On Improving Reliability of SRAM-Based Physically Unclonable Functions Article Swipe
YOU?
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· 2017
· Open Access
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· DOI: https://doi.org/10.3390/jlpea7010002
Physically unclonable functions (PUFs) have been touted for their inherent resistance to invasive attacks and low cost in providing a hardware root of trust for various security applications. SRAM PUFs in particular are popular in industry for key/ID generation. Due to intrinsic process variations, SRAM cells, ideally, tend to have the same start-up behavior. SRAM PUFs exploit this start-up behavior. Unfortunately, not all SRAM cells exhibit reliable start-up behavior due to noise susceptibility. Hence, design enhancements are needed for improving reliability. Some of the proposed enhancements in literature include fuzzy extraction, error-correcting codes and voting mechanisms. All enhancements involve a trade-off between area/power/performance overhead and PUF reliability. This paper presents a design enhancement technique for reliability that improves upon previous solutions. We present simulation results to quantify improvement in SRAM PUF reliability and efficiency. The proposed technique is shown to generate a 128-bit key in ≤0.2 μ s at an area estimate of 4538 μ m 2 with error rate as low as 10 − 6 for intrinsic error probability of 15%.
Related Topics
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.3390/jlpea7010002
- https://www.mdpi.com/2079-9268/7/1/2/pdf?version=1484215899
- OA Status
- gold
- Cited By
- 31
- References
- 30
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2579868530
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W2579868530Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.3390/jlpea7010002Digital Object Identifier
- Title
-
On Improving Reliability of SRAM-Based Physically Unclonable FunctionsWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2017Year of publication
- Publication date
-
2017-01-12Full publication date if available
- Authors
-
Arunkumar Vijayakumar, Vinay C. Patil, Sandip KunduList of authors in order
- Landing page
-
https://doi.org/10.3390/jlpea7010002Publisher landing page
- PDF URL
-
https://www.mdpi.com/2079-9268/7/1/2/pdf?version=1484215899Direct link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://www.mdpi.com/2079-9268/7/1/2/pdf?version=1484215899Direct OA link when available
- Concepts
-
Static random-access memory, Physical unclonable function, Reliability (semiconductor), Overhead (engineering), Computer science, Key (lock), Key generation, Reliability engineering, Exploit, Hardware security module, Embedded system, Electronic engineering, Power (physics), Cryptography, Engineering, Computer hardware, Algorithm, Computer security, Quantum mechanics, Physics, Operating systemTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
31Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 4, 2024: 3, 2023: 4, 2022: 1, 2021: 3Per-year citation counts (last 5 years)
- References (count)
-
30Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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