Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault Injection Article Swipe
Afef Kchaou
,
Sehmi Saad
,
Hatem Garrab
,
Mohsen Machhout
·
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/cryptography9030054
YOU?
·
· 2025
· Open Access
·
· DOI: https://doi.org/10.3390/cryptography9030054
This paper presents a comprehensive register transfer-level (RTL) fault injection study targeting the program counter (PC) of the LEON3 processor, a SPARC V8-compliant core widely used in safety-critical and radiation-prone embedded applications. Using the enhanced NETFI+ framework, over four million faults, including single-event upsets (SEUs), multiple-bit upsets (MBUs), and single-event transients (SETs), were systematically injected into the PC across all pipeline stages. The analysis reveals that early stages, particularly Fetch (FE), Decode (DE), Register Access (RA), and Execute (EX), are highly sensitive to SEU and MBU faults. The propagation of errors detected in the two early stages of the pipeline (FE and DE) is classified with an important percentage of halt execution and timeout traps. Intermediate stages, such as RA and EX, exhibited a higher incidence of silent data corruption and halt execution, while the Memory (ME) and Exception (XC) stages demonstrated greater resilience through fault masking. SET faults were mostly transient and masked, though they occasionally resulted in control flow anomalies. In addition to error classification, detailed trap and exception analysis was performed to characterize fault-induced failure mechanisms. The findings underscore the need for pipeline-stage-specific hardening strategies and highlight the value of simulation-based fault injection for early design validation in safety-critical embedded processors.
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.3390/cryptography9030054
- https://www.mdpi.com/2410-387X/9/3/54/pdf?version=1756291564
- OA Status
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- OpenAlex ID
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Reliability of LEON3 Processor’s Program Counter Against SEU, MBU, and SET Fault InjectionWork title
- Type
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2025Year of publication
- Publication date
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2025-08-27Full publication date if available
- Authors
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Afef Kchaou, Sehmi Saad, Hatem Garrab, Mohsen MachhoutList of authors in order
- Landing page
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https://doi.org/10.3390/cryptography9030054Publisher landing page
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https://www.mdpi.com/2410-387X/9/3/54/pdf?version=1756291564Direct link to full text PDF
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goldOpen access status per OpenAlex
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https://www.mdpi.com/2410-387X/9/3/54/pdf?version=1756291564Direct OA link when available
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Fault injection, Reliability (semiconductor), Computer science, Set (abstract data type), Embedded system, Reliability engineering, Engineering, Operating system, Programming language, Software, Physics, Power (physics), Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
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1Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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| referenced_works | https://openalex.org/W2099569658, https://openalex.org/W4294672459, https://openalex.org/W4312920563, https://openalex.org/W4406241441, https://openalex.org/W4403936809, https://openalex.org/W2185040577, https://openalex.org/W3157134994, https://openalex.org/W2044428420, https://openalex.org/W335201183, https://openalex.org/W4317039632, https://openalex.org/W4404914463, https://openalex.org/W4409213760, https://openalex.org/W2013289383, https://openalex.org/W4256477176, https://openalex.org/W2062455052, https://openalex.org/W3206774238, https://openalex.org/W4387415064, https://openalex.org/W1991588008, https://openalex.org/W2034762427, https://openalex.org/W4407921616, https://openalex.org/W4283691678, https://openalex.org/W2252608406, https://openalex.org/W3133015476, https://openalex.org/W2953488518, https://openalex.org/W2057151571, https://openalex.org/W1587166803, https://openalex.org/W2749520459, https://openalex.org/W1987858661, https://openalex.org/W4310153678, https://openalex.org/W3072699177, https://openalex.org/W3128203310, https://openalex.org/W4382941062, https://openalex.org/W4388723347, https://openalex.org/W1983397967, https://openalex.org/W2080414204, https://openalex.org/W2974242627, https://openalex.org/W3093836561, https://openalex.org/W2797382335, https://openalex.org/W2951363666, https://openalex.org/W2408771053, https://openalex.org/W3003481615, https://openalex.org/W2559930489, https://openalex.org/W4392642388, https://openalex.org/W2062057212, https://openalex.org/W2608323989, https://openalex.org/W1979903046, https://openalex.org/W2559705978, https://openalex.org/W4229484812, https://openalex.org/W2296343188, https://openalex.org/W2144233431, https://openalex.org/W2895268534, https://openalex.org/W2338817557, https://openalex.org/W2029450858, https://openalex.org/W2295881776, https://openalex.org/W2004979398, https://openalex.org/W2028687031, https://openalex.org/W2594660560, https://openalex.org/W2053166527, https://openalex.org/W2560082747, https://openalex.org/W2043701226, https://openalex.org/W2129886214, https://openalex.org/W2105215328, https://openalex.org/W4295364813, https://openalex.org/W4200137232, https://openalex.org/W4408551155, https://openalex.org/W3080144001, https://openalex.org/W2741405272, https://openalex.org/W2121043529, https://openalex.org/W130690310 |
| referenced_works_count | 69 |
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| abstract_inverted_index.SEU | 83 |
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