Label recognition on metal surfaces in semiconductor industry by YOLO object detection model Article Swipe
Wei‐Chang Yeh
,
Shu‐Yi Liao
,
Chia-Ling Huang
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.1007/s00170-025-15489-9
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.1007/s00170-025-15489-9
Related Topics
Concepts
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1007/s00170-025-15489-9
- https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdf
- OA Status
- hybrid
- Cited By
- 1
- References
- 25
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4410020479
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4410020479Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1007/s00170-025-15489-9Digital Object Identifier
- Title
-
Label recognition on metal surfaces in semiconductor industry by YOLO object detection modelWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2025Year of publication
- Publication date
-
2025-05-01Full publication date if available
- Authors
-
Wei‐Chang Yeh, Shu‐Yi Liao, Chia-Ling HuangList of authors in order
- Landing page
-
https://doi.org/10.1007/s00170-025-15489-9Publisher landing page
- PDF URL
-
https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdfDirect OA link when available
- Concepts
-
Object (grammar), Semiconductor industry, Semiconductor, Artificial intelligence, Industrial and production engineering, Metal, Computer science, Engineering, Computer vision, Materials science, Pattern recognition (psychology), Metallurgy, Manufacturing engineering, Optoelectronics, Mechanical engineeringTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
1Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 1Per-year citation counts (last 5 years)
- References (count)
-
25Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4410020479 |
|---|---|
| doi | https://doi.org/10.1007/s00170-025-15489-9 |
| ids.doi | https://doi.org/10.1007/s00170-025-15489-9 |
| ids.openalex | https://openalex.org/W4410020479 |
| fwci | 3.61023173 |
| type | article |
| title | Label recognition on metal surfaces in semiconductor industry by YOLO object detection model |
| biblio.issue | 3-4 |
| biblio.volume | 138 |
| biblio.last_page | 1363 |
| biblio.first_page | 1349 |
| topics[0].id | https://openalex.org/T12111 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9998999834060669 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2209 |
| topics[0].subfield.display_name | Industrial and Manufacturing Engineering |
| topics[0].display_name | Industrial Vision Systems and Defect Detection |
| topics[1].id | https://openalex.org/T12549 |
| topics[1].field.id | https://openalex.org/fields/17 |
| topics[1].field.display_name | Computer Science |
| topics[1].score | 0.984499990940094 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/1707 |
| topics[1].subfield.display_name | Computer Vision and Pattern Recognition |
| topics[1].display_name | Image and Object Detection Techniques |
| topics[2].id | https://openalex.org/T10036 |
| topics[2].field.id | https://openalex.org/fields/17 |
| topics[2].field.display_name | Computer Science |
| topics[2].score | 0.9822999835014343 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/1707 |
| topics[2].subfield.display_name | Computer Vision and Pattern Recognition |
| topics[2].display_name | Advanced Neural Network Applications |
| funders[0].id | https://openalex.org/F4320323092 |
| funders[0].ror | https://ror.org/00zdnkx70 |
| funders[0].display_name | National Tsing Hua University |
| is_xpac | False |
| apc_list.value | 2790 |
| apc_list.currency | EUR |
| apc_list.value_usd | 3590 |
| apc_paid.value | 2790 |
| apc_paid.currency | EUR |
| apc_paid.value_usd | 3590 |
| concepts[0].id | https://openalex.org/C2781238097 |
| concepts[0].level | 2 |
| concepts[0].score | 0.5677959322929382 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q175026 |
| concepts[0].display_name | Object (grammar) |
| concepts[1].id | https://openalex.org/C2987888538 |
| concepts[1].level | 2 |
| concepts[1].score | 0.5351831316947937 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q2986369 |
| concepts[1].display_name | Semiconductor industry |
| concepts[2].id | https://openalex.org/C108225325 |
| concepts[2].level | 2 |
| concepts[2].score | 0.5260679125785828 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q11456 |
| concepts[2].display_name | Semiconductor |
| concepts[3].id | https://openalex.org/C154945302 |
| concepts[3].level | 1 |
| concepts[3].score | 0.47104763984680176 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q11660 |
| concepts[3].display_name | Artificial intelligence |
| concepts[4].id | https://openalex.org/C2776865271 |
| concepts[4].level | 2 |
| concepts[4].score | 0.46951597929000854 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q18351432 |
| concepts[4].display_name | Industrial and production engineering |
| concepts[5].id | https://openalex.org/C544153396 |
| concepts[5].level | 2 |
| concepts[5].score | 0.42715984582901 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q11426 |
| concepts[5].display_name | Metal |
| concepts[6].id | https://openalex.org/C41008148 |
| concepts[6].level | 0 |
| concepts[6].score | 0.3880952000617981 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[6].display_name | Computer science |
| concepts[7].id | https://openalex.org/C127413603 |
| concepts[7].level | 0 |
| concepts[7].score | 0.38427338004112244 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[7].display_name | Engineering |
| concepts[8].id | https://openalex.org/C31972630 |
| concepts[8].level | 1 |
| concepts[8].score | 0.37761420011520386 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q844240 |
| concepts[8].display_name | Computer vision |
| concepts[9].id | https://openalex.org/C192562407 |
| concepts[9].level | 0 |
| concepts[9].score | 0.3691067695617676 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[9].display_name | Materials science |
| concepts[10].id | https://openalex.org/C153180895 |
| concepts[10].level | 2 |
| concepts[10].score | 0.3548154830932617 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q7148389 |
| concepts[10].display_name | Pattern recognition (psychology) |
| concepts[11].id | https://openalex.org/C191897082 |
| concepts[11].level | 1 |
| concepts[11].score | 0.26436835527420044 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11467 |
| concepts[11].display_name | Metallurgy |
| concepts[12].id | https://openalex.org/C117671659 |
| concepts[12].level | 1 |
| concepts[12].score | 0.2488572597503662 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q11049265 |
| concepts[12].display_name | Manufacturing engineering |
| concepts[13].id | https://openalex.org/C49040817 |
| concepts[13].level | 1 |
| concepts[13].score | 0.233560711145401 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[13].display_name | Optoelectronics |
| concepts[14].id | https://openalex.org/C78519656 |
| concepts[14].level | 1 |
| concepts[14].score | 0.18862226605415344 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q101333 |
| concepts[14].display_name | Mechanical engineering |
| keywords[0].id | https://openalex.org/keywords/object |
| keywords[0].score | 0.5677959322929382 |
| keywords[0].display_name | Object (grammar) |
| keywords[1].id | https://openalex.org/keywords/semiconductor-industry |
| keywords[1].score | 0.5351831316947937 |
| keywords[1].display_name | Semiconductor industry |
| keywords[2].id | https://openalex.org/keywords/semiconductor |
| keywords[2].score | 0.5260679125785828 |
| keywords[2].display_name | Semiconductor |
| keywords[3].id | https://openalex.org/keywords/artificial-intelligence |
| keywords[3].score | 0.47104763984680176 |
| keywords[3].display_name | Artificial intelligence |
| keywords[4].id | https://openalex.org/keywords/industrial-and-production-engineering |
| keywords[4].score | 0.46951597929000854 |
| keywords[4].display_name | Industrial and production engineering |
| keywords[5].id | https://openalex.org/keywords/metal |
| keywords[5].score | 0.42715984582901 |
| keywords[5].display_name | Metal |
| keywords[6].id | https://openalex.org/keywords/computer-science |
| keywords[6].score | 0.3880952000617981 |
| keywords[6].display_name | Computer science |
| keywords[7].id | https://openalex.org/keywords/engineering |
| keywords[7].score | 0.38427338004112244 |
| keywords[7].display_name | Engineering |
| keywords[8].id | https://openalex.org/keywords/computer-vision |
| keywords[8].score | 0.37761420011520386 |
| keywords[8].display_name | Computer vision |
| keywords[9].id | https://openalex.org/keywords/materials-science |
| keywords[9].score | 0.3691067695617676 |
| keywords[9].display_name | Materials science |
| keywords[10].id | https://openalex.org/keywords/pattern-recognition |
| keywords[10].score | 0.3548154830932617 |
| keywords[10].display_name | Pattern recognition (psychology) |
| keywords[11].id | https://openalex.org/keywords/metallurgy |
| keywords[11].score | 0.26436835527420044 |
| keywords[11].display_name | Metallurgy |
| keywords[12].id | https://openalex.org/keywords/manufacturing-engineering |
| keywords[12].score | 0.2488572597503662 |
| keywords[12].display_name | Manufacturing engineering |
| keywords[13].id | https://openalex.org/keywords/optoelectronics |
| keywords[13].score | 0.233560711145401 |
| keywords[13].display_name | Optoelectronics |
| keywords[14].id | https://openalex.org/keywords/mechanical-engineering |
| keywords[14].score | 0.18862226605415344 |
| keywords[14].display_name | Mechanical engineering |
| language | en |
| locations[0].id | doi:10.1007/s00170-025-15489-9 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S77056576 |
| locations[0].source.issn | 0268-3768, 1433-3015 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 0268-3768 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | The International Journal of Advanced Manufacturing Technology |
| locations[0].source.host_organization | https://openalex.org/P4310319900 |
| locations[0].source.host_organization_name | Springer Science+Business Media |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310319900, https://openalex.org/P4310319965 |
| locations[0].source.host_organization_lineage_names | Springer Science+Business Media, Springer Nature |
| locations[0].license | cc-by-nc-nd |
| locations[0].pdf_url | https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by-nc-nd |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | The International Journal of Advanced Manufacturing Technology |
| locations[0].landing_page_url | https://doi.org/10.1007/s00170-025-15489-9 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5012456515 |
| authorships[0].author.orcid | https://orcid.org/0000-0001-7393-0768 |
