Multi-beam interferometric patterning in optically transparent materials Article Swipe
Nicholas Cheng Yang Tham
,
Young‐Jin Kim
,
Murukeshan Vadakke Matham
·
YOU?
·
· 2017
· Open Access
·
· DOI: https://doi.org/10.1117/12.2270634
YOU?
·
· 2017
· Open Access
·
· DOI: https://doi.org/10.1117/12.2270634
A method to directly pattern nanoscale periodic features within optically transparent solid materials by means of a configurable multi-beam femtosecond laser interference is proposed. While femtosecond micromachining of optically transparent solid materials has been explored in great detail in the recent past, research in direct interference patterning on such materials has not been well established. Therefore, different design considerations such as complete void formation and flexibility of the patterned substrate are investigated as part of this study. The relationship between intensity distributions and actual void formation in optically transparent materials is also investigated to establish critical parameters for pattern formation. It is envisaged that this proposed method and data obtained may enable to explore the untapped domains of developing substrates for solid-state 3D microbattery applications.
Related Topics
Concepts
Materials science
Femtosecond
Surface micromachining
Void (composites)
Interferometry
Interference (communication)
Laser
Optoelectronics
Laser beams
Nanolithography
Substrate (aquarium)
Nanotechnology
Nanoscopic scale
Optics
Fabrication
Computer science
Composite material
Channel (broadcasting)
Geology
Oceanography
Computer network
Pathology
Physics
Alternative medicine
Medicine
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1117/12.2270634
- https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdf
- OA Status
- bronze
- References
- 25
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2626846415
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W2626846415Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1117/12.2270634Digital Object Identifier
- Title
-
Multi-beam interferometric patterning in optically transparent materialsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2017Year of publication
- Publication date
-
2017-06-13Full publication date if available
- Authors
-
Nicholas Cheng Yang Tham, Young‐Jin Kim, Murukeshan Vadakke MathamList of authors in order
- Landing page
-
https://doi.org/10.1117/12.2270634Publisher landing page
- PDF URL
-
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
bronzeOpen access status per OpenAlex
- OA URL
-
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdfDirect OA link when available
- Concepts
-
Materials science, Femtosecond, Surface micromachining, Void (composites), Interferometry, Interference (communication), Laser, Optoelectronics, Laser beams, Nanolithography, Substrate (aquarium), Nanotechnology, Nanoscopic scale, Optics, Fabrication, Computer science, Composite material, Channel (broadcasting), Geology, Oceanography, Computer network, Pathology, Physics, Alternative medicine, MedicineTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
0Total citation count in OpenAlex
- References (count)
-
25Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W2626846415 |
|---|---|
| doi | https://doi.org/10.1117/12.2270634 |
| ids.doi | https://doi.org/10.1117/12.2270634 |
| ids.mag | 2626846415 |
| ids.openalex | https://openalex.org/W2626846415 |
| fwci | 0.0 |
| type | article |
| title | Multi-beam interferometric patterning in optically transparent materials |
| biblio.issue | |
| biblio.volume | 10449 |
| biblio.last_page | 1044919 |
| biblio.first_page | 1044919 |
| topics[0].id | https://openalex.org/T11723 |
| topics[0].field.id | https://openalex.org/fields/25 |
| topics[0].field.display_name | Materials Science |
| topics[0].score | 0.9991999864578247 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2508 |
| topics[0].subfield.display_name | Surfaces, Coatings and Films |
| topics[0].display_name | Optical Coatings and Gratings |
| topics[1].id | https://openalex.org/T11799 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9986000061035156 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2211 |
| topics[1].subfield.display_name | Mechanics of Materials |
| topics[1].display_name | Adhesion, Friction, and Surface Interactions |
| topics[2].id | https://openalex.org/T11301 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9984999895095825 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2204 |
| topics[2].subfield.display_name | Biomedical Engineering |
| topics[2].display_name | Advanced Surface Polishing Techniques |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C192562407 |
| concepts[0].level | 0 |
| concepts[0].score | 0.8030974864959717 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[0].display_name | Materials science |
| concepts[1].id | https://openalex.org/C167735695 |
| concepts[1].level | 3 |
| concepts[1].score | 0.769467830657959 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q1777507 |
| concepts[1].display_name | Femtosecond |
| concepts[2].id | https://openalex.org/C145667562 |
| concepts[2].level | 4 |
| concepts[2].score | 0.5733555555343628 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q7646003 |
| concepts[2].display_name | Surface micromachining |
| concepts[3].id | https://openalex.org/C2779772531 |
| concepts[3].level | 2 |
| concepts[3].score | 0.5667382478713989 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q19689164 |
| concepts[3].display_name | Void (composites) |
| concepts[4].id | https://openalex.org/C166689943 |
| concepts[4].level | 2 |
| concepts[4].score | 0.5419067740440369 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q850283 |
| concepts[4].display_name | Interferometry |
| concepts[5].id | https://openalex.org/C32022120 |
| concepts[5].level | 3 |
| concepts[5].score | 0.5376352667808533 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q797225 |
| concepts[5].display_name | Interference (communication) |
| concepts[6].id | https://openalex.org/C520434653 |
| concepts[6].level | 2 |
| concepts[6].score | 0.5339722633361816 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q38867 |
| concepts[6].display_name | Laser |
| concepts[7].id | https://openalex.org/C49040817 |
| concepts[7].level | 1 |
| concepts[7].score | 0.5136327147483826 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q193091 |
| concepts[7].display_name | Optoelectronics |
| concepts[8].id | https://openalex.org/C2984025587 |
| concepts[8].level | 3 |
| concepts[8].score | 0.4987807273864746 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q38867 |
| concepts[8].display_name | Laser beams |
| concepts[9].id | https://openalex.org/C162117346 |
| concepts[9].level | 4 |
| concepts[9].score | 0.4499149024486542 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q1106386 |
| concepts[9].display_name | Nanolithography |
| concepts[10].id | https://openalex.org/C2777289219 |
| concepts[10].level | 2 |
| concepts[10].score | 0.42688870429992676 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q7632154 |
| concepts[10].display_name | Substrate (aquarium) |
| concepts[11].id | https://openalex.org/C171250308 |
| concepts[11].level | 1 |
| concepts[11].score | 0.4263712763786316 |
| concepts[11].wikidata | https://www.wikidata.org/wiki/Q11468 |
| concepts[11].display_name | Nanotechnology |
| concepts[12].id | https://openalex.org/C45206210 |
| concepts[12].level | 2 |
| concepts[12].score | 0.41784507036209106 |
| concepts[12].wikidata | https://www.wikidata.org/wiki/Q2415817 |
| concepts[12].display_name | Nanoscopic scale |
| concepts[13].id | https://openalex.org/C120665830 |
| concepts[13].level | 1 |
| concepts[13].score | 0.3629736304283142 |
| concepts[13].wikidata | https://www.wikidata.org/wiki/Q14620 |
| concepts[13].display_name | Optics |
| concepts[14].id | https://openalex.org/C136525101 |
| concepts[14].level | 3 |
| concepts[14].score | 0.1792060136795044 |
| concepts[14].wikidata | https://www.wikidata.org/wiki/Q5428139 |
| concepts[14].display_name | Fabrication |
| concepts[15].id | https://openalex.org/C41008148 |
| concepts[15].level | 0 |
| concepts[15].score | 0.16667762398719788 |
| concepts[15].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[15].display_name | Computer science |
| concepts[16].id | https://openalex.org/C159985019 |
| concepts[16].level | 1 |
| concepts[16].score | 0.06818345189094543 |
| concepts[16].wikidata | https://www.wikidata.org/wiki/Q181790 |
| concepts[16].display_name | Composite material |
