Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses Article Swipe

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Total internal reflection Optics X-ray optics Reflection (computer programming) Numerical aperture Physics Realization (probability) Total external reflection Focus (optics) Aperture (computer memory) Silicon Geometrical optics Limit (mathematics) Optoelectronics X-ray Mathematics Statistics Acoustics Wavelength Computer science Programming language Mathematical analysis

Jens Patommel , Susanne Klare , Robert Hoppe , Stephan Ritter , D. Samberg , Felix Wittwer , Α. Jahn , Karola Richter , Christian Wenzel , Johann W. Bartha , Maria Scholz , Frank Seiboth , Ulrike Boesenberg , Gerald Falkenberg , Christian G. Schroer ·

YOU? · · 2017 · Open Access · · DOI: https://doi.org/10.1063/1.4977882 · OA: W2592934233

In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett. 91, 204801 (2003)], the concept of adiabatically focusing refractive lenses was proposed to overcome this limit [Schroer and Lengeler, Phys. Rev. Lett. 94, 054802 (2005)]. We present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10−3 that clearly exceeds the critical angle of total reflection of 1.55 mrad.