| authorships[0].author.display_name | Wei‐Chang Yeh |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Wei-Chang Yeh |
| authorships[0].is_corresponding | False |
| authorships[1].author.id | https://openalex.org/A5028011058 |
| authorships[1].author.orcid | https://orcid.org/0000-0001-9477-3837 |
| authorships[1].author.display_name | Shu‐Yi Liao |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Shao-Yu Liao |
| authorships[1].is_corresponding | False |
| authorships[2].author.id | https://openalex.org/A5110118869 |
| authorships[2].author.orcid | |
| authorships[2].author.display_name | Chia-Ling Huang |
| authorships[2].author_position | last |
| authorships[2].raw_author_name | Chia-Ling Huang |
| authorships[2].is_corresponding | False |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdf |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Label recognition on metal surfaces in semiconductor industry by YOLO object detection model |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T12111 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9998999834060669 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2209 |
| primary_topic.subfield.display_name | Industrial and Manufacturing Engineering |
| primary_topic.display_name | Industrial Vision Systems and Defect Detection |
| related_works | https://openalex.org/W1133772531, https://openalex.org/W4407045511, https://openalex.org/W2003395613, https://openalex.org/W2009756068, https://openalex.org/W1996936719, https://openalex.org/W2041977039, https://openalex.org/W2003336031, https://openalex.org/W2522770730, https://openalex.org/W3198605251, https://openalex.org/W4235956757 |
| cited_by_count | 1 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 1 |
| locations_count | 1 |
| best_oa_location.id | doi:10.1007/s00170-025-15489-9 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S77056576 |
| best_oa_location.source.issn | 0268-3768, 1433-3015 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 0268-3768 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | The International Journal of Advanced Manufacturing Technology |
| best_oa_location.source.host_organization | https://openalex.org/P4310319900 |
| best_oa_location.source.host_organization_name | Springer Science+Business Media |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310319900, https://openalex.org/P4310319965 |
| best_oa_location.source.host_organization_lineage_names | Springer Science+Business Media, Springer Nature |
| best_oa_location.license | cc-by-nc-nd |
| best_oa_location.pdf_url | https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | The International Journal of Advanced Manufacturing Technology |
| best_oa_location.landing_page_url | https://doi.org/10.1007/s00170-025-15489-9 |
| primary_location.id | doi:10.1007/s00170-025-15489-9 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S77056576 |
| primary_location.source.issn | 0268-3768, 1433-3015 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 0268-3768 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | The International Journal of Advanced Manufacturing Technology |
| primary_location.source.host_organization | https://openalex.org/P4310319900 |
| primary_location.source.host_organization_name | Springer Science+Business Media |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310319900, https://openalex.org/P4310319965 |
| primary_location.source.host_organization_lineage_names | Springer Science+Business Media, Springer Nature |
| primary_location.license | cc-by-nc-nd |
| primary_location.pdf_url | https://link.springer.com/content/pdf/10.1007/s00170-025-15489-9.pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by-nc-nd |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | The International Journal of Advanced Manufacturing Technology |
| primary_location.landing_page_url | https://doi.org/10.1007/s00170-025-15489-9 |
| publication_date | 2025-05-01 |
| publication_year | 2025 |
| referenced_works | https://openalex.org/W3043753526, https://openalex.org/W4280590759, https://openalex.org/W1968031169, https://openalex.org/W4392815556, https://openalex.org/W2890747436, https://openalex.org/W3012374719, https://openalex.org/W3196497390, https://openalex.org/W2072000620, https://openalex.org/W2733287485, https://openalex.org/W3084093109, https://openalex.org/W2154087496, https://openalex.org/W71648540, https://openalex.org/W2057848898, https://openalex.org/W1581809140, https://openalex.org/W3075854517, https://openalex.org/W3178709966, https://openalex.org/W4377969586, https://openalex.org/W4379619922, https://openalex.org/W3021634528, https://openalex.org/W4384557639, https://openalex.org/W2963037989, https://openalex.org/W4384929105, https://openalex.org/W4382984600, https://openalex.org/W4384201615, https://openalex.org/W4386076325 |
| referenced_works_count | 25 |
| abstract_inverted_index | |
| cited_by_percentile_year.max | 95 |
| cited_by_percentile_year.min | 91 |
| countries_distinct_count | 0 |
| institutions_distinct_count | 3 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/9 |
| sustainable_development_goals[0].score | 0.6000000238418579 |
| sustainable_development_goals[0].display_name | Industry, innovation and infrastructure |
| citation_normalized_percentile.value | 0.8643129 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | True |