Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy Article Swipe
Cecile S. Bonifacio
,
Paweł Nowakowski
,
K. Costello
,
M.L. Ray
,
R. I. Guy Morrison
,
P.E. Fischione
·
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.1017/s1431927619013503
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.1017/s1431927619013503
Journal Article Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy Get access CS Bonifacio, CS Bonifacio E.A. Fischione Instruments, Inc., Export, PA, USA Search for other works by this author on: Oxford Academic Google Scholar P Nowakowski, P Nowakowski E.A. Fischione Instruments, Inc., Export, PA, USA Search for other works by this author on: Oxford Academic Google Scholar K Costello, K Costello Quorum Technologies Ltd., East Sussex, UK Search for other works by this author on: Oxford Academic Google Scholar ML Ray, ML Ray E.A. Fischione Instruments, Inc., Export, PA, USA Search for other works by this author on: Oxford Academic Google Scholar R Morrison, R Morrison Quorum Technologies Ltd., East Sussex, UK Search for other works by this author on: Oxford Academic Google Scholar PE Fischione PE Fischione E.A. Fischione Instruments, Inc., Export, PA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2554–2555, https://doi.org/10.1017/S1431927619013503 Published: 01 August 2019
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Concepts
Metadata
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- Language
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- Landing Page
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- https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8D48CA377F6A94714ED646C85DC38957/S1431927619013503a.pdf/div-class-title-post-fib-specimen-preparation-of-atom-probe-specimens-under-controlled-environments-for-correlative-microscopy-div.pdf
- OA Status
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- Cited By
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- Related Works
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- OpenAlex ID
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All OpenAlex metadata
Raw OpenAlex JSON
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https://openalex.org/W2965872490Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1017/s1431927619013503Digital Object Identifier
- Title
-
Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative MicroscopyWork title
- Type
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2019Year of publication
- Publication date
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2019-08-01Full publication date if available
- Authors
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Cecile S. Bonifacio, Paweł Nowakowski, K. Costello, M.L. Ray, R. I. Guy Morrison, P.E. FischioneList of authors in order
- Landing page
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https://doi.org/10.1017/s1431927619013503Publisher landing page
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https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8D48CA377F6A94714ED646C85DC38957/S1431927619013503a.pdf/div-class-title-post-fib-specimen-preparation-of-atom-probe-specimens-under-controlled-environments-for-correlative-microscopy-div.pdfDirect link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
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bronzeOpen access status per OpenAlex
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https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8D48CA377F6A94714ED646C85DC38957/S1431927619013503a.pdf/div-class-title-post-fib-specimen-preparation-of-atom-probe-specimens-under-controlled-environments-for-correlative-microscopy-div.pdfDirect OA link when available
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Atom probe, Library science, Atomic force microscopy, Nanotechnology, History, Art history, Computer science, Materials science, Transmission electron microscopyTop concepts (fields/topics) attached by OpenAlex
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2Total citation count in OpenAlex
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2022: 1, 2021: 1Per-year citation counts (last 5 years)
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4Number of works referenced by this work
- Related works (count)
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10Other works algorithmically related by OpenAlex
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| abstract_inverted_index.Instruments, | 23, 46, 91, 136 |
| abstract_inverted_index.Technologies | 68, 113 |
| abstract_inverted_index.Microanalysis, | 155 |
| abstract_inverted_index.https://doi.org/10.1017/S1431927619013503 | 165 |
| cited_by_percentile_year.max | 94 |
| cited_by_percentile_year.min | 89 |
| countries_distinct_count | 0 |
| institutions_distinct_count | 6 |
| citation_normalized_percentile.value | 0.50344021 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |