Spatially Resolved Conductivity of Rectangular Interconnects considering Surface Scattering -- Part I: Physical Modeling Article Swipe
Xinkang Chen
,
Sumeet Kumar Gupta
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2401.14366
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2401.14366
Accurate modeling of interconnect conductivity is important for performance evaluation of chips in advanced technologies. Surface scattering in interconnects is usually treated by using Fuchs-Sondheimer (FS) approach. While the FS model offer explicit inclusion of the physical parameters, it lacks spatial dependence of conductivity across the interconnect cross-section. To capture the space-dependency of conductivity, an empirical modeling approach based on "cosh" function has been proposed, but it lacks physical insights. In this work, we present a 2D spatially resolved FS (SRFS) model for rectangular interconnects derived from the Boltzmann transport equations. The proposed SRFS model for surface scattering offers both spatial dependence and explicit relation of conductivity to physical parameters such as mean free path and specularity of electrons and interconnect geometry. We highlight the importance of physics-based spatially resolved conductivity model by showing the differences in the spatial profiles between the proposed physical approach and the previous empirical approach. In Part II of this work, we build upon the SRFS approach to propose a compact model for spatially-resolved conductivity accounting for surface scattering in rectangular interconnects.
Related Topics
Concepts
Scattering
Specularity
Conductivity
Boltzmann equation
Interconnection
Work (physics)
Mean free path
Surface (topology)
Statistical physics
Computation
Computational physics
Materials science
Physics
Computer science
Optics
Mathematics
Geometry
Algorithm
Quantum mechanics
Computer network
Specular reflection
Metadata
- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2401.14366
- https://arxiv.org/pdf/2401.14366
- OA Status
- green
- References
- 23
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4391272953
All OpenAlex metadata
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https://openalex.org/W4391272953Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2401.14366Digital Object Identifier
- Title
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Spatially Resolved Conductivity of Rectangular Interconnects considering Surface Scattering -- Part I: Physical ModelingWork title
- Type
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preprintOpenAlex work type
- Language
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enPrimary language
- Publication year
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2024Year of publication
- Publication date
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2024-01-25Full publication date if available
- Authors
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Xinkang Chen, Sumeet Kumar GuptaList of authors in order
- Landing page
-
https://arxiv.org/abs/2401.14366Publisher landing page
- PDF URL
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https://arxiv.org/pdf/2401.14366Direct link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
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greenOpen access status per OpenAlex
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https://arxiv.org/pdf/2401.14366Direct OA link when available
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Scattering, Specularity, Conductivity, Boltzmann equation, Interconnection, Work (physics), Mean free path, Surface (topology), Statistical physics, Computation, Computational physics, Materials science, Physics, Computer science, Optics, Mathematics, Geometry, Algorithm, Quantum mechanics, Computer network, Specular reflectionTop concepts (fields/topics) attached by OpenAlex
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0Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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| citation_normalized_percentile.is_in_top_10_percent | False |