Proceedings of the 17th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications
High Resolution Mask R-CNN-based Damage Detection on Titanium Nitride Coated Milling Tools for Condition Monitoring by using a New Illumination Technique
January 2022 • Mühenad Bilal, Sunil Kancharana, Christian Mayer, Daniel Pfaller, Leonid Koval, Markus Bregulla, Rafał Cupek, Adam Ziębiński