Research on spatial uniformity test of grating imaging spectrometer Article Swipe
CAO Pan
,
Shijun Xu
,
Xiaohong Shi
,
Yuan Liang
,
Chunlian Zhan
·
YOU?
·
· 2020
· Open Access
·
· DOI: https://doi.org/10.5768/jao202041.0203003
YOU?
·
· 2020
· Open Access
·
· DOI: https://doi.org/10.5768/jao202041.0203003
空间均匀性是成像光谱仪辐射定标的核心参数之一。通过对国内外均匀性测试方法研究,提出采用空间分布法对光栅式成像光谱仪的空间均匀性进行测试研究。该方法能准确给出各个位置点信号响应的详细分布,对于提高并改善光栅式成像光谱仪的图谱质量具有重要的意义。空间分布法建立在高稳定性、高均匀性标准光源的基础上,由计算机软件对测试结果进行图谱分离,提取同波长下空间响应信号获得光栅式成像光谱仪的空间均匀性。最后分析了空间均匀性测量不确定度的影响因素,并分析了空间均匀性对绝对辐射定标和光谱精度的影响。
Related Topics
Concepts
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.5768/jao202041.0203003
- OA Status
- hybrid
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W3139474825
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
-
https://openalex.org/W3139474825Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.5768/jao202041.0203003Digital Object Identifier
- Title
-
Research on spatial uniformity test of grating imaging spectrometerWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2020Year of publication
- Publication date
-
2020-01-01Full publication date if available
- Authors
-
CAO Pan, Shijun Xu, Xiaohong Shi, Yuan Liang, Chunlian ZhanList of authors in order
- Landing page
-
https://doi.org/10.5768/jao202041.0203003Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
hybridOpen access status per OpenAlex
- OA URL
-
https://doi.org/10.5768/jao202041.0203003Direct OA link when available
- Concepts
-
Spectrometer, Imaging spectrometer, Grating, Optics, Remote sensing, Materials science, Physics, GeologyTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
0Total citation count in OpenAlex
- Related works (count)
-
10Other works algorithmically related by OpenAlex
Full payload
| id | https://openalex.org/W3139474825 |
|---|---|
| doi | https://doi.org/10.5768/jao202041.0203003 |
| ids.doi | https://doi.org/10.5768/jao202041.0203003 |
| ids.mag | 3139474825 |
| ids.openalex | https://openalex.org/W3139474825 |
| fwci | 0.0 |
| type | article |
| title | Research on spatial uniformity test of grating imaging spectrometer |
| biblio.issue | 2 |
| biblio.volume | 41 |
| biblio.last_page | 360 |
| biblio.first_page | 354 |
| topics[0].id | https://openalex.org/T14257 |
| topics[0].field.id | https://openalex.org/fields/22 |
| topics[0].field.display_name | Engineering |
| topics[0].score | 0.9696999788284302 |
| topics[0].domain.id | https://openalex.org/domains/3 |
| topics[0].domain.display_name | Physical Sciences |
| topics[0].subfield.id | https://openalex.org/subfields/2208 |
| topics[0].subfield.display_name | Electrical and Electronic Engineering |
| topics[0].display_name | Advanced Measurement and Detection Methods |
| topics[1].id | https://openalex.org/T13928 |
| topics[1].field.id | https://openalex.org/fields/22 |
| topics[1].field.display_name | Engineering |
| topics[1].score | 0.9071999788284302 |
| topics[1].domain.id | https://openalex.org/domains/3 |
| topics[1].domain.display_name | Physical Sciences |
| topics[1].subfield.id | https://openalex.org/subfields/2204 |
| topics[1].subfield.display_name | Biomedical Engineering |
| topics[1].display_name | Advanced Sensor Technologies Research |
| is_xpac | False |
| apc_list | |
| apc_paid | |
| concepts[0].id | https://openalex.org/C33390570 |
| concepts[0].level | 2 |
| concepts[0].score | 0.7610664367675781 |
| concepts[0].wikidata | https://www.wikidata.org/wiki/Q188463 |
| concepts[0].display_name | Spectrometer |
| concepts[1].id | https://openalex.org/C183852935 |
| concepts[1].level | 3 |
| concepts[1].score | 0.7440674901008606 |
| concepts[1].wikidata | https://www.wikidata.org/wiki/Q6002848 |
| concepts[1].display_name | Imaging spectrometer |
| concepts[2].id | https://openalex.org/C2777813233 |
| concepts[2].level | 2 |
| concepts[2].score | 0.6430221796035767 |
| concepts[2].wikidata | https://www.wikidata.org/wiki/Q1527816 |
| concepts[2].display_name | Grating |
| concepts[3].id | https://openalex.org/C120665830 |
| concepts[3].level | 1 |
| concepts[3].score | 0.6144394278526306 |
| concepts[3].wikidata | https://www.wikidata.org/wiki/Q14620 |
| concepts[3].display_name | Optics |
| concepts[4].id | https://openalex.org/C62649853 |
| concepts[4].level | 1 |
| concepts[4].score | 0.4533866345882416 |
| concepts[4].wikidata | https://www.wikidata.org/wiki/Q199687 |
| concepts[4].display_name | Remote sensing |
| concepts[5].id | https://openalex.org/C192562407 |
| concepts[5].level | 0 |
| concepts[5].score | 0.39327991008758545 |
| concepts[5].wikidata | https://www.wikidata.org/wiki/Q228736 |
| concepts[5].display_name | Materials science |
| concepts[6].id | https://openalex.org/C121332964 |
| concepts[6].level | 0 |
| concepts[6].score | 0.2686709463596344 |
| concepts[6].wikidata | https://www.wikidata.org/wiki/Q413 |
| concepts[6].display_name | Physics |
| concepts[7].id | https://openalex.org/C127313418 |
| concepts[7].level | 0 |
| concepts[7].score | 0.1397877335548401 |
| concepts[7].wikidata | https://www.wikidata.org/wiki/Q1069 |
| concepts[7].display_name | Geology |
| keywords[0].id | https://openalex.org/keywords/spectrometer |
| keywords[0].score | 0.7610664367675781 |
| keywords[0].display_name | Spectrometer |
| keywords[1].id | https://openalex.org/keywords/imaging-spectrometer |
| keywords[1].score | 0.7440674901008606 |
| keywords[1].display_name | Imaging spectrometer |
| keywords[2].id | https://openalex.org/keywords/grating |
| keywords[2].score | 0.6430221796035767 |
| keywords[2].display_name | Grating |
| keywords[3].id | https://openalex.org/keywords/optics |
| keywords[3].score | 0.6144394278526306 |
| keywords[3].display_name | Optics |
| keywords[4].id | https://openalex.org/keywords/remote-sensing |
| keywords[4].score | 0.4533866345882416 |
| keywords[4].display_name | Remote sensing |
| keywords[5].id | https://openalex.org/keywords/materials-science |
| keywords[5].score | 0.39327991008758545 |
| keywords[5].display_name | Materials science |
| keywords[6].id | https://openalex.org/keywords/physics |
| keywords[6].score | 0.2686709463596344 |
| keywords[6].display_name | Physics |
| keywords[7].id | https://openalex.org/keywords/geology |
| keywords[7].score | 0.1397877335548401 |
| keywords[7].display_name | Geology |
| language | en |
| locations[0].id | doi:10.5768/jao202041.0203003 |
| locations[0].is_oa | True |
| locations[0].source.id | https://openalex.org/S2764877685 |
| locations[0].source.issn | 1002-2082 |
| locations[0].source.type | journal |
| locations[0].source.is_oa | False |
| locations[0].source.issn_l | 1002-2082 |
| locations[0].source.is_core | False |
| locations[0].source.is_in_doaj | False |
| locations[0].source.display_name | Journal of Applied Optics |
| locations[0].source.host_organization | https://openalex.org/P4323862650 |
| locations[0].source.host_organization_name | ying yong guang xue bian ji bu |
| locations[0].source.host_organization_lineage | https://openalex.org/P4323862650 |
| locations[0].license | cc-by |
| locations[0].pdf_url | |
| locations[0].version | publishedVersion |
| locations[0].raw_type | journal-article |
| locations[0].license_id | https://openalex.org/licenses/cc-by |
| locations[0].is_accepted | True |
| locations[0].is_published | True |
| locations[0].raw_source_name | Journal of Applied Optics |
| locations[0].landing_page_url | https://doi.org/10.5768/jao202041.0203003 |
| indexed_in | crossref |
| authorships[0].author.id | https://openalex.org/A5067166453 |
| authorships[0].author.orcid | |
| authorships[0].author.display_name | CAO Pan |
| authorships[0].author_position | first |
| authorships[0].raw_author_name | CAO Pan |
| authorships[0].is_corresponding | False |
| authorships[1].author.id | https://openalex.org/A5101995162 |
| authorships[1].author.orcid | https://orcid.org/0000-0002-8120-8035 |
| authorships[1].author.display_name | Shijun Xu |
| authorships[1].author_position | middle |
| authorships[1].raw_author_name | XU Shijun |
| authorships[1].is_corresponding | False |
| authorships[2].author.id | https://openalex.org/A5100541869 |
| authorships[2].author.orcid | |
| authorships[2].author.display_name | Xiaohong Shi |
| authorships[2].author_position | middle |
| authorships[2].raw_author_name | SHI Xiaohong |
| authorships[2].is_corresponding | False |
| authorships[3].author.id | https://openalex.org/A5101861363 |
| authorships[3].author.orcid | https://orcid.org/0000-0001-6858-5023 |
| authorships[3].author.display_name | Yuan Liang |
| authorships[3].author_position | middle |
| authorships[3].raw_author_name | YUAN Liang |
| authorships[3].is_corresponding | False |
| authorships[4].author.id | https://openalex.org/A5005002083 |
| authorships[4].author.orcid | |
| authorships[4].author.display_name | Chunlian Zhan |
| authorships[4].author_position | last |
| authorships[4].raw_author_name | ZHAN Chunlian |
