Microwave Based Lifetime Measurements and Analysis for Detector Materials. Article Swipe

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Eric A. Shaner , Clark N. Kadlec , Michael Goldflam , Edward S. Bielejec , Preston T. Webster , Evan Michael Anderson , Samuel D. Hawkins , B. V. Olson , Emil Kadlec , John F. Klem , Jin K. Kim ·

YOU? · · 2020 · Open Access ·

Related Topics

Microwave

Materials Science

Optoelectronics

Environmental Science

Computer Science

Physics

Optics

Concepts

Detector Microwave Materials science Optoelectronics Environmental science Computer science Physics Optics Telecommunications

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Type: paratext
Language: en
Landing Page: https://www.osti.gov/biblio/1510628
OA Status: green
Related Works: 10
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Title: Microwave Based Lifetime Measurements and Analysis for Detector Materials.

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Type: paratext

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Language: en

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Publication year: 2020

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Publication date: 2020-01-20

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Authors: Eric A. Shaner, Clark N. Kadlec, Michael Goldflam, Edward S. Bielejec, Preston T. Webster, Evan Michael Anderson, Samuel D. Hawkins, B. V. Olson, Emil Kadlec, John F. Klem, Jin K. Kim

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Landing page: https://www.osti.gov/biblio/1510628

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Open access: Yes

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OA status: green

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OA URL: https://www.osti.gov/biblio/1510628

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Concepts: Detector, Microwave, Materials science, Optoelectronics, Environmental science, Computer science, Physics, Optics, Telecommunications

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Cited by: 0

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