025 |
| referenced_works | https://openalex.org/W3129933233, https://openalex.org/W3157542420, https://openalex.org/W6848443691, https://openalex.org/W2998011150, https://openalex.org/W4288084466, https://openalex.org/W2743702233, https://openalex.org/W3193682477, https://openalex.org/W4213019371, https://openalex.org/W2344973853, https://openalex.org/W2740646481, https://openalex.org/W4210839840, https://openalex.org/W3039619065, https://openalex.org/W2954183584, https://openalex.org/W2924629359, https://openalex.org/W4384345708, https://openalex.org/W4210712189, https://openalex.org/W4285586642, https://openalex.org/W4229573069, https://openalex.org/W2569302008, https://openalex.org/W4384155551, https://openalex.org/W4399668305, https://openalex.org/W4403908669, https://openalex.org/W4389159406, https://openalex.org/W2963790596, https://openalex.org/W6639456316, https://openalex.org/W3003689949, https://openalex.org/W2740343870, https://openalex.org/W6757641836, https://openalex.org/W2898644864, https://openalex.org/W2794832431, https://openalex.org/W3134796670, https://openalex.org/W2343875716, https://openalex.org/W3208407575, https://openalex.org/W2122947685, https://openalex.org/W127597465, https://openalex.org/W3091512861, https://openalex.org/W3014792488, https://openalex.org/W4398212001, https://openalex.org/W2546468634, https://openalex.org/W3155100939, https://openalex.org/W4306406277, https://openalex.org/W4229034550, https://openalex.org/W3134686229, https://openalex.org/W6859054521, https://openalex.org/W4308643319, https://openalex.org/W4399256020, https://openalex.org/W4389560241, https://openalex.org/W4388422146, https://openalex.org/W3161027892, https://openalex.org/W2907705732 |
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