Abstract Networks of solution-processed nanomaterials are becoming increasingly important across applications in electronics, sensing and energy storage/generation. Although the physical properties of these devices are often completely dominated by network morphology, the network structure itself remains difficult to interrogate. Here, we utilise FIB-SEM nanotomography to quantitatively characterise the morphology of nanostructured networks and their devices using nanometre-resolution 3D images. The influence of n…