| concepts[17].id | https://openalex.org/C127162648 |
| concepts[17].level | 2 |
| concepts[17].score | 0.0 |
| concepts[17].wikidata | https://www.wikidata.org/wiki/Q16858953 |
| concepts[17].display_name | Channel (broadcasting) |
| concepts[18].id | https://openalex.org/C127313418 |
| concepts[18].level | 0 |
| concepts[18].score | 0.0 |
| concepts[18].wikidata | https://www.wikidata.org/wiki/Q1069 |
| concepts[18].display_name | Geology |
| concepts[19].id | https://openalex.org/C111368507 |
| concepts[19].level | 1 |
| concepts[19].score | 0.0 |
| concepts[19].wikidata | https://www.wikidata.org/wiki/Q43518 |
| concepts[19].display_name | Oceanography |
| concepts[20].id | https://openalex.org/C31258907 |
| concepts[20].level | 1 |
| concepts[20].score | 0.0 |
| concepts[20].wikidata | https://www.wikidata.org/wiki/Q1301371 |
| concepts[20].display_name | Computer network |
| concepts[21].id | https://openalex.org/C142724271 |
| concepts[21].level | 1 |
| concepts[21].score | 0.0 |
| concepts[21].wikidata | https://www.wikidata.org/wiki/Q7208 |
| concepts[21].display_name | Pathology |
| concepts[22].id | https://openalex.org/C121332964 |
| concepts[22].level | 0 |
| concepts[22].score | 0.0 |
| concepts[22].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[22].display_name | Physics |
| concepts[23].id | https://openalex.org/C204787440 |
| concepts[23].level | 2 |
| concepts[23].score | 0.0 |
| concepts[23].wikidata | https://www.wikidata.org/wiki/Q188504 |
| concepts[23].display_name | Alternative medicine |
| concepts[24].id | https://openalex.org/C71924100 |
| concepts[24].level | 0 |
| concepts[24].score | 0.0 |
| concepts[24].wikidata | https://www.wikidata.org/wiki/Q11190 |
| concepts[24].display_name | Medicine |
| keywords[0].id | https://openalex.org/keywords/materials-science |
| keywords[0].score | 0.8030974864959717 |
| keywords[0].display_name | Materials science |
| keywords[1].id | https://openalex.org/keywords/femtosecond |
| keywords[1].score | 0.769467830657959 |
| keywords[1].display_name | Femtosecond |
| keywords[2].id | https://openalex.org/keywords/surface-micromachining |
| keywords[2].score | 0.5733555555343628 |
| keywords[2].display_name | Surface micromachining |
| keywords[3].id | https://openalex.org/keywords/void |
| keywords[3].score | 0.5667382478713989 |
| keywords[3].display_name | Void (composites) |
| keywords[4].id | https://openalex.org/keywords/interferometry |
| keywords[4].score | 0.5419067740440369 |
| keywords[4].display_name | Interferometry |
| keywords[5].id | https://openalex.org/keywords/interference |
| keywords[5].score | 0.5376352667808533 |
| keywords[5].display_name | Interference (communication) |
| keywords[6].id | https://openalex.org/keywords/laser |
| keywords[6].score | 0.5339722633361816 |
| keywords[6].display_name | Laser |
| keywords[7].id | https://openalex.org/keywords/optoelectronics |
| keywords[7].score | 0.5136327147483826 |
| keywords[7].display_name | Optoelectronics |
| keywords[8].id | https://openalex.org/keywords/laser-beams |
| keywords[8].score | 0.4987807273864746 |
| keywords[8].display_name | Laser beams |
| keywords[9].id | https://openalex.org/keywords/nanolithography |
| keywords[9].score | 0.4499149024486542 |
| keywords[9].display_name | Nanolithography |
| keywords[10].id | https://openalex.org/keywords/substrate |
| keywords[10].score | 0.42688870429992676 |
| keywords[10].display_name | Substrate (aquarium) |
| keywords[11].id | https://openalex.org/keywords/nanotechnology |
| keywords[11].score | 0.4263712763786316 |
| keywords[11].display_name | Nanotechnology |
| keywords[12].id | https://openalex.org/keywords/nanoscopic-scale |
| keywords[12].score | 0.41784507036209106 |
| keywords[12].display_name | Nanoscopic scale |
| keywords[13].id | https://openalex.org/keywords/optics |
| keywords[13].score | 0.3629736304283142 |
| keywords[13].display_name | Optics |
| keywords[14].id | https://openalex.org/keywords/fabrication |
| keywords[14].score | 0.1792060136795044 |
| keywords[14].display_name | Fabrication |
| keywords[15].id | https://openalex.org/keywords/computer-science |
| keywords[15].score | 0.16667762398719788 |
| keywords[15].display_name | Computer science |
| keywords[16].id | https://openalex.org/keywords/composite-material |
| keywords[16].score | 0.06818345189094543 |
| keywords[16].display_name | Composite material |
| language | en |
| locations[0].id | doi:10.1117/12.2270634 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S183492911 |
| locations[0].source.issn | 0277-786X, 1996-756X |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 0277-786X |
| locations[0].source.is_core | True |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE |
| locations[0].source.host_organization | https://openalex.org/P4310315543 |
| locations[0].source.host_organization_name | SPIE |
| locations[0].source.host_organization_lineage | https://openalex.org/P4310315543 |
| locations[0].source.host_organization_lineage_names | SPIE |
| locations[0].license | |
| locations[0].pdf_url | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdf |
| locations[0].version | publishedVersion |
| locations[0].raw_type | proceedings-article |
| locations[0].license_id | |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | SPIE Proceedings |
| locations[0].landing_page_url | https://doi.org/10.1117/12.2270634 |
| locations[1].id | pmh:oai:dr.ntu.edu.sg:10356/106387 |
| locations[1].is_oa | False |
| locations[1].source.id | https://openalex.org/S4306402609 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | DR-NTU (Nanyang Technological University) |
| locations[1].source.host_organization | https://openalex.org/I172675005 |
| locations[1].source.host_organization_name | Nanyang Technological University |
| locations[1].source.host_organization_lineage | https://openalex.org/I172675005 |
| locations[1].license | |
| locations[1].pdf_url | |
| locations[1].version | submittedVersion |
| locations[1].raw_type | Journal Article |
| locations[1].license_id | |
| locations[1].is_accepted | False |
| locations[1].is_published | False |
| locations[1].raw_source_name | |
| locations[1].landing_page_url | http://hdl.handle.net/10220/49634 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5011109230 |
| authorships[0].author.orcid | https://orcid.org/0000-0003-4370-2427 |
| authorships[0].author.display_name | Nicholas Cheng Yang Tham |
| authorships[0].countries | SG |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I172675005 |
| authorships[0].affiliations[0].raw_affiliation_string | Nanyang Technological Univ. (Singapore) |
| authorships[0].institutions[0].id | https://openalex.org/I172675005 |
| authorships[0].institutions[0].ror | https://ror.org/02e7b5302 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I172675005 |
| authorships[0].institutions[0].country_code | SG |
| authorships[0].institutions[0].display_name | Nanyang Technological University |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Nicholas Tham |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | Nanyang Technological Univ. (Singapore) |
| authorships[1].author.id | https://openalex.org/A5100440449 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-4271-5771 |
| authorships[1].author.display_name | Young‐Jin Kim |
| authorships[1].countries | SG |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I172675005 |
| authorships[1].affiliations[0].raw_affiliation_string | Nanyang Technological Univ. (Singapore) |
| authorships[1].institutions[0].id | https://openalex.org/I172675005 |
| authorships[1].institutions[0].ror | https://ror.org/02e7b5302 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I172675005 |
| authorships[1].institutions[0].country_code | SG |
| authorships[1].institutions[0].display_name | Nanyang Technological University |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Y. J. Kim |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Nanyang Technological Univ. (Singapore) |
| authorships[2].author.id | https://openalex.org/A5037859315 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-9848-604X |
| authorships[2].author.display_name | Murukeshan Vadakke Matham |
| authorships[2].countries | SG |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I172675005 |
| authorships[2].affiliations[0].raw_affiliation_string | Nanyang Technological Univ. (Singapore) |
| authorships[2].institutions[0].id | https://openalex.org/I172675005 |
| authorships[2].institutions[0].ror | https://ror.org/02e7b5302 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I172675005 |
| authorships[2].institutions[0].country_code | SG |
| authorships[2].institutions[0].display_name | Nanyang Technological University |
| authorships[2].author_position | last |
| authorships[2].raw_author_name | Murukeshan V. M. |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Nanyang Technological Univ. (Singapore) |
| has_content.pdf | True |
| has_content.grobid_xml | True |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdf |
| open_access.oa_status | bronze |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Multi-beam interferometric patterning in optically transparent materials |
| has_fulltext | True |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T11723 |
| primary_topic.field.id | https://openalex.org/fields/25 |
| primary_topic.field.display_name | Materials Science |
| primary_topic.score | 0.9991999864578247 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2508 |
| primary_topic.subfield.display_name | Surfaces, Coatings and Films |
| primary_topic.display_name | Optical Coatings and Gratings |
| related_works | https://openalex.org/W1524640612, https://openalex.org/W2380858524, https://openalex.org/W1993058210, https://openalex.org/W2370977132, https://openalex.org/W2378827508, https://openalex.org/W4210818449, https://openalex.org/W3160602223, https://openalex.org/W4246919967, https://openalex.org/W2135723976, https://openalex.org/W2122671233 |
| cited_by_count | 0 |
| locations_count | 2 |
| best_oa_location.id | doi:10.1117/12.2270634 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S183492911 |
| best_oa_location.source.issn | 0277-786X, 1996-756X |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 0277-786X |
| best_oa_location.source.is_core | True |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE |
| best_oa_location.source.host_organization | https://openalex.org/P4310315543 |
| best_oa_location.source.host_organization_name | SPIE |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4310315543 |
| best_oa_location.source.host_organization_lineage_names | SPIE |
| best_oa_location.license | |
| best_oa_location.pdf_url | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdf |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | proceedings-article |
| best_oa_location.license_id | |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | SPIE Proceedings |
| best_oa_location.landing_page_url | https://doi.org/10.1117/12.2270634 |
| primary_location.id | doi:10.1117/12.2270634 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S183492911 |
| primary_location.source.issn | 0277-786X, 1996-756X |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 0277-786X |
| primary_location.source.is_core | True |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE |
| primary_location.source.host_organization | https://openalex.org/P4310315543 |
| primary_location.source.host_organization_name | SPIE |
| primary_location.source.host_organization_lineage | https://openalex.org/P4310315543 |
| primary_location.source.host_organization_lineage_names | SPIE |
| primary_location.license | |
| primary_location.pdf_url | https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10449/1044919/Multi-beam-interferometric-patterning-in-optically-transparent-materials/10.1117/12.2270634.pdf |
| primary_location.version | publishedVersion |
| primary_location.raw_type | proceedings-article |
| primary_location.license_id | |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | SPIE Proceedings |
| primary_location.landing_page_url | https://doi.org/10.1117/12.2270634 |
| publication_date | 2017-06-13 |
| publication_year | 2017 |
| referenced_works | https://openalex.org/W2046952946, https://openalex.org/W2023090422, https://openalex.org/W2103633039, https://openalex.org/W2094748040, https://openalex.org/W2027652230, https://openalex.org/W2003374081, https://openalex.org/W2077254572, https://openalex.org/W2067477336, https://openalex.org/W1971382880, https://openalex.org/W1987804578, https://openalex.org/W2087232764, https://openalex.org/W1986178319, https://openalex.org/W2053277709, https://openalex.org/W2091789254, https://openalex.org/W1974892479, https://openalex.org/W6629529388, https://openalex.org/W4251264148, https://openalex.org/W2555855034, https://openalex.org/W2024796202, https://openalex.org/W6772211674, https://openalex.org/W1985157193, https://openalex.org/W2051944757, https://openalex.org/W2068191037, https://openalex.org/W1496814262, https://openalex.org/W2995249355 |
| referenced_works_count | 25 |
| abstract_inverted_index.A | 0 |
| abstract_inverted_index.a | 16 |
| abstract_inverted_index.3D | 122 |
| abstract_inverted_index.It | 100 |
| abstract_inverted_index.as | 60, 72 |
| abstract_inverted_index.by | 13 |
| abstract_inverted_index.in | 35, 38, 43, 86 |
| abstract_inverted_index.is | 22, 90, 101 |
| abstract_inverted_index.of | 15, 27, 66, 74, 117 |
| abstract_inverted_index.on | 47 |
| abstract_inverted_index.to | 2, 93, 112 |
| abstract_inverted_index.The | 77 |
| abstract_inverted_index.and | 64, 82, 107 |
| abstract_inverted_index.are | 70 |
| abstract_inverted_index.for | 97, 120 |
| abstract_inverted_index.has | 32, 50 |
| abstract_inverted_index.may | 110 |
| abstract_inverted_index.not | 51 |
| abstract_inverted_index.the | 39, 67, 114 |
| abstract_inverted_index.also | 91 |
| abstract_inverted_index.been | 33, 52 |
| abstract_inverted_index.data | 108 |
| abstract_inverted_index.part | 73 |
| abstract_inverted_index.such | 48, 59 |
| abstract_inverted_index.that | 103 |
| abstract_inverted_index.this | 75, 104 |
| abstract_inverted_index.void | 62, 84 |
| abstract_inverted_index.well | 53 |
| abstract_inverted_index.While | 24 |
| abstract_inverted_index.great | 36 |
| abstract_inverted_index.laser | 20 |
| abstract_inverted_index.means | 14 |
| abstract_inverted_index.past, | 41 |
| abstract_inverted_index.solid | 11, 30 |
| abstract_inverted_index.actual | 83 |
| abstract_inverted_index.design | 57 |
| abstract_inverted_index.detail | 37 |
| abstract_inverted_index.direct | 44 |
| abstract_inverted_index.enable | 111 |
| abstract_inverted_index.method | 1, 106 |
| abstract_inverted_index.recent | 40 |
| abstract_inverted_index.study. | 76 |
| abstract_inverted_index.within | 8 |
| abstract_inverted_index.between | 79 |
| abstract_inverted_index.domains | 116 |
| abstract_inverted_index.explore | 113 |
| abstract_inverted_index.pattern | 4, 98 |
| abstract_inverted_index.complete | 61 |
| abstract_inverted_index.critical | 95 |
| abstract_inverted_index.directly | 3 |
| abstract_inverted_index.explored | 34 |
| abstract_inverted_index.features | 7 |
| abstract_inverted_index.obtained | 109 |
| abstract_inverted_index.periodic | 6 |
| abstract_inverted_index.proposed | 105 |
| abstract_inverted_index.research | 42 |
| abstract_inverted_index.untapped | 115 |
| abstract_inverted_index.different | 56 |
| abstract_inverted_index.envisaged | 102 |
| abstract_inverted_index.establish | 94 |
| abstract_inverted_index.formation | 63, 85 |
| abstract_inverted_index.intensity | 80 |
| abstract_inverted_index.materials | 12, 31, 49, 89 |
| abstract_inverted_index.nanoscale | 5 |
| abstract_inverted_index.optically | 9, 28, 87 |
| abstract_inverted_index.patterned | 68 |
| abstract_inverted_index.proposed. | 23 |
| abstract_inverted_index.substrate | 69 |
| abstract_inverted_index.Therefore, | 55 |
| abstract_inverted_index.developing | 118 |
| abstract_inverted_index.formation. | 99 |
| abstract_inverted_index.multi-beam | 18 |
| abstract_inverted_index.parameters | 96 |
| abstract_inverted_index.patterning | 46 |
| abstract_inverted_index.substrates | 119 |
| abstract_inverted_index.femtosecond | 19, 25 |
| abstract_inverted_index.flexibility | 65 |
| abstract_inverted_index.solid-state | 121 |
| abstract_inverted_index.transparent | 10, 29, 88 |
| abstract_inverted_index.configurable | 17 |
| abstract_inverted_index.established. | 54 |
| abstract_inverted_index.interference | 21, 45 |
| abstract_inverted_index.investigated | 71, 92 |
| abstract_inverted_index.microbattery | 123 |
| abstract_inverted_index.relationship | 78 |
| abstract_inverted_index.applications. | 124 |
| abstract_inverted_index.distributions | 81 |
| abstract_inverted_index.considerations | 58 |
| abstract_inverted_index.micromachining | 26 |
| cited_by_percentile_year | |
| countries_distinct_count | 1 |
| institutions_distinct_count | 3 |
| citation_normalized_percentile.value | 0.06552262 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |