Selection of Optimal Path Control Algorithms for Probe Heads Used on Five-Axis Measuring Systems Article Swipe

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Adam Gąska , Piotr Gąska , Maciej Gruza , Jerzy Sładek ·

YOU? · · 2018 · Open Access · · DOI: https://doi.org/10.3390/app8122455

The utilization of rotational movements of a probing system during points measurementscontributes to the reduction of measurement duration and increases measurement repeatability.However, knowledge on such behavior and accuracy of probing systems is still unsatisfactory.Machines combined with articulating probing systems that have the ability of continuous indexationbecome redundant systems, which means that the same points can be measured using almost infinitemutual configurations of the machine and probe stylus orientations. Therefore, the proper selectionof inspection path planning method becomes one of the main factors affecting the accuracy of themeasurement. It is possible to assess the impact of this factor on the accuracy of the measurementby comparing the results of the measurements of gauge elements, which are done using differentpath controlling algorithms. After that, the best method for basic measuring tasks can be chosenin order to reduce measurement errors. Measurements of the multi-feature check gauge, using thedefault method for path planning and those chosen on the basis of described experiments, indicatesthat the improvement of accuracy may reach several microns. Results presented in this paper can bedirectly transferred to similar systems and measuring tasks, which are commonly met in industrialand scientific practice.

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Stylus Computer science Gauge (firearms) Algorithm Path (computing) Repeatability System of measurement Computer vision Mathematics Statistics Physics Programming language Astronomy History Archaeology

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Type: article
Language: en
Landing Page: https://doi.org/10.3390/app8122455
PDF: https://www.mdpi.com/2076-3417/8/12/2455/pdf?version=1543716032
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DOI: https://doi.org/10.3390/app8122455

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Title: Selection of Optimal Path Control Algorithms for Probe Heads Used on Five-Axis Measuring Systems

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Language: en

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Publication year: 2018

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Publication date: 2018-12-02

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Authors: Adam Gąska, Piotr Gąska, Maciej Gruza, Jerzy Sładek

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Landing page: https://doi.org/10.3390/app8122455

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Concepts: Stylus, Computer science, Gauge (firearms), Algorithm, Path (computing), Repeatability, System of measurement, Computer vision, Mathematics, Statistics, Physics, Programming language, Astronomy, History, Archaeology

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