Structured illumination with thermal imaging (SI-TI): A dynamically reconfigurable metrology for parallelized thermal transport characterization Article Swipe
Qiye Zheng
,
Divya Chalise
,
Mingxin Jia
,
Yuqiang Zeng
,
Minxiang Zeng
,
Mortaza Saeidi‐Javash
,
A. N. M. Tanvir
,
Gottlieb Uahengo
,
Sumanjeet Kaur
,
Javier E. Garay
,
Tengfei Luo
,
Yanliang Zhang
,
Ravi Prasher
,
Chris Dames
·
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.1063/5.0079842
YOU?
·
· 2022
· Open Access
·
· DOI: https://doi.org/10.1063/5.0079842
The recent push for the “materials by design” paradigm requires synergistic integration of scalable computation, synthesis, and characterization. Among these, techniques for efficient measurement of thermal transport can be a bottleneck limiting the experimental database size, especially for diverse materials with a range of roughness, porosity, and anisotropy. Traditional contact thermal measurements have challenges with throughput and the lack of spatially resolvable property mapping, while non-contact pump-probe laser methods generally need mirror smooth sample surfaces and also require serial raster scanning to achieve property mapping. Here, we present structured illumination with thermal imaging (SI-TI), a new thermal characterization tool based on parallelized all-optical heating and thermometry. Experiments on representative dense and porous bulk materials as well as a 3D printed thermoelectric thick film (∼50 μm) demonstrate that SI-TI (1) enables paralleled measurement of multiple regions and samples without raster scanning; (2) can dynamically adjust the heating pattern purely in software, to optimize the measurement sensitivity in different directions for anisotropic materials; and (3) can tolerate rough (∼3 μm) and scratched sample surfaces. This work highlights a new avenue in adaptivity and throughput for thermal characterization of diverse materials.
Related Topics
Concepts
Characterization (materials science)
Materials science
Metrology
Raster scan
Thermal
Bottleneck
Raster graphics
Throughput
Porosity
Nanometrology
Computer science
Optoelectronics
Optics
Nanotechnology
Composite material
Computer graphics (images)
Artificial intelligence
Physics
Telecommunications
Embedded system
Meteorology
Wireless
Metadata
- Type
- article
- Language
- en
- Landing Page
- https://doi.org/10.1063/5.0079842
- OA Status
- gold
- Cited By
- 15
- References
- 95
- Related Works
- 10
- OpenAlex ID
- https://openalex.org/W4280544936
All OpenAlex metadata
Raw OpenAlex JSON
- OpenAlex ID
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https://openalex.org/W4280544936Canonical identifier for this work in OpenAlex
- DOI
-
https://doi.org/10.1063/5.0079842Digital Object Identifier
- Title
-
Structured illumination with thermal imaging (SI-TI): A dynamically reconfigurable metrology for parallelized thermal transport characterizationWork title
- Type
-
articleOpenAlex work type
- Language
-
enPrimary language
- Publication year
-
2022Year of publication
- Publication date
-
2022-05-11Full publication date if available
- Authors
-
Qiye Zheng, Divya Chalise, Mingxin Jia, Yuqiang Zeng, Minxiang Zeng, Mortaza Saeidi‐Javash, A. N. M. Tanvir, Gottlieb Uahengo, Sumanjeet Kaur, Javier E. Garay, Tengfei Luo, Yanliang Zhang, Ravi Prasher, Chris DamesList of authors in order
- Landing page
-
https://doi.org/10.1063/5.0079842Publisher landing page
- Open access
-
YesWhether a free full text is available
- OA status
-
goldOpen access status per OpenAlex
- OA URL
-
https://escholarship.org/uc/item/5w99n5jxDirect OA link when available
- Concepts
-
Characterization (materials science), Materials science, Metrology, Raster scan, Thermal, Bottleneck, Raster graphics, Throughput, Porosity, Nanometrology, Computer science, Optoelectronics, Optics, Nanotechnology, Composite material, Computer graphics (images), Artificial intelligence, Physics, Telecommunications, Embedded system, Meteorology, WirelessTop concepts (fields/topics) attached by OpenAlex
- Cited by
-
15Total citation count in OpenAlex
- Citations by year (recent)
-
2025: 8, 2024: 4, 2023: 2, 2022: 1Per-year citation counts (last 5 years)
- References (count)
-
95Number of works referenced by this work
- Related works (count)
-
10Other works algorithmically related by OpenAlex
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| referenced_works | https://openalex.org/W2886177874, https://openalex.org/W2929465105, https://openalex.org/W2908719159, https://openalex.org/W3106150533, https://openalex.org/W3033622286, https://openalex.org/W1992985800, https://openalex.org/W3024236153, https://openalex.org/W3032911473, https://openalex.org/W3042021489, https://openalex.org/W3083200713, https://openalex.org/W3196368292, https://openalex.org/W3135349239, https://openalex.org/W3108499612, https://openalex.org/W2504884566, https://openalex.org/W3155038719, https://openalex.org/W3097732124, https://openalex.org/W2018189177, https://openalex.org/W2332287436, https://openalex.org/W2005698581, https://openalex.org/W3005026758, https://openalex.org/W2960059926, https://openalex.org/W2782009972, https://openalex.org/W2009590881, https://openalex.org/W2036784309, https://openalex.org/W2047474443, https://openalex.org/W2401940155, https://openalex.org/W2980689262, https://openalex.org/W2810725316, https://openalex.org/W2166475097, https://openalex.org/W1972746924, https://openalex.org/W4250669982, https://openalex.org/W1501353567, https://openalex.org/W2018627122, https://openalex.org/W2053100058, https://openalex.org/W2079630474, https://openalex.org/W1973741254, https://openalex.org/W2033959212, https://openalex.org/W1516649739, https://openalex.org/W2029388731, https://openalex.org/W2043099428, https://openalex.org/W2047905832, https://openalex.org/W2016822228, https://openalex.org/W294809207, https://openalex.org/W1969018186, https://openalex.org/W2036838520, https://openalex.org/W2115381062, https://openalex.org/W2153336873, https://openalex.org/W2886435609, https://openalex.org/W2092016229, https://openalex.org/W2092877776, https://openalex.org/W2015635420, https://openalex.org/W2066979850, https://openalex.org/W2139872781, https://openalex.org/W1985630444, https://openalex.org/W2068678894, https://openalex.org/W2763995872, https://openalex.org/W2769758651, https://openalex.org/W2559664077, https://openalex.org/W2101675075, https://openalex.org/W2794225259, https://openalex.org/W2031738427, https://openalex.org/W2238896166, https://openalex.org/W2051519052, https://openalex.org/W3003357145, https://openalex.org/W2120344420, https://openalex.org/W2018998370, https://openalex.org/W2014351761, https://openalex.org/W3013199652, https://openalex.org/W2785704963, https://openalex.org/W2134826600, https://openalex.org/W2041775300, https://openalex.org/W3127272917, https://openalex.org/W2986366849, https://openalex.org/W3096008879, https://openalex.org/W2089554181, https://openalex.org/W2515496184, https://openalex.org/W63693126, https://openalex.org/W2810206899, https://openalex.org/W2029515855, https://openalex.org/W3033276442, https://openalex.org/W2523563190, https://openalex.org/W2399632194, https://openalex.org/W3094902261, https://openalex.org/W2006003332, https://openalex.org/W2616860187, https://openalex.org/W2796913193, https://openalex.org/W2042498709, https://openalex.org/W2957866584, https://openalex.org/W2974707108, https://openalex.org/W3198412909, https://openalex.org/W4247230479, https://openalex.org/W3100700130, https://openalex.org/W3102576887, https://openalex.org/W3099752842, https://openalex.org/W3200943799 |
| referenced_works_count | 95 |
| abstract_inverted_index.a | 29, 41, 94, 117, 175 |
| abstract_inverted_index.3D | 118 |
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| abstract_inverted_index.be | 28 |
| abstract_inverted_index.by | 6 |
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| abstract_inverted_index.on | 100, 107 |
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| abstract_inverted_index.we | 86 |
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| abstract_inverted_index.(2) | 140 |
| abstract_inverted_index.(3) | 162 |
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| abstract_inverted_index.the | 4, 32, 57, 144, 152 |
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| abstract_inverted_index.also | 76 |
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| abstract_inverted_index.film | 122 |
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| abstract_inverted_index.tool | 98 |
| abstract_inverted_index.well | 115 |
| abstract_inverted_index.with | 40, 54, 90 |
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| abstract_inverted_index.μm) | 124, 167 |
| abstract_inverted_index.(∼3 | 166 |
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| abstract_inverted_index.Here, | 85 |
| abstract_inverted_index.SI-TI | 127 |
| abstract_inverted_index.based | 99 |
| abstract_inverted_index.dense | 109 |
| abstract_inverted_index.laser | 67 |
| abstract_inverted_index.range | 42 |
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| abstract_inverted_index.size, | 35 |
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| abstract_inverted_index.(∼50 | 123 |
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| abstract_inverted_index.mirror | 71 |
| abstract_inverted_index.porous | 111 |
| abstract_inverted_index.purely | 147 |
| abstract_inverted_index.raster | 79, 138 |
| abstract_inverted_index.recent | 1 |
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| abstract_inverted_index.serial | 78 |
| abstract_inverted_index.smooth | 72 |
| abstract_inverted_index.these, | 19 |
| abstract_inverted_index.achieve | 82 |
| abstract_inverted_index.contact | 49 |
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| abstract_inverted_index.enables | 129 |
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| abstract_inverted_index.imaging | 92 |
| abstract_inverted_index.methods | 68 |
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| abstract_inverted_index.present | 87 |
| abstract_inverted_index.printed | 119 |
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| abstract_inverted_index.require | 77 |
| abstract_inverted_index.samples | 136 |
| abstract_inverted_index.thermal | 25, 50, 91, 96, 183 |
| abstract_inverted_index.without | 137 |
| abstract_inverted_index.(SI-TI), | 93 |
| abstract_inverted_index.database | 34 |
| abstract_inverted_index.limiting | 31 |
| abstract_inverted_index.mapping, | 63 |
| abstract_inverted_index.mapping. | 84 |
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| abstract_inverted_index.tolerate | 164 |
| abstract_inverted_index.design” | 7 |
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| abstract_inverted_index.efficient | 22 |
| abstract_inverted_index.generally | 69 |
| abstract_inverted_index.materials | 39, 113 |
| abstract_inverted_index.porosity, | 45 |
| abstract_inverted_index.scanning; | 139 |
| abstract_inverted_index.scratched | 169 |
| abstract_inverted_index.software, | 149 |
| abstract_inverted_index.spatially | 60 |
| abstract_inverted_index.surfaces. | 171 |
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| abstract_inverted_index.adaptivity | 179 |
| abstract_inverted_index.bottleneck | 30 |
| abstract_inverted_index.challenges | 53 |
| abstract_inverted_index.directions | 157 |
| abstract_inverted_index.especially | 36 |
| abstract_inverted_index.highlights | 174 |
| abstract_inverted_index.materials. | 187 |
| abstract_inverted_index.materials; | 160 |
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| abstract_inverted_index.resolvable | 61 |
| abstract_inverted_index.roughness, | 44 |
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| abstract_inverted_index.anisotropy. | 47 |
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| corresponding_author_ids | https://openalex.org/A5026967877, https://openalex.org/A5018053089 |
| countries_distinct_count | 1 |
| institutions_distinct_count | 14 |
| corresponding_institution_ids | https://openalex.org/I148283060, https://openalex.org/I95457486 |
| citation_normalized_percentile.value | 0.76184915 |
| citation_normalized_percentile.is_in_top_1_percent | False |
| citation_normalized_percentile.is_in_top_10_percent | False |