Recycled IC detection through aging sensor Article Swipe
YOU?
·
· 2018
· Open Access
·
· DOI: https://doi.org/10.1109/ets.2018.8400713
In this paper, we propose a novel technique to detect recycled ICs via an on-chip, coarse-grained aging sensor, which can be applied to low-power circuits featuring power gating. The sensor detects the increase in the power-rail discharge time of power-gated circuits, when the circuit enters the sleep condition. Through HSPICE simulations, we prove that power network discharge time (τdV) is extremely sensitive to the age of the circuit. Indeed, after only 1 month of operation, τdVincreases by more than 3X and, after 1 year, its increase exceeds 7X. Our technique enables the detection of recycled ICs with a very high confidence and is a considerably more sensitive indicator of an aged device that alternative solutions relying on fine-grained performance degradation sensors.
Related Topics
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/ets.2018.8400713
- OA Status
- green
- Cited By
- 11
- References
- 9
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2810695183
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W2810695183Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1109/ets.2018.8400713Digital Object Identifier
- Title
-
Recycled IC detection through aging sensorWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2018Year of publication
- Publication date
-
2018-05-01Full publication date if available
- Authors
-
Daniele Rossi, Vasileios Tenentes, Saqib Khursheed, S.M. ReddyList of authors in order
- Landing page
-
https://doi.org/10.1109/ets.2018.8400713Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
-
https://ieeexplore.ieee.org/document/8400713Direct OA link when available
- Concepts
-
Power (physics), Electronic circuit, Computer science, Integrated circuit, Degradation (telecommunications), Embedded system, Electrical engineering, Engineering, Telecommunications, Physics, Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
11Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 2, 2024: 1, 2021: 6, 2020: 2Per-year citation counts (last 5 years)
- References (count)
-
9Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W2810695183 |
|---|---|
| doi | https://doi.org/10.1109/ets.2018.8400713 |
| ids.doi | https://doi.org/10.1109/ets.2018.8400713 |
| ids.mag | 2810695183 |
| ids.openalex | https://openalex.org/W2810695183 |
| fwci | 2.38257337 |
| type | article |
| title | Recycled IC detection through aging sensor |
| awards[0].id | https://openalex.org/G6581995234 |
| awards[0].funder_id | https://openalex.org/F4320334627 |
| awards[0].display_name | |
| awards[0].funder_award_id | EP/L025450/1 |
| awards[0].funder_display_name | Engineering and Physical Sciences Research Council |
| biblio.issue | |
| biblio.volume | |
| biblio.last_page | 2 |
| biblio.first_page | 1 |
| topics[0].id | https://openalex.org/T12122 |
| topics[0].field.id | https://openalex.org/fields/17 |
| topics[0].field.display_name | Computer Science |
| topics[0].score | 0.9998000264167786 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/1708 |
| topics[0].subfield.display_name | Hardware and Architecture |
| topics[0].display_name | Physical Unclonable Functions (PUFs) and Hardware Security |
| topics[1].id | https://openalex.org/T10502 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9991000294685364 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2208 |
| topics[1].subfield.display_name | Electrical and Electronic Engineering |
| topics[1].display_name | Advanced Memory and Neural Computing |
| topics[2].id | https://openalex.org/T14117 |
| topics[2].field.id | https://openalex.org/fields/22 |
| topics[2].field.display_name | Engineering |
| topics[2].score | 0.9986000061035156 |
| topics[2].domain.id | https://openalex.org/domains/3 |
| topics[2].domain.display_name | Physical Sciences |
| topics[2].subfield.id | https://openalex.org/subfields/2208 |
| topics[2].subfield.display_name | Electrical and Electronic Engineering |
| topics[2].display_name | Integrated Circuits and Semiconductor Failure Analysis |
| funders[0].id | https://openalex.org/F4320334627 |
| funders[0].ror | https://ror.org/0439y7842 |
| funders[0].display_name | Engineering and Physical Sciences Research Council |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C163258240 |
| concepts[0].level | 2 |
| concepts[0].score | 0.5649309754371643 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q25342 |
| concepts[0].display_name | Power (physics) |
| concepts[1].id | https://openalex.org/C134146338 |
| concepts[1].level | 2 |
| concepts[1].score | 0.5610132813453674 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q1815901 |
| concepts[1].display_name | Electronic circuit |
| concepts[2].id | https://openalex.org/C41008148 |
| concepts[2].level | 0 |
| concepts[2].score | 0.517920196056366 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q21198 |
| concepts[2].display_name | Computer science |
| concepts[3].id | https://openalex.org/C530198007 |
| concepts[3].level | 2 |
| concepts[3].score | 0.48728716373443604 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q80831 |
| concepts[3].display_name | Integrated circuit |
| concepts[4].id | https://openalex.org/C2779679103 |
| concepts[4].level | 2 |
| concepts[4].score | 0.44683295488357544 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q5251805 |
| concepts[4].display_name | Degradation (telecommunications) |
| concepts[5].id | https://openalex.org/C149635348 |
| concepts[5].level | 1 |
| concepts[5].score | 0.41126763820648193 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q193040 |
| concepts[5].display_name | Embedded system |
| concepts[6].id | https://openalex.org/C119599485 |
| concepts[6].level | 1 |
| concepts[6].score | 0.3879038691520691 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q43035 |
| concepts[6].display_name | Electrical engineering |
| concepts[7].id | https://openalex.org/C127413603 |
| concepts[7].level | 0 |
| concepts[7].score | 0.24480953812599182 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q11023 |
| concepts[7].display_name | Engineering |
| concepts[8].id | https://openalex.org/C76155785 |
| concepts[8].level | 1 |
| concepts[8].score | 0.1517651379108429 |
| concepts[8].wikidata | https://www.wikidata.org/wiki/Q418 |
| concepts[8].display_name | Telecommunications |
| concepts[9].id | https://openalex.org/C121332964 |
| concepts[9].level | 0 |
| concepts[9].score | 0.11671942472457886 |
| concepts[9].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[9].display_name | Physics |
| concepts[10].id | https://openalex.org/C62520636 |
| concepts[10].level | 1 |
| concepts[10].score | 0.0 |
| concepts[10].wikidata | https://www.wikidata.org/wiki/Q944 |
| concepts[10].display_name | Quantum mechanics |
| keywords[0].id | https://openalex.org/keywords/power |
| keywords[0].score | 0.5649309754371643 |
| keywords[0].display_name | Power (physics) |
| keywords[1].id | https://openalex.org/keywords/electronic-circuit |
| keywords[1].score | 0.5610132813453674 |
| keywords[1].display_name | Electronic circuit |
| keywords[2].id | https://openalex.org/keywords/computer-science |
| keywords[2].score | 0.517920196056366 |
| keywords[2].display_name | Computer science |
| keywords[3].id | https://openalex.org/keywords/integrated-circuit |
| keywords[3].score | 0.48728716373443604 |
| keywords[3].display_name | Integrated circuit |
| keywords[4].id | https://openalex.org/keywords/degradation |
| keywords[4].score | 0.44683295488357544 |
| keywords[4].display_name | Degradation (telecommunications) |
| keywords[5].id | https://openalex.org/keywords/embedded-system |
| keywords[5].score | 0.41126763820648193 |
| keywords[5].display_name | Embedded system |
| keywords[6].id | https://openalex.org/keywords/electrical-engineering |
| keywords[6].score | 0.3879038691520691 |
| keywords[6].display_name | Electrical engineering |
| keywords[7].id | https://openalex.org/keywords/engineering |
| keywords[7].score | 0.24480953812599182 |
| keywords[7].display_name | Engineering |
| keywords[8].id | https://openalex.org/keywords/telecommunications |
| keywords[8].score | 0.1517651379108429 |
| keywords[8].display_name | Telecommunications |
| keywords[9].id | https://openalex.org/keywords/physics |
| keywords[9].score | 0.11671942472457886 |
| keywords[9].display_name | Physics |
| language | en |
| locations[0].id | doi:10.1109/ets.2018.8400713 |
| locations[0].is_oa | False |
| locations[0].source | |
| locations[0].license | |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | proceedings-article |
| locations[0].license_id | |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | 2018 IEEE 23rd European Test Symposium (ETS) |
| locations[0].landing_page_url | https://doi.org/10.1109/ets.2018.8400713 |
| locations[1].id | pmh:oai:arpi.unipi.it:11568/1026953 |
| locations[1].is_oa | True |
| locations[1].source.id | https://openalex.org/S4377196265 |
| locations[1].source.issn | |
| locations[1].source.type | repository |
| locations[1].source.is_oa | False |
| locations[1].source.issn_l | |
| locations[1].source.is_core | False |
| locations[1].source.is_in_doaj | False |
| locations[1].source.display_name | CINECA IRIS Institutial research information system (University of Pisa) |
| locations[1].source.host_organization | https://openalex.org/I108290504 |
| locations[1].source.host_organization_name | University of Pisa |
| locations[1].source.host_organization_lineage | https://openalex.org/I108290504 |
| locations[1].license | other-oa |
| locations[1].pdf_url | |
| locations[1].version | submittedVersion |
| locations[1].raw_type | info:eu-repo/semantics/conferenceObject |
| locations[1].license_id | https://openalex.org/licenses/other-oa |
| locations[1].is_accepted | False |
| locations[1].is_published | False |
| locations[1].raw_source_name | |
| locations[1].landing_page_url | https://ieeexplore.ieee.org/document/8400713 |
| locations[2].id | pmh:oai:eprints.soton.ac.uk:423091 |
| locations[2].is_oa | False |
| locations[2].source.id | https://openalex.org/S4306401019 |
| locations[2].source.issn | |
| locations[2].source.type | repository |
| locations[2].source.is_oa | False |
| locations[2].source.issn_l | |
| locations[2].source.is_core | False |
| locations[2].source.is_in_doaj | False |
| locations[2].source.display_name | ePrints Soton (University of Southampton) |
| locations[2].source.host_organization | https://openalex.org/I43439940 |
| locations[2].source.host_organization_name | University of Southampton |
| locations[2].source.host_organization_lineage | https://openalex.org/I43439940 |
| locations[2].license | |
| locations[2].pdf_url | |
| locations[2].version | submittedVersion |
| locations[2].raw_type | Conference or Workshop Item |
| locations[2].license_id | |
| locations[2].is_accepted | False |
| locations[2].is_published | False |
| locations[2].raw_source_name | |
| locations[2].landing_page_url | https://eprints.soton.ac.uk/423091/ |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5076546330 |
| authorships[0].author.orcid | https://orcid.org/0000-0002-9487-378X |
| authorships[0].author.display_name | Daniele Rossi |
| authorships[0].countries | GB |
| authorships[0].affiliations[0].institution_ids | https://openalex.org/I141584323 |
| authorships[0].affiliations[0].raw_affiliation_string | School of Engineering and Technology, University of Hertfordshire, UK |
| authorships[0].institutions[0].id | https://openalex.org/I141584323 |
| authorships[0].institutions[0].ror | https://ror.org/0267vjk41 |
| authorships[0].institutions[0].type | education |
| authorships[0].institutions[0].lineage | https://openalex.org/I141584323 |
| authorships[0].institutions[0].country_code | GB |
| authorships[0].institutions[0].display_name | University of Hertfordshire |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | Daniele Rossi |
| authorships[0].is_corresponding | False |
| authorships[0].raw_affiliation_strings | School of Engineering and Technology, University of Hertfordshire, UK |
| authorships[1].author.id | https://openalex.org/A5021612104 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-3980-3746 |
| authorships[1].author.display_name | Vasileios Tenentes |
| authorships[1].countries | GB |
| authorships[1].affiliations[0].institution_ids | https://openalex.org/I43439940 |
| authorships[1].affiliations[0].raw_affiliation_string | Dept. of Electronics and Computer Science, University of Southampton, UK |
| authorships[1].institutions[0].id | https://openalex.org/I43439940 |
| authorships[1].institutions[0].ror | https://ror.org/01ryk1543 |
| authorships[1].institutions[0].type | education |
| authorships[1].institutions[0].lineage | https://openalex.org/I43439940 |
| authorships[1].institutions[0].country_code | GB |
| authorships[1].institutions[0].display_name | University of Southampton |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | Vasileios Tenentes |
| authorships[1].is_corresponding | False |
| authorships[1].raw_affiliation_strings | Dept. of Electronics and Computer Science, University of Southampton, UK |
| authorships[2].author.id | https://openalex.org/A5107854382 |
| authorships[2].author.orcid | https://orcid.org/0000-0002-5720-0607 |
| authorships[2].author.display_name | Saqib Khursheed |
| authorships[2].countries | GB |
| authorships[2].affiliations[0].institution_ids | https://openalex.org/I146655781 |
| authorships[2].affiliations[0].raw_affiliation_string | Dept. of Electrical engineering & Electronics, University of Liverpool, UK |
| authorships[2].institutions[0].id | https://openalex.org/I146655781 |
| authorships[2].institutions[0].ror | https://ror.org/04xs57h96 |
| authorships[2].institutions[0].type | education |
| authorships[2].institutions[0].lineage | https://openalex.org/I146655781 |
| authorships[2].institutions[0].country_code | GB |
| authorships[2].institutions[0].display_name | University of Liverpool |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | Saqib Khursheed |
| authorships[2].is_corresponding | False |
| authorships[2].raw_affiliation_strings | Dept. of Electrical engineering & Electronics, University of Liverpool, UK |
| authorships[3].author.id | https://openalex.org/A5077101123 |
| authorships[3].author.orcid | https://orcid.org/0000-0001-9208-8262 |
| authorships[3].author.display_name | S.M. Reddy |
| authorships[3].countries | US |
| authorships[3].affiliations[0].institution_ids | https://openalex.org/I126307644 |
| authorships[3].affiliations[0].raw_affiliation_string | College of Engineering, University of Iowa, USA |
| authorships[3].institutions[0].id | https://openalex.org/I126307644 |
| authorships[3].institutions[0].ror | https://ror.org/036jqmy94 |
| authorships[3].institutions[0].type | education |
| authorships[3].institutions[0].lineage | https://openalex.org/I126307644 |
| authorships[3].institutions[0].country_code | US |
| authorships[3].institutions[0].display_name | University of Iowa |
| authorships[3].author_position | last |
| authorships[3].raw_author_name | Sudhakar M. Reddy |
| authorships[3].is_corresponding | False |
| authorships[3].raw_affiliation_strings | College of Engineering, University of Iowa, USA |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://ieeexplore.ieee.org/document/8400713 |
| open_access.oa_status | green |
| open_access.any_repository_has_fulltext | False |
| created_date | 2018-07-10T00:00:00 |
| display_name | Recycled IC detection through aging sensor |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T12122 |
| primary_topic.field.id | https://openalex.org/fields/17 |
| primary_topic.field.display_name | Computer Science |
| primary_topic.score | 0.9998000264167786 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/1708 |
| primary_topic.subfield.display_name | Hardware and Architecture |
| primary_topic.display_name | Physical Unclonable Functions (PUFs) and Hardware Security |
| related_works | https://openalex.org/W2748952813, https://openalex.org/W2534928293, https://openalex.org/W2150099345, https://openalex.org/W3004580327, https://openalex.org/W1490077415, https://openalex.org/W2160318243, https://openalex.org/W4293463510, https://openalex.org/W2182874356, https://openalex.org/W3215142653, https://openalex.org/W1487051936 |
| cited_by_count | 11 |
| counts_by_year[0].year | 2025 |
| counts_by_year[0].cited_by_count | 2 |
| counts_by_year[1].year | 2024 |
| counts_by_year[1].cited_by_count | 1 |
| counts_by_year[2].year | 2021 |
| counts_by_year[2].cited_by_count | 6 |
| counts_by_year[3].year | 2020 |
| counts_by_year[3].cited_by_count | 2 |
| locations_count | 3 |
| best_oa_location.id | pmh:oai:arpi.unipi.it:11568/1026953 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S4377196265 |
| best_oa_location.source.issn | |
| best_oa_location.source.type | repository |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | |
| best_oa_location.source.is_core | False |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | CINECA IRIS Institutial research information system (University of Pisa) |
| best_oa_location.source.host_organization | https://openalex.org/I108290504 |
| best_oa_location.source.host_organization_name | University of Pisa |
| best_oa_location.source.host_organization_lineage | https://openalex.org/I108290504 |
| best_oa_location.license | other-oa |
| best_oa_location.pdf_url | |
| best_oa_location.version | submittedVersion |
| best_oa_location.raw_type | info:eu-repo/semantics/conferenceObject |
| best_oa_location.license_id | https://openalex.org/licenses/other-oa |
| best_oa_location.is_accepted | False |
| best_oa_location.is_published | False |
| best_oa_location.raw_source_name | |
| best_oa_location.landing_page_url | https://ieeexplore.ieee.org/document/8400713 |
| primary_location.id | doi:10.1109/ets.2018.8400713 |
| primary_location.is_oa | False |
| primary_location.source | |
| primary_location.license | |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | proceedings-article |
| primary_location.license_id | |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | 2018 IEEE 23rd European Test Symposium (ETS) |
| primary_location.landing_page_url | https://doi.org/10.1109/ets.2018.8400713 |
| publication_date | 2018-05-01 |
| publication_year | 2018 |
| referenced_works | https://openalex.org/W2040298438, https://openalex.org/W2077447828, https://openalex.org/W2571247453, https://openalex.org/W1992413325, https://openalex.org/W2127655490, https://openalex.org/W2557849386, https://openalex.org/W4302083512, https://openalex.org/W2099101940, https://openalex.org/W1504193762 |
| referenced_works_count | 9 |
| abstract_inverted_index.1 | 71, 82 |
| abstract_inverted_index.a | 5, 97, 103 |
| abstract_inverted_index.3X | 79 |
| abstract_inverted_index.In | 0 |
| abstract_inverted_index.an | 13, 109 |
| abstract_inverted_index.be | 20 |
| abstract_inverted_index.by | 76 |
| abstract_inverted_index.in | 33 |
| abstract_inverted_index.is | 59, 102 |
| abstract_inverted_index.of | 38, 65, 73, 93, 108 |
| abstract_inverted_index.on | 116 |
| abstract_inverted_index.to | 8, 22, 62 |
| abstract_inverted_index.we | 3, 51 |
| abstract_inverted_index.7X. | 87 |
| abstract_inverted_index.ICs | 11, 95 |
| abstract_inverted_index.Our | 88 |
| abstract_inverted_index.The | 28 |
| abstract_inverted_index.age | 64 |
| abstract_inverted_index.and | 101 |
| abstract_inverted_index.can | 19 |
| abstract_inverted_index.its | 84 |
| abstract_inverted_index.the | 31, 34, 42, 45, 63, 66, 91 |
| abstract_inverted_index.via | 12 |
| abstract_inverted_index.aged | 110 |
| abstract_inverted_index.and, | 80 |
| abstract_inverted_index.high | 99 |
| abstract_inverted_index.more | 77, 105 |
| abstract_inverted_index.only | 70 |
| abstract_inverted_index.than | 78 |
| abstract_inverted_index.that | 53, 112 |
| abstract_inverted_index.this | 1 |
| abstract_inverted_index.time | 37, 57 |
| abstract_inverted_index.very | 98 |
| abstract_inverted_index.when | 41 |
| abstract_inverted_index.with | 96 |
| abstract_inverted_index.after | 69, 81 |
| abstract_inverted_index.aging | 16 |
| abstract_inverted_index.month | 72 |
| abstract_inverted_index.novel | 6 |
| abstract_inverted_index.power | 26, 54 |
| abstract_inverted_index.prove | 52 |
| abstract_inverted_index.sleep | 46 |
| abstract_inverted_index.which | 18 |
| abstract_inverted_index.year, | 83 |
| abstract_inverted_index.(τdV) | 58 |
| abstract_inverted_index.HSPICE | 49 |
| abstract_inverted_index.detect | 9 |
| abstract_inverted_index.device | 111 |
| abstract_inverted_index.enters | 44 |
| abstract_inverted_index.paper, | 2 |
| abstract_inverted_index.sensor | 29 |
| abstract_inverted_index.Indeed, | 68 |
| abstract_inverted_index.Through | 48 |
| abstract_inverted_index.applied | 21 |
| abstract_inverted_index.circuit | 43 |
| abstract_inverted_index.detects | 30 |
| abstract_inverted_index.enables | 90 |
| abstract_inverted_index.exceeds | 86 |
| abstract_inverted_index.gating. | 27 |
| abstract_inverted_index.network | 55 |
| abstract_inverted_index.propose | 4 |
| abstract_inverted_index.relying | 115 |
| abstract_inverted_index.sensor, | 17 |
| abstract_inverted_index.circuit. | 67 |
| abstract_inverted_index.circuits | 24 |
| abstract_inverted_index.increase | 32, 85 |
| abstract_inverted_index.on-chip, | 14 |
| abstract_inverted_index.recycled | 10, 94 |
| abstract_inverted_index.sensors. | 120 |
| abstract_inverted_index.circuits, | 40 |
| abstract_inverted_index.detection | 92 |
| abstract_inverted_index.discharge | 36, 56 |
| abstract_inverted_index.extremely | 60 |
| abstract_inverted_index.featuring | 25 |
| abstract_inverted_index.indicator | 107 |
| abstract_inverted_index.low-power | 23 |
| abstract_inverted_index.sensitive | 61, 106 |
| abstract_inverted_index.solutions | 114 |
| abstract_inverted_index.technique | 7, 89 |
| abstract_inverted_index.condition. | 47 |
| abstract_inverted_index.confidence | 100 |
| abstract_inverted_index.operation, | 74 |
| abstract_inverted_index.power-rail | 35 |
| abstract_inverted_index.alternative | 113 |
| abstract_inverted_index.degradation | 119 |
| abstract_inverted_index.performance | 118 |
| abstract_inverted_index.power-gated | 39 |
| abstract_inverted_index.considerably | 104 |
| abstract_inverted_index.fine-grained | 117 |
| abstract_inverted_index.simulations, | 50 |
| abstract_inverted_index.τdVincreases | 75 |
| abstract_inverted_index.coarse-grained | 15 |
| cited_by_percentile_year.max | 98 |
| cited_by_percentile_year.min | 90 |
| countries_distinct_count | 2 |
| institutions_distinct_count | 4 |
| sustainable_development_goals[0].id | https://metadata.un.org/sdg/7 |
| sustainable_development_goals[0].score | 0.6600000262260437 |
| sustainable_development_goals[0].display_name | Affordable and clean energy |
| citation_normalized_percentile.value | 0.86725018 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |