Magnetic proximity coupling to defects in a two-dimensional semiconductor Article Swipe
Muhammad Hassan Shaikh
,
Matthew P. Whalen
,
Dai Q. Ho
,
Aqiq Ishraq
,
Collin Maurtua
,
Kenji Watanabe
,
Takashi Taniguchi
,
Yafei Ren
,
Anderson Janotti
,
John Q. Xiao
,
Chitraleema Chakraborty
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2408.11986
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2408.11986
The ultrathin structure and efficient spin dynamics of two-dimensional (2D) antiferromagnetic (AFM) materials hold unprecedented opportunities for ultrafast memory devices, artificial intelligence circuits, and novel computing technology. For example, chromium thiophosphate (CrPS4) is one of the most promising 2D A-type AFM materials due to its robust stability in diverse environmental conditions and net out-of-plane magnetic moment in each layer, attributed to anisotropy in crystal axes (a and b). However, their net zero magnetic moment poses a challenge for detecting the Neel state that is used to encode information. In this study, we demonstrate the detection of the Neel vector by detecting the magnetic order of the surface layer by employing defects in tungsten diselenide (WSe2). These defects are ideal candidates for optically active transducers to probe the magnetic order due to their narrow linewidth and high susceptibility to magnetic fields. We observed spin-polarized charge transfer in the heterostructure of bulk CrPS4 and single-layer WSe2 indicating type-II band alignment as supported by density functional theory (DFT) calculations. In the A-type AFM regime, the intensity of both right-handed and left-handed circularly polarized light emanating from the sample remains constant as a function of the applied magnetic field, indicating a constant polarized transition behavior. Our results showcase a new approach to optically characterizing the magnetic states of 2D bulk AFM material, highlighting avenues for future research and technological applications.
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- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2408.11986
- https://arxiv.org/pdf/2408.11986
- OA Status
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- Cited By
- 1
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- OpenAlex ID
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All OpenAlex metadata
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https://openalex.org/W4405656912Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2408.11986Digital Object Identifier
- Title
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Magnetic proximity coupling to defects in a two-dimensional semiconductorWork title
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preprintOpenAlex work type
- Language
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enPrimary language
- Publication year
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2024Year of publication
- Publication date
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2024-08-21Full publication date if available
- Authors
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Muhammad Hassan Shaikh, Matthew P. Whalen, Dai Q. Ho, Aqiq Ishraq, Collin Maurtua, Kenji Watanabe, Takashi Taniguchi, Yafei Ren, Anderson Janotti, John Q. Xiao, Chitraleema ChakrabortyList of authors in order
- Landing page
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https://arxiv.org/abs/2408.11986Publisher landing page
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https://arxiv.org/pdf/2408.11986Direct link to full text PDF
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YesWhether a free full text is available
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greenOpen access status per OpenAlex
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https://arxiv.org/pdf/2408.11986Direct OA link when available
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Coupling (piping), Semiconductor, Inductive coupling, Condensed matter physics, Materials science, Physics, Optoelectronics, Quantum mechanics, MetallurgyTop concepts (fields/topics) attached by OpenAlex
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1Total citation count in OpenAlex
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2025: 1Per-year citation counts (last 5 years)
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10Other works algorithmically related by OpenAlex
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| abstract_inverted_index.structure | 2 |
| abstract_inverted_index.supported | 159 |
| abstract_inverted_index.ultrafast | 17 |
| abstract_inverted_index.ultrathin | 1 |
| abstract_inverted_index.anisotropy | 61 |
| abstract_inverted_index.artificial | 20 |
| abstract_inverted_index.attributed | 59 |
| abstract_inverted_index.candidates | 119 |
| abstract_inverted_index.circularly | 178 |
| abstract_inverted_index.conditions | 50 |
| abstract_inverted_index.diselenide | 113 |
| abstract_inverted_index.functional | 162 |
| abstract_inverted_index.indicating | 154, 195 |
| abstract_inverted_index.transition | 199 |
| abstract_inverted_index.demonstrate | 92 |
| abstract_inverted_index.left-handed | 177 |
| abstract_inverted_index.technology. | 26 |
| abstract_inverted_index.transducers | 123 |
| abstract_inverted_index.highlighting | 218 |
| abstract_inverted_index.information. | 87 |
| abstract_inverted_index.intelligence | 21 |
| abstract_inverted_index.out-of-plane | 53 |
| abstract_inverted_index.right-handed | 175 |
| abstract_inverted_index.single-layer | 152 |
| abstract_inverted_index.applications. | 225 |
| abstract_inverted_index.calculations. | 165 |
| abstract_inverted_index.environmental | 49 |
| abstract_inverted_index.opportunities | 15 |
| abstract_inverted_index.technological | 224 |
| abstract_inverted_index.thiophosphate | 30 |
| abstract_inverted_index.unprecedented | 14 |
| abstract_inverted_index.characterizing | 209 |
| abstract_inverted_index.spin-polarized | 142 |
| abstract_inverted_index.susceptibility | 136 |
| abstract_inverted_index.heterostructure | 147 |
| abstract_inverted_index.two-dimensional | 8 |
| abstract_inverted_index.antiferromagnetic | 10 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 11 |
| citation_normalized_percentile |