Special Issue on Reliability Article Swipe
Souvik Mahapatra
,
Kevin J. Chen
,
B. Kaczer
,
Lucio Pancheri
,
Elyse Rosenbaum
,
Chandra Mouli
,
Hei Wong
,
A. Kerber
,
Christian Monzio Compagnoni
,
R.J. Koval
,
Gaudenzio Meneghesso
,
David C. Sheridan
,
S. Ramey
,
Runsheng Wang
,
J. H. Stathis
·
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.1109/ted.2019.2943987
YOU?
·
· 2019
· Open Access
·
· DOI: https://doi.org/10.1109/ted.2019.2943987
Reliability is an important consideration during semiconductor technology development, which ensures that the performances of devices, circuits, and systems are maintained over a specified period of time, leading to successful products. Device reliability is at the core of overall product reliability, which continues to remain an important area of research and has attracted the attention of IEEE Transactions on Electron Devices (T-ED) authors and readers throughout the years. Device reliability can be classified into two broad areas: gradual drift of device performance over time or sudden failure, and both are of importance for logic, memory, RF, and power devices. Different aspects of device reliability are usually reported, such as the development of electrical or physical characterization methods, investigation and modeling of a particular phenomenon, impact of material and processes on reliability, and development of reliability tolerant technologies.
Related Topics
Concepts
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1109/ted.2019.2943987
- https://ieeexplore.ieee.org/ielx7/16/8886611/08886623.pdf
- OA Status
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- Cited By
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- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W2982301576
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W2982301576Canonical identifier for this work in OpenAlex
- DOI
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https://doi.org/10.1109/ted.2019.2943987Digital Object Identifier
- Title
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Special Issue on ReliabilityWork title
- Type
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articleOpenAlex work type
- Language
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enPrimary language
- Publication year
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2019Year of publication
- Publication date
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2019-10-31Full publication date if available
- Authors
-
Souvik Mahapatra, Kevin J. Chen, B. Kaczer, Lucio Pancheri, Elyse Rosenbaum, Chandra Mouli, Hei Wong, A. Kerber, Christian Monzio Compagnoni, R.J. Koval, Gaudenzio Meneghesso, David C. Sheridan, S. Ramey, Runsheng Wang, J. H. StathisList of authors in order
- Landing page
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https://doi.org/10.1109/ted.2019.2943987Publisher landing page
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https://ieeexplore.ieee.org/ielx7/16/8886611/08886623.pdfDirect link to full text PDF
- Open access
-
YesWhether a free full text is available
- OA status
-
bronzeOpen access status per OpenAlex
- OA URL
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https://ieeexplore.ieee.org/ielx7/16/8886611/08886623.pdfDirect OA link when available
- Concepts
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Reliability (semiconductor), Reliability engineering, Computer science, Engineering, Power (physics), Quantum mechanics, PhysicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
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2Total citation count in OpenAlex
- Related works (count)
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10Other works algorithmically related by OpenAlex
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