Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides Article Swipe

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Leon Zens , Vira R. Besaga , Jens Möller , Nils C. Gerhardt , Martin R. Hofmann ·

YOU? · · 2024 · Open Access · · DOI: https://doi.org/10.1364/oe.538741

We present a new methodology for measuring the gain and the linewidth enhancement factor of a semiconductor ridge-waveguide laser structure. The holographic methodology is based on a modified Mach-Zehnder interferometer. Compared with existing methods, the holographic setup allows to measure intensity and phase related properties such as optical gain and linewidth enhancement factor spectrally and spatially resolved. The obtained values agree well with data acquired from standard gain measurements.

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Optics Laser linewidth Holography Materials science Semiconductor Semiconductor laser theory Optoelectronics Physics Laser

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Type: article
Language: en
Landing Page: https://doi.org/10.1364/oe.538741
OA Status: gold
Cited By: 2
Related Works: 10
OpenAlex ID: https://openalex.org/W4404454682

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OpenAlex ID: https://openalex.org/W4404454682

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DOI: https://doi.org/10.1364/oe.538741

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Title: Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides

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Type: article

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Language: en

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Publication year: 2024

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Publication date: 2024-11-17

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Authors: Leon Zens, Vira R. Besaga, Jens Möller, Nils C. Gerhardt, Martin R. Hofmann

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Landing page: https://doi.org/10.1364/oe.538741

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OA status: gold

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OA URL: https://doi.org/10.1364/oe.538741

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Concepts: Optics, Laser linewidth, Holography, Materials science, Semiconductor, Semiconductor laser theory, Optoelectronics, Physics, Laser

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Cited by: 2

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Citations by year (recent): 2025: 1

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Related works (count): 10

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