Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron Transistors Article Swipe
In this paper an improved Gray-Wolf-Optimization (GWO) based small-signal modeling is developed. The proposed method is demonstrated by modeling GaN High Electron Mobility Transistors (HEMTs) on SiC and Diamond substrates. The technique bases on engineering the optimization objective function to provide reliable values for the model parameters; while keeping a better fitting for the targeted measurements. The reliability of extraction has been further improved by using physical relevant condition to remove any unrealistic values during the optimization process. The modeling procedure was applied on 2x50-, 8x150-, 8x250- and 16x250- GaN HEMTs on SiC substrate in addition to 2x125- and 4x125- GaN HEMTs on Diamond substrate. Very good results were obtained for both technologies with an excellent fitting for the related measurements. The results also show the reliability of the developed technique and validate its applicability for small- and large-signal modeling applications.
Related Topics
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/jeds.2021.3119052
- https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdf
- OA Status
- gold
- Cited By
- 8
- References
- 44
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W3206945127
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W3206945127Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1109/jeds.2021.3119052Digital Object Identifier
- Title
-
Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron TransistorsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2021Year of publication
- Publication date
-
2021-01-01Full publication date if available
- Authors
-
Anwar JarndalList of authors in order
- Landing page
-
https://doi.org/10.1109/jeds.2021.3119052Publisher landing page
- PDF URL
-
https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdfDirect OA link when available
- Concepts
-
Transistor, Materials science, Diamond, Electronic engineering, High-electron-mobility transistor, Optoelectronics, Reliability (semiconductor), Substrate (aquarium), Gallium nitride, Computer science, Electrical engineering, Engineering, Nanotechnology, Physics, Layer (electronics), Power (physics), Geology, Oceanography, Quantum mechanics, Voltage, Composite materialTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
8Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 1, 2024: 2, 2023: 3, 2022: 1, 2021: 1Per-year citation counts (last 5 years)
- References (count)
-
44Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W3206945127 |
|---|---|
| doi | https://doi.org/10.1109/jeds.2021.3119052 |
| ids.doi | https://doi.org/10.1109/jeds.2021.3119052 |
| ids.mag | 3206945127 |
| ids.openalex | https://openalex.org/W3206945127 |
| fwci | 0.90920048 |
| type | article |
| title | Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron Transistors |
| biblio.issue | |
| biblio.volume | 9 |
| biblio.last_page | 965 |
| biblio.first_page | 958 |
| topics[0].id | https://openalex.org/T10099 |
| topics[0].field.id | https://openalex.org/fields/31 |
| topics[0].field.display_name | Physics and Astronomy |
| topics[0].score | 1.0 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/3104 |
| topics[0].subfield.display_name | Condensed Matter Physics |
| topics[0].display_name | GaN-based semiconductor devices and materials |
| topics[1].id | https://openalex.org/T10361 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9994999766349792 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Silicon Carbide Semiconductor Technologies |
| topics[2].id | https://openalex.org/T10187 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9986000061035156 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Radio Frequency Integrated Circuit Design |
| funders[0].id | https://openalex.org/F4320316805 |
| funders[0].ror | https://ror.org/00engpz63 |
| funders[0].display_name | University of Sharjah |
| is_xpac | False |
| apc_list.value | 1350 |
| apc_list.currency | USD |
| apc_list.value_usd | 1350 |
| apc_paid.value | 1350 |
| apc_paid.currency | USD |
| apc_paid.value_usd | 1350 |
| concepts[0].id | https://openalex.org/C172385210 |
| concepts[0].level | 3 |
| concepts[0].score | 0.6710448265075684 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q5339 |
| concepts[0].display_name | Transistor |
| concepts[1].id | https://openalex.org/C192562407 |
| concepts[1].level | 0 |
| concepts[1].score | 0.618445634841919 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[1].display_name | Materials science |
| concepts[2].id | https://openalex.org/C2776921476 |
| concepts[2].level | 2 |
| concepts[2].score | 0.5299343466758728 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q5283 |
| concepts[2].display_name | Diamond |
| concepts[3].id | https://openalex.org/C24326235 |
| concepts[3].level | 1 |
| concepts[3].score | 0.5193142294883728 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q126095 |
| concepts[3].display_name | Electronic engineering |
| concepts[4].id | https://openalex.org/C162057924 |
| concepts[4].level | 4 |
| concepts[4].score | 0.5095368027687073 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q1617706 |
| concepts[4].display_name | High-electron-mobility transistor |
| concepts[5].id | https://openalex.org/C49040817 |
| concepts[5].level | 1 |
| concepts[5].score | 0.504899799823761 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[5].display_name | Optoelectronics |
| concepts[6].id | https://openalex.org/C43214815 |
| concepts[6].level | 3 |
| concepts[6].score | 0.4955636262893677 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q7310987 |
| concepts[6].display_name | Reliability (semiconductor) |
| concepts[7].id | https://openalex.org/C2777289219 |
| concepts[7].level | 2 |
| concepts[7].score | 0.42996105551719666 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q7632154 |
| concepts[7].display_name | Substrate (aquarium) |
| concepts[8].id | https://openalex.org/C2778871202 |
| concepts[8].level | 3 |
| concepts[8].score | 0.41233232617378235 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q411713 |
| concepts[8].display_name | Gallium nitride |
| concepts[9].id | https://openalex.org/C41008148 |
| concepts[9].level | 0 |
| concepts[9].score | 0.3796950578689575 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[9].display_name | Computer science |
| concepts[10].id | https://openalex.org/C119599485 |
| concepts[10].level | 1 |
| concepts[10].score | 0.2193804383277893 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[10].display_name | Electrical engineering |
| concepts[11].id | https://openalex.org/C127413603 |
| concepts[11].level | 0 |
| concepts[11].score | 0.20572736859321594 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[11].display_name | Engineering |
| concepts[12].id | https://openalex.org/C171250308 |
| concepts[12].level | 1 |
| concepts[12].score | 0.14048686623573303 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q11468 |
| concepts[12].display_name | Nanotechnology |
| concepts[13].id | https://openalex.org/C121332964 |
| concepts[13].level | 0 |
| concepts[13].score | 0.11344078183174133 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[13].display_name | Physics |
| concepts[14].id | https://openalex.org/C2779227376 |
| concepts[14].level | 2 |
| concepts[14].score | 0.0800066888332367 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q6505497 |
| concepts[14].display_name | Layer (electronics) |
| concepts[15].id | https://openalex.org/C163258240 |
| concepts[15].level | 2 |
| concepts[15].score | 0.0 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q25342 |
| concepts[15].display_name | Power (physics) |
| concepts[16].id | https://openalex.org/C127313418 |
| concepts[16].level | 0 |
| concepts[16].score | 0.0 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q1069 |
| concepts[16].display_name | Geology |
| concepts[17].id | https://openalex.org/C111368507 |
| concepts[17].level | 1 |
| concepts[17].score | 0.0 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q43518 |
| concepts[17].display_name | Oceanography |
| concepts[18].id | https://openalex.org/C62520636 |
| concepts[18].level | 1 |
| concepts[18].score | 0.0 |
| concepts[18].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[18].display_name | Quantum mechanics |
| concepts[19].id | https://openalex.org/C165801399 |
| concepts[19].level | 2 |
| concepts[19].score | 0.0 |
| concepts[19].wikidata | https://www.wikidata.org/wiki/Q25428 |
| concepts[19].display_name | Voltage |
| concepts[20].id | https://openalex.org/C159985019 |
| concepts[20].level | 1 |
| concepts[20].score | 0.0 |
| concepts[20].wikidata | https://www.wikidata.org/wiki/Q181790 |
| concepts[20].display_name | Composite material |
| keywords[0].id | https://openalex.org/keywords/transistor |
| keywords[0].score | 0.6710448265075684 |
| keywords[0].display_name | Transistor |
| keywords[1].id | https://openalex.org/keywords/materials-science |
| keywords[1].score | 0.618445634841919 |
| keywords[1].display_name | Materials science |
| keywords[2].id | https://openalex.org/keywords/diamond |
| keywords[2].score | 0.5299343466758728 |
| keywords[2].display_name | Diamond |
| keywords[3].id | https://openalex.org/keywords/electronic-engineering |
| keywords[3].score | 0.5193142294883728 |
| keywords[3].display_name | Electronic engineering |
| keywords[4].id | https://openalex.org/keywords/high-electron-mobility-transistor |
| keywords[4].score | 0.5095368027687073 |
| keywords[4].display_name | High-electron-mobility transistor |
| keywords[5].id | https://openalex.org/keywords/optoelectronics |
| keywords[5].score | 0.504899799823761 |
| keywords[5].display_name | Optoelectronics |
| keywords[6].id | https://openalex.org/keywords/reliability |
| keywords[6].score | 0.4955636262893677 |
| keywords[6].display_name | Reliability (semiconductor) |
| keywords[7].id | https://openalex.org/keywords/substrate |
| keywords[7].score | 0.42996105551719666 |
| keywords[7].display_name | Substrate (aquarium) |
| keywords[8].id | https://openalex.org/keywords/gallium-nitride |
| keywords[8].score | 0.41233232617378235 |
| keywords[8].display_name | Gallium nitride |
| keywords[9].id | https://openalex.org/keywords/computer-science |
| keywords[9].score | 0.3796950578689575 |
| keywords[9].display_name | Computer science |
| keywords[10].id | https://openalex.org/keywords/electrical-engineering |
| keywords[10].score | 0.2193804383277893 |
| keywords[10].display_name | Electrical engineering |
| keywords[11].id | https://openalex.org/keywords/engineering |
| keywords[11].score | 0.20572736859321594 |
| keywords[11].display_name | Engineering |
| keywords[12].id | https://openalex.org/keywords/nanotechnology |
| keywords[12].score | 0.14048686623573303 |
| keywords[12].display_name | Nanotechnology |
| keywords[13].id | https://openalex.org/keywords/physics |
| keywords[13].score | 0.11344078183174133 |
| keywords[13].display_name | Physics |
| keywords[14].id | https://openalex.org/keywords/layer |
| keywords[14].score | 0.0800066888332367 |
| keywords[14].display_name | Layer (electronics) |
| language | en |
| locations[0].id | doi:10.1109/jeds.2021.3119052 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S2482167115 |
| locations[0].source.issn | 2168-6734 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | True |
| locations[0].source.issn_l | 2168-6734 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | True |
| locations[0].source.display_name | IEEE Journal of the Electron Devices Society |
| locations[0].source.host_organization | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_name | Institute of Electrical and Electronics Engineers |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| locations[0].license | cc-by |
| locations[0].pdf_url | https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | IEEE Journal of the Electron Devices Society |
| locations[0].landing_page_url | https://doi.org/10.1109/jeds.2021.3119052 |
| locations[1].id | pmh:oai:doaj.org/article:cc537cd9d45c4491aff4624a40cc09ba |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4306401280 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | DOAJ (DOAJ: Directory of Open Access Journals) |
| locations[1].source.host_organization | |
| locations[1].source.host_organization_name | |
| locations[1].license | cc-by-sa |
| locations[1].pdf_url | |
| locations[1].version | submittedVersion |
| locations[1].raw_type | article |
| locations[1].license_id | https://openalex.org/licenses/cc-by-sa |
| locations[1].is_accepted | False |
| locations[1].is_published | False |
| locations[1].raw_source_name | IEEE Journal of the Electron Devices Society, Vol 9, Pp 958-965 (2021) |
| locations[1].landing_page_url | https://doaj.org/article/cc537cd9d45c4491aff4624a40cc09ba |
| indexed_in | crossref, doaj |
| authorships[0].author.id | https://openalex.org/A5075083686 |
| authorships[0].author.orcid | https://orcid.org/0000-0002-1873-2088 |
| authorships[0].author.display_name | Anwar Jarndal |
| authorships[0].countries | AE, US |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I4210142152 |
| authorships[0].affiliations[0].raw_affiliation_string | ORCiD |
| authorships[0].affiliations[1].institution_ids | https://openalex.org/I29891158 |
| authorships[0].affiliations[1].raw_affiliation_string | Electrical Engineering Department, University of Sharjah, Sharjah, UAE |
| authorships[0].institutions[0].id | https://openalex.org/I29891158 |
| authorships[0].institutions[0].ror | https://ror.org/00engpz63 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I29891158 |
| authorships[0].institutions[0].country_code | AE |
| authorships[0].institutions[0].display_name | University of Sharjah |
| authorships[0].institutions[1].id | https://openalex.org/I4210142152 |
| authorships[0].institutions[1].ror | https://ror.org/04fa4r544 |
| authorships[0].institutions[1].type | nonprofit |
| authorships[0].institutions[1].lineage | https://openalex.org/I4210142152 |
| authorships[0].institutions[1].country_code | US |
| authorships[0].institutions[1].display_name | ORCID |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Anwar Jarndal |
| authorships[0].is_corresponding | True |
| authorships[0].raw_affiliation_strings | Electrical Engineering Department, University of Sharjah, Sharjah, UAE, ORCiD |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdf |
| open_access.oa_status | gold |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron Transistors |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T10099 |
| primary_topic.field.id | https://openalex.org/fields/31 |
| primary_topic.field.display_name | Physics and Astronomy |
| primary_topic.score | 1.0 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/3104 |
| primary_topic.subfield.display_name | Condensed Matter Physics |
| primary_topic.display_name | GaN-based semiconductor devices and materials |
| related_works | https://openalex.org/W2472160638, https://openalex.org/W3209950509, https://openalex.org/W2559825181, https://openalex.org/W4377089489, https://openalex.org/W1975307200, https://openalex.org/W3042786859, https://openalex.org/W2466508933, https://openalex.org/W4313611767, https://openalex.org/W4385217635, https://openalex.org/W244742193 |
| cited_by_count | 8 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 1 |
| counts_by_year[1].year | 2024 |
| counts_by_year[1].cited_by_count | 2 |
| counts_by_year[2].year | 2023 |
| counts_by_year[2].cited_by_count | 3 |
| counts_by_year[3].year | 2022 |
| counts_by_year[3].cited_by_count | 1 |
| counts_by_year[4].year | 2021 |
| counts_by_year[4].cited_by_count | 1 |
| locations_count | 2 |
| best_oa_location.id | doi:10.1109/jeds.2021.3119052 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S2482167115 |
| best_oa_location.source.issn | 2168-6734 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | True |
| best_oa_location.source.issn_l | 2168-6734 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | True |
| best_oa_location.source.display_name | IEEE Journal of the Electron Devices Society |
| best_oa_location.source.host_organization | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | IEEE Journal of the Electron Devices Society |
| best_oa_location.landing_page_url | https://doi.org/10.1109/jeds.2021.3119052 |
| primary_location.id | doi:10.1109/jeds.2021.3119052 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S2482167115 |
| primary_location.source.issn | 2168-6734 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | True |
| primary_location.source.issn_l | 2168-6734 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | True |
| primary_location.source.display_name | IEEE Journal of the Electron Devices Society |
| primary_location.source.host_organization | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| primary_location.license | cc-by |
| primary_location.pdf_url | https://ieeexplore.ieee.org/ielx7/6245494/6423298/09566206.pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | IEEE Journal of the Electron Devices Society |
| primary_location.landing_page_url | https://doi.org/10.1109/jeds.2021.3119052 |
| publication_date | 2021-01-01 |
| publication_year | 2021 |
| referenced_works | https://openalex.org/W2521027089, https://openalex.org/W1506911099, https://openalex.org/W2779967340, https://openalex.org/W2028620340, https://openalex.org/W2061438946, https://openalex.org/W6747816620, https://openalex.org/W2097571405, https://openalex.org/W2152195021, https://openalex.org/W2048348988, https://openalex.org/W3007502832, https://openalex.org/W2277677220, https://openalex.org/W2932530650, https://openalex.org/W2154338298, https://openalex.org/W1491076001, https://openalex.org/W2135579379, https://openalex.org/W2102721944, https://openalex.org/W2112265040, https://openalex.org/W2123276907, https://openalex.org/W2024713431, https://openalex.org/W2153948655, https://openalex.org/W2248867217, https://openalex.org/W3022544462, https://openalex.org/W2136181622, https://openalex.org/W3114787613, https://openalex.org/W2515298236, https://openalex.org/W2894692902, https://openalex.org/W2956682320, https://openalex.org/W3137438848, https://openalex.org/W2099408414, https://openalex.org/W3024735379, https://openalex.org/W3139239931, https://openalex.org/W2946634659, https://openalex.org/W3038041031, https://openalex.org/W2908441412, https://openalex.org/W2505977967, https://openalex.org/W2593833075, https://openalex.org/W2968032989, https://openalex.org/W3006364526, https://openalex.org/W2602951411, https://openalex.org/W1481672268, https://openalex.org/W4232866525, https://openalex.org/W2075465556, https://openalex.org/W2543580944, https://openalex.org/W2782624333 |
| referenced_works_count | 44 |
| abstract_inverted_index.a | 49 |
| abstract_inverted_index.In | 0 |
| abstract_inverted_index.an | 3, 138 |
| abstract_inverted_index.by | 17, 64 |
| abstract_inverted_index.in | 110 |
| abstract_inverted_index.is | 10, 15 |
| abstract_inverted_index.of | 58, 151 |
| abstract_inverted_index.on | 25, 33, 83, 107, 126 |
| abstract_inverted_index.to | 39, 69, 112 |
| abstract_inverted_index.GaN | 19, 105, 124 |
| abstract_inverted_index.SiC | 26, 108 |
| abstract_inverted_index.The | 12, 30, 56, 78, 145 |
| abstract_inverted_index.and | 27, 99, 118, 155, 161 |
| abstract_inverted_index.any | 71 |
| abstract_inverted_index.for | 43, 52, 134, 141, 159 |
| abstract_inverted_index.has | 60 |
| abstract_inverted_index.its | 157 |
| abstract_inverted_index.the | 35, 44, 53, 75, 142, 149, 152 |
| abstract_inverted_index.was | 81 |
| abstract_inverted_index.High | 20 |
| abstract_inverted_index.Very | 129 |
| abstract_inverted_index.also | 147 |
| abstract_inverted_index.been | 61 |
| abstract_inverted_index.both | 135 |
| abstract_inverted_index.good | 130 |
| abstract_inverted_index.show | 148 |
| abstract_inverted_index.this | 1 |
| abstract_inverted_index.were | 132 |
| abstract_inverted_index.with | 137 |
| abstract_inverted_index.(GWO) | 6 |
| abstract_inverted_index.HEMTs | 106, 125 |
| abstract_inverted_index.based | 7 |
| abstract_inverted_index.bases | 32 |
| abstract_inverted_index.model | 45 |
| abstract_inverted_index.paper | 2 |
| abstract_inverted_index.using | 65 |
| abstract_inverted_index.while | 47 |
| abstract_inverted_index.better | 50 |
| abstract_inverted_index.during | 74 |
| abstract_inverted_index.method | 14 |
| abstract_inverted_index.remove | 70 |
| abstract_inverted_index.small- | 160 |
| abstract_inverted_index.values | 42, 73 |
| abstract_inverted_index.(HEMTs) | 24 |
| abstract_inverted_index.Diamond | 28, 127 |
| abstract_inverted_index.applied | 82 |
| abstract_inverted_index.fitting | 51, 140 |
| abstract_inverted_index.further | 62 |
| abstract_inverted_index.keeping | 48 |
| abstract_inverted_index.provide | 40 |
| abstract_inverted_index.related | 143 |
| abstract_inverted_index.results | 131, 146 |
| abstract_inverted_index.Electron | 21 |
| abstract_inverted_index.Mobility | 22 |
| abstract_inverted_index.addition | 111 |
| abstract_inverted_index.function | 38 |
| abstract_inverted_index.improved | 4, 63 |
| abstract_inverted_index.modeling | 9, 18, 79, 163 |
| abstract_inverted_index.obtained | 133 |
| abstract_inverted_index.physical | 66 |
| abstract_inverted_index.process. | 77 |
| abstract_inverted_index.proposed | 13 |
| abstract_inverted_index.relevant | 67 |
| abstract_inverted_index.reliable | 41 |
| abstract_inverted_index.targeted | 54 |
| abstract_inverted_index.validate | 156 |
| abstract_inverted_index.<tex-math | 85, 90, 95, 101, 114, 120 |
| abstract_inverted_index.\text{m}$ | 87, 92, 97, 103, 116, 122 |
| abstract_inverted_index.condition | 68 |
| abstract_inverted_index.developed | 153 |
| abstract_inverted_index.excellent | 139 |
| abstract_inverted_index.objective | 37 |
| abstract_inverted_index.procedure | 80 |
| abstract_inverted_index.substrate | 109 |
| abstract_inverted_index.technique | 31, 154 |
| abstract_inverted_index.developed. | 11 |
| abstract_inverted_index.extraction | 59 |
| abstract_inverted_index.substrate. | 128 |
| abstract_inverted_index.Transistors | 23 |
| abstract_inverted_index.engineering | 34 |
| abstract_inverted_index.parameters; | 46 |
| abstract_inverted_index.reliability | 57, 150 |
| abstract_inverted_index.substrates. | 29 |
| abstract_inverted_index.unrealistic | 72 |
| abstract_inverted_index.demonstrated | 16 |
| abstract_inverted_index.large-signal | 162 |
| abstract_inverted_index.optimization | 36, 76 |
| abstract_inverted_index.small-signal | 8 |
| abstract_inverted_index.technologies | 136 |
| abstract_inverted_index.applicability | 158 |
| abstract_inverted_index.applications. | 164 |
| abstract_inverted_index.measurements. | 55, 144 |
| abstract_inverted_index.2x50-<inline-formula> | 84 |
| abstract_inverted_index.notation="LaTeX">$\mu | 86, 91, 96, 102, 115, 121 |
| abstract_inverted_index.2x125-<inline-formula> | 113 |
| abstract_inverted_index.4x125-<inline-formula> | 119 |
| abstract_inverted_index.8x150-<inline-formula> | 89 |
| abstract_inverted_index.8x250-<inline-formula> | 94 |
| abstract_inverted_index.Gray-Wolf-Optimization | 5 |
| abstract_inverted_index.16x250-<inline-formula> | 100 |
| abstract_inverted_index.</tex-math></inline-formula> | 98, 104, 117, 123 |
| abstract_inverted_index.</tex-math></inline-formula>, | 88, 93 |
| cited_by_percentile_year.max | 97 |
| cited_by_percentile_year.min | 89 |
| corresponding_author_ids | https://openalex.org/A5075083686 |
| countries_distinct_count | 2 |
| institutions_distinct_count | 1 |
| corresponding_institution_ids | https://openalex.org/I29891158, https://openalex.org/I4210142152 |
| citation_normalized_percentile.value | 0.7957723 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |