Soft error-mitigating semiconductor design system and associated methods Article Swipe
A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs, as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.
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Metadata
- Type
- article
- Language
- en
- Landing Page
- https://www.osti.gov/biblio/1987180
- https://www.osti.gov/biblio/1987180
- OA Status
- green
- Cited By
- 1
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4389501945
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4389501945Canonical identifier for this work in OpenAlex
- Title
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Soft error-mitigating semiconductor design system and associated methodsWork title
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2023Year of publication
- Publication date
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2023-08-21Full publication date if available
- Authors
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Sandeep Miryala, J. Hoff, G. DeptuchList of authors in order
- Landing page
-
https://www.osti.gov/biblio/1987180Publisher landing page
- PDF URL
-
https://www.osti.gov/biblio/1987180Direct link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
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https://www.osti.gov/biblio/1987180Direct OA link when available
- Concepts
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Computer science, Soft error, Semiconductor, Reliability engineering, Engineering, Electronic engineering, Electrical engineeringTop concepts (fields/topics) attached by OpenAlex
- Cited by
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1Total citation count in OpenAlex
- Citations by year (recent)
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2024: 1Per-year citation counts (last 5 years)
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10Other works algorithmically related by OpenAlex
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