Journal of Instrumentation • Vol 12 • No 02
Study of low multiplicity electron source LEETECH with diamond detector
February 2017 • Viacheslav Kubytskyi, V. Krylov, P. Bambade, B. Cabouat, F. Wicek, Frédéric Bogard, S. Barsuk, V. Rodin, L. Burmistrov, O. Bezshyyko, D. Attié, P. Co…
In this paper, we present experimental and numerical studies of the calibration of low-multiplicity electron source using signals from electrons incident on a diamond detector. The experiments were performed at the newly commissioned versatile LEETECH platform at the PHIL photoinjector facility at LAL. We show that with a single crystal CVD diamonds of 500 micrometers thickness, the energy losses from the first three electrons of 2.5–3 MeV are clearly resolved. The described technique can be used as a complementar…