High-resolution X-ray imaging technologies for non-destructive testing of integrated circuits Article Swipe

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Xiangyi Wang , Zhi Wang , Zhiai Xu , Longbing He , Litao Sun , Pengcheng Liu ·

YOU? · · 2025 · Open Access · · DOI: https://doi.org/10.1016/j.nanoms.2025.09.014

Related Topics

X-Ray

X-Ray Crystallography

Energy-Dispersive X-Ray Spectroscopy

X-Ray Photoelectron Spectroscopy

X-Ray Fluorescence

Chandra X-Ray Observatory

Functional Magnetic Resonance Imaging

X-Ray Spex

X-Ray Tube

X-Ray Generator

Diffusion-Weighted Magnetic Resonance Imaging

Dual-Energy X-Ray Absorptiometry

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Type: article
Language: en
Landing Page: https://doi.org/10.1016/j.nanoms.2025.09.014
OA Status: diamond
References: 51
OpenAlex ID: https://openalex.org/W4415977336

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DOI: https://doi.org/10.1016/j.nanoms.2025.09.014

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Title: High-resolution X-ray imaging technologies for non-destructive testing of integrated circuits

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Type: article

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Language: en

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Publication year: 2025

Year of publication
Publication date: 2025-11-01

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Authors: Xiangyi Wang, Zhi Wang, Zhiai Xu, Longbing He, Litao Sun, Pengcheng Liu

List of authors in order
Landing page: https://doi.org/10.1016/j.nanoms.2025.09.014

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Open access: Yes

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OA status: diamond

Open access status per OpenAlex
OA URL: https://doi.org/10.1016/j.nanoms.2025.09.014

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Cited by: 0

Total citation count in OpenAlex
References (count): 51

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