Impact of device scaling on the electrical properties of MoS2 field-effect transistors Article Swipe

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Goutham Arutchelvan , Quentin Smets , Devin Verreck , Zubair Ahmed , Abhinav Gaur , Surajit Sutar , Julien Jussot , Benjamin Groven , Marc Heyns , Dennis Lin , Inge Asselberghs , Iuliana Radu ·

YOU? · · 2021 · Open Access · · DOI: https://doi.org/10.1038/s41598-021-85968-y

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Electrical Engineering

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Scaling Transconductance Materials science Contact resistance Optoelectronics Transistor Schottky barrier Field-effect transistor Electrical engineering Nanotechnology Voltage Layer (electronics) Diode Mathematics Engineering Geometry

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Type: article
Language: en
Landing Page: https://doi.org/10.1038/s41598-021-85968-y
PDF: https://www.nature.com/articles/s41598-021-85968-y.pdf
OA Status: gold
Cited By: 65
References: 47
Related Works: 10
OpenAlex ID: https://openalex.org/W3135180842

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DOI: https://doi.org/10.1038/s41598-021-85968-y

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Title: Impact of device scaling on the electrical properties of MoS2 field-effect transistors

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Type: article

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Language: en

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Publication year: 2021

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Publication date: 2021-03-23

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Authors: Goutham Arutchelvan, Quentin Smets, Devin Verreck, Zubair Ahmed, Abhinav Gaur, Surajit Sutar, Julien Jussot, Benjamin Groven, Marc Heyns, Dennis Lin, Inge Asselberghs, Iuliana Radu

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Landing page: https://doi.org/10.1038/s41598-021-85968-y

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PDF URL: https://www.nature.com/articles/s41598-021-85968-y.pdf

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Concepts: Scaling, Transconductance, Materials science, Contact resistance, Optoelectronics, Transistor, Schottky barrier, Field-effect transistor, Electrical engineering, Nanotechnology, Voltage, Layer (electronics), Diode, Mathematics, Engineering, Geometry

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Cited by: 65

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