| authorships[4].is_corresponding | False |
| has_content.pdf | False |
| has_content.grobid_xml | False |
| is_paratext | False |
| open_access.is_oa | True |
| open_access.oa_url | https://doi.org/10.5768/jao202041.0203003 |
| open_access.oa_status | hybrid |
| open_access.any_repository_has_fulltext | False |
| created_date | 2025-10-10T00:00:00 |
| display_name | Research on spatial uniformity test of grating imaging spectrometer |
| has_fulltext | False |
| is_retracted | False |
| updated_date | 2025-11-06T03:46:38.306776 |
| primary_topic.id | https://openalex.org/T14257 |
| primary_topic.field.id | https://openalex.org/fields/22 |
| primary_topic.field.display_name | Engineering |
| primary_topic.score | 0.9696999788284302 |
| primary_topic.domain.id | https://openalex.org/domains/3 |
| primary_topic.domain.display_name | Physical Sciences |
| primary_topic.subfield.id | https://openalex.org/subfields/2208 |
| primary_topic.subfield.display_name | Electrical and Electronic Engineering |
| primary_topic.display_name | Advanced Measurement and Detection Methods |
| related_works | https://openalex.org/W2019335219, https://openalex.org/W1610874655, https://openalex.org/W3197418586, https://openalex.org/W3109000664, https://openalex.org/W2155174779, https://openalex.org/W2038488252, https://openalex.org/W3000675426, https://openalex.org/W2133239258, https://openalex.org/W1965007223, https://openalex.org/W2029028893 |
| cited_by_count | 0 |
| locations_count | 1 |
| best_oa_location.id | doi:10.5768/jao202041.0203003 |
| best_oa_location.is_oa | True |
| best_oa_location.source.id | https://openalex.org/S2764877685 |
| best_oa_location.source.issn | 1002-2082 |
| best_oa_location.source.type | journal |
| best_oa_location.source.is_oa | False |
| best_oa_location.source.issn_l | 1002-2082 |
| best_oa_location.source.is_core | False |
| best_oa_location.source.is_in_doaj | False |
| best_oa_location.source.display_name | Journal of Applied Optics |
| best_oa_location.source.host_organization | https://openalex.org/P4323862650 |
| best_oa_location.source.host_organization_name | ying yong guang xue bian ji bu |
| best_oa_location.source.host_organization_lineage | https://openalex.org/P4323862650 |
| best_oa_location.license | cc-by |
| best_oa_location.pdf_url | |
| best_oa_location.version | publishedVersion |
| best_oa_location.raw_type | journal-article |
| best_oa_location.license_id | https://openalex.org/licenses/cc-by |
| best_oa_location.is_accepted | True |
| best_oa_location.is_published | True |
| best_oa_location.raw_source_name | Journal of Applied Optics |
| best_oa_location.landing_page_url | https://doi.org/10.5768/jao202041.0203003 |
| primary_location.id | doi:10.5768/jao202041.0203003 |
| primary_location.is_oa | True |
| primary_location.source.id | https://openalex.org/S2764877685 |
| primary_location.source.issn | 1002-2082 |
| primary_location.source.type | journal |
| primary_location.source.is_oa | False |
| primary_location.source.issn_l | 1002-2082 |
| primary_location.source.is_core | False |
| primary_location.source.is_in_doaj | False |
| primary_location.source.display_name | Journal of Applied Optics |
| primary_location.source.host_organization | https://openalex.org/P4323862650 |
| primary_location.source.host_organization_name | ying yong guang xue bian ji bu |
| primary_location.source.host_organization_lineage | https://openalex.org/P4323862650 |
| primary_location.license | cc-by |
| primary_location.pdf_url | |
| primary_location.version | publishedVersion |
| primary_location.raw_type | journal-article |
| primary_location.license_id | https://openalex.org/licenses/cc-by |
| primary_location.is_accepted | True |
| primary_location.is_published | True |
| primary_location.raw_source_name | Journal of Applied Optics |
| primary_location.landing_page_url | https://doi.org/10.5768/jao202041.0203003 |
| publication_date | 2020-01-01 |
| publication_year | 2020 |
| referenced_works_count | 0 |
| abstract_inverted_index.空间均匀性是成像光谱仪辐射定标的核心参数之一。通过对国内外均匀性测试方法研究,提出采用空间分布法对光栅式成像光谱仪的空间均匀性进行测试研究。该方法能准确给出各个位置点信号响应的详细分布,对于提高并改善光栅式成像光谱仪的图谱质量具有重要的意义。空间分布法建立在高稳定性、高均匀性标准光源的基础上,由计算机软件对测试结果进行图谱分离,提取同波长下空间响应信号获得光栅式成像光谱仪的空间均匀性。最后分析了空间均匀性测量不确定度的影响因素,并分析了空间均匀性对绝对辐射定标和光谱精度的影响。 | 0 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 5 |
| citation_normalized_percentile.value | 0.17146424 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |