Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes Article Swipe
Yoni Xiong
,
Nicholas J. Pieper
,
Jenna B. Kronenberg
,
Yueh Chiang
,
Rita Fung
,
Shi-Jie Wen
,
B. L. Bhuva
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1109/tns.2024.3365474
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1109/tns.2024.3365474
With modern integrated circuits (ICs) operating at the GHz range of operation, the single-event (SE) cross-section of an average logic circuit feeding data into a conventional latch has become comparable to the latch SE cross-section. Logic SE cross-sections at advanced FinFET technology nodes are analyzed to identify the "Threshold Frequencies" at which the logic SE cross-section for a typical logic circuit exceeds that of the latch following it. The Threshold Frequency as a function of particle LET, supply voltage, and latch design are analyzed for the 16-nm, 7-nm, and 5-nm bulk FinFET technology nodes. Results show that the Threshold Frequency is of the order of 100's of MHz at these nodes for all test conditions used in this study. Understanding the Threshold Frequency concept and trends will allow designers to harden circuits efficiently to meet design specifications with minimum performance penalty.
Related Topics
Concepts
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/tns.2024.3365474
- OA Status
- hybrid
- Cited By
- 1
- References
- 30
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4391768445
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4391768445Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1109/tns.2024.3365474Digital Object Identifier
- Title
-
Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology NodesWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2024Year of publication
- Publication date
-
2024-02-13Full publication date if available
- Authors
-
Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Yueh Chiang, Rita Fung, Shi-Jie Wen, B. L. BhuvaList of authors in order
- Landing page
-
https://doi.org/10.1109/tns.2024.3365474Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.1109/tns.2024.3365474Direct OA link when available
- Concepts
-
Logic gate, Electrical engineering, Electronic engineering, Event (particle physics), Physics, Computer science, Optoelectronics, Materials science, Engineering, Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
1Total citation count in OpenAlex
- Citations by year (recent)
-
2024: 1Per-year citation counts (last 5 years)
- References (count)
-
30Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4391768445 |
|---|---|
| doi | https://doi.org/10.1109/tns.2024.3365474 |
| ids.doi | https://doi.org/10.1109/tns.2024.3365474 |
| ids.openalex | https://openalex.org/W4391768445 |
| fwci | 0.36916847 |
| type | article |
| title | Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes |
| biblio.issue | 8 |
| biblio.volume | 71 |
| biblio.last_page | 1681 |
| biblio.first_page | 1675 |
| topics[0].id | https://openalex.org/T11005 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9993000030517578 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Radiation Effects in Electronics |
| topics[1].id | https://openalex.org/T10472 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9965999722480774 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Semiconductor materials and devices |
| topics[2].id | https://openalex.org/T11032 |
| topics[2].field.id | https://openalex.org/fields/17 |
| topics[2].field.display_name | Computer Science |
| topics[2].score | 0.9890999794006348 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/1708 |
| topics[2].subfield.display_name | Hardware and Architecture |
| topics[2].display_name | VLSI and Analog Circuit Testing |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C131017901 |
| concepts[0].level | 2 |
| concepts[0].score | 0.6203332543373108 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q170451 |
| concepts[0].display_name | Logic gate |
| concepts[1].id | https://openalex.org/C119599485 |
| concepts[1].level | 1 |
| concepts[1].score | 0.518714964389801 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[1].display_name | Electrical engineering |
| concepts[2].id | https://openalex.org/C24326235 |
| concepts[2].level | 1 |
| concepts[2].score | 0.5185406804084778 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[2].display_name | Electronic engineering |
| concepts[3].id | https://openalex.org/C2779662365 |
| concepts[3].level | 2 |
| concepts[3].score | 0.45324647426605225 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q5416694 |
| concepts[3].display_name | Event (particle physics) |
| concepts[4].id | https://openalex.org/C121332964 |
| concepts[4].level | 0 |
| concepts[4].score | 0.4199870824813843 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[4].display_name | Physics |
| concepts[5].id | https://openalex.org/C41008148 |
| concepts[5].level | 0 |
| concepts[5].score | 0.40000665187835693 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[5].display_name | Computer science |
| concepts[6].id | https://openalex.org/C49040817 |
| concepts[6].level | 1 |
| concepts[6].score | 0.3623678684234619 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[6].display_name | Optoelectronics |
| concepts[7].id | https://openalex.org/C192562407 |
| concepts[7].level | 0 |
| concepts[7].score | 0.35687798261642456 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[7].display_name | Materials science |
| concepts[8].id | https://openalex.org/C127413603 |
| concepts[8].level | 0 |
| concepts[8].score | 0.33811405301094055 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[8].display_name | Engineering |
| concepts[9].id | https://openalex.org/C62520636 |
| concepts[9].level | 1 |
| concepts[9].score | 0.0 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[9].display_name | Quantum mechanics |
| keywords[0].id | https://openalex.org/keywords/logic-gate |
| keywords[0].score | 0.6203332543373108 |
| keywords[0].display_name | Logic gate |
| keywords[1].id | https://openalex.org/keywords/electrical-engineering |
| keywords[1].score | 0.518714964389801 |
| keywords[1].display_name | Electrical engineering |
| keywords[2].id | https://openalex.org/keywords/electronic-engineering |
| keywords[2].score | 0.5185406804084778 |
| keywords[2].display_name | Electronic engineering |
| keywords[3].id | https://openalex.org/keywords/event |
| keywords[3].score | 0.45324647426605225 |
| keywords[3].display_name | Event (particle physics) |
| keywords[4].id | https://openalex.org/keywords/physics |
| keywords[4].score | 0.4199870824813843 |
| keywords[4].display_name | Physics |
| keywords[5].id | https://openalex.org/keywords/computer-science |
| keywords[5].score | 0.40000665187835693 |
| keywords[5].display_name | Computer science |
| keywords[6].id | https://openalex.org/keywords/optoelectronics |
| keywords[6].score | 0.3623678684234619 |
| keywords[6].display_name | Optoelectronics |
| keywords[7].id | https://openalex.org/keywords/materials-science |
| keywords[7].score | 0.35687798261642456 |
| keywords[7].display_name | Materials science |
| keywords[8].id | https://openalex.org/keywords/engineering |
| keywords[8].score | 0.33811405301094055 |
| keywords[8].display_name | Engineering |
| language | en |
| locations[0].id | doi:10.1109/tns.2024.3365474 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S14279044 |
| locations[0].source.issn | 0018-9499, 1558-1578 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 0018-9499 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | IEEE Transactions on Nuclear Science |
| locations[0].source.host_organization | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_name | Institute of Electrical and Electronics Engineers |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| locations[0].license | cc-by |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | IEEE Transactions on Nuclear Science |
| locations[0].landing_page_url | https://doi.org/10.1109/tns.2024.3365474 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5015226951 |
| authorships[0].author.orcid | https://orcid.org/0000-0002-3635-7429 |
| authorships[0].author.display_name | Yoni Xiong |
| authorships[0].countries | US |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I200719446 |
| authorships[0].affiliations[0].raw_affiliation_string | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[0].institutions[0].id | https://openalex.org/I200719446 |
| authorships[0].institutions[0].ror | https://ror.org/02vm5rt34 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I200719446 |
| authorships[0].institutions[0].country_code | US |
| authorships[0].institutions[0].display_name | Vanderbilt University |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Yoni Xiong |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[1].author.id | https://openalex.org/A5005276432 |
| authorships[1].author.orcid | https://orcid.org/0000-0003-4968-7029 |
| authorships[1].author.display_name | Nicholas J. Pieper |
| authorships[1].countries | US |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I200719446 |
| authorships[1].affiliations[0].raw_affiliation_string | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[1].institutions[0].id | https://openalex.org/I200719446 |
| authorships[1].institutions[0].ror | https://ror.org/02vm5rt34 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I200719446 |
| authorships[1].institutions[0].country_code | US |
| authorships[1].institutions[0].display_name | Vanderbilt University |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Nicholas J. Pieper |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[2].author.id | https://openalex.org/A5113117955 |
| authorships[2].author.orcid | https://orcid.org/0009-0009-4632-6704 |
| authorships[2].author.display_name | Jenna B. Kronenberg |
| authorships[2].countries | US |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I200719446 |
| authorships[2].affiliations[0].raw_affiliation_string | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[2].institutions[0].id | https://openalex.org/I200719446 |
| authorships[2].institutions[0].ror | https://ror.org/02vm5rt34 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I200719446 |
| authorships[2].institutions[0].country_code | US |
| authorships[2].institutions[0].display_name | Vanderbilt University |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Jenna B. Kronenberg |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[3].author.id | https://openalex.org/A5044181817 |
| authorships[3].author.orcid | https://orcid.org/0000-0001-8643-1116 |
| authorships[3].author.display_name | Yueh Chiang |
| authorships[3].countries | TW |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I4210120917 |
| authorships[3].affiliations[0].raw_affiliation_string | Digital IPs Solution Division, Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, Taiwan |
| authorships[3].institutions[0].id | https://openalex.org/I4210120917 |
| authorships[3].institutions[0].ror | https://ror.org/02wx79d08 |
| authorships[3].institutions[0].type | company |
| authorships[3].institutions[0].lineage | https://openalex.org/I4210120917 |
| authorships[3].institutions[0].country_code | TW |
| authorships[3].institutions[0].display_name | Taiwan Semiconductor Manufacturing Company (Taiwan) |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Yueh Chiang |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | Digital IPs Solution Division, Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, Taiwan |
| authorships[4].author.id | https://openalex.org/A5061264216 |
| authorships[4].author.orcid | https://orcid.org/0000-0001-9774-1451 |
| authorships[4].author.display_name | Rita Fung |
| authorships[4].countries | US |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I135428043 |
| authorships[4].affiliations[0].raw_affiliation_string | Cisco Systems Inc., San Jose, CA, USA |
| authorships[4].institutions[0].id | https://openalex.org/I135428043 |
| authorships[4].institutions[0].ror | https://ror.org/03yt1ez60 |
| authorships[4].institutions[0].type | company |
| authorships[4].institutions[0].lineage | https://openalex.org/I135428043 |
| authorships[4].institutions[0].country_code | US |
| authorships[4].institutions[0].display_name | Cisco Systems (United States) |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Rita Fung |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | Cisco Systems Inc., San Jose, CA, USA |
| authorships[5].author.id | https://openalex.org/A5025156540 |
| authorships[5].author.orcid | https://orcid.org/0009-0002-7478-2351 |
| authorships[5].author.display_name | Shi-Jie Wen |
| authorships[5].countries | US |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I135428043 |
| authorships[5].affiliations[0].raw_affiliation_string | Cisco Systems Inc., San Jose, CA, USA |
| authorships[5].institutions[0].id | https://openalex.org/I135428043 |
| authorships[5].institutions[0].ror | https://ror.org/03yt1ez60 |
| authorships[5].institutions[0].type | company |
| authorships[5].institutions[0].lineage | https://openalex.org/I135428043 |
| authorships[5].institutions[0].country_code | US |
| authorships[5].institutions[0].display_name | Cisco Systems (United States) |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Shi-Jie Wen |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | Cisco Systems Inc., San Jose, CA, USA |
| authorships[6].author.id | https://openalex.org/A5090534631 |
| authorships[6].author.orcid | https://orcid.org/0000-0002-2171-100X |
| authorships[6].author.display_name | B. L. Bhuva |
| authorships[6].countries | US |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I200719446 |
| authorships[6].affiliations[0].raw_affiliation_string | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| authorships[6].institutions[0].id | https://openalex.org/I200719446 |
| authorships[6].institutions[0].ror | https://ror.org/02vm5rt34 |
| authorships[6].institutions[0].type | education |
| authorships[6].institutions[0].lineage | https://openalex.org/I200719446 |
| authorships[6].institutions[0].country_code | US |
| authorships[6].institutions[0].display_name | Vanderbilt University |
| authorships[6].author_position | last |
| authorships[6].raw_author_name | Bharat L. Bhuva |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | Department of Electrical and Computer Engineering (ECE), Vanderbilt University, Nashville, TN, USA |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.1109/tns.2024.3365474 |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11005 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9993000030517578 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Radiation Effects in Electronics |
| related_works | https://openalex.org/W2748952813, https://openalex.org/W2043727559, https://openalex.org/W2058040533, https://openalex.org/W4376623368, https://openalex.org/W3183539093, https://openalex.org/W4386768751, https://openalex.org/W3176972442, https://openalex.org/W2728768942, https://openalex.org/W1182684176, https://openalex.org/W4200284277 |
| cited_by_count | 1 |
| counts_by_year[0].year | 2024 |
| counts_by_year[0].cited_by_count | 1 |
| locations_count | 1 |
| best_oa_location.id | doi:10.1109/tns.2024.3365474 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S14279044 |
| best_oa_location.source.issn | 0018-9499, 1558-1578 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 0018-9499 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | IEEE Transactions on Nuclear Science |
| best_oa_location.source.host_organization | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | IEEE Transactions on Nuclear Science |
| best_oa_location.landing_page_url | https://doi.org/10.1109/tns.2024.3365474 |
| primary_location.id | doi:10.1109/tns.2024.3365474 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S14279044 |
| primary_location.source.issn | 0018-9499, 1558-1578 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 0018-9499 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | IEEE Transactions on Nuclear Science |
| primary_location.source.host_organization | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| primary_location.license | cc-by |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | IEEE Transactions on Nuclear Science |
| primary_location.landing_page_url | https://doi.org/10.1109/tns.2024.3365474 |
| publication_date | 2024-02-13 |
| publication_year | 2024 |
| referenced_works | https://openalex.org/W3113196971, https://openalex.org/W2048751700, https://openalex.org/W2169213530, https://openalex.org/W2129009228, https://openalex.org/W1935014183, https://openalex.org/W2121395914, https://openalex.org/W2077268733, https://openalex.org/W2011434544, https://openalex.org/W1857708274, https://openalex.org/W2654812537, https://openalex.org/W1986706096, https://openalex.org/W2772446577, https://openalex.org/W4206599364, https://openalex.org/W3159144428, https://openalex.org/W1989361845, https://openalex.org/W2768410506, https://openalex.org/W2050431855, https://openalex.org/W2122995125, https://openalex.org/W2061643944, https://openalex.org/W2563310135, https://openalex.org/W6715034758, https://openalex.org/W2113626924, https://openalex.org/W2121052741, https://openalex.org/W2805330804, https://openalex.org/W4312999421, https://openalex.org/W2137273775, https://openalex.org/W2098694303, https://openalex.org/W2560368994, https://openalex.org/W3118958636, https://openalex.org/W2412892188 |
| referenced_works_count | 30 |
| abstract_inverted_index.a | 24, 57, 72 |
| abstract_inverted_index.SE | 33, 36, 54 |
| abstract_inverted_index.an | 17 |
| abstract_inverted_index.as | 71 |
| abstract_inverted_index.at | 6, 38, 50, 108 |
| abstract_inverted_index.in | 116 |
| abstract_inverted_index.is | 100 |
| abstract_inverted_index.of | 10, 16, 63, 74, 101, 104, 106 |
| abstract_inverted_index.to | 30, 45, 129, 133 |
| abstract_inverted_index.GHz | 8 |
| abstract_inverted_index.MHz | 107 |
| abstract_inverted_index.The | 68 |
| abstract_inverted_index.all | 112 |
| abstract_inverted_index.and | 79, 88, 124 |
| abstract_inverted_index.are | 43, 82 |
| abstract_inverted_index.for | 56, 84, 111 |
| abstract_inverted_index.has | 27 |
| abstract_inverted_index.it. | 67 |
| abstract_inverted_index.the | 7, 12, 31, 47, 52, 64, 85, 97, 102, 120 |
| abstract_inverted_index.(SE) | 14 |
| abstract_inverted_index.5-nm | 89 |
| abstract_inverted_index.LET, | 76 |
| abstract_inverted_index.With | 0 |
| abstract_inverted_index.bulk | 90 |
| abstract_inverted_index.data | 22 |
| abstract_inverted_index.into | 23 |
| abstract_inverted_index.meet | 134 |
| abstract_inverted_index.show | 95 |
| abstract_inverted_index.test | 113 |
| abstract_inverted_index.that | 62, 96 |
| abstract_inverted_index.this | 117 |
| abstract_inverted_index.used | 115 |
| abstract_inverted_index.will | 126 |
| abstract_inverted_index.with | 137 |
| abstract_inverted_index.(ICs) | 4 |
| abstract_inverted_index.100's | 105 |
| abstract_inverted_index.7-nm, | 87 |
| abstract_inverted_index.Logic | 35 |
| abstract_inverted_index.allow | 127 |
| abstract_inverted_index.latch | 26, 32, 65, 80 |
| abstract_inverted_index.logic | 19, 53, 59 |
| abstract_inverted_index.nodes | 42, 110 |
| abstract_inverted_index.order | 103 |
| abstract_inverted_index.range | 9 |
| abstract_inverted_index.these | 109 |
| abstract_inverted_index.which | 51 |
| abstract_inverted_index.16-nm, | 86 |
| abstract_inverted_index.FinFET | 40, 91 |
| abstract_inverted_index.become | 28 |
| abstract_inverted_index.design | 81, 135 |
| abstract_inverted_index.harden | 130 |
| abstract_inverted_index.modern | 1 |
| abstract_inverted_index.nodes. | 93 |
| abstract_inverted_index.study. | 118 |
| abstract_inverted_index.supply | 77 |
| abstract_inverted_index.trends | 125 |
| abstract_inverted_index.Results | 94 |
| abstract_inverted_index.average | 18 |
| abstract_inverted_index.circuit | 20, 60 |
| abstract_inverted_index.concept | 123 |
| abstract_inverted_index.exceeds | 61 |
| abstract_inverted_index.feeding | 21 |
| abstract_inverted_index.minimum | 138 |
| abstract_inverted_index.typical | 58 |
| abstract_inverted_index.advanced | 39 |
| abstract_inverted_index.analyzed | 44, 83 |
| abstract_inverted_index.circuits | 3, 131 |
| abstract_inverted_index.function | 73 |
| abstract_inverted_index.identify | 46 |
| abstract_inverted_index.particle | 75 |
| abstract_inverted_index.penalty. | 140 |
| abstract_inverted_index.voltage, | 78 |
| abstract_inverted_index.Frequency | 70, 99, 122 |
| abstract_inverted_index.Threshold | 69, 98, 121 |
| abstract_inverted_index.designers | 128 |
| abstract_inverted_index.following | 66 |
| abstract_inverted_index.operating | 5 |
| abstract_inverted_index."Threshold | 48 |
| abstract_inverted_index.comparable | 29 |
| abstract_inverted_index.conditions | 114 |
| abstract_inverted_index.integrated | 2 |
| abstract_inverted_index.operation, | 11 |
| abstract_inverted_index.technology | 41, 92 |
| abstract_inverted_index.efficiently | 132 |
| abstract_inverted_index.performance | 139 |
| abstract_inverted_index.Frequencies" | 49 |
| abstract_inverted_index.conventional | 25 |
| abstract_inverted_index.single-event | 13 |
| abstract_inverted_index.Understanding | 119 |
| abstract_inverted_index.cross-section | 15, 55 |
| abstract_inverted_index.cross-section. | 34 |
| abstract_inverted_index.cross-sections | 37 |
| abstract_inverted_index.specifications | 136 |
| cited_by_percentile_year.max | 94 |
| cited_by_percentile_year.min | 90 |
| countries_distinct_count | 2 |
| institutions_distinct_count | 7 |
| citation_normalized_percentile.value | 0.5184186 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |