Spatially Resolved Conductivity of Rectangular Interconnects considering Surface Scattering -- Part II: Circuit-Compatible Modeling Article Swipe
Xinkang Chen
,
Sumeet Kumar Gupta
·
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2401.14374
YOU?
·
· 2024
· Open Access
·
· DOI: https://doi.org/10.48550/arxiv.2401.14374
Interconnect conductivity modeling is a critical aspect for modern chip design. Surface scattering -- an important scattering mechanism in scaled interconnects is usually captured using Fuchs-Sondheimer (FS) model which offers the average behavior of the interconnect. However, to support the modern interconnect structures (such as tapered geometries), modeling spatial dependency of conductivity becomes important. In Part I of this work, we presented a spatially resolved FS (SRFS) model for rectangular interconnects derived from the fundamental FS approach. While the proposed SRFS model offers both spatial-dependency of conductivity and its direct relationship with the physical parameters, its complex expression is not suitable for incorporation in circuit simulations. In this part, we build upon our SRFS model to propose a circuit-compatible conductivity model for rectangular interconnects accounting for 2D surface scattering. The proposed circuit-compatible model offers spatial resolution of conductivity as well as explicit dependence on the physical parameters such as electron mean free path ($λ_0$), specularity ($p$) and interconnect geometry. We validate our circuit-compatible model over a range of interconnect width/height (and $λ_0$) and p values and show a close match with the physical SRFS model proposed in Part I (with error < 0.7%). We also compare our circuit-compatible model with a previous spatially resolved analytical model (appropriately modified for a fair comparison) and show that our model captures the spatial resolution of conductivity and the dependence on physical parameters more accurately. Finally, we present a semi-analytical equation for the average conductivity based on our circuit-compatible model.
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- Type
- preprint
- Language
- en
- Landing Page
- http://arxiv.org/abs/2401.14374
- https://arxiv.org/pdf/2401.14374
- OA Status
- green
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4391272949
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Raw OpenAlex JSON
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https://openalex.org/W4391272949Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.48550/arxiv.2401.14374Digital Object Identifier
- Title
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Spatially Resolved Conductivity of Rectangular Interconnects considering Surface Scattering -- Part II: Circuit-Compatible ModelingWork title
- Type
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preprintOpenAlex work type
- Language
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enPrimary language
- Publication year
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2024Year of publication
- Publication date
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2024-01-25Full publication date if available
- Authors
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Xinkang Chen, Sumeet Kumar GuptaList of authors in order
- Landing page
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https://arxiv.org/abs/2401.14374Publisher landing page
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https://arxiv.org/pdf/2401.14374Direct link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
-
greenOpen access status per OpenAlex
- OA URL
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https://arxiv.org/pdf/2401.14374Direct OA link when available
- Concepts
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Scattering, Interconnection, Conductivity, Equivalent circuit, Materials science, Electronic engineering, Computational physics, Physics, Optics, Computer science, Engineering, Telecommunications, Quantum mechanics, VoltageTop concepts (fields/topics) attached by OpenAlex
- Cited by
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0Total citation count in OpenAlex
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10Other works algorithmically related by OpenAlex
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| abstract_inverted_index.Interconnect | 0 |
| abstract_inverted_index.conductivity | 1, 51, 86, 119, 137, 222, 240 |
| abstract_inverted_index.geometries), | 46 |
| abstract_inverted_index.interconnect | 41, 157, 168 |
| abstract_inverted_index.relationship | 90 |
| abstract_inverted_index.simulations. | 105 |
| abstract_inverted_index.width/height | 169 |
| abstract_inverted_index.incorporation | 102 |
| abstract_inverted_index.interconnect. | 35 |
| abstract_inverted_index.interconnects | 20, 70, 123 |
| abstract_inverted_index.(appropriately | 206 |
| abstract_inverted_index.semi-analytical | 235 |
| abstract_inverted_index.Fuchs-Sondheimer | 25 |
| abstract_inverted_index.circuit-compatible | 118, 131, 162, 197, 244 |
| abstract_inverted_index.spatial-dependency | 84 |
| cited_by_percentile_year | |
| countries_distinct_count | 0 |
| institutions_distinct_count | 2 |
| citation_normalized_percentile.value | 0.01498629 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |