Steady-state junction current distribution in p-n GaN diodes measured using low-energy electron microscopy (LEEM) Article Swipe
Wan Ying Ho
,
Cameron Johnson
,
Tanay Tak
,
Mylène Sauty
,
Yi Chao Chow
,
Shuji Nakamura
,
Andreas K. Schmid
,
Jacques Peretti
,
Claude Weisbuch
,
James S. Speck
·
YOU?
·
· 2023
· Open Access
·
· DOI: https://doi.org/10.1063/5.0153947
YOU?
·
· 2023
· Open Access
·
· DOI: https://doi.org/10.1063/5.0153947
We report on the measurement of the lateral distribution of the junction current of an electrical biased p-n GaN diode by electron emission microscopy using a low-energy electron microscope. The vacuum level at the surface of the diode was lowered by deposition of cesium to achieve negative electron affinity, allowing overflow electrons at the surface of the biased diodes to be emitted and their spatial distribution imaged. The results were compared to the literature, and a good match with analytical solutions by Joyce and Wemple [J. Appl. Phys. 41, 3818 (1970)] was obtained.
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- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1063/5.0153947
- https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0153947/18047012/031101_1_5.0153947.pdf
- OA Status
- bronze
- Cited By
- 4
- References
- 25
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4384559451
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Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4384559451Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1063/5.0153947Digital Object Identifier
- Title
-
Steady-state junction current distribution in p-n GaN diodes measured using low-energy electron microscopy (LEEM)Work title
- Type
-
articleOpenAlex work type
- Language
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enPrimary language
- Publication year
-
2023Year of publication
- Publication date
-
2023-07-17Full publication date if available
- Authors
-
Wan Ying Ho, Cameron Johnson, Tanay Tak, Mylène Sauty, Yi Chao Chow, Shuji Nakamura, Andreas K. Schmid, Jacques Peretti, Claude Weisbuch, James S. SpeckList of authors in order
- Landing page
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https://doi.org/10.1063/5.0153947Publisher landing page
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https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0153947/18047012/031101_1_5.0153947.pdfDirect link to full text PDF
- Open access
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YesWhether a free full text is available
- OA status
-
bronzeOpen access status per OpenAlex
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https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0153947/18047012/031101_1_5.0153947.pdfDirect OA link when available
- Concepts
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Diode, Low-energy electron microscopy, Electron, Electron microscope, Optoelectronics, Materials science, Wide-bandgap semiconductor, Microscopy, Chemistry, Atomic physics, Optics, Physics, Quantum mechanicsTop concepts (fields/topics) attached by OpenAlex
- Cited by
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4Total citation count in OpenAlex
- Citations by year (recent)
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2025: 1, 2024: 1, 2023: 2Per-year citation counts (last 5 years)
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25Number of works referenced by this work
- Related works (count)
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10Other works algorithmically related by OpenAlex
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