Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics Article Swipe
Michele Zenari
,
Matteo Buffolo
,
Carlo De Santi
,
Jeroen Goyvaerts
,
Alexander Grabowski
,
Johan Gustavsson
,
Roel Baets
,
Anders Larsson
,
Günther Roelkens
,
Gaudenzio Meneghesso
,
Enrico Zanoni
,
Matteo Meneghini
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1109/ted.2023.3346370
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.1109/ted.2023.3346370
This article deals for the first time with the electrical degradation of novel 845 nm vertical-cavity silicon-integrated lasers (VCSILs) for silicon photonics (SiPh). We analyzed the reliability of these devices by submitting them to high current stress. The experimental results showed that stress induced: 1) a significant increase in the series resistance, occurring in two separated time-windows and 2) a lowering of the turn-on voltage. To understand the origin of such degradation phenomena, we simulated the - characteristics and the band diagrams by a Poisson-drift-diffusion simulator. We demonstrated that the degradation was caused by the diffusion of mobile species capable of compensating the p-type doping. The diffusing species are expected to migrate from the p-contact region in the top distributed Bragg reflector (DBR) towards the active layers.
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/ted.2023.3346370
- https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdf
- OA Status
- hybrid
- Cited By
- 5
- References
- 32
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4390533516
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W4390533516Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1109/ted.2023.3346370Digital Object Identifier
- Title
-
Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon PhotonicsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2024Year of publication
- Publication date
-
2024-01-03Full publication date if available
- Authors
-
Michele Zenari, Matteo Buffolo, Carlo De Santi, Jeroen Goyvaerts, Alexander Grabowski, Johan Gustavsson, Roel Baets, Anders Larsson, Günther Roelkens, Gaudenzio Meneghesso, Enrico Zanoni, Matteo MeneghiniList of authors in order
- Landing page
-
https://doi.org/10.1109/ted.2023.3346370Publisher landing page
- PDF URL
-
https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdfDirect OA link when available
- Concepts
-
Degradation (telecommunications), Silicon, Photonics, Doping, Materials science, Diffusion, Reliability (semiconductor), Optoelectronics, Mathematics, Physics, Electrical engineering, Engineering, Quantum mechanics, Power (physics)Top concepts (fields/topics) attached by OpenAlex
- Cited by
-
5Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 2, 2024: 3Per-year citation counts (last 5 years)
- References (count)
-
32Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W4390533516 |
|---|---|
| doi | https://doi.org/10.1109/ted.2023.3346370 |
| ids.doi | https://doi.org/10.1109/ted.2023.3346370 |
| ids.openalex | https://openalex.org/W4390533516 |
| fwci | 1.84584236 |
| type | article |
| title | Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics |
| biblio.issue | 2 |
| biblio.volume | 71 |
| biblio.last_page | 1138 |
| biblio.first_page | 1131 |
| topics[0].id | https://openalex.org/T10299 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 1.0 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Photonic and Optical Devices |
| topics[1].id | https://openalex.org/T10623 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9994999766349792 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Thin-Film Transistor Technologies |
| topics[2].id | https://openalex.org/T10472 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9987999796867371 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Semiconductor materials and devices |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C2779679103 |
| concepts[0].level | 2 |
| concepts[0].score | 0.6434822082519531 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q5251805 |
| concepts[0].display_name | Degradation (telecommunications) |
| concepts[1].id | https://openalex.org/C544956773 |
| concepts[1].level | 2 |
| concepts[1].score | 0.5704804062843323 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q670 |
| concepts[1].display_name | Silicon |
| concepts[2].id | https://openalex.org/C20788544 |
| concepts[2].level | 2 |
| concepts[2].score | 0.5348265171051025 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q467054 |
| concepts[2].display_name | Photonics |
| concepts[3].id | https://openalex.org/C57863236 |
| concepts[3].level | 2 |
| concepts[3].score | 0.4920918345451355 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q1130571 |
| concepts[3].display_name | Doping |
| concepts[4].id | https://openalex.org/C192562407 |
| concepts[4].level | 0 |
| concepts[4].score | 0.48348909616470337 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[4].display_name | Materials science |
| concepts[5].id | https://openalex.org/C69357855 |
| concepts[5].level | 2 |
| concepts[5].score | 0.4716956913471222 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q163214 |
| concepts[5].display_name | Diffusion |
| concepts[6].id | https://openalex.org/C43214815 |
| concepts[6].level | 3 |
| concepts[6].score | 0.4411846101284027 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q7310987 |
| concepts[6].display_name | Reliability (semiconductor) |
| concepts[7].id | https://openalex.org/C49040817 |
| concepts[7].level | 1 |
| concepts[7].score | 0.4028277099132538 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[7].display_name | Optoelectronics |
| concepts[8].id | https://openalex.org/C33923547 |
| concepts[8].level | 0 |
| concepts[8].score | 0.328616738319397 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q395 |
| concepts[8].display_name | Mathematics |
| concepts[9].id | https://openalex.org/C121332964 |
| concepts[9].level | 0 |
| concepts[9].score | 0.3257787823677063 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[9].display_name | Physics |
| concepts[10].id | https://openalex.org/C119599485 |
| concepts[10].level | 1 |
| concepts[10].score | 0.3229178786277771 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[10].display_name | Electrical engineering |
| concepts[11].id | https://openalex.org/C127413603 |
| concepts[11].level | 0 |
| concepts[11].score | 0.20103377103805542 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[11].display_name | Engineering |
| concepts[12].id | https://openalex.org/C62520636 |
| concepts[12].level | 1 |
| concepts[12].score | 0.1560288667678833 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[12].display_name | Quantum mechanics |
| concepts[13].id | https://openalex.org/C163258240 |
| concepts[13].level | 2 |
| concepts[13].score | 0.0 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q25342 |
| concepts[13].display_name | Power (physics) |
| keywords[0].id | https://openalex.org/keywords/degradation |
| keywords[0].score | 0.6434822082519531 |
| keywords[0].display_name | Degradation (telecommunications) |
| keywords[1].id | https://openalex.org/keywords/silicon |
| keywords[1].score | 0.5704804062843323 |
| keywords[1].display_name | Silicon |
| keywords[2].id | https://openalex.org/keywords/photonics |
| keywords[2].score | 0.5348265171051025 |
| keywords[2].display_name | Photonics |
| keywords[3].id | https://openalex.org/keywords/doping |
| keywords[3].score | 0.4920918345451355 |
| keywords[3].display_name | Doping |
| keywords[4].id | https://openalex.org/keywords/materials-science |
| keywords[4].score | 0.48348909616470337 |
| keywords[4].display_name | Materials science |
| keywords[5].id | https://openalex.org/keywords/diffusion |
| keywords[5].score | 0.4716956913471222 |
| keywords[5].display_name | Diffusion |
| keywords[6].id | https://openalex.org/keywords/reliability |
| keywords[6].score | 0.4411846101284027 |
| keywords[6].display_name | Reliability (semiconductor) |
| keywords[7].id | https://openalex.org/keywords/optoelectronics |
| keywords[7].score | 0.4028277099132538 |
| keywords[7].display_name | Optoelectronics |
| keywords[8].id | https://openalex.org/keywords/mathematics |
| keywords[8].score | 0.328616738319397 |
| keywords[8].display_name | Mathematics |
| keywords[9].id | https://openalex.org/keywords/physics |
| keywords[9].score | 0.3257787823677063 |
| keywords[9].display_name | Physics |
| keywords[10].id | https://openalex.org/keywords/electrical-engineering |
| keywords[10].score | 0.3229178786277771 |
| keywords[10].display_name | Electrical engineering |
| keywords[11].id | https://openalex.org/keywords/engineering |
| keywords[11].score | 0.20103377103805542 |
| keywords[11].display_name | Engineering |
| keywords[12].id | https://openalex.org/keywords/quantum-mechanics |
| keywords[12].score | 0.1560288667678833 |
| keywords[12].display_name | Quantum mechanics |
| language | en |
| locations[0].id | doi:10.1109/ted.2023.3346370 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S162355128 |
| locations[0].source.issn | 0018-9383, 1557-9646 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 0018-9383 |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | IEEE Transactions on Electron Devices |
| locations[0].source.host_organization | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_name | Institute of Electrical and Electronics Engineers |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310319808 |
| locations[0].source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| locations[0].license | other-oa |
| locations[0].pdf_url | https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/other-oa |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | IEEE Transactions on Electron Devices |
| locations[0].landing_page_url | https://doi.org/10.1109/ted.2023.3346370 |
| locations[1].id | pmh:oai:archive.ugent.be:01J3FTSNCQWPN4VMXGG6J259N8 |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4306400477 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | Ghent University Academic Bibliography (Ghent University) |
| locations[1].source.host_organization | https://openalex.org/I32597200 |
| locations[1].source.host_organization_name | Ghent University |
| locations[1].source.host_organization_lineage | https://openalex.org/I32597200 |
| locations[1].license | cc-by-nc-nd |
| locations[1].pdf_url | |
| locations[1].version | publishedVersion |
| locations[1].raw_type | info:eu-repo/semantics/publishedVersion |
| locations[1].license_id | https://openalex.org/licenses/cc-by-nc-nd |
| locations[1].is_accepted | True |
| locations[1].is_published | True |
| locations[1].raw_source_name | ISSN: 1557-9646 |
| locations[1].landing_page_url | https://biblio.ugent.be/publication/01J3FTSNCQWPN4VMXGG6J259N8 |
| locations[2].id | pmh:oai:research.chalmers.se:539351 |
| locations[2].is_oa | False |
| locations[2].source.id | https://openalex.org/S4306402469 |
| locations[2].source.issn | |
| locations[2].source.type | repository |
| locations[2].source.is_oa | False |
| locations[2].source.issn_l | |
| locations[2].source.is_core | False |
| locations[2].source.is_in_doaj | False |
| locations[2].source.display_name | Chalmers Research (Chalmers University of Technology) |
| locations[2].source.host_organization | https://openalex.org/I66862912 |
| locations[2].source.host_organization_name | Chalmers University of Technology |
| locations[2].source.host_organization_lineage | https://openalex.org/I66862912 |
| locations[2].license | |
| locations[2].pdf_url | |
| locations[2].version | submittedVersion |
| locations[2].raw_type | |
| locations[2].license_id | |
| locations[2].is_accepted | False |
| locations[2].is_published | False |
| locations[2].raw_source_name | |
| locations[2].landing_page_url | https://research.chalmers.se/en/publication/539351 |
| locations[3].id | pmh:oai:www.research.unipd.it:11577/3504349 |
| locations[3].is_oa | True |
| locations[3].source.id | https://openalex.org/S4306402448 |
| locations[3].source.issn | |
| locations[3].source.type | repository |
| locations[3].source.is_oa | False |
| locations[3].source.issn_l | |
| locations[3].source.is_core | False |
| locations[3].source.is_in_doaj | False |
| locations[3].source.display_name | Padua Research Archive (University of Padua) |
| locations[3].source.host_organization | https://openalex.org/I138689650 |
| locations[3].source.host_organization_name | University of Padua |
| locations[3].source.host_organization_lineage | https://openalex.org/I138689650 |
| locations[3].license | cc-by-nc-nd |
| locations[3].pdf_url | |
| locations[3].version | submittedVersion |
| locations[3].raw_type | info:eu-repo/semantics/article |
| locations[3].license_id | https://openalex.org/licenses/cc-by-nc-nd |
| locations[3].is_accepted | False |
| locations[3].is_published | False |
| locations[3].raw_source_name | |
| locations[3].landing_page_url | https://hdl.handle.net/11577/3504349 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5064007751 |
| authorships[0].author.orcid | https://orcid.org/0000-0001-8803-3824 |
| authorships[0].author.display_name | Michele Zenari |
| authorships[0].countries | IT |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[0].affiliations[0].raw_affiliation_string | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[0].institutions[0].id | https://openalex.org/I138689650 |
| authorships[0].institutions[0].ror | https://ror.org/00240q980 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[0].institutions[0].country_code | IT |
| authorships[0].institutions[0].display_name | University of Padua |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Michele Zenari |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[1].author.id | https://openalex.org/A5023295218 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-9255-6457 |
| authorships[1].author.display_name | Matteo Buffolo |
| authorships[1].countries | IT |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[1].affiliations[0].raw_affiliation_string | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[1].institutions[0].id | https://openalex.org/I138689650 |
| authorships[1].institutions[0].ror | https://ror.org/00240q980 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[1].institutions[0].country_code | IT |
| authorships[1].institutions[0].display_name | University of Padua |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Matteo Buffolo |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[2].author.id | https://openalex.org/A5064109540 |
| authorships[2].author.orcid | https://orcid.org/0000-0001-6064-077X |
| authorships[2].author.display_name | Carlo De Santi |
| authorships[2].countries | IT |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[2].affiliations[0].raw_affiliation_string | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[2].institutions[0].id | https://openalex.org/I138689650 |
| authorships[2].institutions[0].ror | https://ror.org/00240q980 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[2].institutions[0].country_code | IT |
| authorships[2].institutions[0].display_name | University of Padua |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Carlo De Santi |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[3].author.id | https://openalex.org/A5085875092 |
| authorships[3].author.orcid | https://orcid.org/0000-0002-8600-367X |
| authorships[3].author.display_name | Jeroen Goyvaerts |
| authorships[3].affiliations[0].raw_affiliation_string | LIGENTEC SA, Ecublens, Switzerland |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | Jeroen Goyvaerts |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | LIGENTEC SA, Ecublens, Switzerland |
| authorships[4].author.id | https://openalex.org/A5087699986 |
| authorships[4].author.orcid | https://orcid.org/0000-0001-7714-3788 |
| authorships[4].author.display_name | Alexander Grabowski |
| authorships[4].countries | SE |
| authorships[4].affiliations[0].institution_ids | https://openalex.org/I66862912 |
| authorships[4].affiliations[0].raw_affiliation_string | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[4].institutions[0].id | https://openalex.org/I66862912 |
| authorships[4].institutions[0].ror | https://ror.org/040wg7k59 |
| authorships[4].institutions[0].type | education |
| authorships[4].institutions[0].lineage | https://openalex.org/I66862912 |
| authorships[4].institutions[0].country_code | SE |
| authorships[4].institutions[0].display_name | Chalmers University of Technology |
| authorships[4].author_position | middle |
| authorships[4].raw_author_name | Alexander Grabowski |
| authorships[4].is_corresponding | False |
| authorships[4].raw_affiliation_strings | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[5].author.id | https://openalex.org/A5111957467 |
| authorships[5].author.orcid | |
| authorships[5].author.display_name | Johan Gustavsson |
| authorships[5].countries | SE |
| authorships[5].affiliations[0].institution_ids | https://openalex.org/I66862912 |
| authorships[5].affiliations[0].raw_affiliation_string | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[5].institutions[0].id | https://openalex.org/I66862912 |
| authorships[5].institutions[0].ror | https://ror.org/040wg7k59 |
| authorships[5].institutions[0].type | education |
| authorships[5].institutions[0].lineage | https://openalex.org/I66862912 |
| authorships[5].institutions[0].country_code | SE |
| authorships[5].institutions[0].display_name | Chalmers University of Technology |
| authorships[5].author_position | middle |
| authorships[5].raw_author_name | Johan Gustavsson |
| authorships[5].is_corresponding | False |
| authorships[5].raw_affiliation_strings | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[6].author.id | https://openalex.org/A5077297843 |
| authorships[6].author.orcid | https://orcid.org/0000-0003-1266-1319 |
| authorships[6].author.display_name | Roel Baets |
| authorships[6].countries | BE |
| authorships[6].affiliations[0].institution_ids | https://openalex.org/I32597200 |
| authorships[6].affiliations[0].raw_affiliation_string | Photonics Research Group, Ghent University-imec, Ghent, Belgium |
| authorships[6].institutions[0].id | https://openalex.org/I32597200 |
| authorships[6].institutions[0].ror | https://ror.org/00cv9y106 |
| authorships[6].institutions[0].type | education |
| authorships[6].institutions[0].lineage | https://openalex.org/I32597200 |
| authorships[6].institutions[0].country_code | BE |
| authorships[6].institutions[0].display_name | Ghent University |
| authorships[6].author_position | middle |
| authorships[6].raw_author_name | Roel Baets |
| authorships[6].is_corresponding | False |
| authorships[6].raw_affiliation_strings | Photonics Research Group, Ghent University-imec, Ghent, Belgium |
| authorships[7].author.id | https://openalex.org/A5078557689 |
| authorships[7].author.orcid | https://orcid.org/0000-0002-0912-7695 |
| authorships[7].author.display_name | Anders Larsson |
| authorships[7].countries | SE |
| authorships[7].affiliations[0].institution_ids | https://openalex.org/I66862912 |
| authorships[7].affiliations[0].raw_affiliation_string | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[7].institutions[0].id | https://openalex.org/I66862912 |
| authorships[7].institutions[0].ror | https://ror.org/040wg7k59 |
| authorships[7].institutions[0].type | education |
| authorships[7].institutions[0].lineage | https://openalex.org/I66862912 |
| authorships[7].institutions[0].country_code | SE |
| authorships[7].institutions[0].display_name | Chalmers University of Technology |
| authorships[7].author_position | middle |
| authorships[7].raw_author_name | Anders Larsson |
| authorships[7].is_corresponding | False |
| authorships[7].raw_affiliation_strings | Department of Microtechnology and Nanoscience, Photonics Laboratory, Chalmers University of Technology, Goteborg, Sweden |
| authorships[8].author.id | https://openalex.org/A5049388016 |
| authorships[8].author.orcid | https://orcid.org/0000-0002-4667-5092 |
| authorships[8].author.display_name | Günther Roelkens |
| authorships[8].countries | BE |
| authorships[8].affiliations[0].institution_ids | https://openalex.org/I32597200 |
| authorships[8].affiliations[0].raw_affiliation_string | Photonics Research Group, Ghent University-imec, Ghent, Belgium |
| authorships[8].institutions[0].id | https://openalex.org/I32597200 |
| authorships[8].institutions[0].ror | https://ror.org/00cv9y106 |
| authorships[8].institutions[0].type | education |
| authorships[8].institutions[0].lineage | https://openalex.org/I32597200 |
| authorships[8].institutions[0].country_code | BE |
| authorships[8].institutions[0].display_name | Ghent University |
| authorships[8].author_position | middle |
| authorships[8].raw_author_name | Günther Roelkens |
| authorships[8].is_corresponding | False |
| authorships[8].raw_affiliation_strings | Photonics Research Group, Ghent University-imec, Ghent, Belgium |
| authorships[9].author.id | https://openalex.org/A5101587480 |
| authorships[9].author.orcid | https://orcid.org/0000-0002-6715-4827 |
| authorships[9].author.display_name | Gaudenzio Meneghesso |
| authorships[9].countries | IT |
| authorships[9].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[9].affiliations[0].raw_affiliation_string | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[9].institutions[0].id | https://openalex.org/I138689650 |
| authorships[9].institutions[0].ror | https://ror.org/00240q980 |
| authorships[9].institutions[0].type | education |
| authorships[9].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[9].institutions[0].country_code | IT |
| authorships[9].institutions[0].display_name | University of Padua |
| authorships[9].author_position | middle |
| authorships[9].raw_author_name | Gaudenzio Meneghesso |
| authorships[9].is_corresponding | False |
| authorships[9].raw_affiliation_strings | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[10].author.id | https://openalex.org/A5002653396 |
| authorships[10].author.orcid | https://orcid.org/0000-0001-7349-9656 |
| authorships[10].author.display_name | Enrico Zanoni |
| authorships[10].countries | IT |
| authorships[10].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[10].affiliations[0].raw_affiliation_string | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[10].institutions[0].id | https://openalex.org/I138689650 |
| authorships[10].institutions[0].ror | https://ror.org/00240q980 |
| authorships[10].institutions[0].type | education |
| authorships[10].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[10].institutions[0].country_code | IT |
| authorships[10].institutions[0].display_name | University of Padua |
| authorships[10].author_position | middle |
| authorships[10].raw_author_name | Enrico Zanoni |
| authorships[10].is_corresponding | False |
| authorships[10].raw_affiliation_strings | Department of Information Engineering, University of Padua, Padua, Italy |
| authorships[11].author.id | https://openalex.org/A5059611177 |
| authorships[11].author.orcid | https://orcid.org/0000-0003-2421-505X |
| authorships[11].author.display_name | Matteo Meneghini |
| authorships[11].countries | IT |
| authorships[11].affiliations[0].institution_ids | https://openalex.org/I138689650 |
| authorships[11].affiliations[0].raw_affiliation_string | Department of Information Engineering and the Department of Physics and Astronomy, University of Padua, Padua, Italy |
| authorships[11].institutions[0].id | https://openalex.org/I138689650 |
| authorships[11].institutions[0].ror | https://ror.org/00240q980 |
| authorships[11].institutions[0].type | education |
| authorships[11].institutions[0].lineage | https://openalex.org/I138689650 |
| authorships[11].institutions[0].country_code | IT |
| authorships[11].institutions[0].display_name | University of Padua |
| authorships[11].author_position | last |
| authorships[11].raw_author_name | Matteo Meneghini |
| authorships[11].is_corresponding | False |
| authorships[11].raw_affiliation_strings | Department of Information Engineering and the Department of Physics and Astronomy, University of Padua, Padua, Italy |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdf |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Modeling the Electrical Degradation of Micro-transfer-Printed 845 nm VCSILs for Silicon Photonics |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T10299 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 1.0 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Photonic and Optical Devices |
| related_works | https://openalex.org/W2534928293, https://openalex.org/W2150099345, https://openalex.org/W3011831393, https://openalex.org/W2518845051, https://openalex.org/W2030563063, https://openalex.org/W3004580327, https://openalex.org/W1490077415, https://openalex.org/W2160318243, https://openalex.org/W2038256311, https://openalex.org/W2516241657 |
| cited_by_count | 5 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 2 |
| counts_by_year[1].year | 2024 |
| counts_by_year[1].cited_by_count | 3 |
| locations_count | 4 |
| best_oa_location.id | doi:10.1109/ted.2023.3346370 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S162355128 |
| best_oa_location.source.issn | 0018-9383, 1557-9646 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 0018-9383 |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | IEEE Transactions on Electron Devices |
| best_oa_location.source.host_organization | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| best_oa_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| best_oa_location.license | other-oa |
| best_oa_location.pdf_url | https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/other-oa |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | IEEE Transactions on Electron Devices |
| best_oa_location.landing_page_url | https://doi.org/10.1109/ted.2023.3346370 |
| primary_location.id | doi:10.1109/ted.2023.3346370 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S162355128 |
| primary_location.source.issn | 0018-9383, 1557-9646 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 0018-9383 |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | IEEE Transactions on Electron Devices |
| primary_location.source.host_organization | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_name | Institute of Electrical and Electronics Engineers |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310319808 |
| primary_location.source.host_organization_lineage_names | Institute of Electrical and Electronics Engineers |
| primary_location.license | other-oa |
| primary_location.pdf_url | https://ieeexplore.ieee.org/ielx7/16/4358746/10380419.pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/other-oa |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | IEEE Transactions on Electron Devices |
| primary_location.landing_page_url | https://doi.org/10.1109/ted.2023.3346370 |
| publication_date | 2024-01-03 |
| publication_year | 2024 |
| referenced_works | https://openalex.org/W3195862557, https://openalex.org/W3095839225, https://openalex.org/W4292794675, https://openalex.org/W4280527710, https://openalex.org/W2774040361, https://openalex.org/W2523090265, https://openalex.org/W2222684113, https://openalex.org/W4210911305, https://openalex.org/W2093831575, https://openalex.org/W2490684948, https://openalex.org/W3134101410, https://openalex.org/W2323085337, https://openalex.org/W3176635967, https://openalex.org/W4312979108, https://openalex.org/W4379742633, https://openalex.org/W2101448980, https://openalex.org/W2051933992, https://openalex.org/W1984143815, https://openalex.org/W4220984571, https://openalex.org/W3208700238, https://openalex.org/W4245151143, https://openalex.org/W2047611792, https://openalex.org/W1970403668, https://openalex.org/W2024265030, https://openalex.org/W3037462700, https://openalex.org/W2129161465, https://openalex.org/W2483859313, https://openalex.org/W2987474275, https://openalex.org/W2142335225, https://openalex.org/W2077271633, https://openalex.org/W3023868049, https://openalex.org/W3103448394 |
| referenced_works_count | 32 |
| abstract_inverted_index.a | 45, 59, 89 |
| abstract_inverted_index.1) | 44 |
| abstract_inverted_index.2) | 58 |
| abstract_inverted_index.To | 65 |
| abstract_inverted_index.We | 23, 92 |
| abstract_inverted_index.by | 30, 88, 99 |
| abstract_inverted_index.in | 48, 53, 122 |
| abstract_inverted_index.nm | 14 |
| abstract_inverted_index.of | 11, 27, 61, 69, 102, 106 |
| abstract_inverted_index.to | 33, 116 |
| abstract_inverted_index.we | 73 |
| abstract_inverted_index.845 | 13 |
| abstract_inverted_index.The | 37, 111 |
| abstract_inverted_index.and | 57, 84 |
| abstract_inverted_index.are | 114 |
| abstract_inverted_index.for | 3, 19 |
| abstract_inverted_index.the | 4, 8, 25, 49, 62, 67, 75, 85, 95, 100, 108, 119, 123, 130 |
| abstract_inverted_index.top | 124 |
| abstract_inverted_index.two | 54 |
| abstract_inverted_index.was | 97 |
| abstract_inverted_index.This | 0 |
| abstract_inverted_index.band | 86 |
| abstract_inverted_index.from | 118 |
| abstract_inverted_index.high | 34 |
| abstract_inverted_index.such | 70 |
| abstract_inverted_index.that | 41, 94 |
| abstract_inverted_index.them | 32 |
| abstract_inverted_index.time | 6 |
| abstract_inverted_index.with | 7 |
| abstract_inverted_index.(DBR) | 128 |
| abstract_inverted_index.Bragg | 126 |
| abstract_inverted_index.deals | 2 |
| abstract_inverted_index.first | 5 |
| abstract_inverted_index.novel | 12 |
| abstract_inverted_index.these | 28 |
| abstract_inverted_index.active | 131 |
| abstract_inverted_index.caused | 98 |
| abstract_inverted_index.lasers | 17 |
| abstract_inverted_index.mobile | 103 |
| abstract_inverted_index.origin | 68 |
| abstract_inverted_index.p-type | 109 |
| abstract_inverted_index.region | 121 |
| abstract_inverted_index.series | 50 |
| abstract_inverted_index.showed | 40 |
| abstract_inverted_index.stress | 42 |
| abstract_inverted_index.(SiPh). | 22 |
| abstract_inverted_index.article | 1 |
| abstract_inverted_index.capable | 105 |
| abstract_inverted_index.current | 35 |
| abstract_inverted_index.devices | 29 |
| abstract_inverted_index.doping. | 110 |
| abstract_inverted_index.layers. | 132 |
| abstract_inverted_index.migrate | 117 |
| abstract_inverted_index.results | 39 |
| abstract_inverted_index.silicon | 20 |
| abstract_inverted_index.species | 104, 113 |
| abstract_inverted_index.stress. | 36 |
| abstract_inverted_index.towards | 129 |
| abstract_inverted_index.turn-on | 63 |
| abstract_inverted_index.(VCSILs) | 18 |
| abstract_inverted_index.analyzed | 24 |
| abstract_inverted_index.diagrams | 87 |
| abstract_inverted_index.expected | 115 |
| abstract_inverted_index.increase | 47 |
| abstract_inverted_index.induced: | 43 |
| abstract_inverted_index.lowering | 60 |
| abstract_inverted_index.voltage. | 64 |
| abstract_inverted_index.diffusing | 112 |
| abstract_inverted_index.diffusion | 101 |
| abstract_inverted_index.occurring | 52 |
| abstract_inverted_index.p-contact | 120 |
| abstract_inverted_index.photonics | 21 |
| abstract_inverted_index.reflector | 127 |
| abstract_inverted_index.separated | 55 |
| abstract_inverted_index.simulated | 74 |
| abstract_inverted_index.electrical | 9 |
| abstract_inverted_index.phenomena, | 72 |
| abstract_inverted_index.simulator. | 91 |
| abstract_inverted_index.submitting | 31 |
| abstract_inverted_index.understand | 66 |
| abstract_inverted_index.degradation | 10, 71, 96 |
| abstract_inverted_index.distributed | 125 |
| abstract_inverted_index.reliability | 26 |
| abstract_inverted_index.resistance, | 51 |
| abstract_inverted_index.significant | 46 |
| abstract_inverted_index.<tex-math | 77, 80 |
| abstract_inverted_index.compensating | 107 |
| abstract_inverted_index.demonstrated | 93 |
| abstract_inverted_index.experimental | 38 |
| abstract_inverted_index.time-windows | 56 |
| abstract_inverted_index.characteristics | 83 |
| abstract_inverted_index.vertical-cavity | 15 |
| abstract_inverted_index.silicon-integrated | 16 |
| abstract_inverted_index.<inline-formula> | 76 |
| abstract_inverted_index.</inline-formula> | 82 |
| abstract_inverted_index.Poisson-drift-diffusion | 90 |
| abstract_inverted_index.</inline-formula>-<inline-formula> | 79 |
| abstract_inverted_index.notation="LaTeX">$\\textit{I}$</tex-math> | 78 |
| abstract_inverted_index.notation="LaTeX">$\\textit{V}$</tex-math> | 81 |
| cited_by_percentile_year.max | 97 |
| cited_by_percentile_year.min | 95 |
| countries_distinct_count | 3 |
| institutions_distinct_count | 12 |
| citation_normalized_percentile.value | 0.80509616 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |