On the resolution of atom probe tomography in the analysis of transformation interfaces Article Swipe
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Atom probe
Transformation (genetics)
Context (archaeology)
Resolution (logic)
Key (lock)
Materials science
Atom (system on chip)
Phase (matter)
Microstructure
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Tomography
Crystallography
Computer science
Optics
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Understanding the segregation and partitioning at transformation interfaces in steels is key to control microstructure and properties. The results from atom probe tomography used to analyze the precise composition of these interfaces are often, because of the widening of the profile caused by limited spatial resolution. Here, by targeting regions of the data with optimal depth resolution, we demonstrate segregation over only five atomic planes or so, in agreement with reports from e.g. electron microscopy. This Letter discusses the issues arising from superficial processing of APT data that lead to their misinterpretation in the context of phase transitions and transformations.
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